JP2019536018A5 - - Google Patents

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Publication number
JP2019536018A5
JP2019536018A5 JP2019523730A JP2019523730A JP2019536018A5 JP 2019536018 A5 JP2019536018 A5 JP 2019536018A5 JP 2019523730 A JP2019523730 A JP 2019523730A JP 2019523730 A JP2019523730 A JP 2019523730A JP 2019536018 A5 JP2019536018 A5 JP 2019536018A5
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Japan
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baseline
frequency response
frequency
transducer
lens assembly
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JP2019523730A
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Japanese (ja)
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JP7265106B2 (ja
JP2019536018A (ja
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Priority claimed from US15/497,624 external-priority patent/US10682675B2/en
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Priority to JP2023003541A priority Critical patent/JP7509344B2/ja
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JP2019523730A 2016-11-01 2017-11-01 欠陥又は劣化を検出するためのインピーダンス監視を備える超音波レンズクリーニングシステム Active JP7265106B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2023003541A JP7509344B2 (ja) 2016-11-01 2023-01-13 欠陥又は劣化を検出するためのインピーダンス監視を備える超音波レンズクリーニングシステム

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201662415554P 2016-11-01 2016-11-01
US62/415,554 2016-11-01
US15/497,624 US10682675B2 (en) 2016-11-01 2017-04-26 Ultrasonic lens cleaning system with impedance monitoring to detect faults or degradation
US15/497,624 2017-04-26
PCT/US2017/059536 WO2018085403A1 (en) 2016-11-01 2017-11-01 Ultrasonic lens cleaning system with impedance monitoring to detect faults or degradation

Related Child Applications (1)

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JP2023003541A Division JP7509344B2 (ja) 2016-11-01 2023-01-13 欠陥又は劣化を検出するためのインピーダンス監視を備える超音波レンズクリーニングシステム

Publications (3)

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JP2019536018A JP2019536018A (ja) 2019-12-12
JP2019536018A5 true JP2019536018A5 (enExample) 2020-12-17
JP7265106B2 JP7265106B2 (ja) 2023-04-26

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JP2019523730A Active JP7265106B2 (ja) 2016-11-01 2017-11-01 欠陥又は劣化を検出するためのインピーダンス監視を備える超音波レンズクリーニングシステム
JP2023003541A Active JP7509344B2 (ja) 2016-11-01 2023-01-13 欠陥又は劣化を検出するためのインピーダンス監視を備える超音波レンズクリーニングシステム

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Country Status (5)

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US (1) US10682675B2 (enExample)
EP (1) EP3535067A4 (enExample)
JP (2) JP7265106B2 (enExample)
CN (1) CN109922897A (enExample)
WO (1) WO2018085403A1 (enExample)

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