KR102870073B1 - 화학적-기계적-연마 후 세척용 조성물 - Google Patents
화학적-기계적-연마 후 세척용 조성물Info
- Publication number
- KR102870073B1 KR102870073B1 KR1020187021141A KR20187021141A KR102870073B1 KR 102870073 B1 KR102870073 B1 KR 102870073B1 KR 1020187021141 A KR1020187021141 A KR 1020187021141A KR 20187021141 A KR20187021141 A KR 20187021141A KR 102870073 B1 KR102870073 B1 KR 102870073B1
- Authority
- KR
- South Korea
- Prior art keywords
- acid
- composition
- range
- cleaning composition
- cleaning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/37—Polymers
- C11D3/3703—Macromolecular compounds obtained otherwise than by reactions only involving carbon-to-carbon unsaturated bonds
- C11D3/3707—Polyethers, e.g. polyalkyleneoxides
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/0005—Other compounding ingredients characterised by their effect
- C11D3/0026—Low foaming or foam regulating compositions
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/37—Polymers
- C11D3/3703—Macromolecular compounds obtained otherwise than by reactions only involving carbon-to-carbon unsaturated bonds
- C11D3/3719—Polyamides or polyimides
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/37—Polymers
- C11D3/3746—Macromolecular compounds obtained by reactions only involving carbon-to-carbon unsaturated bonds
- C11D3/3757—(Co)polymerised carboxylic acids, -anhydrides, -esters in solid and liquid compositions
- C11D3/3765—(Co)polymerised carboxylic acids, -anhydrides, -esters in solid and liquid compositions in liquid compositions
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/37—Polymers
- C11D3/3746—Macromolecular compounds obtained by reactions only involving carbon-to-carbon unsaturated bonds
- C11D3/378—(Co)polymerised monomers containing sulfur, e.g. sulfonate
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/37—Polymers
- C11D3/3746—Macromolecular compounds obtained by reactions only involving carbon-to-carbon unsaturated bonds
- C11D3/3784—(Co)polymerised monomers containing phosphorus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
- H01L21/02068—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
- H01L21/02074—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers the processing being a planarization of conductive layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H10P52/00—
-
- H10P70/15—
-
- H10P70/277—
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/18—Glass; Plastics
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Wood Science & Technology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Organic Chemistry (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Detergent Compositions (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP15201910.5 | 2015-12-22 | ||
| EP15201910 | 2015-12-22 | ||
| PCT/EP2016/081847 WO2017108743A1 (en) | 2015-12-22 | 2016-12-20 | Composition for post chemical-mechanical-polishing cleaning |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20180091928A KR20180091928A (ko) | 2018-08-16 |
| KR102870073B1 true KR102870073B1 (ko) | 2025-10-13 |
Family
ID=55023982
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020187021141A Active KR102870073B1 (ko) | 2015-12-22 | 2016-12-20 | 화학적-기계적-연마 후 세척용 조성물 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US10844325B2 (enExample) |
| EP (1) | EP3394234B1 (enExample) |
| JP (1) | JP6949846B2 (enExample) |
| KR (1) | KR102870073B1 (enExample) |
| CN (1) | CN108473918B (enExample) |
| SG (1) | SG11201804637UA (enExample) |
| TW (1) | TWI794152B (enExample) |
| WO (1) | WO2017108743A1 (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017108748A2 (en) * | 2015-12-22 | 2017-06-29 | Basf Se | Composition for post chemical-mechanical-polishing cleaning |
| CN111386139A (zh) * | 2017-11-29 | 2020-07-07 | 巴斯夫欧洲公司 | 定型人发的方法 |
| CN109576090A (zh) * | 2018-12-13 | 2019-04-05 | 中国科学院上海光学精密机械研究所 | 氧化物光学元件化学机械抛光后残留物清洗剂及其制备方法 |
| WO2021188766A1 (en) * | 2020-03-19 | 2021-09-23 | Fujifilm Electronic Materials U.S.A., Inc. | Cleaning compositions and methods of use thereof |
| JP2022144640A (ja) * | 2021-03-19 | 2022-10-03 | メルク パテント ゲゼルシャフト ミット ベシュレンクテル ハフツング | 基板処理液、これを用いる基板の製造方法およびデバイスの製造方法 |
| CA3213769A1 (en) | 2021-04-01 | 2022-10-06 | Sterilex, Llc | Quat-free powdered disinfectant/sanitizer |
| US20250305152A1 (en) | 2022-05-31 | 2025-10-02 | Basf Se | Composition, its use and a process for cleaning substrates comprising cobalt and copper |
| WO2024260813A1 (en) | 2023-06-20 | 2024-12-26 | Basf Se | Alkaline composition, its use and a process for cleaning substrates comprising cobalt and copper |
| WO2024260812A1 (en) | 2023-06-20 | 2024-12-26 | Basf Se | Alkaline composition, its use and a process for cleaning substrates comprising cobalt and copper |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090239777A1 (en) * | 2006-09-21 | 2009-09-24 | Advanced Technology Materials, Inc. | Antioxidants for post-cmp cleaning formulations |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3907985A (en) * | 1973-07-27 | 1975-09-23 | Burton Parsons And Company Inc | Polystyrene sulfonate containing opthalmic solutions |
| WO1995016767A1 (en) * | 1993-12-14 | 1995-06-22 | The Procter & Gamble Company | Liquid laundry detergents containing polyamino acid and polyalkylene glycol |
| JP4832690B2 (ja) * | 1999-08-24 | 2011-12-07 | ローム アンド ハース エレクトロニック マテリアルズ シーエムピー ホウルディングス インコーポレイテッド | 絶縁体及び金属のcmp用組成物及びそれに関する方法 |
| WO2008023215A1 (en) | 2006-08-23 | 2008-02-28 | Freescale Semiconductor, Inc. | Post chemical mechanical polishing rinse formulation |
| JP4777197B2 (ja) | 2006-09-11 | 2011-09-21 | 富士フイルム株式会社 | 洗浄液及びそれを用いた洗浄方法 |
| CN101720352B (zh) * | 2007-05-17 | 2015-11-25 | 安格斯公司 | 用于cpm后清除配方的新抗氧化剂 |
| CA2692254C (en) | 2007-08-28 | 2013-12-31 | Ecolab Inc. | Paste-like detergent formulation comprising branched alkoxylated fatty alcohols as non-ionic surfactants |
| US20090056744A1 (en) | 2007-08-29 | 2009-03-05 | Micron Technology, Inc. | Wafer cleaning compositions and methods |
| JP2009069505A (ja) | 2007-09-13 | 2009-04-02 | Tosoh Corp | レジスト除去用洗浄液及び洗浄方法 |
| JP6014985B2 (ja) * | 2010-10-01 | 2016-10-26 | 三菱化学株式会社 | 半導体デバイス用基板洗浄液及び洗浄方法 |
| KR102105381B1 (ko) * | 2012-02-15 | 2020-04-29 | 엔테그리스, 아이엔씨. | 조성물을 이용한 cmp-후 제거 방법 및 그의 이용 방법 |
| TWI573864B (zh) * | 2012-03-14 | 2017-03-11 | 卡博特微電子公司 | 具有高移除率及低缺陷率之對氧化物及氮化物有選擇性之cmp組成物 |
| EP3022280B1 (en) * | 2013-07-19 | 2019-01-02 | Ecolab USA Inc. | Mild alkaline solid instrument cleaner |
| KR102040050B1 (ko) * | 2013-08-02 | 2019-11-05 | 동우 화인켐 주식회사 | 웨이퍼 다이싱용 세정제 조성물 |
| JP2015181079A (ja) * | 2014-03-05 | 2015-10-15 | 三洋化成工業株式会社 | 磁気ディスク基板用洗浄剤組成物 |
-
2016
- 2016-12-20 US US16/064,918 patent/US10844325B2/en active Active
- 2016-12-20 EP EP16822665.2A patent/EP3394234B1/en active Active
- 2016-12-20 JP JP2018533247A patent/JP6949846B2/ja active Active
- 2016-12-20 CN CN201680075224.6A patent/CN108473918B/zh active Active
- 2016-12-20 KR KR1020187021141A patent/KR102870073B1/ko active Active
- 2016-12-20 SG SG11201804637UA patent/SG11201804637UA/en unknown
- 2016-12-20 WO PCT/EP2016/081847 patent/WO2017108743A1/en not_active Ceased
- 2016-12-21 TW TW105142442A patent/TWI794152B/zh active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20090239777A1 (en) * | 2006-09-21 | 2009-09-24 | Advanced Technology Materials, Inc. | Antioxidants for post-cmp cleaning formulations |
Also Published As
| Publication number | Publication date |
|---|---|
| US10844325B2 (en) | 2020-11-24 |
| CN108473918A (zh) | 2018-08-31 |
| TWI794152B (zh) | 2023-03-01 |
| EP3394234B1 (en) | 2019-10-09 |
| JP6949846B2 (ja) | 2021-10-13 |
| TW201732026A (zh) | 2017-09-16 |
| SG11201804637UA (en) | 2018-07-30 |
| KR20180091928A (ko) | 2018-08-16 |
| CN108473918B (zh) | 2021-11-30 |
| JP2019502803A (ja) | 2019-01-31 |
| EP3394234A1 (en) | 2018-10-31 |
| WO2017108743A1 (en) | 2017-06-29 |
| US20180371371A1 (en) | 2018-12-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR102870073B1 (ko) | 화학적-기계적-연마 후 세척용 조성물 | |
| KR102773140B1 (ko) | 포스트 화학적-기계적-폴리싱 세정을 위한 조성물 | |
| EP2596091B1 (en) | Aqueous alkaline cleaning compositions and methods of their use | |
| CN1670147A (zh) | 碱性后化学机械平面化清洗组合物 | |
| KR101751553B1 (ko) | 수성 알칼리 세정 조성물 및 그 사용 방법 | |
| EP1466963A1 (en) | Cleaning liquid composition for semiconductor substrate | |
| KR102377573B1 (ko) | 포스트 화학적-기계적-폴리싱 세정용 조성물 | |
| KR20250020516A (ko) | 코발트 및 구리를 포함하는 기판의 세정을 위한 조성물, 이의 용도 및 방법 | |
| KR102399811B1 (ko) | 금속막 연마 후 세정액 조성물 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
St.27 status event code: A-0-1-A10-A15-nap-PA0105 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| D22 | Grant of ip right intended |
Free format text: ST27 STATUS EVENT CODE: A-1-2-D10-D22-EXM-PE0701 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| F11 | Ip right granted following substantive examination |
Free format text: ST27 STATUS EVENT CODE: A-2-4-F10-F11-EXM-PR0701 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U12-oth-PR1002 Fee payment year number: 1 |
|
| U12 | Designation fee paid |
Free format text: ST27 STATUS EVENT CODE: A-2-2-U10-U12-OTH-PR1002 (AS PROVIDED BY THE NATIONAL OFFICE) Year of fee payment: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| Q13 | Ip right document published |
Free format text: ST27 STATUS EVENT CODE: A-4-4-Q10-Q13-NAP-PG1601 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |