JPWO2021199744A1 - - Google Patents
Info
- Publication number
- JPWO2021199744A1 JPWO2021199744A1 JP2022511640A JP2022511640A JPWO2021199744A1 JP WO2021199744 A1 JPWO2021199744 A1 JP WO2021199744A1 JP 2022511640 A JP2022511640 A JP 2022511640A JP 2022511640 A JP2022511640 A JP 2022511640A JP WO2021199744 A1 JPWO2021199744 A1 JP WO2021199744A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020067655 | 2020-04-03 | ||
| PCT/JP2021/005742 WO2021199744A1 (ja) | 2020-04-03 | 2021-02-16 | 計測装置、計測方法及びプログラム |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPWO2021199744A1 true JPWO2021199744A1 (enExample) | 2021-10-07 |
Family
ID=77930258
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022511640A Pending JPWO2021199744A1 (enExample) | 2020-04-03 | 2021-02-16 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20230107896A1 (enExample) |
| EP (1) | EP4130652A4 (enExample) |
| JP (1) | JPWO2021199744A1 (enExample) |
| CN (1) | CN115335657A (enExample) |
| WO (1) | WO2021199744A1 (enExample) |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05231832A (ja) | 1992-02-24 | 1993-09-07 | I N R Kenkyusho:Kk | 三次元形状測定方法及び装置 |
| JPH05272969A (ja) * | 1992-03-26 | 1993-10-22 | Fuji Electric Co Ltd | 測距装置 |
| JP2003202213A (ja) * | 2001-10-29 | 2003-07-18 | Mitsutoyo Corp | 姿勢検出センサ、加速度センサ及びそれを用いた移動経路計測装置 |
| JP4132914B2 (ja) * | 2002-03-27 | 2008-08-13 | サンクス株式会社 | ワーク姿勢制御装置及びワーク姿勢制御方法、傾斜測定装置及びその測定動作方法 |
| US7023536B2 (en) * | 2004-03-08 | 2006-04-04 | Electronic Scripting Products, Inc. | Apparatus and method for determining orientation parameters of an elongate object |
| US7312879B2 (en) * | 2005-08-23 | 2007-12-25 | University Of Washington | Distance determination in a scanned beam image capture device |
| JP2009186404A (ja) * | 2008-02-08 | 2009-08-20 | Dainippon Screen Mfg Co Ltd | 画像情報生成装置及び画像情報生成方法。 |
| CN201607216U (zh) * | 2010-02-02 | 2010-10-13 | 科瑞自动化技术(深圳)有限公司 | 同时测量待测面的角度和高度的装置 |
| US11880178B1 (en) * | 2010-11-16 | 2024-01-23 | Ectoscan Systems, Llc | Surface data, acquisition, storage, and assessment system |
| JP2014126381A (ja) * | 2012-12-25 | 2014-07-07 | Nikon Corp | 形状測定装置、構造物製造システム、形状測定方法、構造物製造方法、及び形状測定プログラム |
| TWI580930B (zh) * | 2015-12-30 | 2017-05-01 | Tilt angle and distance measurement method | |
| EP3463056A4 (en) * | 2016-05-23 | 2020-07-29 | ContinUse Biometrics Ltd. | SYSTEM AND METHOD FOR USE IN DEPTH CHARACTERIZATION OF OBJECTS |
| JP6685849B2 (ja) * | 2016-06-17 | 2020-04-22 | 株式会社ミツトヨ | 光干渉測定装置及び光干渉測定方法 |
| JP2018124167A (ja) * | 2017-01-31 | 2018-08-09 | オムロン株式会社 | 傾斜測定装置 |
| JP7157547B2 (ja) * | 2018-04-20 | 2022-10-20 | 株式会社キーエンス | 形状測定装置、形状測定方法及び形状測定プログラム |
| JP7102302B2 (ja) * | 2018-09-10 | 2022-07-19 | 京セラ株式会社 | 電磁波検出装置の調整方法 |
| WO2021144795A1 (en) * | 2020-01-14 | 2021-07-22 | Pxe Computation Imaging Ltd. | System and method for optical imaging and measurement of objects |
-
2021
- 2021-02-16 US US17/913,568 patent/US20230107896A1/en not_active Abandoned
- 2021-02-16 CN CN202180024721.4A patent/CN115335657A/zh active Pending
- 2021-02-16 JP JP2022511640A patent/JPWO2021199744A1/ja active Pending
- 2021-02-16 EP EP21778884.3A patent/EP4130652A4/en not_active Withdrawn
- 2021-02-16 WO PCT/JP2021/005742 patent/WO2021199744A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| EP4130652A1 (en) | 2023-02-08 |
| EP4130652A4 (en) | 2023-10-04 |
| US20230107896A1 (en) | 2023-04-06 |
| CN115335657A (zh) | 2022-11-11 |
| WO2021199744A1 (ja) | 2021-10-07 |