JP2019523393A5 - - Google Patents

Download PDF

Info

Publication number
JP2019523393A5
JP2019523393A5 JP2018560812A JP2018560812A JP2019523393A5 JP 2019523393 A5 JP2019523393 A5 JP 2019523393A5 JP 2018560812 A JP2018560812 A JP 2018560812A JP 2018560812 A JP2018560812 A JP 2018560812A JP 2019523393 A5 JP2019523393 A5 JP 2019523393A5
Authority
JP
Japan
Prior art keywords
sample
depth
unit
illumination
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2018560812A
Other languages
English (en)
Japanese (ja)
Other versions
JP2019523393A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/IL2017/050574 external-priority patent/WO2017203525A1/en
Publication of JP2019523393A publication Critical patent/JP2019523393A/ja
Publication of JP2019523393A5 publication Critical patent/JP2019523393A5/ja
Pending legal-status Critical Current

Links

JP2018560812A 2016-05-23 2017-05-23 物体の深さ特性評価に使用するシステム及び方法 Pending JP2019523393A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201662340264P 2016-05-23 2016-05-23
US62/340,264 2016-05-23
US201662349750P 2016-06-14 2016-06-14
US62/349,750 2016-06-14
PCT/IL2017/050574 WO2017203525A1 (en) 2016-05-23 2017-05-23 System and method for use in depth characterization of objects

Publications (2)

Publication Number Publication Date
JP2019523393A JP2019523393A (ja) 2019-08-22
JP2019523393A5 true JP2019523393A5 (enExample) 2020-07-02

Family

ID=60412202

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018560812A Pending JP2019523393A (ja) 2016-05-23 2017-05-23 物体の深さ特性評価に使用するシステム及び方法

Country Status (6)

Country Link
US (1) US10724846B2 (enExample)
EP (1) EP3463056A4 (enExample)
JP (1) JP2019523393A (enExample)
CN (1) CN109475293A (enExample)
IL (1) IL262792B (enExample)
WO (1) WO2017203525A1 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11598627B2 (en) * 2016-02-03 2023-03-07 Virginia Tech Intellectual Properties, Inc. Methods, systems and apparatus of interferometry for imaging and sensing
JP6580012B2 (ja) * 2016-09-28 2019-09-25 富士フイルム株式会社 撮影画像評価装置および方法並びにプログラム
IL253862B (en) * 2017-08-06 2021-04-29 Elbit Systems Land & C4I Ltd Photoacoustic excitation sensing enhanced by cross-correlated unfocused speckle images
EP3477278B1 (de) * 2017-10-27 2020-04-22 Humboldt-Universität zu Berlin Photoakustik-verfahren mit einem messlicht aufweisend einen vorbestimmten wellenlängenbereich zur bestimmung von eigenschaften einer inhomogenen probe
US11957441B2 (en) 2018-05-10 2024-04-16 ContinUse Biometrics Ltd. System and method for depth flow inspection
IL261039B (en) * 2018-08-07 2020-10-29 Elbit Systems Land & C4I Ltd A two-stage system and method for sensing photoacoustic excitation
US10931881B2 (en) * 2018-09-20 2021-02-23 ContinUse Biometrics Ltd. Sample inspection utilizing time modulated illumination
US11740128B2 (en) * 2019-07-24 2023-08-29 Sanguis Corporation System and method for non-invasive measurement of analytes in vivo
CN119355867A (zh) * 2019-10-02 2025-01-24 科格尼菲博有限公司 光学神经元单元及其网络
US12422251B2 (en) 2020-01-14 2025-09-23 Pxe Computational Imaging Ltd. System and method for optical imaging and measurement of objects
JPWO2021199744A1 (enExample) * 2020-04-03 2021-10-07
US11850026B2 (en) 2020-06-24 2023-12-26 The Governing Council Of The University Of Toronto Remote portable vital signs monitoring
KR20230056770A (ko) * 2020-08-27 2023-04-27 노바 엘티디. 높은 처리량 광학 계측
US11954172B2 (en) * 2021-08-05 2024-04-09 Photomics, Inc. One-to-many randomizing interference microscope
DE102021208775B8 (de) * 2021-08-11 2023-01-19 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein Verfahren zur Erkennung von Defekten an stoffschlüssigen Verbindungen
US20230296510A1 (en) * 2022-03-16 2023-09-21 Meta Platforms Technologies, Llc System and method for separating volumetric and surface scattering of optical component
CN115187644B (zh) * 2022-06-10 2025-07-29 奥比中光科技集团股份有限公司 应用于单目结构光的深度计算模型的训练方法和计算方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62275431A (ja) * 1986-02-25 1987-11-30 興和株式会社 眼科診断方法及び装置
US6006128A (en) * 1997-06-02 1999-12-21 Izatt; Joseph A. Doppler flow imaging using optical coherence tomography
WO2003087790A1 (en) * 2002-03-28 2003-10-23 Takai Tofu & Soymilk Equipment Company Limited Evaluation method and device for gel state or sol-gel state change of object
JP2006520900A (ja) * 2003-03-11 2006-09-14 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 励起システム及び焦点モニタリングシステムを備える分光分析装置及び方法
US7254429B2 (en) * 2004-08-11 2007-08-07 Glucolight Corporation Method and apparatus for monitoring glucose levels in a biological tissue
JP4804204B2 (ja) * 2006-04-13 2011-11-02 キヤノン株式会社 記録材量測定方法、画像形成方法、記録材量測定装置、及び画像形成装置
FR2915077B1 (fr) 2007-04-19 2010-09-10 Inst Radioprot Et De Surete Nu Dispositif d'aide au diagnostic et pronostic de modifications physiopathologiques des tissus.
US20090040527A1 (en) * 2007-07-20 2009-02-12 Paul Dan Popescu Method and apparatus for speckle noise reduction in electromagnetic interference detection
IL184868A0 (en) 2007-07-26 2008-03-20 Univ Bar Ilan Motion detection system and method
US8184298B2 (en) * 2008-05-21 2012-05-22 The Board Of Trustees Of The University Of Illinois Spatial light interference microscopy and fourier transform light scattering for cell and tissue characterization
WO2010013184A1 (en) 2008-07-31 2010-02-04 Koninklijke Philips Electronics N.V. Analysis by photo acoustic displacement and interferometryl
GB0907277D0 (en) * 2009-04-29 2009-06-10 Univ Kent Kanterbury Method for depth resolved wavefront sensing, depth resolved wavefront sensors and method and apparatus for optical imaging
US10124410B2 (en) * 2010-09-25 2018-11-13 Ipg Photonics Corporation Methods and systems for coherent imaging and feedback control for modification of materials
US9636041B2 (en) * 2011-01-28 2017-05-02 Bar Ilan University Method and system for non-invasively monitoring biological or biochemical parameters of individual
WO2012101644A2 (en) 2011-01-28 2012-08-02 Bar Ilan University Method and system for non-invasively monitoring biological or biochemical parameters of individual
US9618319B2 (en) * 2011-02-18 2017-04-11 The General Hospital Corporation Laser speckle microrheometer for measuring mechanical properties of biological tissue
US10359361B2 (en) * 2011-02-18 2019-07-23 The General Hospital Corporation Laser speckle micro-rheology in characterization of biomechanical properties of tissues
JP6143422B2 (ja) * 2012-03-30 2017-06-07 キヤノン株式会社 画像処理装置及びその方法
CN104736042B (zh) * 2012-08-01 2017-09-12 巴伊兰大学 用于非侵入地监测个体的生物参数或生化参数的方法和系统
WO2014186674A2 (en) * 2013-05-17 2014-11-20 Ninepoint Medical, Inc. Angular image manipulation
US9733460B2 (en) * 2014-01-08 2017-08-15 The General Hospital Corporation Method and apparatus for microscopic imaging

Similar Documents

Publication Publication Date Title
JP2019523393A5 (enExample)
US10724846B2 (en) System and method for use in depth characterization of objects
ATE487111T1 (de) Vorrichtung zur tomografischen erfassung von objekten
JP2008298767A5 (enExample)
WO2017168984A1 (ja) 撮像装置、撮像方法
JP6230957B2 (ja) 検査装置及び検査方法
US20180172431A1 (en) Optical characteristic measuring apparatus and optical characteristic measuring method
US10989517B2 (en) Vibration sensing system with wavelength encoding
EP3662280B1 (en) Photoacoustic excitation sensing enhanced by cross-correlated unfocused speckle images
JP2010133934A (ja) 2つの測定ユニットを有する表面測定装置
KR20150146415A (ko) 동적 광산란 측정 장치 및 동적 광산란 측정 방법
ATE464004T1 (de) Optischer blutflussmesser unter verwendung von selbstmisch-dopplereffekt
RU2018116893A (ru) Устройство, система и способ получения информации о показателе жизненно важной функции живого существа
US20190385281A1 (en) System and method for monitoring a sample with at least two wavelengths
JP2018054448A (ja) スペクトルの測定方法
JP4580720B2 (ja) リモートセンシング装置
US20210172883A1 (en) System and method for passively monitoring a sample
WO2016080442A1 (ja) 品質評価方法及び品質評価装置
US11187648B2 (en) Two-stage photo-acoustic excitation sensing systems and methods
CN104111243B (zh) 一种荧光比率测量系统及方法
KR101539945B1 (ko) 간섭계를 이용한 진동측정방법
JPWO2016174963A1 (ja) 顕微鏡装置
JP2005241348A (ja) 音場可視化計測装置
CN106290226B (zh) 一种太赫兹透射成像装置及方法
JP6130805B2 (ja) 距離測定装置および方法