JP2023512424A5 - - Google Patents
Info
- Publication number
- JP2023512424A5 JP2023512424A5 JP2022539408A JP2022539408A JP2023512424A5 JP 2023512424 A5 JP2023512424 A5 JP 2023512424A5 JP 2022539408 A JP2022539408 A JP 2022539408A JP 2022539408 A JP2022539408 A JP 2022539408A JP 2023512424 A5 JP2023512424 A5 JP 2023512424A5
- Authority
- JP
- Japan
- Prior art keywords
- ray
- ray beam
- sample holder
- sample
- delivery system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP19290126.2 | 2019-12-30 | ||
| EP19290126.2A EP3845891B1 (en) | 2019-12-30 | 2019-12-30 | X-ray scattering apparatus |
| EP20197189.2 | 2020-09-21 | ||
| EP20197189.2A EP3845892B1 (en) | 2019-12-30 | 2020-09-21 | X-ray scattering apparatus |
| PCT/EP2020/087964 WO2021136771A1 (en) | 2019-12-30 | 2020-12-29 | X-ray scattering apparatus |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2023512424A JP2023512424A (ja) | 2023-03-27 |
| JP2023512424A5 true JP2023512424A5 (https=) | 2023-12-20 |
| JP7635239B2 JP7635239B2 (ja) | 2025-02-25 |
Family
ID=69467290
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022539650A Active JP7542068B2 (ja) | 2019-12-30 | 2020-12-29 | X線散乱装置 |
| JP2022539408A Active JP7635239B2 (ja) | 2019-12-30 | 2020-12-29 | X線散乱装置 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022539650A Active JP7542068B2 (ja) | 2019-12-30 | 2020-12-29 | X線散乱装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US11796485B2 (https=) |
| EP (2) | EP3845891B1 (https=) |
| JP (2) | JP7542068B2 (https=) |
| CN (2) | CN114222916B (https=) |
| WO (2) | WO2021136771A1 (https=) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP4095522B1 (en) * | 2021-05-25 | 2023-08-16 | Xenocs SAS | X-ray scattering apparatus and x-ray scattering method |
| US12436115B2 (en) * | 2022-02-25 | 2025-10-07 | Proto Patents Ltd. | Transmission X-ray diffraction apparatus and related method |
| CN116008322A (zh) * | 2022-12-27 | 2023-04-25 | 中国科学院高能物理研究所 | 一种广角/小角/超小角x射线散射无缝联用装置 |
| CN117054457A (zh) * | 2023-07-03 | 2023-11-14 | 深圳综合粒子设施研究院 | 相机系统及小角x射线散射仪 |
| US20250035691A1 (en) * | 2023-07-27 | 2025-01-30 | International Business Machines Corporation | Emc scattering apparatus |
| EP4589288A1 (en) | 2024-01-16 | 2025-07-23 | Chemovator GmbH | Sample holder, in particular for a sample analyzed by x-ray diffraction |
| FR3160771B1 (fr) * | 2024-03-26 | 2026-03-20 | Letsee Imaging | Système d’imagerie à rayons X de type Hartmann |
| CN119510465A (zh) * | 2024-09-25 | 2025-02-25 | 中国科学院高能物理研究所 | 一种x射线散射衍射实验入射光斑实时监测的方法和装置 |
| CN120948519B (zh) * | 2025-10-20 | 2026-01-27 | 中科先进技术温州研究院 | 一种多几何构型衍射引导装置及x射线衍射设备 |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5245648A (en) * | 1991-04-05 | 1993-09-14 | The United States Of America As Represented By The United States Department Of Energy | X-ray tomographic image magnification process, system and apparatus therefor |
| JP3271426B2 (ja) * | 1994-05-09 | 2002-04-02 | 石川島播磨重工業株式会社 | 放射光ビームライン装置 |
| JPH08145916A (ja) * | 1994-11-18 | 1996-06-07 | Hitachi Ltd | 小角散乱x線装置 |
| JP3697246B2 (ja) * | 2003-03-26 | 2005-09-21 | 株式会社リガク | X線回折装置 |
| JP5031215B2 (ja) * | 2004-09-21 | 2012-09-19 | ジョルダン バレー アプライド ラディエイション リミテッド | 多機能x線分析システム |
| US7120228B2 (en) | 2004-09-21 | 2006-10-10 | Jordan Valley Applied Radiation Ltd. | Combined X-ray reflectometer and diffractometer |
| US7076024B2 (en) * | 2004-12-01 | 2006-07-11 | Jordan Valley Applied Radiation, Ltd. | X-ray apparatus with dual monochromators |
| GB0500536D0 (en) * | 2005-01-12 | 2005-02-16 | Koninkl Philips Electronics Nv | Coherent scatter computer tomography material identification |
| JP4860418B2 (ja) * | 2006-10-10 | 2012-01-25 | 株式会社リガク | X線光学系 |
| EP1947448B1 (en) * | 2007-01-19 | 2013-07-03 | Panalytical B.V. | X-ray diffraction equipment for X-ray scattering |
| JP5116014B2 (ja) * | 2007-06-21 | 2013-01-09 | 株式会社リガク | 小角広角x線測定装置 |
| US20110064197A1 (en) * | 2009-09-16 | 2011-03-17 | Geoffrey Harding | X-ray diffraction devices and method for assembling an object imaging system |
| FR2955391B1 (fr) * | 2010-01-18 | 2012-03-16 | Xenocs | Systeme compact d'analyse par rayons-x |
| JP6322627B2 (ja) * | 2012-06-08 | 2018-05-09 | リガク イノベイティブ テクノロジーズ インコーポレイテッド | デュアルモード小角散乱カメラ |
| WO2013185000A1 (en) * | 2012-06-08 | 2013-12-12 | Rigaku Innovative Technologies, Inc. | X-ray beam system offering 1d and 2d beams |
| US9778213B2 (en) * | 2013-08-19 | 2017-10-03 | Kla-Tencor Corporation | Metrology tool with combined XRF and SAXS capabilities |
| FR3023001B1 (fr) | 2014-06-30 | 2025-01-17 | Commissariat Energie Atomique | Procede d'analyse d'un objet en deux temps utilisant un rayonnement en transmission puis un spectre en diffusion. |
| GB201421837D0 (en) * | 2014-12-09 | 2015-01-21 | Reishig Peter | A method of generating a fingerprint for a gemstone using X-ray imaging |
| DE102015226101A1 (de) * | 2015-12-18 | 2017-06-22 | Bruker Axs Gmbh | Röntgenoptik-Baugruppe mit Umschaltsystem für drei Strahlpfade und zugehöriges Röntgendiffraktometer |
| EP3246695B1 (en) | 2016-05-20 | 2020-12-16 | Xenocs SAS | X-ray scattering apparatus |
| CN109982640A (zh) * | 2016-11-16 | 2019-07-05 | 皇家飞利浦有限公司 | 用于根据相衬成像数据生成多能量数据的装置 |
| US10707051B2 (en) | 2018-05-14 | 2020-07-07 | Gatan, Inc. | Cathodoluminescence optical hub |
-
2019
- 2019-12-30 EP EP19290126.2A patent/EP3845891B1/en active Active
-
2020
- 2020-09-21 EP EP20197189.2A patent/EP3845892B1/en active Active
- 2020-12-29 WO PCT/EP2020/087964 patent/WO2021136771A1/en not_active Ceased
- 2020-12-29 US US17/621,005 patent/US11796485B2/en active Active
- 2020-12-29 US US17/783,183 patent/US11835474B2/en active Active
- 2020-12-29 WO PCT/EP2020/087969 patent/WO2021136774A1/en not_active Ceased
- 2020-12-29 CN CN202080057746.XA patent/CN114222916B/zh active Active
- 2020-12-29 CN CN202080094499.0A patent/CN115053125B/zh active Active
- 2020-12-29 JP JP2022539650A patent/JP7542068B2/ja active Active
- 2020-12-29 JP JP2022539408A patent/JP7635239B2/ja active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7635239B2 (ja) | X線散乱装置 | |
| JP2023512424A5 (https=) | ||
| JP7792488B2 (ja) | 小角x線散乱計測計 | |
| KR102517042B1 (ko) | X-선 작은 각 산란측정용 x-선 방출원 광학 기기 | |
| US7551719B2 (en) | Multifunction X-ray analysis system | |
| JP2023512899A5 (https=) | ||
| KR20050010835A (ko) | 대역 판을 포함하는 다중 영상화 시스템을 사용하는 원소특이성 x-선 형광 현미경 | |
| KR20130112001A (ko) | X선 토포그래피 장치 | |
| JP2009002805A (ja) | 小角広角x線測定装置 | |
| Shin et al. | A scanning transmission X-ray microscope at the Pohang Light Source | |
| US20240248050A1 (en) | X-ray scattering apparatus and x-ray scattering method | |
| JP6198406B2 (ja) | マイクロ回折方法及び装置 | |
| JP4694296B2 (ja) | 蛍光x線三次元分析装置 | |
| CN108398450A (zh) | 基于组合x射线毛细管的微束x射线荧光分析方法 | |
| JP3197104B2 (ja) | X線解析装置 | |
| WO2006095468A1 (ja) | X線回折分析装置およびx線回折分析方法 | |
| US20250251355A1 (en) | Semiconductor inspection apparatus, semiconductor inspection system and semiconductor inspection method | |
| CN108709898A (zh) | 基于组合x射线毛细管的微束x射线荧光分析系统 | |
| WO2026028783A1 (ja) | スリット装置および透過型小角散乱装置 | |
| KR101052361B1 (ko) | 중에너지 이온빔 산란을 이용한 분광분석기 | |
| Falkenberg et al. | Status of the Hard X-ray Micro/Nano-Probe beamline (P06) at PETRA III | |
| CN110987990A (zh) | 一种高能单色闪光x射线衍射成像方法及系统 |