JP2020077700A - ウェーハの加工方法 - Google Patents
ウェーハの加工方法 Download PDFInfo
- Publication number
- JP2020077700A JP2020077700A JP2018208994A JP2018208994A JP2020077700A JP 2020077700 A JP2020077700 A JP 2020077700A JP 2018208994 A JP2018208994 A JP 2018208994A JP 2018208994 A JP2018208994 A JP 2018208994A JP 2020077700 A JP2020077700 A JP 2020077700A
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- JP
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- Prior art keywords
- wafer
- polyester sheet
- frame
- polyester
- sheet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 229920000728 polyester Polymers 0.000 claims abstract description 132
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- 238000000034 method Methods 0.000 claims description 30
- 230000010354 integration Effects 0.000 claims description 21
- -1 polyethylene terephthalate Polymers 0.000 claims description 18
- 238000010438 heat treatment Methods 0.000 claims description 16
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 claims description 7
- 239000011112 polyethylene naphthalate Substances 0.000 claims description 7
- 229920000139 polyethylene terephthalate Polymers 0.000 claims description 7
- 239000005020 polyethylene terephthalate Substances 0.000 claims description 7
- 239000011521 glass Substances 0.000 claims description 6
- 238000007664 blowing Methods 0.000 claims description 5
- 229910001218 Gallium arsenide Inorganic materials 0.000 claims description 4
- 230000006835 compression Effects 0.000 abstract 1
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- 229920005989 resin Polymers 0.000 description 5
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 3
- 229910002601 GaN Inorganic materials 0.000 description 3
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 3
- 239000003513 alkali Substances 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 1
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
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- 150000002009 diols Chemical class 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
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- 239000000178 monomer Substances 0.000 description 1
- 229920001707 polybutylene terephthalate Polymers 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920002215 polytrimethylene terephthalate Polymers 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Classifications
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- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
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- H01L21/02002—Preparing wafers
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- H01L21/02008—Multistep processes
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
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- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
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- H01L21/2003—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy characterised by the substrate
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- High Energy & Nuclear Physics (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Dicing (AREA)
- Laser Beam Processing (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
波長 :355nm
繰り返し周波数:50kHz
平均出力 :5W
送り速度 :200mm/秒
1a 表面
1b 裏面
3 分割予定ライン
3a 分割溝
5 デバイス
7 フレーム
7a 開口
9 ポリエステル系シート
9a 切断痕
11 フレームユニット
2 チャックテーブル
2a 保持面
2b,36a 吸引源
2c,36b 切り替え部
4 ヒートガン
4a 熱風
6 ヒートローラー
8 赤外線ランプ
8a 赤外線
10 カッター
12 レーザー加工装置
14 レーザー加工ユニット
14a 加工ヘッド
16 レーザービーム
18 ピックアップ装置
20 ドラム
22 フレーム保持ユニット
24 クランプ
26 フレーム支持台
28 ロッド
30 エアシリンダ
32 ベース
34 突き上げ機構
34a エアー
36 コレット
Claims (7)
- 複数のデバイスが、分割予定ラインによって区画された表面の各領域に形成されたウェーハを個々のデバイスチップに分割するウェーハの加工方法であって、
ウェーハを収容する開口を有するフレームの該開口内にウェーハを位置付け、該ウェーハの裏面と該フレームの外周とにポリエステル系シートを配設するポリエステル系シート配設工程と、
該ポリエステル系シートを加熱し熱圧着により該ウェーハと該フレームとを該ポリエステル系シートを介して一体化する一体化工程と、
該ウェーハに対して吸収性を有する波長のレーザービームを該分割予定ラインに沿って該ウェーハに照射し、分割溝を形成して該ウェーハを個々のデバイスチップに分割する分割工程と、
該ポリエステル系シート側からエアーを吹き付けることにより個々にデバイスチップを突き上げ、該ポリエステル系シートから該デバイスチップをピックアップするピックアップ工程と、
を備えることを特徴とするウェーハの加工方法。 - 該一体化工程において、赤外線の照射によって該熱圧着を実施することを特徴とする請求項1記載のウェーハの加工方法。
- 該一体化工程において、一体化を実施した後、該フレームの外周からはみ出したポリエステル系シートを除去することを特徴とする請求項1記載のウェーハの加工方法。
- 該ピックアップ工程では、該ポリエステル系シートを拡張して各デバイスチップ間の間隔を広げることを特徴とする請求項1記載のウェーハの加工方法。
- 該ポリエステル系シートは、ポリエチレンテレフタレートシート、ポリエチレンナフタレートシートのいずれかであることを特徴とする請求項1記載のウェーハの加工方法。
- 該一体化工程において、該ポリエステル系シートが該ポリエチレンテレフタレートシートである場合に加熱温度は250℃〜270℃であり、該ポリエステル系シートが該ポリエチレンナフタレートシートである場合に加熱温度は160℃〜180℃であることを特徴とする請求項5記載のウェーハの加工方法。
- 該ウェーハは、Si、GaN、GaAs、ガラスのいずれかで構成されることを特徴とする請求項1記載のウェーハの加工方法。
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JP2018208994A JP7199786B2 (ja) | 2018-11-06 | 2018-11-06 | ウェーハの加工方法 |
MYPI2019006205A MY192239A (en) | 2018-11-06 | 2019-10-22 | Wafer processing method |
KR1020190134593A KR20200052832A (ko) | 2018-11-06 | 2019-10-28 | 웨이퍼의 가공 방법 |
SG10201910165QA SG10201910165QA (en) | 2018-11-06 | 2019-10-31 | Wafer processing method |
TW108139809A TWI822896B (zh) | 2018-11-06 | 2019-11-01 | 晶圓的加工方法 |
CN201911063925.XA CN111146135B (zh) | 2018-11-06 | 2019-11-04 | 晶片的加工方法 |
US16/674,203 US11056334B2 (en) | 2018-11-06 | 2019-11-05 | Wafer processing method using a ring frame and a polyester sheet |
DE102019217091.9A DE102019217091A1 (de) | 2018-11-06 | 2019-11-06 | Waferbearbeitungsverfahren |
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