JP2021532574A5 - - Google Patents
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- Publication number
- JP2021532574A5 JP2021532574A5 JP2021500910A JP2021500910A JP2021532574A5 JP 2021532574 A5 JP2021532574 A5 JP 2021532574A5 JP 2021500910 A JP2021500910 A JP 2021500910A JP 2021500910 A JP2021500910 A JP 2021500910A JP 2021532574 A5 JP2021532574 A5 JP 2021532574A5
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2024046425A JP7791924B2 (ja) | 2018-07-19 | 2024-03-22 | 高アスペクト比の誘電体エッチングを達成するための3つ以上の状態 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US16/040,502 | 2018-07-19 | ||
| US16/040,502 US10504744B1 (en) | 2018-07-19 | 2018-07-19 | Three or more states for achieving high aspect ratio dielectric etch |
| PCT/US2019/042255 WO2020018701A1 (en) | 2018-07-19 | 2019-07-17 | Three or more states for achieving high aspect ratio dielectric etch |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024046425A Division JP7791924B2 (ja) | 2018-07-19 | 2024-03-22 | 高アスペクト比の誘電体エッチングを達成するための3つ以上の状態 |
Publications (4)
| Publication Number | Publication Date |
|---|---|
| JP2021532574A JP2021532574A (ja) | 2021-11-25 |
| JPWO2020018701A5 JPWO2020018701A5 (https=) | 2022-07-27 |
| JP2021532574A5 true JP2021532574A5 (https=) | 2022-07-27 |
| JP7461333B2 JP7461333B2 (ja) | 2024-04-03 |
Family
ID=68766060
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021500910A Active JP7461333B2 (ja) | 2018-07-19 | 2019-07-17 | 高アスペクト比の誘電体エッチングを達成するための3つ以上の状態 |
| JP2024046425A Active JP7791924B2 (ja) | 2018-07-19 | 2024-03-22 | 高アスペクト比の誘電体エッチングを達成するための3つ以上の状態 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024046425A Active JP7791924B2 (ja) | 2018-07-19 | 2024-03-22 | 高アスペクト比の誘電体エッチングを達成するための3つ以上の状態 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US10504744B1 (https=) |
| JP (2) | JP7461333B2 (https=) |
| KR (2) | KR102891958B1 (https=) |
| TW (1) | TWI846712B (https=) |
| WO (1) | WO2020018701A1 (https=) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019010312A1 (en) * | 2017-07-07 | 2019-01-10 | Advanced Energy Industries, Inc. | INTER-PERIODIC CONTROL SYSTEM FOR PLASMA POWER SUPPLY SYSTEM AND METHOD OF OPERATION |
| US11615943B2 (en) * | 2017-07-07 | 2023-03-28 | Advanced Energy Industries, Inc. | Inter-period control for passive power distribution of multiple electrode inductive plasma source |
| US11651939B2 (en) * | 2017-07-07 | 2023-05-16 | Advanced Energy Industries, Inc. | Inter-period control system for plasma power delivery system and method of operating same |
| US10504744B1 (en) * | 2018-07-19 | 2019-12-10 | Lam Research Corporation | Three or more states for achieving high aspect ratio dielectric etch |
| WO2020068107A1 (en) * | 2018-09-28 | 2020-04-02 | Lam Research Corporation | Systems and methods for optimizing power delivery to an electrode of a plasma chamber |
| JP7451540B2 (ja) * | 2019-01-22 | 2024-03-18 | アプライド マテリアルズ インコーポレイテッド | パルス状電圧波形を制御するためのフィードバックループ |
| CN114041201B (zh) * | 2019-04-29 | 2024-12-06 | 朗姆研究公司 | 用于rf等离子体工具中的多级脉冲的系统和方法 |
| US11158488B2 (en) * | 2019-06-26 | 2021-10-26 | Mks Instruments, Inc. | High speed synchronization of plasma source/bias power delivery |
| WO2021118862A2 (en) * | 2019-12-13 | 2021-06-17 | Lam Research Corporation | Multi-state pulsing for achieving a balance between bow control and mask selectivity |
| JP2023519960A (ja) * | 2020-04-06 | 2023-05-15 | ラム リサーチ コーポレーション | プラズマシース安定化のための無線周波数パルス開始電力スパイクを制御するための方法およびシステム |
| US11545364B2 (en) | 2020-08-24 | 2023-01-03 | Tokyo Electron Limited | Pulsed capacitively coupled plasma processes |
| WO2022103765A1 (en) * | 2020-11-13 | 2022-05-19 | Lam Research Corporation | Systems and methods for radiofrequency signal generator-based control of impedance matching system |
| US11658006B2 (en) * | 2021-01-14 | 2023-05-23 | Applied Materials, Inc. | Plasma sources and plasma processing apparatus thereof |
| US20230215694A1 (en) * | 2021-02-05 | 2023-07-06 | Lam Research Corporation | Duty cycle control to achieve uniformity |
| WO2023136913A1 (en) * | 2022-01-14 | 2023-07-20 | Lam Research Corporation | Method to control etch profile by rf pulsing |
| CN118715590A (zh) * | 2022-02-17 | 2024-09-27 | 朗姆研究公司 | 用于减少衬底特征中的变化性的系统和方法 |
| JP2025508379A (ja) * | 2022-02-18 | 2025-03-26 | ラム リサーチ コーポレーション | 中心周波数同調のためのシステムおよび方法 |
| US11996274B2 (en) * | 2022-04-07 | 2024-05-28 | Mks Instruments, Inc. | Real-time, non-invasive IEDF plasma sensor |
| WO2024107552A1 (en) * | 2022-11-16 | 2024-05-23 | Lam Research Corporation | Systems and methods for driving passivation to increase an etch rate |
| WO2026035547A1 (en) * | 2024-08-05 | 2026-02-12 | Lam Research Corporation | High aspect ratio feature etching by multi-state pulsing |
Family Cites Families (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7247218B2 (en) * | 2003-05-16 | 2007-07-24 | Applied Materials, Inc. | Plasma density, energy and etch rate measurements at bias power input and real time feedback control of plasma source and bias power |
| US7144521B2 (en) | 2003-08-22 | 2006-12-05 | Lam Research Corporation | High aspect ratio etch using modulation of RF powers of various frequencies |
| US7547636B2 (en) | 2007-02-05 | 2009-06-16 | Lam Research Corporation | Pulsed ultra-high aspect ratio dielectric etch |
| JP5141519B2 (ja) | 2008-12-02 | 2013-02-13 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理装置の運転方法 |
| US8383001B2 (en) | 2009-02-20 | 2013-02-26 | Tokyo Electron Limited | Plasma etching method, plasma etching apparatus and storage medium |
| US8382999B2 (en) * | 2009-03-26 | 2013-02-26 | Applied Materials, Inc. | Pulsed plasma high aspect ratio dielectric process |
| US8475673B2 (en) * | 2009-04-24 | 2013-07-02 | Lam Research Company | Method and apparatus for high aspect ratio dielectric etch |
| US8404598B2 (en) | 2009-08-07 | 2013-03-26 | Applied Materials, Inc. | Synchronized radio frequency pulsing for plasma etching |
| US10225919B2 (en) * | 2011-06-30 | 2019-03-05 | Aes Global Holdings, Pte. Ltd | Projected plasma source |
| US9197196B2 (en) * | 2012-02-22 | 2015-11-24 | Lam Research Corporation | State-based adjustment of power and frequency |
| US10157729B2 (en) * | 2012-02-22 | 2018-12-18 | Lam Research Corporation | Soft pulsing |
| US9295148B2 (en) * | 2012-12-14 | 2016-03-22 | Lam Research Corporation | Computation of statistics for statistical data decimation |
| TWI599272B (zh) * | 2012-09-14 | 2017-09-11 | 蘭姆研究公司 | 根據三個或更多狀態之功率及頻率調整 |
| US9620337B2 (en) * | 2013-01-31 | 2017-04-11 | Lam Research Corporation | Determining a malfunctioning device in a plasma system |
| JP6081254B2 (ja) * | 2013-03-26 | 2017-02-15 | 株式会社東芝 | 永久磁石とそれを用いたモータおよび発電機 |
| KR101677748B1 (ko) | 2014-10-29 | 2016-11-29 | 삼성전자 주식회사 | 펄스 플라즈마 장치 및 펄스 플라즈마 장치 구동 방법 |
| US9536749B2 (en) * | 2014-12-15 | 2017-01-03 | Lam Research Corporation | Ion energy control by RF pulse shape |
| US10340879B2 (en) * | 2015-02-18 | 2019-07-02 | Reno Technologies, Inc. | Switching circuit |
| US10332725B2 (en) * | 2015-03-30 | 2019-06-25 | Lam Research Corporation | Systems and methods for reversing RF current polarity at one output of a multiple output RF matching network |
| US9761459B2 (en) * | 2015-08-05 | 2017-09-12 | Lam Research Corporation | Systems and methods for reverse pulsing |
| US9947514B2 (en) * | 2015-09-01 | 2018-04-17 | Mks Instruments, Inc. | Plasma RF bias cancellation system |
| US9543148B1 (en) * | 2015-09-01 | 2017-01-10 | Lam Research Corporation | Mask shrink layer for high aspect ratio dielectric etch |
| US10347464B2 (en) * | 2015-09-15 | 2019-07-09 | Lam Research Corporation | Cycle-averaged frequency tuning for low power voltage mode operation |
| US9788405B2 (en) * | 2015-10-03 | 2017-10-10 | Applied Materials, Inc. | RF power delivery with approximated saw tooth wave pulsing |
| US10418243B2 (en) * | 2015-10-09 | 2019-09-17 | Applied Materials, Inc. | Ultra-high modulus and etch selectivity boron-carbon hardmask films |
| US9614524B1 (en) * | 2015-11-28 | 2017-04-04 | Applied Materials, Inc. | Automatic impedance tuning with RF dual level pulsing |
| US9852889B1 (en) * | 2016-06-22 | 2017-12-26 | Lam Research Corporation | Systems and methods for controlling directionality of ions in an edge region by using an electrode within a coupling ring |
| US9872373B1 (en) * | 2016-10-25 | 2018-01-16 | Applied Materials, Inc. | Smart multi-level RF pulsing methods |
| US10002746B1 (en) * | 2017-09-13 | 2018-06-19 | Lam Research Corporation | Multi regime plasma wafer processing to increase directionality of ions |
| US10264663B1 (en) * | 2017-10-18 | 2019-04-16 | Lam Research Corporation | Matchless plasma source for semiconductor wafer fabrication |
| US10304669B1 (en) * | 2018-01-21 | 2019-05-28 | Mks Instruments, Inc. | Adaptive counter measure control thwarting IMD jamming impairments for RF plasma systems |
| US10269540B1 (en) * | 2018-01-25 | 2019-04-23 | Advanced Energy Industries, Inc. | Impedance matching system and method of operating the same |
| US10304660B1 (en) * | 2018-03-21 | 2019-05-28 | Lam Research Corporation | Multi-level pulsing of DC and RF signals |
| US10224183B1 (en) * | 2018-03-21 | 2019-03-05 | Lam Research Corporation | Multi-level parameter and frequency pulsing with a low angular spread |
| US10504744B1 (en) * | 2018-07-19 | 2019-12-10 | Lam Research Corporation | Three or more states for achieving high aspect ratio dielectric etch |
-
2018
- 2018-07-19 US US16/040,502 patent/US10504744B1/en active Active
-
2019
- 2019-07-16 TW TW108125058A patent/TWI846712B/zh active
- 2019-07-17 KR KR1020217004926A patent/KR102891958B1/ko active Active
- 2019-07-17 KR KR1020257039300A patent/KR20250173581A/ko active Pending
- 2019-07-17 JP JP2021500910A patent/JP7461333B2/ja active Active
- 2019-07-17 WO PCT/US2019/042255 patent/WO2020018701A1/en not_active Ceased
- 2019-11-21 US US16/691,125 patent/US10861708B2/en active Active
-
2024
- 2024-03-22 JP JP2024046425A patent/JP7791924B2/ja active Active
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