JP2018526825A - 電界効果トランジスタ形成方法 - Google Patents
電界効果トランジスタ形成方法 Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 240
- 230000005669 field effect Effects 0.000 title claims description 40
- 229920000642 polymer Polymers 0.000 claims abstract description 300
- 239000000463 material Substances 0.000 claims abstract description 220
- 238000000465 moulding Methods 0.000 claims abstract description 207
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 203
- 229910021389 graphene Inorganic materials 0.000 claims description 203
- 239000000758 substrate Substances 0.000 claims description 89
- 239000011888 foil Substances 0.000 claims description 75
- 239000002131 composite material Substances 0.000 claims description 48
- 229920000307 polymer substrate Polymers 0.000 claims description 44
- 239000011248 coating agent Substances 0.000 claims description 25
- 238000000576 coating method Methods 0.000 claims description 25
- 239000002096 quantum dot Substances 0.000 claims description 25
- 239000007788 liquid Substances 0.000 claims description 9
- 239000010410 layer Substances 0.000 description 264
- 230000008569 process Effects 0.000 description 34
- 229910052751 metal Inorganic materials 0.000 description 16
- 239000002184 metal Substances 0.000 description 16
- 238000000206 photolithography Methods 0.000 description 14
- 238000000231 atomic layer deposition Methods 0.000 description 12
- 239000004020 conductor Substances 0.000 description 12
- 238000005538 encapsulation Methods 0.000 description 12
- 238000004528 spin coating Methods 0.000 description 12
- 239000000126 substance Substances 0.000 description 10
- 239000000356 contaminant Substances 0.000 description 8
- 238000000151 deposition Methods 0.000 description 8
- 239000011810 insulating material Substances 0.000 description 8
- 238000001883 metal evaporation Methods 0.000 description 8
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 8
- 239000004926 polymethyl methacrylate Substances 0.000 description 8
- 239000002356 single layer Substances 0.000 description 8
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 230000003213 activating effect Effects 0.000 description 6
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 6
- 238000005229 chemical vapour deposition Methods 0.000 description 6
- 230000007547 defect Effects 0.000 description 6
- 238000007641 inkjet printing Methods 0.000 description 6
- 229910052760 oxygen Inorganic materials 0.000 description 6
- 239000001301 oxygen Substances 0.000 description 6
- 238000005192 partition Methods 0.000 description 6
- -1 polyethylene terephthalate Polymers 0.000 description 6
- 239000011347 resin Substances 0.000 description 6
- 229920005989 resin Polymers 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- 229920001187 thermosetting polymer Polymers 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 4
- 230000004913 activation Effects 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 4
- 229910052802 copper Inorganic materials 0.000 description 4
- 239000010949 copper Substances 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 238000004049 embossing Methods 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 229910052809 inorganic oxide Inorganic materials 0.000 description 4
- 230000007935 neutral effect Effects 0.000 description 4
- 150000004767 nitrides Chemical class 0.000 description 4
- 229920000620 organic polymer Polymers 0.000 description 4
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 4
- 229920000139 polyethylene terephthalate Polymers 0.000 description 4
- 239000005020 polyethylene terephthalate Substances 0.000 description 4
- 239000002861 polymer material Substances 0.000 description 4
- 238000007639 printing Methods 0.000 description 4
- 239000013545 self-assembled monolayer Substances 0.000 description 4
- 238000005507 spraying Methods 0.000 description 4
- 230000007847 structural defect Effects 0.000 description 4
- 238000007740 vapor deposition Methods 0.000 description 4
- 229910052582 BN Inorganic materials 0.000 description 2
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 2
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 2
- 229920012266 Poly(ether sulfone) PES Polymers 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 239000002318 adhesion promoter Substances 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 229920001577 copolymer Polymers 0.000 description 2
- 238000003851 corona treatment Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000007772 electrode material Substances 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 229920005570 flexible polymer Polymers 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- CWQXQMHSOZUFJS-UHFFFAOYSA-N molybdenum disulfide Chemical compound S=[Mo]=S CWQXQMHSOZUFJS-UHFFFAOYSA-N 0.000 description 2
- 229910052982 molybdenum disulfide Inorganic materials 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000035699 permeability Effects 0.000 description 2
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 239000011112 polyethylene naphthalate Substances 0.000 description 2
- 239000002952 polymeric resin Substances 0.000 description 2
- 238000007764 slot die coating Methods 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
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- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
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Abstract
Description
Claims (15)
- 2次元材料の層を電極の間に設けることができる2以上の電極をリリース層に形成し、
前記2以上の電極の上に重ねて成形用ポリマーを設け、
前記2以上の電極と前記成形用ポリマーとが平面表面の少なくとも一部を形成する
方法。 - 前記リリース層は、2次元材料の平滑層を設けることができるように平滑面を有する
請求項1に記載の方法。 - 前記2以上の電極を同一面に設ける
請求項1または2に記載の方法。 - 前記電極を前記リリース層から取り除いた後に、前記2次元材料を前記電極の上に重ねて設ける
請求項1〜3のいずれか1項に記載の方法。 - 前記2次元材料を前記リリース層に設け、前記2以上の電極の少なくとも一部を前記2次元材料の上に重ねて設け、前記2以上の電極と前記2次元材料と前記成形用ポリマーとが前記平面表面の少なくとも一部を形成する
請求項1〜3のいずれか1項に記載の方法。 - 前記成形用ポリマーを含む複合ポリマー基板を形成する
請求項1〜5のいずれか1項に記載の方法。 - 前記複合ポリマー基板に硬質皮膜を設ける
請求項6に記載の方法。 - 前記2次元材料と前記2以上の電極とが電界効果トランジスタの少なくとも一部を形成する
請求項1〜7のいずれか1項に記載の方法。 - 複数の電界効果トランジスタを形成するために複数の電極と2次元材料の複数部分とを設け、前記複数の電界効果トランジスタのうち、少なくとも一部がボトムゲート型電界効果トランジスタであり、かつ少なくとも一部がトップゲート型電界効果トランジスタである
請求項1〜8のいずれか1項に記載の方法。 - 前記2次元材料はグラフェンを含む
請求項1〜9のいずれか1項に記載の方法。 - 前記2次元材料を活性化する
請求項1〜10のいずれか1項に記載の方法。 - 前記2次元材料を量子ドットで活性化する
請求項1〜11のいずれか1項に記載の方法。 - 前記2以上の電極を前記リリース層から取り除いた後に、前記成形用ポリマーが前記2以上の電極に対するフレキシブル基板となる
請求項1〜12のいずれか1項に記載の方法。 - 前記成形用ポリマーは、液体ポリマーおよび成形用ポリマー箔の少なくとも一方を含む
請求項1〜13のいずれか1項に記載の方法。 - 2次元材料の層と、前記2次元材料の層を電極の間に設けることができる、リリース層に形成された2以上の電極と、
前記2以上の電極の上に重なる成形用ポリマーとを備え、
前記2以上の電極と前記成形用ポリマーとが平面表面の少なくとも一部を形成する
装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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EP15182390.3 | 2015-08-25 | ||
EP15182390.3A EP3136445B1 (en) | 2015-08-25 | 2015-08-25 | A method for forming apparatus comprising two dimensional material |
PCT/EP2016/070124 WO2017032850A1 (en) | 2015-08-25 | 2016-08-25 | A method for forming apparatus comprising two dimensional material |
Publications (2)
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JP2018526825A true JP2018526825A (ja) | 2018-09-13 |
JP6518007B2 JP6518007B2 (ja) | 2019-05-22 |
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US (1) | US10396180B2 (ja) |
EP (1) | EP3136445B1 (ja) |
JP (1) | JP6518007B2 (ja) |
KR (1) | KR102038853B1 (ja) |
CA (1) | CA2996460C (ja) |
WO (1) | WO2017032850A1 (ja) |
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EP3163633B1 (en) | 2015-10-28 | 2021-09-01 | Nokia Technologies Oy | A light-based sensor apparatus and associated methods |
WO2018072103A1 (zh) * | 2016-10-18 | 2018-04-26 | 广东东邦科技有限公司 | 基于柔性多层石墨烯量子碳基板料的tft结构及制造方法 |
WO2019081492A1 (en) * | 2017-10-26 | 2019-05-02 | Emberion Oy | PHOTOSENSITIVE FIELD EFFECT TRANSISTOR |
WO2019115876A1 (en) | 2017-12-12 | 2019-06-20 | Emberion Oy | Photosensitive field-effect transistor |
CN108493246A (zh) * | 2018-02-09 | 2018-09-04 | 中国科学院微电子研究所 | 半导体器件与其制作方法 |
KR102143058B1 (ko) * | 2018-04-19 | 2020-08-11 | 서울대학교산학협력단 | 2차원 물질의 패턴이 형성된 유연소자 및 그 제조 방법 |
GB2579396A (en) * | 2018-11-30 | 2020-06-24 | Emberion Oy | P-I-N photodetector |
GB201916745D0 (en) | 2019-11-18 | 2020-01-01 | Cambridge Entpr Ltd | Device fabrication techniques |
CN112034008A (zh) * | 2020-09-11 | 2020-12-04 | 电子科技大学 | 一种石墨烯晶体结构质量评价方法 |
CN113666112A (zh) * | 2021-08-19 | 2021-11-19 | 单原子微纳米科技(淮安)有限责任公司 | 一种自动化二维材料转移装置 |
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JP2010062399A (ja) * | 2008-09-05 | 2010-03-18 | Sony Corp | 半導体装置、半導体装置の製造方法、および電子機器 |
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EP3136445A1 (en) | 2017-03-01 |
US20180248019A1 (en) | 2018-08-30 |
JP6518007B2 (ja) | 2019-05-22 |
KR102038853B1 (ko) | 2019-10-31 |
US10396180B2 (en) | 2019-08-27 |
CA2996460A1 (en) | 2017-03-02 |
EP3136445B1 (en) | 2021-03-17 |
CA2996460C (en) | 2020-03-24 |
KR20180043345A (ko) | 2018-04-27 |
WO2017032850A1 (en) | 2017-03-02 |
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