JP2022519242A5 - - Google Patents

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Publication number
JP2022519242A5
JP2022519242A5 JP2021544450A JP2021544450A JP2022519242A5 JP 2022519242 A5 JP2022519242 A5 JP 2022519242A5 JP 2021544450 A JP2021544450 A JP 2021544450A JP 2021544450 A JP2021544450 A JP 2021544450A JP 2022519242 A5 JP2022519242 A5 JP 2022519242A5
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JP
Japan
Prior art keywords
radiation
material layer
filter
elemental composition
thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2021544450A
Other languages
English (en)
Japanese (ja)
Other versions
JP2022519242A (ja
JP7461958B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2020/015615 external-priority patent/WO2020160106A1/en
Publication of JP2022519242A publication Critical patent/JP2022519242A/ja
Publication of JP2022519242A5 publication Critical patent/JP2022519242A5/ja
Priority to JP2023199834A priority Critical patent/JP7660180B2/ja
Application granted granted Critical
Publication of JP7461958B2 publication Critical patent/JP7461958B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2021544450A 2019-01-30 2020-01-29 放射線ベースの厚さゲージ Active JP7461958B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2023199834A JP7660180B2 (ja) 2019-01-30 2023-11-27 放射線ベースの厚さゲージ

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201962799001P 2019-01-30 2019-01-30
US62/799,001 2019-01-30
PCT/US2020/015615 WO2020160106A1 (en) 2019-01-30 2020-01-29 Radiation-based thickness gauge

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2023199834A Division JP7660180B2 (ja) 2019-01-30 2023-11-27 放射線ベースの厚さゲージ

Publications (3)

Publication Number Publication Date
JP2022519242A JP2022519242A (ja) 2022-03-22
JP2022519242A5 true JP2022519242A5 (https=) 2023-02-03
JP7461958B2 JP7461958B2 (ja) 2024-04-04

Family

ID=69740644

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2021544450A Active JP7461958B2 (ja) 2019-01-30 2020-01-29 放射線ベースの厚さゲージ
JP2023199834A Active JP7660180B2 (ja) 2019-01-30 2023-11-27 放射線ベースの厚さゲージ

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2023199834A Active JP7660180B2 (ja) 2019-01-30 2023-11-27 放射線ベースの厚さゲージ

Country Status (6)

Country Link
US (1) US11079222B2 (https=)
EP (1) EP3918372A1 (https=)
JP (2) JP7461958B2 (https=)
KR (1) KR102609389B1 (https=)
CN (1) CN113728247B (https=)
WO (1) WO2020160106A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7461958B2 (ja) * 2019-01-30 2024-04-04 ノードソン コーポレーション 放射線ベースの厚さゲージ
EP4601028A4 (en) 2022-10-03 2026-04-01 Fujifilm Corp METHOD FOR MANUFACTURING AN ELECTRODE LAYER
JP2024077026A (ja) * 2022-11-28 2024-06-07 キヤノン株式会社 放射線撮像装置
WO2024119407A1 (zh) * 2022-12-07 2024-06-13 宁德时代新能源科技股份有限公司 面密度检测装置
EP4722644A1 (en) * 2024-10-02 2026-04-08 LG Energy Solution, Ltd. An apparatus for inspecting a coated electrode sheet for a secondary battery and a method using the same

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Publication number Priority date Publication date Assignee Title
US3417243A (en) * 1965-10-28 1968-12-17 Minnesota Mining & Mfg Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base
JPS5922161B2 (ja) * 1974-05-13 1984-05-24 株式会社東芝 放射線厚み計
US4525854A (en) * 1983-03-22 1985-06-25 Troxler Electronic Laboratories, Inc. Radiation scatter apparatus and method
GB8515552D0 (en) * 1985-06-19 1985-07-24 Boyle Controls Ltd Coating weight & thickness gauges
US4860329A (en) * 1986-02-24 1989-08-22 Upa Technology, Inc. X-ray fluorescence thickness measuring device
JPH04331308A (ja) * 1991-03-05 1992-11-19 Permelec Electrode Ltd 箔厚み連続測定装置
GB9105639D0 (en) * 1991-03-18 1991-05-01 Data Measurement Corp Dynamic alloy correction gauge
GB9113990D0 (en) * 1991-06-28 1991-08-14 Data Measurement Corp Means of calibrating x-ray gauging systems
US6369381B1 (en) * 1999-01-29 2002-04-09 Troxler Electronic Laboratories, Inc. Apparatus and method for calibration of nuclear gauges
US6787773B1 (en) * 2000-06-07 2004-09-07 Kla-Tencor Corporation Film thickness measurement using electron-beam induced x-ray microanalysis
DE10345754A1 (de) * 2003-09-23 2005-04-21 Mesacon Messelektronik Gmbh Dr Vorrichtung und Verfahren zur Bestimmung der Dicke bewegter metallischer, bandförmiger Werkstoffe
CN1995993B (zh) * 2005-12-31 2010-07-14 清华大学 一种利用多种能量辐射扫描物质的方法及其装置
CN201177501Y (zh) 2007-12-27 2009-01-07 江苏天瑞信息技术有限公司 X荧光测厚光谱仪
ITUD20080072A1 (it) * 2008-04-04 2009-10-05 Danieli Automation Spa Misuratore di spessore per lamiere e relativo procedimento di misura
CN101893432B (zh) * 2009-05-21 2014-11-26 昆山善思光电科技有限公司 无损探伤测厚仪
EP2527055A1 (de) 2011-05-25 2012-11-28 Siemens Aktiengesellschaft Verfahren sowie Vorrichtung zur Bestimmung einer Dicke eines Walzguts
DE102011051365B4 (de) * 2011-06-27 2013-08-22 Rayonic Sensor Systems Gmbh Detektionseinrichtung und System zum Messen der Dicke einer Zinkschicht auf Stahl und zum Messen des Eisengehaltes einer Zinkschicht
CN102607476B (zh) 2012-01-05 2016-07-13 黑龙江省科学院技术物理研究所 可调节高精度x射线测厚仪及测试方法
WO2014082795A1 (de) * 2012-11-29 2014-06-05 Helmut Fischer GmbH Institut für Elektronik und Messtechnik Verfahren und vorrichtung zur durchführung einer röntgenfluoreszenzanalyse
AU2014268284A1 (en) * 2014-11-30 2016-06-16 Southern Innovation International Pty Ltd Method and apparatus for material identification
CN106197550B (zh) * 2016-08-17 2018-07-06 西安交通大学 集测厚仪、密度计和料位计于一体的测量装置及测量方法
JP7461958B2 (ja) * 2019-01-30 2024-04-04 ノードソン コーポレーション 放射線ベースの厚さゲージ

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