JP2021036347A5 - - Google Patents

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Publication number
JP2021036347A5
JP2021036347A5 JP2020201675A JP2020201675A JP2021036347A5 JP 2021036347 A5 JP2021036347 A5 JP 2021036347A5 JP 2020201675 A JP2020201675 A JP 2020201675A JP 2020201675 A JP2020201675 A JP 2020201675A JP 2021036347 A5 JP2021036347 A5 JP 2021036347A5
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JP
Japan
Prior art keywords
exposure
substrate
forming
light
latent image
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JP2020201675A
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English (en)
Japanese (ja)
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JP7071483B2 (ja
JP2021036347A (ja
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JP2020201675A 2020-12-04 2020-12-04 リソグラフィ装置、パターン形成方法及び物品の製造方法 Active JP7071483B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2020201675A JP7071483B2 (ja) 2020-12-04 2020-12-04 リソグラフィ装置、パターン形成方法及び物品の製造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020201675A JP7071483B2 (ja) 2020-12-04 2020-12-04 リソグラフィ装置、パターン形成方法及び物品の製造方法

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2019158671A Division JP6828107B2 (ja) 2019-08-30 2019-08-30 リソグラフィ装置、パターン形成方法及び物品の製造方法

Publications (3)

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JP2021036347A JP2021036347A (ja) 2021-03-04
JP2021036347A5 true JP2021036347A5 (https=) 2021-04-30
JP7071483B2 JP7071483B2 (ja) 2022-05-19

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JP2020201675A Active JP7071483B2 (ja) 2020-12-04 2020-12-04 リソグラフィ装置、パターン形成方法及び物品の製造方法

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JP (1) JP7071483B2 (https=)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1012521A (ja) * 1996-06-21 1998-01-16 Nikon Corp 感光剤塗布方法及び装置、及び位置合わせ方法
JP2001203146A (ja) * 2000-01-20 2001-07-27 Toshiba Corp パターン形成方法
JP2003059105A (ja) * 2001-08-23 2003-02-28 Sony Corp 光ディスクおよびその製造方法
JP2003251937A (ja) * 2002-03-05 2003-09-09 Fuji Photo Film Co Ltd マーキング方法、マーキング装置及び感光材料
JP2005092137A (ja) * 2003-09-19 2005-04-07 Nikon Corp 露光装置及び露光方法
JP2006017975A (ja) * 2004-07-01 2006-01-19 Ricoh Co Ltd 移動体、画像形成装置及び移動体のマーク形成方法
US8500895B2 (en) * 2006-05-22 2013-08-06 Marken-Imaje Corporation Methods of marking and related structures and compositions
US8138058B2 (en) * 2006-11-24 2012-03-20 Semiconductor Energy Laboratory Co., Ltd. Substrate with marker, manufacturing method thereof, laser irradiation apparatus, laser irradiation method, light exposure apparatus, and manufacturing method of semiconductor device
KR102288980B1 (ko) * 2017-03-08 2021-08-12 에스케이하이닉스 주식회사 얼라인먼트 마크를 가지는 임프린트 템플레이트 및 임프린트 방법

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