JP2020535643A5 - - Google Patents

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Publication number
JP2020535643A5
JP2020535643A5 JP2020516898A JP2020516898A JP2020535643A5 JP 2020535643 A5 JP2020535643 A5 JP 2020535643A5 JP 2020516898 A JP2020516898 A JP 2020516898A JP 2020516898 A JP2020516898 A JP 2020516898A JP 2020535643 A5 JP2020535643 A5 JP 2020535643A5
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JP
Japan
Prior art keywords
temperature
niobium
forming
layer
traces
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JP2020516898A
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English (en)
Japanese (ja)
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JP2020535643A (ja
JP7170036B2 (ja
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Priority claimed from US15/715,521 external-priority patent/US10651362B2/en
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JP2020516898A 2017-09-26 2018-06-25 超伝導配線層およびインターコネクトを有する機器の製作 Active JP7170036B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15/715,521 2017-09-26
US15/715,521 US10651362B2 (en) 2017-09-26 2017-09-26 Method of forming superconducting apparatus including superconducting layers and traces
PCT/US2018/039214 WO2019067039A1 (en) 2017-09-26 2018-06-25 DEVICE MANUFACTURE COMPRISING SUPERCONDUCTING WIRING LAYERS AND INTERCONNECTIONS

Publications (3)

Publication Number Publication Date
JP2020535643A JP2020535643A (ja) 2020-12-03
JP2020535643A5 true JP2020535643A5 (https=) 2021-07-26
JP7170036B2 JP7170036B2 (ja) 2022-11-11

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ID=63077939

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Application Number Title Priority Date Filing Date
JP2020516898A Active JP7170036B2 (ja) 2017-09-26 2018-06-25 超伝導配線層およびインターコネクトを有する機器の製作

Country Status (5)

Country Link
US (2) US10651362B2 (https=)
EP (1) EP3688796B1 (https=)
JP (1) JP7170036B2 (https=)
AU (1) AU2018341994B2 (https=)
WO (1) WO2019067039A1 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10651362B2 (en) * 2017-09-26 2020-05-12 Microsoft Technology Licensing, Llc Method of forming superconducting apparatus including superconducting layers and traces
US10615223B2 (en) 2018-06-12 2020-04-07 International Business Machines Corporation Vertical silicon-on-metal superconducting quantum interference device
US20200083154A1 (en) 2018-09-10 2020-03-12 At&S Austria Technologie & Systemtechnik Aktiengesellschaft Component Carrier With a Photoimageable Dielectric Layer and a Structured Conductive Layer Being Used as a Mask for Selectively Exposing the Photoimageable Dielectric Layer With Electromagnetic Radiation
US11417819B2 (en) * 2020-04-27 2022-08-16 Microsoft Technology Licensing, Llc Forming a bumpless superconductor device by bonding two substrates via a dielectric layer
FR3114443B1 (fr) * 2020-09-21 2022-12-23 Commissariat Energie Atomique Structure d’intégration à routage bifonctionnel et assemblage comprenant une telle structure
US11742326B2 (en) * 2020-12-28 2023-08-29 Microsoft Technology Licensing, Llc Stacked superconducting integrated circuits with three dimensional resonant clock networks
FR3129772B1 (fr) * 2021-11-30 2024-10-04 Commissariat Energie Atomique Structure d’intégration destinée à connecter une pluralité de dispositifs semi-conducteurs, procédés, assemblage et système associés
FI20245823A1 (en) * 2024-06-27 2025-12-28 Teknologian Tutkimuskeskus Vtt Oy Superconducting longitudinal connection and method for producing the same

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA1329952C (en) * 1987-04-27 1994-05-31 Yoshihiko Imanaka Multi-layer superconducting circuit substrate and process for manufacturing same
JP2875093B2 (ja) * 1992-03-17 1999-03-24 三菱電機株式会社 半導体装置
US5476719A (en) 1994-08-17 1995-12-19 Trw Inc. Superconducting multi-layer microstrip structure for multi-chip modules and microwave circuits
JPH09260378A (ja) * 1996-03-22 1997-10-03 Canon Inc 埋め込み配線形成方法
JP3457851B2 (ja) * 1997-06-30 2003-10-20 京セラ株式会社 電子回路部品
US6420251B1 (en) * 1999-01-05 2002-07-16 Trw Inc. Method for fabricating a microelectronic integrated circuit with improved step coverage
JP4711249B2 (ja) 2002-08-01 2011-06-29 独立行政法人産業技術総合研究所 超伝導集積回路及びその作製方法
EP3098865B1 (en) * 2009-02-27 2018-10-03 D-Wave Systems Inc. Method for fabricating a superconducting integrated circuit
US8735326B2 (en) * 2010-05-19 2014-05-27 Northrop Grumman Systems Corporation Methods of forming superconductor circuits
WO2013180780A2 (en) * 2012-03-08 2013-12-05 D-Wave Systems Inc. Systems and methods for fabrication of superconducting integrated circuits
JP6435860B2 (ja) 2012-11-05 2018-12-19 大日本印刷株式会社 配線構造体
US9741918B2 (en) * 2013-10-07 2017-08-22 Hypres, Inc. Method for increasing the integration level of superconducting electronics circuits, and a resulting circuit
EP3195377B1 (en) * 2014-08-13 2021-12-15 D-Wave Systems Inc. Method of forming superconducting wiring layers with low magnetic noise
US9653398B1 (en) * 2015-12-08 2017-05-16 Northrop Grumman Systems Corporation Non-oxide based dielectrics for superconductor devices
US10003005B2 (en) * 2016-08-23 2018-06-19 Northrop Grumman Systems Corporation Superconductor device interconnect
US10276504B2 (en) * 2017-05-17 2019-04-30 Northrop Grumman Systems Corporation Preclean and deposition methodology for superconductor interconnects
US10651362B2 (en) * 2017-09-26 2020-05-12 Microsoft Technology Licensing, Llc Method of forming superconducting apparatus including superconducting layers and traces

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