JP2019145871A - イメージセンサ及びイメージセンサの駆動方法 - Google Patents
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- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
- H01L27/14659—Direct radiation imagers structures
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
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- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
- H01L31/115—Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation
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- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/04—Synchronising
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/14—Picture signal circuitry for video frequency region
- H04N5/21—Circuitry for suppressing or minimising disturbance, e.g. moiré or halo
- H04N5/213—Circuitry for suppressing or minimising impulsive noise
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
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Abstract
Description
Claims (8)
- 光電変換素子と、前記光電変換素子に接続されたスイッチング素子と、を含む画素、がマトリクス状に配置された画素マトリクスと、
前記画素マトリクスの画素行を選択し、選択中の画素行の画素に出力信号を出力してスイッチング素子を導通状態にする、選択処理を各画素行について順次実行する走査部と、
前記選択中の画素行の画素の光電変換素子からの信号を検出する、検出処理を実行する検出部と、を含み、
前記走査部は、複数の制御信号の入力を受け付け、前記複数の制御信号に基づいて、各画素行について前記選択処理を実行し、
前記複数の制御信号のうち、全ての画素行について前記選択処理及び前記検出処理が行われる第1期間より短い周期、を有する制御信号である短周期制御信号の周期は、1画素行について前記選択処理及び前記検出処理が行われる第2期間以下である、イメージセンサ。 - 請求項1に記載のイメージセンサであって、
前記走査部は、それぞれが、異なる画素行に接続され、接続された画素行に対して前記選択処理を実行する複数の転送部を含み、
前記複数の転送部それぞれは、
第1短周期制御信号と、第2短周期制御信号の入力を受け付け、
当該転送部に接続された画素行と、当該転送部に隣接する一方の転送部と、に前記出力信号を出力し、
第1ノード、第2ノード、第3ノード、及び第4ノードを含み、
初回の前記選択処理を開始するための第1制御信号、又は他の転送部からの前記出力信号に基づいて、第1ノード及び第2ノードの電位を変化させ、
前記第1ノード及び前記第2ノードの電位と、前記第1短周期制御信号と、に基づいて前記第3ノード及び前記第4ノードの電位を変化させ、
前記第2短周期制御信号を、前記第3ノード及び前記第4ノードの電位に基づいて、前記出力信号として出力する、イメージセンサ。 - 請求項2に記載のイメージセンサであって、
前記複数の転送部それぞれは、
前記第1短周期制御信号を、前記第1ノード及び前記第2ノードの電位に基づいて、当該転送部に隣接する他方の転送部に、内部出力信号として出力し、
他の転送部からの内部出力信号に基づいて、前記第3ノード及び前記第4ノードの電位を変化させる、イメージセンサ。 - 請求項2に記載のイメージセンサであって、
前記複数の転送部それぞれは、当該転送部に対応する前記第2期間において、前記第1ノード、前記第2ノード、前記第3ノード、及び前記第4ノードを再充電する、イメージセンサ。 - 請求項2又は4に記載のイメージセンサであって、
前記複数の転送部は、
前記選択処理における画素行の選択順序を決定するための第2制御信号の入力を受け付け、
前記第2制御信号が示す選択順序に従って前記選択処理を実行する、イメージセンサ。 - 請求項1に記載のイメージセンサであって、
前記走査部は、それぞれが、異なる画素行に接続され、接続された画素行に対して前記選択処理を実行する複数の転送部を含み、
前記複数の転送部それぞれに含まれるトランジスタは、同一の導電型である、イメージセンサ。 - 請求項1に記載のイメージセンサであって、
前記複数の転送部にそれぞれに含まれるトランジスタは、酸化物半導体トランジスタである、イメージセンサ。 - イメージセンサの駆動方法であって、
前記イメージセンサは、光電変換素子と、前記光電変換素子に接続されたスイッチング素子と、を含む画素、がマトリクス状に配置された画素マトリクスを含み、
前記方法は、
前記画素マトリクスの画素行を選択し、選択中の画素行の画素に出力信号を出力してスイッチング素子を導通状態にする、選択処理を各画素行について順次実行し、
前記選択中の画素行の画素の光電変換素子からの信号を検出する検出処理を実行し、
複数の制御信号の入力を受け付け、前記複数の制御信号に基づいて、各画素行について前記選択処理を実行する、ことを含み、
前記複数の制御信号のうち、全ての画素行について前記選択処理及び前記検出処理が行われる第1期間より短い周期、を有する制御信号である短周期制御信号の周期は、1画素行について前記選択処理及び前記検出処理が行われる第2期間以下である、方法。
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JP2018025329A JP7088686B2 (ja) | 2018-02-15 | 2018-02-15 | イメージセンサ及びイメージセンサの駆動方法 |
CN201910029915.8A CN110166717B (zh) | 2018-02-15 | 2019-01-10 | 图像传感器以及驱动图像传感器的方法 |
US16/276,107 US10847568B2 (en) | 2018-02-15 | 2019-02-14 | Image sensor and method of driving image sensor |
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Citations (2)
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JP2007104219A (ja) * | 2005-10-03 | 2007-04-19 | Canon Inc | 放射線撮影装置及びその制御方法、放射線撮影システム |
JP2013026780A (ja) * | 2011-07-20 | 2013-02-04 | Canon Inc | 検出装置及び検出システム |
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JPH04180454A (ja) | 1990-11-15 | 1992-06-26 | Nec Corp | 密着形イメージセンサの信号走査回路 |
JP3066944B2 (ja) * | 1993-12-27 | 2000-07-17 | キヤノン株式会社 | 光電変換装置、その駆動方法及びそれを有するシステム |
JP2004112742A (ja) * | 2002-07-25 | 2004-04-08 | Fujitsu Ltd | 画像歪みを抑制したイメージセンサ |
JP4750512B2 (ja) * | 2005-09-01 | 2011-08-17 | キヤノン株式会社 | 放射線撮像装置、その制御方法及び放射線撮像システム |
JP2007144064A (ja) * | 2005-11-30 | 2007-06-14 | Shimadzu Corp | 撮像センサおよびそれを用いた撮像装置 |
JP5149687B2 (ja) * | 2008-04-28 | 2013-02-20 | キヤノン株式会社 | 撮像センサ、撮像システム、及び撮像センサの制御方法 |
JP2011085680A (ja) | 2009-10-14 | 2011-04-28 | Epson Imaging Devices Corp | 液晶表示装置、走査線駆動回路および電子機器 |
JP6089785B2 (ja) * | 2013-02-28 | 2017-03-08 | コニカミノルタ株式会社 | 放射線画像撮影装置および放射線画像撮影システム |
US10269839B2 (en) * | 2015-03-26 | 2019-04-23 | Carestream Health, Inc. | Apparatus and method using a dual gate TFT structure |
JP7088686B2 (ja) * | 2018-02-15 | 2022-06-21 | Tianma Japan株式会社 | イメージセンサ及びイメージセンサの駆動方法 |
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JP2007104219A (ja) * | 2005-10-03 | 2007-04-19 | Canon Inc | 放射線撮影装置及びその制御方法、放射線撮影システム |
JP2013026780A (ja) * | 2011-07-20 | 2013-02-04 | Canon Inc | 検出装置及び検出システム |
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CN110166717A (zh) | 2019-08-23 |
US10847568B2 (en) | 2020-11-24 |
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