JP2508662Y2 - 疵検出装置 - Google Patents

疵検出装置

Info

Publication number
JP2508662Y2
JP2508662Y2 JP1990122914U JP12291490U JP2508662Y2 JP 2508662 Y2 JP2508662 Y2 JP 2508662Y2 JP 1990122914 U JP1990122914 U JP 1990122914U JP 12291490 U JP12291490 U JP 12291490U JP 2508662 Y2 JP2508662 Y2 JP 2508662Y2
Authority
JP
Japan
Prior art keywords
defect
difference
flaw
density
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1990122914U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0479250U (en:Method
Inventor
守 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP1990122914U priority Critical patent/JP2508662Y2/ja
Publication of JPH0479250U publication Critical patent/JPH0479250U/ja
Application granted granted Critical
Publication of JP2508662Y2 publication Critical patent/JP2508662Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1990122914U 1990-11-22 1990-11-22 疵検出装置 Expired - Lifetime JP2508662Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990122914U JP2508662Y2 (ja) 1990-11-22 1990-11-22 疵検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990122914U JP2508662Y2 (ja) 1990-11-22 1990-11-22 疵検出装置

Publications (2)

Publication Number Publication Date
JPH0479250U JPH0479250U (en:Method) 1992-07-10
JP2508662Y2 true JP2508662Y2 (ja) 1996-08-28

Family

ID=31870649

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990122914U Expired - Lifetime JP2508662Y2 (ja) 1990-11-22 1990-11-22 疵検出装置

Country Status (1)

Country Link
JP (1) JP2508662Y2 (en:Method)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5360467B2 (ja) * 2008-10-08 2013-12-04 アイシン精機株式会社 欠陥検査装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5917088A (ja) * 1982-07-21 1984-01-28 株式会社日立製作所 減圧オリフイス
JPS59224546A (ja) * 1983-06-03 1984-12-17 Matsushita Electric Works Ltd 欠陥検出装置
JPS59225338A (ja) * 1983-06-06 1984-12-18 Daido Steel Co Ltd 鋼材における螢光磁粉探傷方法
JPS59226853A (ja) * 1983-06-07 1984-12-20 Daido Steel Co Ltd 鋼材における螢光磁粉探傷方法
JPS6089734A (ja) * 1983-10-24 1985-05-20 Nok Corp 表面欠陥検査方法
JPS617406A (ja) * 1984-06-21 1986-01-14 Mitsubishi Electric Corp 物体形状の欠陥検出方法
JPS6252454A (ja) * 1985-08-30 1987-03-07 Daido Steel Co Ltd 螢光磁粉探傷における疵判定方法および装置
JP2555022B2 (ja) * 1986-03-28 1996-11-20 株式会社日立製作所 検反機の欠点検出方法
JPS6344281A (ja) * 1986-08-08 1988-02-25 Sanyo Electric Co Ltd 画像処理装置
JPS63175976A (ja) * 1987-01-16 1988-07-20 Toshiba Corp 探傷検査装置

Also Published As

Publication number Publication date
JPH0479250U (en:Method) 1992-07-10

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Legal Events

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EXPY Cancellation because of completion of term