CN109688930A - 用于x射线成像的源光栅 - Google Patents

用于x射线成像的源光栅 Download PDF

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Publication number
CN109688930A
CN109688930A CN201780055442.8A CN201780055442A CN109688930A CN 109688930 A CN109688930 A CN 109688930A CN 201780055442 A CN201780055442 A CN 201780055442A CN 109688930 A CN109688930 A CN 109688930A
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CN
China
Prior art keywords
grating
ray
grating structure
source
imaging system
Prior art date
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Pending
Application number
CN201780055442.8A
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English (en)
Chinese (zh)
Inventor
T·扬森
R·普罗克绍
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Koninklijke Philips NV
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Koninklijke Philips Electronics NV
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Publication of CN109688930A publication Critical patent/CN109688930A/zh
Pending legal-status Critical Current

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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4291—Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1838—Diffraction gratings for use with ultraviolet radiation or X-rays
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1866—Transmission gratings characterised by their structure, e.g. step profile, contours of substrate or grooves, pitch variations, materials
    • G02B5/1871—Transmissive phase gratings
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
    • A61B6/4064—Arrangements for generating radiation specially adapted for radiation diagnosis specially adapted for producing a particular type of beam
    • A61B6/4092—Arrangements for generating radiation specially adapted for radiation diagnosis specially adapted for producing a particular type of beam for producing synchrotron radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Medical Informatics (AREA)
  • Optics & Photonics (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Surgery (AREA)
  • Pathology (AREA)
  • Biophysics (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • General Physics & Mathematics (AREA)
  • Toxicology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201780055442.8A 2016-09-08 2017-08-30 用于x射线成像的源光栅 Pending CN109688930A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP16187753 2016-09-08
EP16187753.5 2016-09-08
PCT/EP2017/071806 WO2018046377A1 (en) 2016-09-08 2017-08-30 Source grating for x-ray imaging

Publications (1)

Publication Number Publication Date
CN109688930A true CN109688930A (zh) 2019-04-26

Family

ID=56888983

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201780055442.8A Pending CN109688930A (zh) 2016-09-08 2017-08-30 用于x射线成像的源光栅

Country Status (5)

Country Link
US (1) US10835193B2 (https=)
EP (1) EP3509492B1 (https=)
JP (1) JP7044764B6 (https=)
CN (1) CN109688930A (https=)
WO (1) WO2018046377A1 (https=)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10845491B2 (en) 2018-06-04 2020-11-24 Sigray, Inc. Energy-resolving x-ray detection system
GB2591630B (en) 2018-07-26 2023-05-24 Sigray Inc High brightness x-ray reflection source
EP3603515A1 (en) * 2018-08-01 2020-02-05 Koninklijke Philips N.V. Apparatus for generating x-ray imaging data
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
WO2020051061A1 (en) 2018-09-04 2020-03-12 Sigray, Inc. System and method for x-ray fluorescence with filtering
WO2020051221A2 (en) 2018-09-07 2020-03-12 Sigray, Inc. System and method for depth-selectable x-ray analysis
DE112020004169T5 (de) 2019-09-03 2022-05-25 Sigray, Inc. System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
US11217357B2 (en) 2020-02-10 2022-01-04 Sigray, Inc. X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles
JP7395775B2 (ja) 2020-05-18 2023-12-11 シグレイ、インコーポレイテッド 結晶解析装置及び複数の検出器素子を使用するｘ線吸収分光法のためのシステム及び方法
CN111839579B (zh) * 2020-09-02 2025-06-27 上海联影医疗科技股份有限公司 一种x射线成像设备的限束器及x射线成像设备
WO2022061347A1 (en) 2020-09-17 2022-03-24 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
KR20260030946A (ko) 2020-12-07 2026-03-06 시그레이, 아이엔씨. 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
WO2023168204A1 (en) 2022-03-02 2023-09-07 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
WO2023177981A1 (en) 2022-03-15 2023-09-21 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
CN119173759A (zh) 2022-05-02 2024-12-20 斯格瑞公司 X射线顺序阵列波长色散光谱仪
CN121013975A (zh) 2023-02-16 2025-11-25 斯格瑞公司 具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
US12429437B2 (en) 2023-11-07 2025-09-30 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
US12429436B2 (en) 2024-01-08 2025-09-30 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
WO2025155719A1 (en) 2024-01-18 2025-07-24 Sigray, Inc. Sequential array of x-ray imaging detectors
WO2025174966A1 (en) 2024-02-15 2025-08-21 Sigray, Inc. System and method for generating a focused x‑ray beam

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3755672A (en) * 1970-11-30 1973-08-28 Medinova Ab So Exposure compensating device for radiographic apparatus
US4672648A (en) * 1985-10-25 1987-06-09 Picker International, Inc. Apparatus and method for radiation attenuation
CN101548339A (zh) * 2006-12-04 2009-09-30 皇家飞利浦电子股份有限公司 尤其适用于x射线的射束过滤器，其并不改变射束的能谱构成
CN102081164A (zh) * 2009-11-26 2011-06-01 横河电机株式会社 X射线测量设备
JP2012024339A (ja) * 2010-07-23 2012-02-09 Fujifilm Corp 放射線画像撮影システム及びコリメータユニット
CN103620694A (zh) * 2011-06-30 2014-03-05 皇家飞利浦有限公司 X射线束传输分布整形器
US20150302946A1 (en) * 2012-12-03 2015-10-22 Koninklijke Philips N.V. Translating x-ray beam transmission profile shaper
CN105393331A (zh) * 2013-07-23 2016-03-09 皇家飞利浦有限公司 用于差分相衬成像装置的x射线管的阳极
CN105916443A (zh) * 2014-01-14 2016-08-31 皇家飞利浦有限公司 用于x射线成像装置的具有衰减元件的x射线发射设备
US20190269375A1 (en) * 2016-04-08 2019-09-05 Rensselaer Polytechnic Institute Filtration methods for dual-energy x-ray ct

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5812629A (en) * 1997-04-30 1998-09-22 Clauser; John F. Ultrahigh resolution interferometric x-ray imaging
US7965444B2 (en) 2006-08-31 2011-06-21 Micron Technology, Inc. Method and apparatus to improve filter characteristics of optical filters
JP5536426B2 (ja) 2009-11-27 2014-07-02 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー ビーム形成ｘ線フィルタおよびこれを使ったｘ線ｃｔ装置
WO2011136759A1 (en) 2010-04-26 2011-11-03 Hewlett-Packard Development Company, L.P. Non-uniform grating
EP2671230B1 (en) * 2011-02-01 2018-05-16 Koninklijke Philips N.V. Differential phase-contrast imaging with focussing deflection structure plates
JP5944413B2 (ja) 2011-02-07 2016-07-05 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． ダイナミックレンジを増大する微分位相コントラスト撮像装置及び方法
US9066704B2 (en) 2011-03-14 2015-06-30 Canon Kabushiki Kaisha X-ray imaging apparatus
CN103890624A (zh) * 2011-10-21 2014-06-25 惠普发展公司，有限责任合伙企业 具有深槽非均匀光栅的光栅耦合器
US20130164457A1 (en) * 2011-12-27 2013-06-27 Rigaku Innovative Technologies, Inc. Method of manufacturing patterned x-ray optical elements
CN104321805B (zh) 2012-05-14 2017-12-15 皇家飞利浦有限公司 暗场计算机断层摄影成像
RU2014154006A (ru) 2012-06-05 2016-08-10 Конинклейке Филипс Н.В. Калибровка с декомпозицией на слои движения рентгеновских ст-томографов
JP2015078976A (ja) 2013-09-11 2015-04-23 キヤノン株式会社 Ｘ線撮像システム
US9726794B2 (en) 2014-06-13 2017-08-08 The Regents Of The University Of California High index contrast grating structure for light manipulation and related method
JP7171190B2 (ja) 2014-11-11 2022-11-15 コーニンクレッカ フィリップス エヌ ヴェ 線源－検出器装置
KR20160089647A (ko) 2015-01-20 2016-07-28 삼성전자주식회사 엑스선 영상장치 및 그 제어방법

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3755672A (en) * 1970-11-30 1973-08-28 Medinova Ab So Exposure compensating device for radiographic apparatus
US4672648A (en) * 1985-10-25 1987-06-09 Picker International, Inc. Apparatus and method for radiation attenuation
CN101548339A (zh) * 2006-12-04 2009-09-30 皇家飞利浦电子股份有限公司 尤其适用于x射线的射束过滤器，其并不改变射束的能谱构成
CN102081164A (zh) * 2009-11-26 2011-06-01 横河电机株式会社 X射线测量设备
JP2012024339A (ja) * 2010-07-23 2012-02-09 Fujifilm Corp 放射線画像撮影システム及びコリメータユニット
CN103620694A (zh) * 2011-06-30 2014-03-05 皇家飞利浦有限公司 X射线束传输分布整形器
US20150302946A1 (en) * 2012-12-03 2015-10-22 Koninklijke Philips N.V. Translating x-ray beam transmission profile shaper
CN105393331A (zh) * 2013-07-23 2016-03-09 皇家飞利浦有限公司 用于差分相衬成像装置的x射线管的阳极
CN105916443A (zh) * 2014-01-14 2016-08-31 皇家飞利浦有限公司 用于x射线成像装置的具有衰减元件的x射线发射设备
US20190269375A1 (en) * 2016-04-08 2019-09-05 Rensselaer Polytechnic Institute Filtration methods for dual-energy x-ray ct

Also Published As

Publication number Publication date
US20190216416A1 (en) 2019-07-18
JP7044764B6 (ja) 2022-05-31
US10835193B2 (en) 2020-11-17
JP7044764B2 (ja) 2022-03-30
WO2018046377A1 (en) 2018-03-15
EP3509492A1 (en) 2019-07-17
JP2019531120A (ja) 2019-10-31
EP3509492B1 (en) 2021-12-15

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Application publication date: 20190426