JP2020153751A5 - - Google Patents

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Publication number
JP2020153751A5
JP2020153751A5 JP2019051075A JP2019051075A JP2020153751A5 JP 2020153751 A5 JP2020153751 A5 JP 2020153751A5 JP 2019051075 A JP2019051075 A JP 2019051075A JP 2019051075 A JP2019051075 A JP 2019051075A JP 2020153751 A5 JP2020153751 A5 JP 2020153751A5
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JP
Japan
Prior art keywords
light
light receiving
measuring device
distance measuring
abnormality
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JP2019051075A
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English (en)
Japanese (ja)
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JP7275701B2 (ja
JP2020153751A (ja
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Priority to JP2019051075A priority Critical patent/JP7275701B2/ja
Priority claimed from JP2019051075A external-priority patent/JP7275701B2/ja
Priority to CN202080022913.7A priority patent/CN113678021B/zh
Priority to PCT/JP2020/004276 priority patent/WO2020189062A1/ja
Publication of JP2020153751A publication Critical patent/JP2020153751A/ja
Publication of JP2020153751A5 publication Critical patent/JP2020153751A5/ja
Priority to US17/478,731 priority patent/US20220003853A1/en
Application granted granted Critical
Publication of JP7275701B2 publication Critical patent/JP7275701B2/ja
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JP2019051075A 2019-03-19 2019-03-19 測距装置および測距装置における異常判定方法 Active JP7275701B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2019051075A JP7275701B2 (ja) 2019-03-19 2019-03-19 測距装置および測距装置における異常判定方法
CN202080022913.7A CN113678021B (zh) 2019-03-19 2020-02-05 测距装置以及测距装置中的异常判定方法
PCT/JP2020/004276 WO2020189062A1 (ja) 2019-03-19 2020-02-05 測距装置および測距装置における異常判定方法
US17/478,731 US20220003853A1 (en) 2019-03-19 2021-09-17 Distance measuring device and malfunction determination method for distance measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019051075A JP7275701B2 (ja) 2019-03-19 2019-03-19 測距装置および測距装置における異常判定方法

Publications (3)

Publication Number Publication Date
JP2020153751A JP2020153751A (ja) 2020-09-24
JP2020153751A5 true JP2020153751A5 (enExample) 2021-07-26
JP7275701B2 JP7275701B2 (ja) 2023-05-18

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JP2019051075A Active JP7275701B2 (ja) 2019-03-19 2019-03-19 測距装置および測距装置における異常判定方法

Country Status (4)

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US (1) US20220003853A1 (enExample)
JP (1) JP7275701B2 (enExample)
CN (1) CN113678021B (enExample)
WO (1) WO2020189062A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP4105597A4 (en) * 2020-02-14 2023-08-09 Sony Semiconductor Solutions Corporation DISTANCE MEASURING DEVICE AND METHOD OF DISTANCE MEASUREMENT
CN120530340A (zh) * 2023-01-16 2025-08-22 索尼半导体解决方案公司 测距装置

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5515156A (en) * 1993-07-29 1996-05-07 Omron Corporation Electromagentic wave generating device and a distance measuring device
JP3078761B2 (ja) * 1997-01-30 2000-08-21 オムロン株式会社 物体検出装置
JP3736433B2 (ja) * 2001-11-14 2006-01-18 日産自動車株式会社 車載用レーダーとその検査方法および車間距離計測装置
US7064817B1 (en) * 2003-11-04 2006-06-20 Sandia Corporation Method to determine and adjust the alignment of the transmitter and receiver fields of view of a LIDAR system
JP3962929B2 (ja) 2004-05-18 2007-08-22 防衛省技術研究本部長 レーザ距離画像生成装置及び方法
JP2006308558A (ja) 2005-03-31 2006-11-09 Sanyo Electric Co Ltd ビーム照射装置
JP5252673B2 (ja) * 2005-05-20 2013-07-31 サイバーレーザー株式会社 レーザ装置の不具合診断方法および不具合修理方法
WO2009057114A2 (en) 2007-10-31 2009-05-07 Ben Gurion University Of The Negev Research And Development Authority Optical sensor measurement and crosstalk evaluation
JP6111617B2 (ja) 2012-07-03 2017-04-12 株式会社リコー レーザレーダ装置
US10768283B2 (en) * 2015-11-11 2020-09-08 Ams Sensors Singapore Pte. Ltd. Enhanced distance data acquisition
US10408940B2 (en) * 2016-09-25 2019-09-10 James Thomas O'Keeffe Remote lidar with coherent fiber optic image bundle
JP6633504B2 (ja) * 2016-12-21 2020-01-22 日本電産モビリティ株式会社 受光素子用マルチプレクサおよび走査式レーザレーダ装置
WO2018147453A1 (ja) 2017-02-09 2018-08-16 コニカミノルタ株式会社 走査型の光学系及びレーザーレーダー装置
JP6879772B2 (ja) * 2017-02-22 2021-06-02 株式会社小糸製作所 車両用灯具
US20180329064A1 (en) * 2017-05-09 2018-11-15 Stmicroelectronics (Grenoble 2) Sas Method and apparatus for mapping column illumination to column detection in a time of flight (tof) system
JP6845774B2 (ja) * 2017-09-15 2021-03-24 株式会社東芝 距離計測装置
CN107966692B (zh) * 2017-11-23 2020-05-08 武汉万集信息技术有限公司 一种具有自检功能的激光雷达
JP7135350B2 (ja) 2018-03-13 2022-09-13 株式会社リコー 物体検出装置、移動体装置及び物体検出方法
JP7316277B2 (ja) * 2018-07-25 2023-07-27 株式会社小糸製作所 センサシステム

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