CN109688930A - 用于x射线成像的源光栅 - Google Patents

用于x射线成像的源光栅 Download PDF

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Publication number
CN109688930A
CN109688930A CN201780055442.8A CN201780055442A CN109688930A CN 109688930 A CN109688930 A CN 109688930A CN 201780055442 A CN201780055442 A CN 201780055442A CN 109688930 A CN109688930 A CN 109688930A
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CN
China
Prior art keywords
grating
ray
grating structure
source
imaging system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201780055442.8A
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English (en)
Chinese (zh)
Inventor
T·扬森
R·普罗克绍
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
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Koninklijke Philips Electronics NV
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Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of CN109688930A publication Critical patent/CN109688930A/zh
Pending legal-status Critical Current

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Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4291—Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1838—Diffraction gratings for use with ultraviolet radiation or X-rays
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1866—Transmission gratings characterised by their structure, e.g. step profile, contours of substrate or grooves, pitch variations, materials
    • G02B5/1871—Transmissive phase gratings
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
    • A61B6/4064—Arrangements for generating radiation specially adapted for radiation diagnosis specially adapted for producing a particular type of beam
    • A61B6/4092—Arrangements for generating radiation specially adapted for radiation diagnosis specially adapted for producing a particular type of beam for producing synchrotron radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Medical Informatics (AREA)
  • Optics & Photonics (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Surgery (AREA)
  • Pathology (AREA)
  • Biophysics (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Molecular Biology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • General Physics & Mathematics (AREA)
  • Toxicology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201780055442.8A 2016-09-08 2017-08-30 用于x射线成像的源光栅 Pending CN109688930A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP16187753 2016-09-08
EP16187753.5 2016-09-08
PCT/EP2017/071806 WO2018046377A1 (en) 2016-09-08 2017-08-30 Source grating for x-ray imaging

Publications (1)

Publication Number Publication Date
CN109688930A true CN109688930A (zh) 2019-04-26

Family

ID=56888983

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201780055442.8A Pending CN109688930A (zh) 2016-09-08 2017-08-30 用于x射线成像的源光栅

Country Status (5)

Country Link
US (1) US10835193B2 (https=)
EP (1) EP3509492B1 (https=)
JP (1) JP7044764B6 (https=)
CN (1) CN109688930A (https=)
WO (1) WO2018046377A1 (https=)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10845491B2 (en) 2018-06-04 2020-11-24 Sigray, Inc. Energy-resolving x-ray detection system
GB2591630B (en) 2018-07-26 2023-05-24 Sigray Inc High brightness x-ray reflection source
EP3603515A1 (en) * 2018-08-01 2020-02-05 Koninklijke Philips N.V. Apparatus for generating x-ray imaging data
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
US10962491B2 (en) 2018-09-04 2021-03-30 Sigray, Inc. System and method for x-ray fluorescence with filtering
DE112019004478T5 (de) 2018-09-07 2021-07-08 Sigray, Inc. System und verfahren zur röntgenanalyse mit wählbarer tiefe
US11143605B2 (en) 2019-09-03 2021-10-12 Sigray, Inc. System and method for computed laminography x-ray fluorescence imaging
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
US11217357B2 (en) 2020-02-10 2022-01-04 Sigray, Inc. X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles
CN115667896B (zh) 2020-05-18 2024-06-21 斯格瑞公司 使用晶体分析器和多个检测元件的x射线吸收光谱的系统和方法
CN111839579B (zh) * 2020-09-02 2025-06-27 上海联影医疗科技股份有限公司 一种x射线成像设备的限束器及x射线成像设备
JP7640682B2 (ja) 2020-09-17 2025-03-05 シグレイ、インコーポレイテッド Ｘ線を用いた深さ分解計測および分析のためのシステムおよび方法
KR102927910B1 (ko) 2020-12-07 2026-02-19 시그레이, 아이엔씨. 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
DE112023002079T5 (de) 2022-05-02 2025-02-27 Sigray, Inc. Sequenzielles wellenlängendispersives röntgenspektrometer
WO2024173256A1 (en) 2023-02-16 2024-08-22 Sigray, Inc. X-ray detector system with at least two stacked flat bragg diffractors
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
WO2025101530A1 (en) 2023-11-07 2025-05-15 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
WO2025151383A1 (en) 2024-01-08 2025-07-17 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
WO2025155719A1 (en) 2024-01-18 2025-07-24 Sigray, Inc. Sequential array of x-ray imaging detectors
WO2025174966A1 (en) 2024-02-15 2025-08-21 Sigray, Inc. System and method for generating a focused x‑ray beam

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3755672A (en) * 1970-11-30 1973-08-28 Medinova Ab So Exposure compensating device for radiographic apparatus
US4672648A (en) * 1985-10-25 1987-06-09 Picker International, Inc. Apparatus and method for radiation attenuation
CN101548339A (zh) * 2006-12-04 2009-09-30 皇家飞利浦电子股份有限公司 尤其适用于x射线的射束过滤器，其并不改变射束的能谱构成
CN102081164A (zh) * 2009-11-26 2011-06-01 横河电机株式会社 X射线测量设备
JP2012024339A (ja) * 2010-07-23 2012-02-09 Fujifilm Corp 放射線画像撮影システム及びコリメータユニット
CN103620694A (zh) * 2011-06-30 2014-03-05 皇家飞利浦有限公司 X射线束传输分布整形器
US20150302946A1 (en) * 2012-12-03 2015-10-22 Koninklijke Philips N.V. Translating x-ray beam transmission profile shaper
CN105393331A (zh) * 2013-07-23 2016-03-09 皇家飞利浦有限公司 用于差分相衬成像装置的x射线管的阳极
CN105916443A (zh) * 2014-01-14 2016-08-31 皇家飞利浦有限公司 用于x射线成像装置的具有衰减元件的x射线发射设备
US20190269375A1 (en) * 2016-04-08 2019-09-05 Rensselaer Polytechnic Institute Filtration methods for dual-energy x-ray ct

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5812629A (en) * 1997-04-30 1998-09-22 Clauser; John F. Ultrahigh resolution interferometric x-ray imaging
US7965444B2 (en) 2006-08-31 2011-06-21 Micron Technology, Inc. Method and apparatus to improve filter characteristics of optical filters
JP5536426B2 (ja) 2009-11-27 2014-07-02 ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー ビーム形成ｘ線フィルタおよびこれを使ったｘ線ｃｔ装置
WO2011136759A1 (en) * 2010-04-26 2011-11-03 Hewlett-Packard Development Company, L.P. Non-uniform grating
CN103460301B (zh) 2011-02-01 2017-08-11 皇家飞利浦电子股份有限公司 具有聚焦偏转结构板的微分相位对比成像
US9287017B2 (en) 2011-02-07 2016-03-15 Koninklijke Philips N.V. Differential phase-contrast imaging with increased dynamic range
US9066704B2 (en) 2011-03-14 2015-06-30 Canon Kabushiki Kaisha X-ray imaging apparatus
WO2013058769A1 (en) * 2011-10-21 2013-04-25 Hewlett-Packard Development Company, L.P. Grating couplers with deep-groove non-uniform gratings
US20130164457A1 (en) 2011-12-27 2013-06-27 Rigaku Innovative Technologies, Inc. Method of manufacturing patterned x-ray optical elements
WO2013171657A1 (en) 2012-05-14 2013-11-21 Koninklijke Philips N.V. Dark field computed tomography imaging
US9636079B2 (en) 2012-06-05 2017-05-02 Koninklijke Philips N.V. Motion layer decomposition calibration of x-ray CT imagers
JP2015078976A (ja) 2013-09-11 2015-04-23 キヤノン株式会社 Ｘ線撮像システム
US9726794B2 (en) 2014-06-13 2017-08-08 The Regents Of The University Of California High index contrast grating structure for light manipulation and related method
JP7171190B2 (ja) 2014-11-11 2022-11-15 コーニンクレッカ フィリップス エヌ ヴェ 線源－検出器装置
KR20160089647A (ko) 2015-01-20 2016-07-28 삼성전자주식회사 엑스선 영상장치 및 그 제어방법

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3755672A (en) * 1970-11-30 1973-08-28 Medinova Ab So Exposure compensating device for radiographic apparatus
US4672648A (en) * 1985-10-25 1987-06-09 Picker International, Inc. Apparatus and method for radiation attenuation
CN101548339A (zh) * 2006-12-04 2009-09-30 皇家飞利浦电子股份有限公司 尤其适用于x射线的射束过滤器，其并不改变射束的能谱构成
CN102081164A (zh) * 2009-11-26 2011-06-01 横河电机株式会社 X射线测量设备
JP2012024339A (ja) * 2010-07-23 2012-02-09 Fujifilm Corp 放射線画像撮影システム及びコリメータユニット
CN103620694A (zh) * 2011-06-30 2014-03-05 皇家飞利浦有限公司 X射线束传输分布整形器
US20150302946A1 (en) * 2012-12-03 2015-10-22 Koninklijke Philips N.V. Translating x-ray beam transmission profile shaper
CN105393331A (zh) * 2013-07-23 2016-03-09 皇家飞利浦有限公司 用于差分相衬成像装置的x射线管的阳极
CN105916443A (zh) * 2014-01-14 2016-08-31 皇家飞利浦有限公司 用于x射线成像装置的具有衰减元件的x射线发射设备
US20190269375A1 (en) * 2016-04-08 2019-09-05 Rensselaer Polytechnic Institute Filtration methods for dual-energy x-ray ct

Also Published As

Publication number Publication date
US20190216416A1 (en) 2019-07-18
JP7044764B6 (ja) 2022-05-31
JP2019531120A (ja) 2019-10-31
JP7044764B2 (ja) 2022-03-30
EP3509492A1 (en) 2019-07-17
US10835193B2 (en) 2020-11-17
WO2018046377A1 (en) 2018-03-15
EP3509492B1 (en) 2021-12-15

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Application publication date: 20190426