JP2018190978A5 - - Google Patents

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Publication number
JP2018190978A5
JP2018190978A5 JP2018087886A JP2018087886A JP2018190978A5 JP 2018190978 A5 JP2018190978 A5 JP 2018190978A5 JP 2018087886 A JP2018087886 A JP 2018087886A JP 2018087886 A JP2018087886 A JP 2018087886A JP 2018190978 A5 JP2018190978 A5 JP 2018190978A5
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JP
Japan
Prior art keywords
power distribution
processing chamber
semi
recursive
circular
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Pending
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JP2018087886A
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English (en)
Japanese (ja)
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JP2018190978A (ja
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Publication of JP2018190978A publication Critical patent/JP2018190978A/ja
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JP2018087886A 2017-05-02 2018-04-29 対称的な給電構造を有する補助電極を用いてプラズマ処理チャンバ内のウェハエッジシースを変調する方法および受動的な方法で動作するとき制御可能なインピーダンスを接地し、能動的に電力を供給するときプラズマへの対称rf電力入力を可能とするドライブ Pending JP2018190978A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762500120P 2017-05-02 2017-05-02
US62/500,120 2017-05-02

Publications (2)

Publication Number Publication Date
JP2018190978A JP2018190978A (ja) 2018-11-29
JP2018190978A5 true JP2018190978A5 (enExample) 2021-05-20

Family

ID=64015476

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018087886A Pending JP2018190978A (ja) 2017-05-02 2018-04-29 対称的な給電構造を有する補助電極を用いてプラズマ処理チャンバ内のウェハエッジシースを変調する方法および受動的な方法で動作するとき制御可能なインピーダンスを接地し、能動的に電力を供給するときプラズマへの対称rf電力入力を可能とするドライブ

Country Status (5)

Country Link
US (1) US20180323042A1 (enExample)
JP (1) JP2018190978A (enExample)
KR (1) KR20180122295A (enExample)
CN (2) CN209266350U (enExample)
TW (1) TW201907439A (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9873180B2 (en) 2014-10-17 2018-01-23 Applied Materials, Inc. CMP pad construction with composite material properties using additive manufacturing processes
US11745302B2 (en) 2014-10-17 2023-09-05 Applied Materials, Inc. Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process
US10875153B2 (en) 2014-10-17 2020-12-29 Applied Materials, Inc. Advanced polishing pad materials and formulations
WO2016060712A1 (en) 2014-10-17 2016-04-21 Applied Materials, Inc. Cmp pad construction with composite material properties using additive manufacturing processes
US9776361B2 (en) 2014-10-17 2017-10-03 Applied Materials, Inc. Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles
US10593574B2 (en) 2015-11-06 2020-03-17 Applied Materials, Inc. Techniques for combining CMP process tracking data with 3D printed CMP consumables
US10391605B2 (en) 2016-01-19 2019-08-27 Applied Materials, Inc. Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
US11471999B2 (en) 2017-07-26 2022-10-18 Applied Materials, Inc. Integrated abrasive polishing pads and manufacturing methods
CN112654655A (zh) 2018-09-04 2021-04-13 应用材料公司 先进抛光垫配方
JP6960390B2 (ja) * 2018-12-14 2021-11-05 東京エレクトロン株式会社 給電構造及びプラズマ処理装置
WO2020146034A1 (en) * 2019-01-08 2020-07-16 Applied Materials, Inc. Recursive coils for inductively coupled plasmas
CN114743854B (zh) 2019-05-14 2025-02-25 玛特森技术公司 末端执行器和用于处理工件的系统
KR102848754B1 (ko) * 2019-07-29 2025-08-20 어플라이드 머티어리얼스, 인코포레이티드 개선된 고온 척킹을 갖는 반도체 기판 지지부들
JP2021103641A (ja) * 2019-12-25 2021-07-15 東京エレクトロン株式会社 プラズマ発生源の検査方法及び負荷
JP7454961B2 (ja) * 2020-03-05 2024-03-25 東京エレクトロン株式会社 プラズマ処理装置
JP7344821B2 (ja) * 2020-03-17 2023-09-14 東京エレクトロン株式会社 プラズマ処理装置
CN112331607B (zh) * 2020-10-28 2024-03-26 北京北方华创微电子装备有限公司 静电卡盘及半导体工艺设备
JP7544450B2 (ja) * 2021-03-17 2024-09-03 東京エレクトロン株式会社 プラズマ処理装置
JP7557429B2 (ja) * 2021-05-27 2024-09-27 東京エレクトロン株式会社 プラズマ処理装置
KR102932754B1 (ko) * 2021-12-24 2026-03-04 삼성전자주식회사 에지 링 어셈블리를 포함하는 기판 처리 장치 및 이를 이용한 기판 처리 방법
WO2025164456A1 (ja) * 2024-02-02 2025-08-07 東京エレクトロン株式会社 プラズマ処理装置
US12463075B2 (en) * 2024-02-23 2025-11-04 Applied Materials, Inc. Cathode assembly for integration of embedded electrostatic chuck (ESC)
US20250299929A1 (en) * 2024-03-25 2025-09-25 Applied Materials, Inc. Substrate support assembly having an edge voltage delivery system

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5822171A (en) * 1994-02-22 1998-10-13 Applied Materials, Inc. Electrostatic chuck with improved erosion resistance
US5633073A (en) * 1995-07-14 1997-05-27 Applied Materials, Inc. Ceramic susceptor with embedded metal electrode and eutectic connection
KR100796830B1 (ko) * 2000-04-12 2008-01-22 아익스트론 아게 기판코팅방법 수행용 반응실
US7311784B2 (en) * 2002-11-26 2007-12-25 Tokyo Electron Limited Plasma processing device
US7572737B1 (en) * 2006-06-30 2009-08-11 Lam Research Corporation Apparatus and methods for adjusting an edge ring potential substrate processing
US9536711B2 (en) * 2007-03-30 2017-01-03 Lam Research Corporation Method and apparatus for DC voltage control on RF-powered electrode
US8691047B2 (en) * 2009-11-17 2014-04-08 Applied Materials, Inc. Large area plasma processing chamber with at-electrode RF matching
US9443753B2 (en) * 2010-07-30 2016-09-13 Applied Materials, Inc. Apparatus for controlling the flow of a gas in a process chamber
KR101202957B1 (ko) * 2010-10-19 2012-11-20 주성엔지니어링(주) 플라즈마 발생용 안테나 및 이를 포함하는 기판처리장치
US9412579B2 (en) * 2012-04-26 2016-08-09 Applied Materials, Inc. Methods and apparatus for controlling substrate uniformity
US10580623B2 (en) * 2013-11-19 2020-03-03 Applied Materials, Inc. Plasma processing using multiple radio frequency power feeds for improved uniformity

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