JP2019531120A5 - - Google Patents
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- JP2019531120A5 JP2019531120A5 JP2019512893A JP2019512893A JP2019531120A5 JP 2019531120 A5 JP2019531120 A5 JP 2019531120A5 JP 2019512893 A JP2019512893 A JP 2019512893A JP 2019512893 A JP2019512893 A JP 2019512893A JP 2019531120 A5 JP2019531120 A5 JP 2019531120A5
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- Japan
- Prior art keywords
- lattice structure
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- ray
- edge
- imaging system
- Prior art date
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP16187753 | 2016-09-08 | ||
| EP16187753.5 | 2016-09-08 | ||
| PCT/EP2017/071806 WO2018046377A1 (en) | 2016-09-08 | 2017-08-30 | Source grating for x-ray imaging |
Publications (4)
| Publication Number | Publication Date |
|---|---|
| JP2019531120A JP2019531120A (ja) | 2019-10-31 |
| JP2019531120A5 true JP2019531120A5 (https=) | 2020-10-08 |
| JP7044764B2 JP7044764B2 (ja) | 2022-03-30 |
| JP7044764B6 JP7044764B6 (ja) | 2022-05-31 |
Family
ID=56888983
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019512893A Expired - Fee Related JP7044764B6 (ja) | 2016-09-08 | 2017-08-30 | Ｘ線撮像のための線源格子 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10835193B2 (https=) |
| EP (1) | EP3509492B1 (https=) |
| JP (1) | JP7044764B6 (https=) |
| CN (1) | CN109688930A (https=) |
| WO (1) | WO2018046377A1 (https=) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| US10845491B2 (en) | 2018-06-04 | 2020-11-24 | Sigray, Inc. | Energy-resolving x-ray detection system |
| GB2591630B (en) | 2018-07-26 | 2023-05-24 | Sigray Inc | High brightness x-ray reflection source |
| EP3603515A1 (en) * | 2018-08-01 | 2020-02-05 | Koninklijke Philips N.V. | Apparatus for generating x-ray imaging data |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| WO2020051061A1 (en) | 2018-09-04 | 2020-03-12 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
| WO2020051221A2 (en) | 2018-09-07 | 2020-03-12 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| DE112020004169T5 (de) | 2019-09-03 | 2022-05-25 | Sigray, Inc. | System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| US11217357B2 (en) | 2020-02-10 | 2022-01-04 | Sigray, Inc. | X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles |
| JP7395775B2 (ja) | 2020-05-18 | 2023-12-11 | シグレイ、インコーポレイテッド | 結晶解析装置及び複数の検出器素子を使用するｘ線吸収分光法のためのシステム及び方法 |
| CN111839579B (zh) * | 2020-09-02 | 2025-06-27 | 上海联影医疗科技股份有限公司 | 一种x射线成像设备的限束器及x射线成像设备 |
| WO2022061347A1 (en) | 2020-09-17 | 2022-03-24 | Sigray, Inc. | System and method using x-rays for depth-resolving metrology and analysis |
| KR20260030946A (ko) | 2020-12-07 | 2026-03-06 | 시그레이, 아이엔씨. | 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템 |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| WO2023168204A1 (en) | 2022-03-02 | 2023-09-07 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| WO2023177981A1 (en) | 2022-03-15 | 2023-09-21 | Sigray, Inc. | System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector |
| CN119173759A (zh) | 2022-05-02 | 2024-12-20 | 斯格瑞公司 | X射线顺序阵列波长色散光谱仪 |
| CN121013975A (zh) | 2023-02-16 | 2025-11-25 | 斯格瑞公司 | 具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统 |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| US12429437B2 (en) | 2023-11-07 | 2025-09-30 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| US12429436B2 (en) | 2024-01-08 | 2025-09-30 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
| WO2025155719A1 (en) | 2024-01-18 | 2025-07-24 | Sigray, Inc. | Sequential array of x-ray imaging detectors |
| WO2025174966A1 (en) | 2024-02-15 | 2025-08-21 | Sigray, Inc. | System and method for generating a focused x‑ray beam |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE347859B (https=) * | 1970-11-30 | 1972-08-14 | Medinova Ab | |
| US4672648A (en) * | 1985-10-25 | 1987-06-09 | Picker International, Inc. | Apparatus and method for radiation attenuation |
| US5812629A (en) * | 1997-04-30 | 1998-09-22 | Clauser; John F. | Ultrahigh resolution interferometric x-ray imaging |
| US7965444B2 (en) | 2006-08-31 | 2011-06-21 | Micron Technology, Inc. | Method and apparatus to improve filter characteristics of optical filters |
| JP5355413B2 (ja) * | 2006-12-04 | 2013-11-27 | コーニンクレッカ フィリップス エヌ ヴェ | Ｘ線用のビームフィルタ及びビームフィルタを有するｘ線装置 |
| JP4911373B2 (ja) * | 2009-11-26 | 2012-04-04 | 横河電機株式会社 | Ｘ線測定装置 |
| JP5536426B2 (ja) | 2009-11-27 | 2014-07-02 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | ビーム形成ｘ線フィルタおよびこれを使ったｘ線ｃｔ装置 |
| WO2011136759A1 (en) | 2010-04-26 | 2011-11-03 | Hewlett-Packard Development Company, L.P. | Non-uniform grating |
| JP2012024339A (ja) * | 2010-07-23 | 2012-02-09 | Fujifilm Corp | 放射線画像撮影システム及びコリメータユニット |
| EP2671230B1 (en) * | 2011-02-01 | 2018-05-16 | Koninklijke Philips N.V. | Differential phase-contrast imaging with focussing deflection structure plates |
| JP5944413B2 (ja) | 2011-02-07 | 2016-07-05 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | ダイナミックレンジを増大する微分位相コントラスト撮像装置及び方法 |
| US9066704B2 (en) | 2011-03-14 | 2015-06-30 | Canon Kabushiki Kaisha | X-ray imaging apparatus |
| WO2013001386A1 (en) * | 2011-06-30 | 2013-01-03 | Koninklijke Philips Electronics N.V. | X-ray beam transmission profile shaper |
| CN103890624A (zh) * | 2011-10-21 | 2014-06-25 | 惠普发展公司，有限责任合伙企业 | 具有深槽非均匀光栅的光栅耦合器 |
| US20130164457A1 (en) * | 2011-12-27 | 2013-06-27 | Rigaku Innovative Technologies, Inc. | Method of manufacturing patterned x-ray optical elements |
| CN104321805B (zh) | 2012-05-14 | 2017-12-15 | 皇家飞利浦有限公司 | 暗场计算机断层摄影成像 |
| RU2014154006A (ru) | 2012-06-05 | 2016-08-10 | Конинклейке Филипс Н.В. | Калибровка с декомпозицией на слои движения рентгеновских ст-томографов |
| RU2015126546A (ru) * | 2012-12-03 | 2017-01-13 | Конинклейке Филипс Н.В. | Перемещение формирователя профиля пропускания рентгеновского пучка |
| US9412554B2 (en) * | 2013-07-23 | 2016-08-09 | Koninklijke Philips N.V. | Anode for an X-ray tube of a differential phase contrast imaging apparatus |
| JP2015078976A (ja) | 2013-09-11 | 2015-04-23 | キヤノン株式会社 | Ｘ線撮像システム |
| CN105916443B (zh) * | 2014-01-14 | 2022-03-22 | 皇家飞利浦有限公司 | 用于x射线成像装置的具有衰减元件的x射线发射设备 |
| US9726794B2 (en) | 2014-06-13 | 2017-08-08 | The Regents Of The University Of California | High index contrast grating structure for light manipulation and related method |
| JP7171190B2 (ja) | 2014-11-11 | 2022-11-15 | コーニンクレッカ フィリップス エヌ ヴェ | 線源－検出器装置 |
| KR20160089647A (ko) | 2015-01-20 | 2016-07-28 | 삼성전자주식회사 | 엑스선 영상장치 및 그 제어방법 |
| US11051772B2 (en) * | 2016-04-08 | 2021-07-06 | Rensselaer Polytechnic Institute | Filtration methods for dual-energy X-ray CT |
-
2017
- 2017-08-30 US US16/329,807 patent/US10835193B2/en not_active Expired - Fee Related
- 2017-08-30 WO PCT/EP2017/071806 patent/WO2018046377A1/en not_active Ceased
- 2017-08-30 JP JP2019512893A patent/JP7044764B6/ja not_active Expired - Fee Related
- 2017-08-30 CN CN201780055442.8A patent/CN109688930A/zh active Pending
- 2017-08-30 EP EP17758190.7A patent/EP3509492B1/en not_active Not-in-force
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