JP2021501469A - 極端に反ったウェハ用の基板ハンドリング装置 - Google Patents
極端に反ったウェハ用の基板ハンドリング装置 Download PDFInfo
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- 239000000758 substrate Substances 0.000 title claims abstract description 241
- 235000012431 wafers Nutrition 0.000 title description 18
- 230000005484 gravity Effects 0.000 claims description 13
- 238000012545 processing Methods 0.000 claims description 6
- 238000012546 transfer Methods 0.000 claims description 6
- 230000000739 chaotic effect Effects 0.000 claims description 3
- 238000000034 method Methods 0.000 description 25
- 230000006870 function Effects 0.000 description 8
- 238000010227 cup method (microbiological evaluation) Methods 0.000 description 7
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 5
- 230000008878 coupling Effects 0.000 description 5
- 238000010168 coupling process Methods 0.000 description 5
- 238000005859 coupling reaction Methods 0.000 description 5
- 230000008901 benefit Effects 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000011109 contamination Methods 0.000 description 3
- 230000014509 gene expression Effects 0.000 description 3
- 230000001788 irregular Effects 0.000 description 3
- 230000000712 assembly Effects 0.000 description 2
- 238000000429 assembly Methods 0.000 description 2
- 230000006399 behavior Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000002783 friction material Substances 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 241001236644 Lavinia Species 0.000 description 1
- 235000002595 Solanum tuberosum Nutrition 0.000 description 1
- 244000061456 Solanum tuberosum Species 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000012636 effector Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000892 gravimetry Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000003607 modifier Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25B—TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING OR HOLDING
- B25B11/00—Work holders not covered by any preceding group in the subclass, e.g. magnetic work holders, vacuum work holders
- B25B11/005—Vacuum work holders
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67288—Monitoring of warpage, curvature, damage, defects or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67772—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving removal of lid, door, cover
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
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- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Robotics (AREA)
- Mechanical Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Manipulator (AREA)
Abstract
Description
本出願は、合衆国法典第35編(特許法)第119条(e)の下で、Balajee Raghavan及びAndrey Yakolovを発明者とする2017年10月27日出願の米国仮特許出願第62/578,251号「END EFFECTOR FOR HANDLING DEVICE FOR EXTREME WARPED SILICON WAFERS」の優先権を主張するものであり、その全文を本明細書に引用している。
Claims (26)
- 第1の支持部及び第2の支持部を含む分岐構造において、前記第1の支持部及び前記第2の支持部が、基板を支持構造に搭載すべく前記基板の背面に接触可能に配置されている分岐構造と、
前記分岐構造に配置された第1の能動支持要素及び第2の能動支持要素であって、前記分岐構造の前記第1の支持部と前記第2の支持部の間に配置された第1の能動支持要素及び第2の能動支持要素と、
前記分岐構造に配置された複数の受動支持要素において、前記第1の能動支持要素及び前記第2の能動支持要素が、前記基板の重心が前記第1の能動支持要素及び前記第2の能動支持要素の前方に配置されるように構成されている複数の受動支持要素とを含む基板ハンドリング装置。 - 前記第1の能動支持要素及び前記第2の能動支持要素が、前記基板が前記第1の能動支持要素及び前記第2の能動支持要素に配置された場合に前記基板と前記複数の受動支持要素の一部との間を接触させるべく構成されている、請求項1に記載の装置。
- 前記第1の能動支持要素が第1の吸入要素を含み、前記第2の能動支持要素が第2の吸入要素を含んでいる、請求項1に記載の装置。
- 前記第1の吸入要素と前記第2の吸入要素が、前記分岐構造の1個以上の真空チャネルを介して真空に流体的に結合されている、請求項3に記載の装置。
- 前記複数の受動支持要素が複数の支持パッドを含んでいる、請求項1に記載の装置。
- 前記複数の支持パッドの少なくともいくつかがテクスチャ化されている、請求項2に記載の装置。
- 前記複数の支持パッドの少なくともいくつかが電気絶縁である、請求項2に記載の装置。
- 前記複数の受動支持要素が、
前記分岐構造の前記第1の支持部に配置された1個以上の第1の支持パッドと、
前記分岐構造の前記第2の支持部に配置された1個以上の第2の支持パッドとを含んでいる、請求項1に記載の装置。 - 前記複数の受動支持要素が更に、
前記分岐構造の追加的な支持部に配置された1個以上の追加的な支持パッドを含み、前記追加的な支持部が前記分岐構造の基部を形成する、請求項8に記載の装置。 - 前記支持構造が、少なくとも1個の処理ツール又は特徴化ツールのチャックを含んでいる、請求項1に記載の装置。
- 前記支持構造がウェハ搬送装置の支持構造を含んでいる、請求項1に記載の装置。
- 前記ウェハ搬送装置が前部開口統一ポッド(FOUP)を含んでいる、請求項11に記載の装置。
- 前記分岐構造が起動可能な機械式アームに機械的に結合されている、請求項1に記載の装置。
- 前記基板がウェハを含んでいる、請求項1に記載の装置。
- 前記ウェハが凸形状、凹形状、又はサドル形状のうち少なくとも一つをなしている、請求項14に記載の装置。
- 前記ウェハが無秩序な局所的反りを含んでいる、請求項14に記載の装置。
- 第1の支持部及び第2の支持部を含む分岐構造において、前記第1の支持部及び前記第2の支持部が、基板を支持構造に搭載すべく前記基板の背面に接触可能に配置されている分岐構造と、
前記分岐構造に配置された第1の能動支持要素及び第2の能動支持要素であって、前記分岐構造の前記第1の支持部と前記第2の支持部の間に配置された第1の能動支持要素及び第2の能動支持要素と、
前記分岐構造に配置された1個以上の受動支持要素において、前記第1の能動支持要素及び前記第2の能動支持要素が、前記基板の重心が前記第1の能動支持要素及び前記第2の能動支持要素の前方に配置されるように構成されている複数の受動支持要素とを含む基板ハンドリング装置。 - チャックと、
基板ハンドリング装置を含むシステムにおいて、前記ハンドリング装置が、
第1の支持部及び第2の支持部を含む分岐構造において、前記第1の支持部及び前記第2の支持部が、基板を前記チャックに配置すべく前記基板の背面に接触可能に配置されている分岐構造と、
前記分岐構造に配置された第1の能動支持要素及び第2の能動支持要素であって、前記分岐構造の前記第1の支持部と前記第2の支持部の間に配置された第1の能動支持要素及び第2の能動支持要素と、
前記分岐構造に配置された1個以上の受動支持要素において、前記第1の能動支持要素及び前記第2の能動支持要素が、前記基板の重心が前記第1の能動支持要素及び前記第2の能動支持要素の前方に配置されるように構成されている1個以上の受動支持要素とを含むシステム。 - 前記第1の能動支持要素及び前記第2の能動支持要素が、前記基板が前記第1の能動支持要素及び前記第2の能動支持要素に配置された場合に前記基板と前記複数の受動支持要素の一部との間を接触させるべく構成されている、請求項18に記載のシステム。
- 前記第1の能動支持要素が第1の吸入要素を含み、前記第2の能動支持要素が第2の吸入要素を含んでいる、請求項18に記載のシステム。
- 前記第1の吸入要素と前記第2の吸入要素が、前記分岐構造の1個以上の真空チャネルを介して流体的に結合されている、請求項18に記載のシステム。
- 前記複数の受動支持要素が複数の支持パッドを含んでいる、請求項18に記載のシステム。
- 前記複数の支持パッドの少なくともいくつかがテクスチャ化されている、請求項22に記載のシステム。
- 前記複数の支持パッドの少なくともいくつかが電気絶縁である、請求項22に記載のシステム。
- 前記複数の受動支持要素が、
前記分岐構造の前記第1の支持部に配置された1個以上の第1の支持パッドと、
前記分岐構造の前記第2の支持部に配置された1個以上の第2の支持パッドとを含んでいる、請求項18に記載のシステム。 - 前記複数の受動支持要素が更に、
前記分岐構造の追加的な支持部に配置された1個以上の追加的な支持パッドを含み、前記追加的な支持部が前記分岐構造の基部を形成する、請求項25に記載のシステム。
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201762578251P | 2017-10-27 | 2017-10-27 | |
US62/578,251 | 2017-10-27 | ||
US16/148,498 US20190131161A1 (en) | 2017-10-27 | 2018-10-01 | Substrate Handling Apparatus for Extreme Warped Wafers |
US16/148,498 | 2018-10-01 | ||
PCT/US2018/057618 WO2019084347A1 (en) | 2017-10-27 | 2018-10-26 | SUBSTRATE HANDLING APPARATUS FOR EXTREMELY DEFORMED PLATELETS |
Publications (2)
Publication Number | Publication Date |
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JP2021501469A true JP2021501469A (ja) | 2021-01-14 |
JP7250785B2 JP7250785B2 (ja) | 2023-04-03 |
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JP2020523381A Active JP7250785B2 (ja) | 2017-10-27 | 2018-10-26 | 極端に反ったウェハ用の基板ハンドリング装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US20190131161A1 (ja) |
EP (1) | EP3682468B1 (ja) |
JP (1) | JP7250785B2 (ja) |
KR (1) | KR102567121B1 (ja) |
CN (1) | CN111344854A (ja) |
TW (2) | TW201923937A (ja) |
WO (1) | WO2019084347A1 (ja) |
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US10332778B2 (en) * | 2015-11-11 | 2019-06-25 | Lam Research Corporation | Lift pin assembly and associated methods |
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2018
- 2018-10-01 US US16/148,498 patent/US20190131161A1/en active Pending
- 2018-10-18 TW TW107136645A patent/TW201923937A/zh unknown
- 2018-10-18 TW TW111146988A patent/TW202312327A/zh unknown
- 2018-10-26 JP JP2020523381A patent/JP7250785B2/ja active Active
- 2018-10-26 CN CN201880072282.2A patent/CN111344854A/zh active Pending
- 2018-10-26 EP EP18871077.6A patent/EP3682468B1/en active Active
- 2018-10-26 WO PCT/US2018/057618 patent/WO2019084347A1/en unknown
- 2018-10-26 KR KR1020207015079A patent/KR102567121B1/ko active IP Right Grant
Patent Citations (5)
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KR20030073023A (ko) * | 2002-03-08 | 2003-09-19 | 엘지.필립스 엘시디 주식회사 | 액정표시소자 제조 공정용 반송 장치 |
KR20080068319A (ko) * | 2007-01-19 | 2008-07-23 | 피에스케이 주식회사 | 기판 반송 장치 |
US20140348618A1 (en) * | 2013-05-24 | 2014-11-27 | Novellus Systems, Inc. | Vacuum robot with linear translation carriage |
JP2016533636A (ja) * | 2013-09-26 | 2016-10-27 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 空気圧エンドエフェクタ装置、基板搬送システム、及び基板搬送方法 |
JP2016538711A (ja) * | 2014-03-06 | 2016-12-08 | カスケード マイクロテック インコーポレイテッドCascade Microtech,Incorporated | ウェーハ‐ハンドリング・エンドエフェクタ |
Also Published As
Publication number | Publication date |
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TW202312327A (zh) | 2023-03-16 |
EP3682468B1 (en) | 2023-05-31 |
WO2019084347A1 (en) | 2019-05-02 |
US20190131161A1 (en) | 2019-05-02 |
KR102567121B1 (ko) | 2023-08-14 |
TW201923937A (zh) | 2019-06-16 |
EP3682468A1 (en) | 2020-07-22 |
KR20200065089A (ko) | 2020-06-08 |
EP3682468A4 (en) | 2021-06-02 |
CN111344854A (zh) | 2020-06-26 |
JP7250785B2 (ja) | 2023-04-03 |
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