JP2018101779A5 - - Google Patents
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- Publication number
- JP2018101779A5 JP2018101779A5 JP2017237854A JP2017237854A JP2018101779A5 JP 2018101779 A5 JP2018101779 A5 JP 2018101779A5 JP 2017237854 A JP2017237854 A JP 2017237854A JP 2017237854 A JP2017237854 A JP 2017237854A JP 2018101779 A5 JP2018101779 A5 JP 2018101779A5
- Authority
- JP
- Japan
- Prior art keywords
- shape
- template
- active region
- adaptive chuck
- correspondence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003044 adaptive effect Effects 0.000 claims 29
- 238000000034 method Methods 0.000 claims 17
- 238000001459 lithography Methods 0.000 claims 3
- 238000001514 detection method Methods 0.000 claims 2
- 238000004519 manufacturing process Methods 0.000 claims 1
- 229920000642 polymer Polymers 0.000 claims 1
- 230000000379 polymerizing effect Effects 0.000 claims 1
- 239000000758 substrate Substances 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/385,189 | 2016-12-20 | ||
| US15/385,189 US10578984B2 (en) | 2016-12-20 | 2016-12-20 | Adaptive chucking system |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018101779A JP2018101779A (ja) | 2018-06-28 |
| JP2018101779A5 true JP2018101779A5 (enExample) | 2021-01-28 |
| JP7085827B2 JP7085827B2 (ja) | 2022-06-17 |
Family
ID=62556290
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017237854A Active JP7085827B2 (ja) | 2016-12-20 | 2017-12-12 | テンプレートの形状を調整する方法、システム、インプリントリソグラフィ方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US10578984B2 (enExample) |
| JP (1) | JP7085827B2 (enExample) |
| KR (1) | KR102272038B1 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10276455B2 (en) * | 2016-07-29 | 2019-04-30 | Taiwan Semiconductor Manufacturing Co., Ltd. | System and method for measurement of semiconductor device fabrication tool implement |
| JP7286391B2 (ja) | 2019-04-16 | 2023-06-05 | キヤノン株式会社 | インプリント装置及び物品の製造方法 |
| US11728203B2 (en) | 2020-10-13 | 2023-08-15 | Canon Kabushiki Kaisha | Chuck assembly, planarization process, apparatus and method of manufacturing an article |
| US12463081B2 (en) | 2023-05-31 | 2025-11-04 | Canon Kabushiki Kaisha | Apparatus including a bonding head and a method of using the same |
| CN118009890B (zh) * | 2024-04-09 | 2024-06-21 | 佛山市仟安金属制品有限公司 | 一种五金件手持对比测量装置 |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6873087B1 (en) | 1999-10-29 | 2005-03-29 | Board Of Regents, The University Of Texas System | High precision orientation alignment and gap control stages for imprint lithography processes |
| US6932934B2 (en) | 2002-07-11 | 2005-08-23 | Molecular Imprints, Inc. | Formation of discontinuous films during an imprint lithography process |
| US7019819B2 (en) | 2002-11-13 | 2006-03-28 | Molecular Imprints, Inc. | Chucking system for modulating shapes of substrates |
| US7077992B2 (en) | 2002-07-11 | 2006-07-18 | Molecular Imprints, Inc. | Step and repeat imprint lithography processes |
| US6980282B2 (en) | 2002-12-11 | 2005-12-27 | Molecular Imprints, Inc. | Method for modulating shapes of substrates |
| US7179396B2 (en) | 2003-03-25 | 2007-02-20 | Molecular Imprints, Inc. | Positive tone bi-layer imprint lithography method |
| US7396475B2 (en) | 2003-04-25 | 2008-07-08 | Molecular Imprints, Inc. | Method of forming stepped structures employing imprint lithography |
| US7157036B2 (en) | 2003-06-17 | 2007-01-02 | Molecular Imprints, Inc | Method to reduce adhesion between a conformable region and a pattern of a mold |
| US8076386B2 (en) | 2004-02-23 | 2011-12-13 | Molecular Imprints, Inc. | Materials for imprint lithography |
| WO2005119802A2 (en) | 2004-05-28 | 2005-12-15 | Board Of Regents, The University Of Texas System | Adaptive shape substrate support system and method |
| JP2007242893A (ja) * | 2006-03-08 | 2007-09-20 | Toshiba Corp | パターン転写方法およびパターン転写装置 |
| US8945444B2 (en) * | 2007-12-04 | 2015-02-03 | Canon Nanotechnologies, Inc. | High throughput imprint based on contact line motion tracking control |
| US8309008B2 (en) * | 2008-10-30 | 2012-11-13 | Molecular Imprints, Inc. | Separation in an imprint lithography process |
| US8913230B2 (en) | 2009-07-02 | 2014-12-16 | Canon Nanotechnologies, Inc. | Chucking system with recessed support feature |
| JP5759303B2 (ja) * | 2011-08-11 | 2015-08-05 | キヤノン株式会社 | インプリント装置、それを用いた物品の製造方法 |
| JP2013110162A (ja) * | 2011-11-17 | 2013-06-06 | Canon Inc | インプリント装置及び物品の製造方法 |
| JP6021606B2 (ja) * | 2011-11-28 | 2016-11-09 | キヤノン株式会社 | インプリント装置、それを用いた物品の製造方法、およびインプリント方法 |
| DE102012111114B4 (de) * | 2012-11-19 | 2018-10-04 | Ev Group E. Thallner Gmbh | Halbleiterbearbeitungsvorrichtung und -verfahren |
| JP2015050437A (ja) * | 2013-09-04 | 2015-03-16 | キヤノン株式会社 | インプリント装置および物品の製造方法 |
| CN105934711B (zh) | 2013-11-08 | 2019-10-25 | 佳能纳米技术公司 | 用于改进的覆盖纠正的低接触式压印光刻术模板卡盘系统 |
| JP6361317B2 (ja) * | 2014-06-25 | 2018-07-25 | 大日本印刷株式会社 | 位置精度推定方法及び位置精度保証方法 |
-
2016
- 2016-12-20 US US15/385,189 patent/US10578984B2/en active Active
-
2017
- 2017-12-12 JP JP2017237854A patent/JP7085827B2/ja active Active
- 2017-12-19 KR KR1020170174767A patent/KR102272038B1/ko active Active
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