JP2023512424A5 - - Google Patents

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Publication number
JP2023512424A5
JP2023512424A5 JP2022539408A JP2022539408A JP2023512424A5 JP 2023512424 A5 JP2023512424 A5 JP 2023512424A5 JP 2022539408 A JP2022539408 A JP 2022539408A JP 2022539408 A JP2022539408 A JP 2022539408A JP 2023512424 A5 JP2023512424 A5 JP 2023512424A5
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JP
Japan
Prior art keywords
ray
ray beam
sample holder
sample
delivery system
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JP2022539408A
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English (en)
Japanese (ja)
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JP2023512424A (ja
JP7635239B2 (ja
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Priority claimed from EP19290126.2A external-priority patent/EP3845891B1/en
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Publication of JP2023512424A5 publication Critical patent/JP2023512424A5/ja
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Publication of JP7635239B2 publication Critical patent/JP7635239B2/ja
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JP2022539408A 2019-12-30 2020-12-29 X線散乱装置 Active JP7635239B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
EP19290126.2 2019-12-30
EP19290126.2A EP3845891B1 (en) 2019-12-30 2019-12-30 X-ray scattering apparatus
EP20197189.2 2020-09-21
EP20197189.2A EP3845892B1 (en) 2019-12-30 2020-09-21 X-ray scattering apparatus
PCT/EP2020/087964 WO2021136771A1 (en) 2019-12-30 2020-12-29 X-ray scattering apparatus

Publications (3)

Publication Number Publication Date
JP2023512424A JP2023512424A (ja) 2023-03-27
JP2023512424A5 true JP2023512424A5 (https=) 2023-12-20
JP7635239B2 JP7635239B2 (ja) 2025-02-25

Family

ID=69467290

Family Applications (2)

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JP2022539650A Active JP7542068B2 (ja) 2019-12-30 2020-12-29 X線散乱装置
JP2022539408A Active JP7635239B2 (ja) 2019-12-30 2020-12-29 X線散乱装置

Family Applications Before (1)

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JP2022539650A Active JP7542068B2 (ja) 2019-12-30 2020-12-29 X線散乱装置

Country Status (5)

Country Link
US (2) US11796485B2 (https=)
EP (2) EP3845891B1 (https=)
JP (2) JP7542068B2 (https=)
CN (2) CN114222916B (https=)
WO (2) WO2021136771A1 (https=)

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EP4095522B1 (en) * 2021-05-25 2023-08-16 Xenocs SAS X-ray scattering apparatus and x-ray scattering method
US12436115B2 (en) * 2022-02-25 2025-10-07 Proto Patents Ltd. Transmission X-ray diffraction apparatus and related method
CN116008322A (zh) * 2022-12-27 2023-04-25 中国科学院高能物理研究所 一种广角/小角/超小角x射线散射无缝联用装置
CN117054457A (zh) * 2023-07-03 2023-11-14 深圳综合粒子设施研究院 相机系统及小角x射线散射仪
US20250035691A1 (en) * 2023-07-27 2025-01-30 International Business Machines Corporation Emc scattering apparatus
EP4589288A1 (en) 2024-01-16 2025-07-23 Chemovator GmbH Sample holder, in particular for a sample analyzed by x-ray diffraction
FR3160771B1 (fr) * 2024-03-26 2026-03-20 Letsee Imaging Système d’imagerie à rayons X de type Hartmann
CN119510465A (zh) * 2024-09-25 2025-02-25 中国科学院高能物理研究所 一种x射线散射衍射实验入射光斑实时监测的方法和装置
CN120948519B (zh) * 2025-10-20 2026-01-27 中科先进技术温州研究院 一种多几何构型衍射引导装置及x射线衍射设备

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US5245648A (en) * 1991-04-05 1993-09-14 The United States Of America As Represented By The United States Department Of Energy X-ray tomographic image magnification process, system and apparatus therefor
JP3271426B2 (ja) * 1994-05-09 2002-04-02 石川島播磨重工業株式会社 放射光ビームライン装置
JPH08145916A (ja) * 1994-11-18 1996-06-07 Hitachi Ltd 小角散乱x線装置
JP3697246B2 (ja) * 2003-03-26 2005-09-21 株式会社リガク X線回折装置
JP5031215B2 (ja) * 2004-09-21 2012-09-19 ジョルダン バレー アプライド ラディエイション リミテッド 多機能x線分析システム
US7120228B2 (en) 2004-09-21 2006-10-10 Jordan Valley Applied Radiation Ltd. Combined X-ray reflectometer and diffractometer
US7076024B2 (en) * 2004-12-01 2006-07-11 Jordan Valley Applied Radiation, Ltd. X-ray apparatus with dual monochromators
GB0500536D0 (en) * 2005-01-12 2005-02-16 Koninkl Philips Electronics Nv Coherent scatter computer tomography material identification
JP4860418B2 (ja) * 2006-10-10 2012-01-25 株式会社リガク X線光学系
EP1947448B1 (en) * 2007-01-19 2013-07-03 Panalytical B.V. X-ray diffraction equipment for X-ray scattering
JP5116014B2 (ja) * 2007-06-21 2013-01-09 株式会社リガク 小角広角x線測定装置
US20110064197A1 (en) * 2009-09-16 2011-03-17 Geoffrey Harding X-ray diffraction devices and method for assembling an object imaging system
FR2955391B1 (fr) * 2010-01-18 2012-03-16 Xenocs Systeme compact d'analyse par rayons-x
JP6322627B2 (ja) * 2012-06-08 2018-05-09 リガク イノベイティブ テクノロジーズ インコーポレイテッド デュアルモード小角散乱カメラ
WO2013185000A1 (en) * 2012-06-08 2013-12-12 Rigaku Innovative Technologies, Inc. X-ray beam system offering 1d and 2d beams
US9778213B2 (en) * 2013-08-19 2017-10-03 Kla-Tencor Corporation Metrology tool with combined XRF and SAXS capabilities
FR3023001B1 (fr) 2014-06-30 2025-01-17 Commissariat Energie Atomique Procede d'analyse d'un objet en deux temps utilisant un rayonnement en transmission puis un spectre en diffusion.
GB201421837D0 (en) * 2014-12-09 2015-01-21 Reishig Peter A method of generating a fingerprint for a gemstone using X-ray imaging
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EP3246695B1 (en) 2016-05-20 2020-12-16 Xenocs SAS X-ray scattering apparatus
CN109982640A (zh) * 2016-11-16 2019-07-05 皇家飞利浦有限公司 用于根据相衬成像数据生成多能量数据的装置
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