JP2019123050A - 支持基台 - Google Patents
支持基台 Download PDFInfo
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- JP2019123050A JP2019123050A JP2018005826A JP2018005826A JP2019123050A JP 2019123050 A JP2019123050 A JP 2019123050A JP 2018005826 A JP2018005826 A JP 2018005826A JP 2018005826 A JP2018005826 A JP 2018005826A JP 2019123050 A JP2019123050 A JP 2019123050A
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- 238000009529 body temperature measurement Methods 0.000 claims abstract description 28
- 238000004891 communication Methods 0.000 claims description 24
- 238000012545 processing Methods 0.000 abstract description 43
- 238000005498 polishing Methods 0.000 description 66
- 238000005259 measurement Methods 0.000 description 23
- 239000000853 adhesive Substances 0.000 description 10
- 230000001070 adhesive effect Effects 0.000 description 10
- 238000003860 storage Methods 0.000 description 8
- 229910052751 metal Inorganic materials 0.000 description 7
- 239000002184 metal Substances 0.000 description 7
- 238000004140 cleaning Methods 0.000 description 6
- 230000007547 defect Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000011347 resin Substances 0.000 description 4
- 229920005989 resin Polymers 0.000 description 4
- 238000003754 machining Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000007517 polishing process Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 238000004590 computer program Methods 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67248—Temperature monitoring
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
- B24B41/068—Table-like supports for panels, sheets or the like
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q17/00—Arrangements for observing, indicating or measuring on machine tools
- B23Q17/20—Arrangements for observing, indicating or measuring on machine tools for indicating or measuring workpiece characteristics, e.g. contour, dimension, hardness
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/27—Work carriers
- B24B37/30—Work carriers for single side lapping of plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B41/00—Component parts such as frames, beds, carriages, headstocks
- B24B41/06—Work supports, e.g. adjustable steadies
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
- B24B49/14—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the temperature during grinding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6831—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/0023—Other grinding machines or devices grinding machines with a plurality of working posts
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Forklifts And Lifting Vehicles (AREA)
- Manipulator (AREA)
- Load-Engaging Elements For Cranes (AREA)
Abstract
Description
本発明の実施形態1に係る支持基台を図面に基づいて説明する。図1は、実施形態1に係る支持基台と被加工物とを示す斜視図である。図2は、実施形態1に係る支持基台により支持された被加工物を研削研磨する研削研磨装置の構成例の斜視図である。図3は、実施形態1に係る支持基台が被加工物を支持した状態を示す斜視図である。図4は、図3中のIV−IV線に沿う断面図である。図5は、実施形態1に係る支持基台の構成を示すブロック図である。
本発明の実施形態2に係る支持基台を図面に基づいて説明する。図6は、実施形態2に係る支持基台と被加工物とを示す斜視図である。図7は、実施形態2に係る支持基台が被加工物を支持した状態を示す断面図である。図8は、実施形態2に係る支持基台の構成を示すブロック図である。図6、図7及び図8は、実施形態1と同一部分に同一符号を付して説明を省略する。
10 箱体
11 支持面
12 載置面
20 温度測定ユニット
21 温度測定器
22 記録部
23 無線通信装置(無線通信手段)
30 電池
51 正極電極(電極)
52 負極電極(電極)
106 チャックテーブル
106−1 保持面
200 被加工物
Claims (4)
- 板状の被加工物を支持する支持基台であって、
該被加工物を支持する支持面と、該支持面と反対側の面でチャックテーブルの保持面に載置される載置面とを備える平板状の箱体と、
該箱体に収容される温度測定ユニット及び該温度測定ユニットの電源となる電池と、を備え、
該温度測定ユニットは、
該支持面の温度を測定する温度測定器と、
該温度測定器で測定した温度を記録する記録部と、を備える支持基台。 - 該温度測定ユニットは、
該温度測定器で測定した温度情報を該箱体の外へ発信する無線通信手段を備える請求項1に記載の支持基台。 - 該支持面には、該電池から電力が供給される電極が設置され、該被加工物は該支持面に静電吸着される請求項1又は請求項2に記載の支持基台。
- 該被加工物は、該支持基台を介して該チャックテーブルに保持された状態で研磨される請求項1、請求項2又は請求項3に記載の支持基台。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018005826A JP7045861B2 (ja) | 2018-01-17 | 2018-01-17 | 支持基台 |
KR1020190002689A KR102614835B1 (ko) | 2018-01-17 | 2019-01-09 | 지지 기대 |
US16/246,724 US11241770B2 (en) | 2018-01-17 | 2019-01-14 | Support base |
CN201910035875.8A CN110052958B (zh) | 2018-01-17 | 2019-01-15 | 支承基台 |
TW108101573A TWI785187B (zh) | 2018-01-17 | 2019-01-16 | 支持基台 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018005826A JP7045861B2 (ja) | 2018-01-17 | 2018-01-17 | 支持基台 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2019123050A true JP2019123050A (ja) | 2019-07-25 |
JP7045861B2 JP7045861B2 (ja) | 2022-04-01 |
Family
ID=67213514
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018005826A Active JP7045861B2 (ja) | 2018-01-17 | 2018-01-17 | 支持基台 |
Country Status (5)
Country | Link |
---|---|
US (1) | US11241770B2 (ja) |
JP (1) | JP7045861B2 (ja) |
KR (1) | KR102614835B1 (ja) |
CN (1) | CN110052958B (ja) |
TW (1) | TWI785187B (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2022022465A (ja) * | 2020-07-25 | 2022-02-04 | 株式会社Revive and design | ガラス傷消し方法、傷消し監視装置、および傷消し監視プログラム |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2003071714A (ja) * | 2001-09-05 | 2003-03-12 | Disco Abrasive Syst Ltd | 研磨装置 |
JP2006315137A (ja) * | 2005-05-13 | 2006-11-24 | Nitta Haas Inc | 研磨パッド |
WO2007072817A1 (ja) * | 2005-12-20 | 2007-06-28 | Nikon Corporation | 基板搬送方法、基板搬送装置および露光装置 |
JP2011194509A (ja) * | 2010-03-19 | 2011-10-06 | Nitta Haas Inc | 研磨装置、研磨パッドおよび研磨情報管理システム |
JP2015104769A (ja) * | 2013-11-29 | 2015-06-08 | 株式会社荏原製作所 | 研磨テーブルおよび研磨装置 |
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JPH08112752A (ja) * | 1994-10-13 | 1996-05-07 | Mitsubishi Materials Shilicon Corp | 半導体ウェーハの研磨方法および研磨装置 |
JPH0929620A (ja) * | 1995-07-20 | 1997-02-04 | Ebara Corp | ポリッシング装置 |
CN1178392A (zh) * | 1996-09-19 | 1998-04-08 | 株式会社日立制作所 | 静电吸盘和应用了静电吸盘的样品处理方法及装置 |
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-
2018
- 2018-01-17 JP JP2018005826A patent/JP7045861B2/ja active Active
-
2019
- 2019-01-09 KR KR1020190002689A patent/KR102614835B1/ko active IP Right Grant
- 2019-01-14 US US16/246,724 patent/US11241770B2/en active Active
- 2019-01-15 CN CN201910035875.8A patent/CN110052958B/zh active Active
- 2019-01-16 TW TW108101573A patent/TWI785187B/zh active
Patent Citations (5)
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JP2003071714A (ja) * | 2001-09-05 | 2003-03-12 | Disco Abrasive Syst Ltd | 研磨装置 |
JP2006315137A (ja) * | 2005-05-13 | 2006-11-24 | Nitta Haas Inc | 研磨パッド |
WO2007072817A1 (ja) * | 2005-12-20 | 2007-06-28 | Nikon Corporation | 基板搬送方法、基板搬送装置および露光装置 |
JP2011194509A (ja) * | 2010-03-19 | 2011-10-06 | Nitta Haas Inc | 研磨装置、研磨パッドおよび研磨情報管理システム |
JP2015104769A (ja) * | 2013-11-29 | 2015-06-08 | 株式会社荏原製作所 | 研磨テーブルおよび研磨装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2022022465A (ja) * | 2020-07-25 | 2022-02-04 | 株式会社Revive and design | ガラス傷消し方法、傷消し監視装置、および傷消し監視プログラム |
Also Published As
Publication number | Publication date |
---|---|
KR102614835B1 (ko) | 2023-12-15 |
CN110052958A (zh) | 2019-07-26 |
JP7045861B2 (ja) | 2022-04-01 |
TW201933528A (zh) | 2019-08-16 |
CN110052958B (zh) | 2022-07-08 |
US11241770B2 (en) | 2022-02-08 |
KR20190088008A (ko) | 2019-07-25 |
TWI785187B (zh) | 2022-12-01 |
US20190217440A1 (en) | 2019-07-18 |
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