JP2018136346A - 放射線画像取得装置および放射線画像取得装置の調整方法 - Google Patents
放射線画像取得装置および放射線画像取得装置の調整方法 Download PDFInfo
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- JP2018136346A JP2018136346A JP2018098853A JP2018098853A JP2018136346A JP 2018136346 A JP2018136346 A JP 2018136346A JP 2018098853 A JP2018098853 A JP 2018098853A JP 2018098853 A JP2018098853 A JP 2018098853A JP 2018136346 A JP2018136346 A JP 2018136346A
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- 230000005855 radiation Effects 0.000 title claims abstract description 115
- 238000000034 method Methods 0.000 title description 7
- 238000006243 chemical reaction Methods 0.000 claims abstract description 136
- 238000003384 imaging method Methods 0.000 claims abstract description 126
- 230000003287 optical effect Effects 0.000 claims abstract description 71
- 230000004044 response Effects 0.000 claims abstract description 5
- 230000000007 visual effect Effects 0.000 description 26
- 238000001514 detection method Methods 0.000 description 20
- 238000004364 calculation method Methods 0.000 description 14
- 230000008859 change Effects 0.000 description 13
- 230000007246 mechanism Effects 0.000 description 9
- 230000005540 biological transmission Effects 0.000 description 5
- 238000002591 computed tomography Methods 0.000 description 5
- 230000001681 protective effect Effects 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 3
- 238000004846 x-ray emission Methods 0.000 description 3
- 229910052684 Cerium Inorganic materials 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 229910052688 Gadolinium Inorganic materials 0.000 description 1
- 229910052771 Terbium Inorganic materials 0.000 description 1
- 230000001154 acute effect Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 235000013305 food Nutrition 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
Abstract
Description
Claims (1)
- 対象物に向けて放射線を出射する放射線源と、
前記放射線源から出射され、前記対象物を透過した前記放射線の入射に応じてシンチレーション光を発生する波長変換部材と、
前記波長変換部材の前記放射線の入射面から出射されるシンチレーション光を撮像する第1の撮像手段と、
前記第1の撮像手段の光軸と前記波長変換部材の前記入射面とがなす角度を保ちながら、前記第1の撮像手段と前記波長変換部材とを回転させる調整手段と、
を備える、放射線画像取得装置。
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JP2018098853A JP6671413B2 (ja) | 2018-05-23 | 2018-05-23 | 放射線画像取得装置 |
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JP2018098853A JP6671413B2 (ja) | 2018-05-23 | 2018-05-23 | 放射線画像取得装置 |
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JP2016037356A Division JP6345720B2 (ja) | 2016-02-29 | 2016-02-29 | 放射線画像取得装置および放射線画像取得装置の調整方法 |
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JP2018136346A true JP2018136346A (ja) | 2018-08-30 |
JP6671413B2 JP6671413B2 (ja) | 2020-03-25 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3933446A4 (en) * | 2019-02-27 | 2022-11-30 | Hamamatsu Photonics K.K. | SCINTILLATOR ATTACHMENT STRUCTURE IN A RADIATION IMAGING UNIT |
Citations (9)
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JP2001215201A (ja) * | 2000-02-02 | 2001-08-10 | Matsushita Electric Ind Co Ltd | X線撮影方法と装置 |
JP2001356173A (ja) * | 2000-06-13 | 2001-12-26 | Konica Corp | 放射線画像撮像装置及び放射線画像撮像方法 |
US20070114425A1 (en) * | 2005-11-22 | 2007-05-24 | Eastman Kodak Company | Radiographic image sensing system |
JP2007155653A (ja) * | 2005-12-08 | 2007-06-21 | Olympus Corp | 放射線観察装置 |
JP2007178228A (ja) * | 2005-12-27 | 2007-07-12 | Shimadzu Corp | X線検査装置 |
JP2008164429A (ja) * | 2006-12-28 | 2008-07-17 | Ishikawajima Inspection & Instrumentation Co | X線検査装置用のx線センサ |
JP2009180719A (ja) * | 2008-02-01 | 2009-08-13 | Ishida Co Ltd | X線検査装置 |
JP2010223837A (ja) * | 2009-03-24 | 2010-10-07 | Toshiba Corp | 放射線検出器、x線ct装置、及び放射線検出器の製造方法 |
JP2012090770A (ja) * | 2010-10-27 | 2012-05-17 | Rf:Kk | 放射線撮像装置 |
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- 2018-05-23 JP JP2018098853A patent/JP6671413B2/ja active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001215201A (ja) * | 2000-02-02 | 2001-08-10 | Matsushita Electric Ind Co Ltd | X線撮影方法と装置 |
JP2001356173A (ja) * | 2000-06-13 | 2001-12-26 | Konica Corp | 放射線画像撮像装置及び放射線画像撮像方法 |
US20070114425A1 (en) * | 2005-11-22 | 2007-05-24 | Eastman Kodak Company | Radiographic image sensing system |
JP2007155653A (ja) * | 2005-12-08 | 2007-06-21 | Olympus Corp | 放射線観察装置 |
JP2007178228A (ja) * | 2005-12-27 | 2007-07-12 | Shimadzu Corp | X線検査装置 |
JP2008164429A (ja) * | 2006-12-28 | 2008-07-17 | Ishikawajima Inspection & Instrumentation Co | X線検査装置用のx線センサ |
JP2009180719A (ja) * | 2008-02-01 | 2009-08-13 | Ishida Co Ltd | X線検査装置 |
JP2010223837A (ja) * | 2009-03-24 | 2010-10-07 | Toshiba Corp | 放射線検出器、x線ct装置、及び放射線検出器の製造方法 |
JP2012090770A (ja) * | 2010-10-27 | 2012-05-17 | Rf:Kk | 放射線撮像装置 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3933446A4 (en) * | 2019-02-27 | 2022-11-30 | Hamamatsu Photonics K.K. | SCINTILLATOR ATTACHMENT STRUCTURE IN A RADIATION IMAGING UNIT |
US11693132B2 (en) | 2019-02-27 | 2023-07-04 | Hamamatsu Photonics K.K. | Scintillator attachment structure in radiation imaging unit |
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