JP2019502803A5 - - Google Patents

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Publication number
JP2019502803A5
JP2019502803A5 JP2018533247A JP2018533247A JP2019502803A5 JP 2019502803 A5 JP2019502803 A5 JP 2019502803A5 JP 2018533247 A JP2018533247 A JP 2018533247A JP 2018533247 A JP2018533247 A JP 2018533247A JP 2019502803 A5 JP2019502803 A5 JP 2019502803A5
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JP
Japan
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composition
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JP2018533247A
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English (en)
Japanese (ja)
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JP2019502803A (ja
JP6949846B2 (ja
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Priority claimed from PCT/EP2016/081847 external-priority patent/WO2017108743A1/en
Publication of JP2019502803A publication Critical patent/JP2019502803A/ja
Publication of JP2019502803A5 publication Critical patent/JP2019502803A5/ja
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JP2018533247A 2015-12-22 2016-12-20 化学機械研磨後の洗浄組成物 Active JP6949846B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP15201910.5 2015-12-22
EP15201910 2015-12-22
PCT/EP2016/081847 WO2017108743A1 (en) 2015-12-22 2016-12-20 Composition for post chemical-mechanical-polishing cleaning

Publications (3)

Publication Number Publication Date
JP2019502803A JP2019502803A (ja) 2019-01-31
JP2019502803A5 true JP2019502803A5 (enExample) 2020-01-16
JP6949846B2 JP6949846B2 (ja) 2021-10-13

Family

ID=55023982

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018533247A Active JP6949846B2 (ja) 2015-12-22 2016-12-20 化学機械研磨後の洗浄組成物

Country Status (8)

Country Link
US (1) US10844325B2 (enExample)
EP (1) EP3394234B1 (enExample)
JP (1) JP6949846B2 (enExample)
KR (1) KR102870073B1 (enExample)
CN (1) CN108473918B (enExample)
SG (1) SG11201804637UA (enExample)
TW (1) TWI794152B (enExample)
WO (1) WO2017108743A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3394879A2 (en) * 2015-12-22 2018-10-31 Basf Se Composition for post chemical-mechanical-polishing cleaning
US20200345616A1 (en) * 2017-11-29 2020-11-05 Basf Se Process for styling human hair
CN109576090A (zh) * 2018-12-13 2019-04-05 中国科学院上海光学精密机械研究所 氧化物光学元件化学机械抛光后残留物清洗剂及其制备方法
CN115397572B (zh) * 2020-03-19 2024-12-31 富士胶片电子材料美国有限公司 清洁组合物及其使用方法
JP2022144640A (ja) * 2021-03-19 2022-10-03 メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフツング 基板処理液、これを用いる基板の製造方法およびデバイスの製造方法
MX2023011631A (es) 2021-04-01 2023-12-15 Sterilex LLC Desinfectante/higienizante en polvo sin compuesto de amonio cuaternario (quat).
WO2023232682A1 (en) 2022-05-31 2023-12-07 Basf Se Composition, its use and a process for cleaning substrates comprising cobalt and copper
CN121548628A (zh) 2023-06-20 2026-02-17 巴斯夫欧洲公司 用于清洁包含钴和铜的衬底的碱性组合物、其用途及方法
WO2024260812A1 (en) 2023-06-20 2024-12-26 Basf Se Alkaline composition, its use and a process for cleaning substrates comprising cobalt and copper
JP2025047371A (ja) * 2023-09-21 2025-04-03 理研ビタミン株式会社 ポリエステル樹脂組成物の製造方法
WO2026057376A1 (en) 2024-09-11 2026-03-19 Basf Se Alkaline composition, its use and a process for cleaning substrates comprising cobalt and copper

Family Cites Families (16)

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Publication number Priority date Publication date Assignee Title
US3907985A (en) * 1973-07-27 1975-09-23 Burton Parsons And Company Inc Polystyrene sulfonate containing opthalmic solutions
WO1995016767A1 (en) * 1993-12-14 1995-06-22 The Procter & Gamble Company Liquid laundry detergents containing polyamino acid and polyalkylene glycol
EP1210395B1 (en) 1999-08-24 2003-10-22 Rodel Holdings, Inc. Compositions for insulator and metal cmp and methods relating thereto
WO2008023215A1 (en) * 2006-08-23 2008-02-28 Freescale Semiconductor, Inc. Post chemical mechanical polishing rinse formulation
JP4777197B2 (ja) * 2006-09-11 2011-09-21 富士フイルム株式会社 洗浄液及びそれを用いた洗浄方法
US8685909B2 (en) * 2006-09-21 2014-04-01 Advanced Technology Materials, Inc. Antioxidants for post-CMP cleaning formulations
MY162607A (en) * 2007-05-17 2017-06-30 Entegris Inc New antioxidants for post-cmp cleaning formulations
CA2692254C (en) * 2007-08-28 2013-12-31 Ecolab Inc. Paste-like detergent formulation comprising branched alkoxylated fatty alcohols as non-ionic surfactants
US20090056744A1 (en) 2007-08-29 2009-03-05 Micron Technology, Inc. Wafer cleaning compositions and methods
JP2009069505A (ja) 2007-09-13 2009-04-02 Tosoh Corp レジスト除去用洗浄液及び洗浄方法
KR101846597B1 (ko) * 2010-10-01 2018-04-06 미쯔비시 케미컬 주식회사 반도체 디바이스용 기판의 세정액 및 세정 방법
US10176979B2 (en) * 2012-02-15 2019-01-08 Entegris, Inc. Post-CMP removal using compositions and method of use
TWI573864B (zh) * 2012-03-14 2017-03-11 卡博特微電子公司 具有高移除率及低缺陷率之對氧化物及氮化物有選擇性之cmp組成物
PL3022280T3 (pl) * 2013-07-19 2019-06-28 Ecolab Usa Inc. Łagodny, alkaliczny, stały środek do czyszczenia narzędzi
KR102040050B1 (ko) * 2013-08-02 2019-11-05 동우 화인켐 주식회사 웨이퍼 다이싱용 세정제 조성물
JP2015181079A (ja) * 2014-03-05 2015-10-15 三洋化成工業株式会社 磁気ディスク基板用洗浄剤組成物

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