JP2024009260A5 - - Google Patents

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Publication number
JP2024009260A5
JP2024009260A5 JP2023199834A JP2023199834A JP2024009260A5 JP 2024009260 A5 JP2024009260 A5 JP 2024009260A5 JP 2023199834 A JP2023199834 A JP 2023199834A JP 2023199834 A JP2023199834 A JP 2023199834A JP 2024009260 A5 JP2024009260 A5 JP 2024009260A5
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JP
Japan
Prior art keywords
radiation
material layer
layer
composition
thickness
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JP2023199834A
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English (en)
Japanese (ja)
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JP2024009260A (ja
JP7660180B2 (ja
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Priority claimed from JP2021544450A external-priority patent/JP7461958B2/ja
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Publication of JP2024009260A5 publication Critical patent/JP2024009260A5/ja
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Publication of JP7660180B2 publication Critical patent/JP7660180B2/ja
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JP2023199834A 2019-01-30 2023-11-27 放射線ベースの厚さゲージ Active JP7660180B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201962799001P 2019-01-30 2019-01-30
US62/799,001 2019-01-30
JP2021544450A JP7461958B2 (ja) 2019-01-30 2020-01-29 放射線ベースの厚さゲージ
PCT/US2020/015615 WO2020160106A1 (en) 2019-01-30 2020-01-29 Radiation-based thickness gauge

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2021544450A Division JP7461958B2 (ja) 2019-01-30 2020-01-29 放射線ベースの厚さゲージ

Publications (3)

Publication Number Publication Date
JP2024009260A JP2024009260A (ja) 2024-01-19
JP2024009260A5 true JP2024009260A5 (https=) 2024-07-26
JP7660180B2 JP7660180B2 (ja) 2025-04-10

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ID=69740644

Family Applications (2)

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JP2021544450A Active JP7461958B2 (ja) 2019-01-30 2020-01-29 放射線ベースの厚さゲージ
JP2023199834A Active JP7660180B2 (ja) 2019-01-30 2023-11-27 放射線ベースの厚さゲージ

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2021544450A Active JP7461958B2 (ja) 2019-01-30 2020-01-29 放射線ベースの厚さゲージ

Country Status (6)

Country Link
US (1) US11079222B2 (https=)
EP (1) EP3918372A1 (https=)
JP (2) JP7461958B2 (https=)
KR (1) KR102609389B1 (https=)
CN (1) CN113728247B (https=)
WO (1) WO2020160106A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7461958B2 (ja) * 2019-01-30 2024-04-04 ノードソン コーポレーション 放射線ベースの厚さゲージ
EP4601028A4 (en) 2022-10-03 2026-04-01 Fujifilm Corp METHOD FOR MANUFACTURING AN ELECTRODE LAYER
JP2024077026A (ja) * 2022-11-28 2024-06-07 キヤノン株式会社 放射線撮像装置
WO2024119407A1 (zh) * 2022-12-07 2024-06-13 宁德时代新能源科技股份有限公司 面密度检测装置
EP4722644A1 (en) * 2024-10-02 2026-04-08 LG Energy Solution, Ltd. An apparatus for inspecting a coated electrode sheet for a secondary battery and a method using the same

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JPS5922161B2 (ja) * 1974-05-13 1984-05-24 株式会社東芝 放射線厚み計
US4525854A (en) * 1983-03-22 1985-06-25 Troxler Electronic Laboratories, Inc. Radiation scatter apparatus and method
GB8515552D0 (en) * 1985-06-19 1985-07-24 Boyle Controls Ltd Coating weight & thickness gauges
US4860329A (en) * 1986-02-24 1989-08-22 Upa Technology, Inc. X-ray fluorescence thickness measuring device
JPH04331308A (ja) * 1991-03-05 1992-11-19 Permelec Electrode Ltd 箔厚み連続測定装置
GB9105639D0 (en) * 1991-03-18 1991-05-01 Data Measurement Corp Dynamic alloy correction gauge
GB9113990D0 (en) * 1991-06-28 1991-08-14 Data Measurement Corp Means of calibrating x-ray gauging systems
US6369381B1 (en) * 1999-01-29 2002-04-09 Troxler Electronic Laboratories, Inc. Apparatus and method for calibration of nuclear gauges
US6787773B1 (en) * 2000-06-07 2004-09-07 Kla-Tencor Corporation Film thickness measurement using electron-beam induced x-ray microanalysis
DE10345754A1 (de) * 2003-09-23 2005-04-21 Mesacon Messelektronik Gmbh Dr Vorrichtung und Verfahren zur Bestimmung der Dicke bewegter metallischer, bandförmiger Werkstoffe
CN1995993B (zh) * 2005-12-31 2010-07-14 清华大学 一种利用多种能量辐射扫描物质的方法及其装置
CN201177501Y (zh) 2007-12-27 2009-01-07 江苏天瑞信息技术有限公司 X荧光测厚光谱仪
ITUD20080072A1 (it) * 2008-04-04 2009-10-05 Danieli Automation Spa Misuratore di spessore per lamiere e relativo procedimento di misura
CN101893432B (zh) * 2009-05-21 2014-11-26 昆山善思光电科技有限公司 无损探伤测厚仪
EP2527055A1 (de) 2011-05-25 2012-11-28 Siemens Aktiengesellschaft Verfahren sowie Vorrichtung zur Bestimmung einer Dicke eines Walzguts
DE102011051365B4 (de) * 2011-06-27 2013-08-22 Rayonic Sensor Systems Gmbh Detektionseinrichtung und System zum Messen der Dicke einer Zinkschicht auf Stahl und zum Messen des Eisengehaltes einer Zinkschicht
CN102607476B (zh) 2012-01-05 2016-07-13 黑龙江省科学院技术物理研究所 可调节高精度x射线测厚仪及测试方法
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AU2014268284A1 (en) * 2014-11-30 2016-06-16 Southern Innovation International Pty Ltd Method and apparatus for material identification
CN106197550B (zh) * 2016-08-17 2018-07-06 西安交通大学 集测厚仪、密度计和料位计于一体的测量装置及测量方法
JP7461958B2 (ja) * 2019-01-30 2024-04-04 ノードソン コーポレーション 放射線ベースの厚さゲージ

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