JP2020134415A - 測定装置 - Google Patents
測定装置 Download PDFInfo
- Publication number
- JP2020134415A JP2020134415A JP2019031070A JP2019031070A JP2020134415A JP 2020134415 A JP2020134415 A JP 2020134415A JP 2019031070 A JP2019031070 A JP 2019031070A JP 2019031070 A JP2019031070 A JP 2019031070A JP 2020134415 A JP2020134415 A JP 2020134415A
- Authority
- JP
- Japan
- Prior art keywords
- microwave
- unit
- measuring device
- coil
- electron spin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004435 EPR spectroscopy Methods 0.000 claims abstract description 27
- 230000008859 change Effects 0.000 claims description 2
- 238000000465 moulding Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 abstract description 31
- 230000005684 electric field Effects 0.000 abstract description 9
- 238000010586 diagram Methods 0.000 description 21
- 239000000758 substrate Substances 0.000 description 16
- 230000004907 flux Effects 0.000 description 10
- 230000003287 optical effect Effects 0.000 description 7
- 238000000387 optically detected magnetic resonance Methods 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 238000004364 calculation method Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 229910003460 diamond Inorganic materials 0.000 description 4
- 239000010432 diamond Substances 0.000 description 4
- 230000005283 ground state Effects 0.000 description 4
- 238000001646 magnetic resonance method Methods 0.000 description 4
- 230000007704 transition Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 230000001678 irradiating effect Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000004088 simulation Methods 0.000 description 2
- 230000005699 Stark effect Effects 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000003467 diminishing effect Effects 0.000 description 1
- 230000002500 effect on skin Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000001208 nuclear magnetic resonance pulse sequence Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000000264 spin echo pulse sequence Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
- G01R33/36—Electrical details, e.g. matching or coupling of the coil to the receiver
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/26—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/032—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
- G01R33/323—Detection of MR without the use of RF or microwaves, e.g. force-detected MR, thermally detected MR, MR detection via electrical conductivity, optically detected MR
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
- G01N24/10—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects by using electron paramagnetic resonance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/28—Details of apparatus provided for in groups G01R33/44 - G01R33/64
- G01R33/32—Excitation or detection systems, e.g. using radio frequency signals
- G01R33/36—Electrical details, e.g. matching or coupling of the coil to the receiver
- G01R33/3628—Tuning/matching of the transmit/receive coil
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/60—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using electron paramagnetic resonance
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measuring Magnetic Variables (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Abstract
【解決手段】 マイクロ波生成部2は、ラビ振動に基づく電子スピン量子操作を行うためのマイクロ波を生成する。観測系11は、そのマイクロ波が照射された電子スピン共鳴部材を使用して被測定場の強度を特定する。マイクロ波生成部2は、上述のマイクロ波を放出するコイル部2aと、コイル部2aに対して電気的に並列に配置された追加静電容量部2bとを備える。そして、追加静電容量部2bは、コイル部2aに対して直接、または、コイル部2aに電気的に接続される電気素子とコイル部2aとの間に配置されている。
【選択図】 図3
Description
2 マイクロ波生成部
2a コイル部
2b 追加静電容量部
2c 電極片
2e 静電容量素子
11 観測系
Claims (6)
- ラビ振動に基づく電子スピン量子操作を行うためのマイクロ波を生成するマイクロ波生成部と、
前記マイクロ波が照射された電子スピン共鳴部材を使用して被測定場の強度を特定する観測系とを備え、
前記マイクロ波生成部は、前記マイクロ波を放出するコイル部と、前記コイル部に対して電気的に並列に配置された追加静電容量部とを備え、
前記追加静電容量部は、前記コイル部に対して直接、または、前記コイル部に電気的に接続される電気素子と前記コイル部との間に配置されていること、
を特徴とする測定装置。 - 前記追加静電容量部は、前記コイル部から延びる一対の電極片を備えることを特徴とする請求項1記載の測定装置。
- 前記コイル部および前記一対の電極片は、1枚の導電板を成形したものであることを特徴とする請求項2記載の測定装置。
- 前記追加静電容量部は、前記コイル部に電気的に接続された静電容量素子を備えることを特徴とする請求項1記載の測定装置。
- 前記マイクロ波生成部に対して電気的に直列に配置された周波数調整部をさらに備え、
前記周波数調整部は、前記追加静電容量部に起因する前記マイクロ波の周波数変化を抑制するように前記マイクロ波の周波数を所望の周波数に調整すること、
を特徴とする請求項1から請求項4のうちのいずれか1項記載の測定装置。 - 前記コイル部は、前記電子スピン共鳴部材を挟むように、もしくは前記電子スピン共鳴部材の一方側において、所定の間隔で互いに平行な2つの電流を導通させ、マイクロ波を放出することを特徴とする請求項1から請求項5のうちのいずれか1項記載の測定装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019031070A JP7265699B2 (ja) | 2019-02-22 | 2019-02-22 | 測定装置 |
CN202010042049.9A CN111610475A (zh) | 2019-02-22 | 2020-01-15 | 测量装置 |
US16/783,847 US11221381B2 (en) | 2019-02-22 | 2020-02-06 | Measurement device having a microwave generator in which a capacitor is formed by coil legs |
EP20158300.2A EP3699621B1 (en) | 2019-02-22 | 2020-02-19 | Measurement device comprising a microwave generator |
US17/457,931 US11747414B2 (en) | 2019-02-22 | 2021-12-07 | Measurement device having a microwave generator in which a capacitor spans coil legs |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019031070A JP7265699B2 (ja) | 2019-02-22 | 2019-02-22 | 測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2020134415A true JP2020134415A (ja) | 2020-08-31 |
JP7265699B2 JP7265699B2 (ja) | 2023-04-27 |
Family
ID=69726429
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019031070A Active JP7265699B2 (ja) | 2019-02-22 | 2019-02-22 | 測定装置 |
Country Status (4)
Country | Link |
---|---|
US (2) | US11221381B2 (ja) |
EP (1) | EP3699621B1 (ja) |
JP (1) | JP7265699B2 (ja) |
CN (1) | CN111610475A (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022210696A1 (ja) * | 2021-03-31 | 2022-10-06 | 住友電気工業株式会社 | ダイヤモンド光磁気センサ |
WO2022244399A1 (ja) * | 2021-05-18 | 2022-11-24 | スミダコーポレーション株式会社 | 磁場測定装置および磁場測定方法 |
WO2024080386A1 (ja) * | 2022-10-13 | 2024-04-18 | スミダコーポレーション株式会社 | 磁場測定装置 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7209182B2 (ja) | 2018-12-27 | 2023-01-20 | スミダコーポレーション株式会社 | 励起光照射装置および励起光照射方法 |
JP7387107B2 (ja) * | 2019-12-24 | 2023-11-28 | スミダコーポレーション株式会社 | 測定装置および測定方法 |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58127154A (ja) * | 1981-10-09 | 1983-07-28 | ザ・メデイカル・カレツジ・オブ・ウイスコンシン・インコ−ポレ−テツド | 集中回路共振器 |
JPS63122443A (ja) * | 1986-10-28 | 1988-05-26 | シーメンス、アクチエンゲゼルシヤフト | 核磁気共鳴断層撮影のための表面共振器 |
JPH0739539A (ja) * | 1993-08-02 | 1995-02-10 | Hitachi Medical Corp | 磁気共鳴検査装置に用いる高周波コイル |
JP2002071596A (ja) * | 2000-08-25 | 2002-03-08 | Yamagata Public Corp For The Development Of Industry | 電子スピン共鳴の計測方法および計測装置 |
JP2002350525A (ja) * | 2001-05-24 | 2002-12-04 | Jeol Ltd | ループギャップ共振器の共振周波数調整機構 |
JP2007078696A (ja) * | 2006-10-20 | 2007-03-29 | Japan Science & Technology Agency | 共振器及び磁気共鳴測定装置 |
JP2007170936A (ja) * | 2005-12-21 | 2007-07-05 | Jeol Ltd | Nmr用複合型円筒形コイル |
JP2014519615A (ja) * | 2011-06-13 | 2014-08-14 | プレジデント アンド フェローズ オブ ハーバード カレッジ | 固体状態のスピン系におけるスピン不純物の吸収に基づく検出 |
JP2016045001A (ja) * | 2014-08-20 | 2016-04-04 | 日本電信電話株式会社 | 磁場検出方法 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6446636A (en) * | 1987-08-14 | 1989-02-21 | Jeol Ltd | Toroidal coil type resonator |
DE19834939A1 (de) * | 1998-07-29 | 2000-02-03 | Norbert Groth | Mikrospektrometer für die ESR-Spektroskopie und Meßverfahren |
JP2001051036A (ja) * | 1999-08-17 | 2001-02-23 | Jeol Ltd | 電子スピン共鳴装置 |
EP1825288A2 (en) * | 2004-12-03 | 2007-08-29 | E.I. Dupont De Nemours And Company | Matual decoupling of excitation and receive coils of a nuclear quadrupole resonance detection system |
JP4465479B2 (ja) * | 2007-01-23 | 2010-05-19 | 国立大学法人山形大学 | 共振器及び電子スピン共鳴分光装置 |
US20130027034A1 (en) * | 2010-04-22 | 2013-01-31 | Koninklijke Philips Electronics N.V. | Nuclear magnetic resonance magnetometer employing optically induced hyperpolarization |
JP2012110489A (ja) | 2010-11-24 | 2012-06-14 | Sumitomo Electric Ind Ltd | 磁気計測装置、及び、磁気センサ素子の製造方法 |
WO2015175047A2 (en) | 2014-02-13 | 2015-11-19 | President And Fellows Of Harvard College | Optically detected magnetic resonance imaging with an electromagnetic field resonator |
CN105158709B (zh) * | 2015-08-05 | 2017-12-22 | 北京航空航天大学 | 一种基于内嵌nv‑色心金刚石的磁场测量装置 |
US10942230B2 (en) * | 2015-11-27 | 2021-03-09 | Helmholtz-Zentrum Berlin Fuer Materialien Und Energie Gmbh | Device for generating and detecting a magnetic resonance of a sample |
DE102015120644B3 (de) * | 2015-11-27 | 2017-03-09 | Helmholtz-Zentrum Berlin Für Materialien Und Energie Gmbh | Vorrichtung und Verfahren zur Erzeugung und Detektion einer transienten Magnetisierung einer Probe |
US10677953B2 (en) * | 2016-05-31 | 2020-06-09 | Lockheed Martin Corporation | Magneto-optical detecting apparatus and methods |
GB201615645D0 (en) * | 2016-09-14 | 2016-10-26 | Imp Innovations Ltd | Apparatus and method for establishing quantum oscillations |
JP7225545B2 (ja) * | 2017-02-21 | 2023-02-21 | 日新電機株式会社 | 検出装置及び検出方法 |
CN107356820A (zh) * | 2017-06-07 | 2017-11-17 | 南京邮电大学 | 一种基于脉冲光探测磁共振的电磁场近场成像系统及方法 |
JP7112652B2 (ja) | 2017-09-12 | 2022-08-04 | スミダコーポレーション株式会社 | 高周波磁場発生装置 |
CN114779141A (zh) * | 2017-09-12 | 2022-07-22 | 胜美达集团株式会社 | 高频磁场产生装置 |
CN108646203B (zh) * | 2018-05-04 | 2020-05-15 | 中国科学技术大学 | 一种纳米尺度的微波磁场测量方法 |
-
2019
- 2019-02-22 JP JP2019031070A patent/JP7265699B2/ja active Active
-
2020
- 2020-01-15 CN CN202010042049.9A patent/CN111610475A/zh active Pending
- 2020-02-06 US US16/783,847 patent/US11221381B2/en active Active
- 2020-02-19 EP EP20158300.2A patent/EP3699621B1/en active Active
-
2021
- 2021-12-07 US US17/457,931 patent/US11747414B2/en active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58127154A (ja) * | 1981-10-09 | 1983-07-28 | ザ・メデイカル・カレツジ・オブ・ウイスコンシン・インコ−ポレ−テツド | 集中回路共振器 |
JPS63122443A (ja) * | 1986-10-28 | 1988-05-26 | シーメンス、アクチエンゲゼルシヤフト | 核磁気共鳴断層撮影のための表面共振器 |
JPH0739539A (ja) * | 1993-08-02 | 1995-02-10 | Hitachi Medical Corp | 磁気共鳴検査装置に用いる高周波コイル |
JP2002071596A (ja) * | 2000-08-25 | 2002-03-08 | Yamagata Public Corp For The Development Of Industry | 電子スピン共鳴の計測方法および計測装置 |
JP2002350525A (ja) * | 2001-05-24 | 2002-12-04 | Jeol Ltd | ループギャップ共振器の共振周波数調整機構 |
JP2007170936A (ja) * | 2005-12-21 | 2007-07-05 | Jeol Ltd | Nmr用複合型円筒形コイル |
JP2007078696A (ja) * | 2006-10-20 | 2007-03-29 | Japan Science & Technology Agency | 共振器及び磁気共鳴測定装置 |
JP2014519615A (ja) * | 2011-06-13 | 2014-08-14 | プレジデント アンド フェローズ オブ ハーバード カレッジ | 固体状態のスピン系におけるスピン不純物の吸収に基づく検出 |
JP2016045001A (ja) * | 2014-08-20 | 2016-04-04 | 日本電信電話株式会社 | 磁場検出方法 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022210696A1 (ja) * | 2021-03-31 | 2022-10-06 | 住友電気工業株式会社 | ダイヤモンド光磁気センサ |
WO2022244399A1 (ja) * | 2021-05-18 | 2022-11-24 | スミダコーポレーション株式会社 | 磁場測定装置および磁場測定方法 |
WO2024080386A1 (ja) * | 2022-10-13 | 2024-04-18 | スミダコーポレーション株式会社 | 磁場測定装置 |
Also Published As
Publication number | Publication date |
---|---|
EP3699621A1 (en) | 2020-08-26 |
CN111610475A (zh) | 2020-09-01 |
US11747414B2 (en) | 2023-09-05 |
EP3699621B1 (en) | 2023-05-03 |
JP7265699B2 (ja) | 2023-04-27 |
US20220091201A1 (en) | 2022-03-24 |
US20200271735A1 (en) | 2020-08-27 |
US11221381B2 (en) | 2022-01-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP7265699B2 (ja) | 測定装置 | |
Hornstein et al. | Continuous-wave operation of a 460-GHz second harmonic gyrotron oscillator | |
NL2018899A (en) | Magnetometer sensor with negatively charged nitrogen-vacancy centers in diamond | |
JP6283696B2 (ja) | オプトエレクトロニクス部品を測定および最適化する方法および装置 | |
WO2021132009A1 (ja) | 測定装置および測定方法 | |
JP2020176994A (ja) | 励起光照射装置および励起光照射方法 | |
JP7112652B2 (ja) | 高周波磁場発生装置 | |
CN109490804B (zh) | 高频磁场产生装置 | |
US10338164B2 (en) | Vacancy center material with highly efficient RF excitation | |
JP7369344B2 (ja) | 磁場測定装置および磁場測定方法 | |
WO2022244399A1 (ja) | 磁場測定装置および磁場測定方法 | |
WO2022210696A1 (ja) | ダイヤモンド光磁気センサ | |
US20230184853A1 (en) | Magnetic field measurement apparatus and magnetic field measurement method | |
Feng et al. | Electron bunch shape measurement using coherent diffraction radiation | |
JP7428322B2 (ja) | 励起光照射装置および励起光照射方法 | |
JP7396787B2 (ja) | 微小電流検出装置および微小電流検出方法 | |
Liu et al. | Millimeter‐Scale Temperature Self‐Calibrated Diamond‐Based Quantum Sensor for High‐Precision Current Sensing | |
WO2022163678A1 (ja) | ダイヤモンドセンサユニット及びダイヤモンドセンサシステム | |
EP4382943A1 (en) | Magnetic field measurement device and magnetic field measurement method | |
JP2022098572A (ja) | センサ | |
CN117097418A (zh) | 金刚石nv色心微波探测器 | |
Xiang et al. | Demonstration of harmonic interaction in an undulator up to the 15th order | |
Prokopenko et al. | MICROWAVE ENERGY HARVESTING USING UNCOUPLED THRESHOLD SPIN-TORQUE MICROWAVE DETECTORS | |
Pandey et al. | High power CW RF performance test of 3.4 m RFQ of VEC-RIB |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20220202 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20221208 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20221222 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20230131 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20230316 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20230329 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 7265699 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |