JP2018195810A5 - - Google Patents
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- JP2018195810A5 JP2018195810A5 JP2018088537A JP2018088537A JP2018195810A5 JP 2018195810 A5 JP2018195810 A5 JP 2018195810A5 JP 2018088537 A JP2018088537 A JP 2018088537A JP 2018088537 A JP2018088537 A JP 2018088537A JP 2018195810 A5 JP2018195810 A5 JP 2018195810A5
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- JP
- Japan
- Prior art keywords
- substrate
- chamber
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- gas
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- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000000758 substrate Substances 0.000 claims description 60
- 229910052736 halogen Inorganic materials 0.000 claims description 24
- 150000002367 halogens Chemical class 0.000 claims description 24
- 238000000034 method Methods 0.000 claims description 16
- 239000007789 gas Substances 0.000 claims 19
- 238000010438 heat treatment Methods 0.000 claims 9
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims 6
- 239000003570 air Substances 0.000 claims 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims 3
- 229910052757 nitrogen Inorganic materials 0.000 claims 3
- 239000001301 oxygen Substances 0.000 claims 3
- 229910052760 oxygen Inorganic materials 0.000 claims 3
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims 2
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical compound [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 claims 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 claims 1
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 claims 1
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 claims 1
- 229910052794 bromium Inorganic materials 0.000 claims 1
- 229910052801 chlorine Inorganic materials 0.000 claims 1
- 239000000460 chlorine Substances 0.000 claims 1
- 229910052731 fluorine Inorganic materials 0.000 claims 1
- 239000011737 fluorine Substances 0.000 claims 1
- 238000010943 off-gassing Methods 0.000 claims 1
- 230000002093 peripheral effect Effects 0.000 claims 1
- 239000000463 material Substances 0.000 description 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/594,118 US10903065B2 (en) | 2017-05-12 | 2017-05-12 | Halogen removal module and associated systems and methods |
| US15/594,118 | 2017-05-12 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018195810A JP2018195810A (ja) | 2018-12-06 |
| JP2018195810A5 true JP2018195810A5 (https=) | 2022-09-21 |
| JP7211716B2 JP7211716B2 (ja) | 2023-01-24 |
Family
ID=64097356
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2018088537A Active JP7211716B2 (ja) | 2017-05-12 | 2018-05-02 | ハロゲン除去モジュールならびに関連のシステムおよび方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US10903065B2 (https=) |
| JP (1) | JP7211716B2 (https=) |
| KR (1) | KR102521160B1 (https=) |
| CN (1) | CN108878313B (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| AU2019361520B2 (en) | 2018-10-17 | 2025-04-24 | Nippon Chemiphar Co., Ltd. | Novel pharmaceutical composition |
| US10777445B2 (en) * | 2018-12-06 | 2020-09-15 | Asm Ip Holding B.V. | Substrate processing apparatus and substrate transfer method |
| FR3092436B1 (fr) * | 2019-02-04 | 2021-02-12 | Aloxtec | Four d’oxydation latérale de VCSEL avec modification locale de la vitesse d’oxydation |
| JP7355615B2 (ja) * | 2019-11-25 | 2023-10-03 | 東京エレクトロン株式会社 | 基板洗浄装置及び基板洗浄方法 |
| GB202015527D0 (en) * | 2020-09-30 | 2020-11-11 | Lam Res Ag | Apparatus for processing wafer-shaped articles |
| WO2022192460A1 (en) * | 2021-03-11 | 2022-09-15 | Applied Materials, Inc. | Systems and methods for fabrication of micro-led displays |
| US11921422B2 (en) * | 2021-04-09 | 2024-03-05 | Applied Materials, Inc. | Single-volume baking chamber for mask clean |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3855024A (en) * | 1971-11-01 | 1974-12-17 | Western Electric Co | Method of vapor-phase polishing a surface of a semiconductor |
| US4778532A (en) * | 1985-06-24 | 1988-10-18 | Cfm Technologies Limited Partnership | Process and apparatus for treating wafers with process fluids |
| JP3247270B2 (ja) * | 1994-08-25 | 2002-01-15 | 東京エレクトロン株式会社 | 処理装置及びドライクリーニング方法 |
| WO1997011482A2 (en) * | 1995-09-05 | 1997-03-27 | Lsi Logic Corporation | Removal of halogens and photoresist from wafers |
| JP4518986B2 (ja) * | 2005-03-17 | 2010-08-04 | 東京エレクトロン株式会社 | 大気搬送室、被処理体の処理後搬送方法、プログラム及び記憶媒体 |
| JP2007243014A (ja) * | 2006-03-10 | 2007-09-20 | Hitachi Kokusai Electric Inc | 半導体装置の製造方法及び基板処理装置 |
| US7846845B2 (en) * | 2006-10-26 | 2010-12-07 | Applied Materials, Inc. | Integrated method for removal of halogen residues from etched substrates in a processing system |
| JP4979079B2 (ja) * | 2007-07-09 | 2012-07-18 | 東京エレクトロン株式会社 | 基板処理装置 |
| US8616821B2 (en) * | 2010-08-26 | 2013-12-31 | Taiwan Semiconductor Manufacturing Company, Ltd. | Integrated apparatus to assure wafer quality and manufacturability |
| WO2012117943A1 (ja) * | 2011-02-28 | 2012-09-07 | 東京エレクトロン株式会社 | 被処理基板処理用ハロゲン除去装置、被処理基板処理装置、および被処理基板処理方法 |
| JP6767257B2 (ja) * | 2016-12-22 | 2020-10-14 | 東京エレクトロン株式会社 | 基板処理装置及び基板処理方法 |
-
2017
- 2017-05-12 US US15/594,118 patent/US10903065B2/en active Active
-
2018
- 2018-04-26 KR KR1020180048466A patent/KR102521160B1/ko active Active
- 2018-05-02 JP JP2018088537A patent/JP7211716B2/ja active Active
- 2018-05-07 CN CN201810425448.6A patent/CN108878313B/zh active Active
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