JP2017515091A - 電磁放射を送信及び受信するためのシステム - Google Patents
電磁放射を送信及び受信するためのシステム Download PDFInfo
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- JP2017515091A JP2017515091A JP2016540513A JP2016540513A JP2017515091A JP 2017515091 A JP2017515091 A JP 2017515091A JP 2016540513 A JP2016540513 A JP 2016540513A JP 2016540513 A JP2016540513 A JP 2016540513A JP 2017515091 A JP2017515091 A JP 2017515091A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/90—Non-optical transmission systems, e.g. transmission systems employing non-photonic corpuscular radiation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
- G01N21/3586—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/636—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited using an arrangement of pump beam and probe beam; using the measurement of optical non-linear properties
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/11—Arrangements specific to free-space transmission, i.e. transmission through air or vacuum
- H04B10/114—Indoor or close-range type systems
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/25—Arrangements specific to fibre transmission
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Abstract
Description
本発明は、契約NNX12CA81Cに基づき米航空宇宙局(NASA)により授与された米国政府の助成を用いてなされた。米国政府は、本発明における一定の権利を有する。
Claims (20)
- 電磁放射を送信及び受信するためのシステムであって、
光パルスをポンプ・パルスとプローブ・パルスに分離するように構成されたビーム・スプリッタと、
送信器スイッチ及び受信器スイッチを有するトランシーバであって、前記ポンプ・パルスが、前記送信器スイッチに向けられ、前記プローブ・パルスが前記受信器スイッチに向けられる、前記トランシーバとを備え、
前記ポンプ・パルスが前記送信器スイッチに達すると、電磁放射が前記トランシーバから発せられる、システム。 - 単一の光ファイバをさらに備え、前記光パルスが、前記単一の光ファイバを介して前記ビーム・スプリッタに提供される、請求項1に記載のシステム。
- 前記単一の光ファイバが、偏波保持ファイバである、請求項2に記載のシステム。
- 前記ポンプ・パルス及び前記プローブ・パルスが、前記偏波保持ファイバ中にあるとき、直交的に偏光される、請求項3に記載のシステム。
- 前記光パルスが前記単一の光ファイバを通って伝播するとき引き起こされる前記光パルスの分散を補償するために、前記単一の光ファイバと光通信する分散補償器をさらに備える、請求項2に記載のシステム。
- 前記電磁放射がテラヘルツ放射である、請求項1に記載のシステム。
- 前記テラヘルツ放射が、連続的な波形のテラヘルツ放射又はパルス化テラヘルツ放射のいずれかである、請求項6に記載のシステム。
- 前記送信器スイッチと受信器スイッチが互いに分離される、請求項1に記載のシステム。
- 前記送信器スイッチと受信器スイッチが、1マイクロメータから1ミリメータの距離だけ互いに分離される、請求項8に記載のシステム。
- 前記送信器スイッチと受信器スイッチが、それぞれアンテナを有する、請求項1に記載のシステム。
- 前記送信器スイッチ用の前記アンテナが、前記受信器スイッチ用の前記アンテナに対して垂直である、請求項10に記載のシステム。
- 前記送信器スイッチと受信器スイッチが、単一のアンテナを利用する、請求項10に記載のシステム。
- 前記送信器スイッチと受信器スイッチが、ハイパス・キャパシタによって互いに電気的に隔離される、請求項12に記載のシステム。
- 前記ビーム・スプリッタが、複屈折ウィンドウである、請求項1に記載のシステム。
- 前記複屈折ウィンドウが、オルトバナジン酸イットリウム又はカルサイトのいずれかから作製される、請求項14に記載のシステム。
- 前記単一の光ファイバからの前記光パルスを集束するために、前記単一の光ファイバと前記ビーム・スプリッタとの間に位置する光集束部をさらに備える、請求項1に記載のシステム。
- 前記光集束部が、グリン・レンズである、請求項16に記載のシステム。
- 半球レンズをさらに備え、前記トランシーバが、前記半球レンズの平面側に取り付けられる、請求項1に記載のシステム。
- 前記受信器スイッチが、前記送信器スイッチによって発せられ、標本から反射される前記電磁放射の少なくとも一部を受信するように構成される、請求項1に記載のシステム。
- 第2のトランシーバをさらに備え、前記第2のトランシーバが、前記送信器スイッチによって発せられ、標本を通る前記電磁放射の少なくとも一部を受信するように構成される、請求項1に記載のシステム。
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US201361917151P | 2013-12-17 | 2013-12-17 | |
US61/917,151 | 2013-12-17 | ||
PCT/US2014/070729 WO2015112284A2 (en) | 2013-12-17 | 2014-12-17 | System for transmitting and receiving electromagnetic radiation |
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JP2017515091A true JP2017515091A (ja) | 2017-06-08 |
JP6441936B2 JP6441936B2 (ja) | 2018-12-19 |
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US (1) | US9998236B2 (ja) |
EP (1) | EP3084376B1 (ja) |
JP (1) | JP6441936B2 (ja) |
KR (1) | KR102278849B1 (ja) |
CN (1) | CN105917200B (ja) |
CA (1) | CA2933870C (ja) |
WO (1) | WO2015112284A2 (ja) |
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2016070273A1 (en) * | 2014-11-07 | 2016-05-12 | Institut National De La Recherche Scientifique | Method and apparatus for characterization of terahertz radiation |
CN106603156B (zh) * | 2016-12-22 | 2018-01-16 | 深圳市太赫兹科技创新研究院 | 基于极化编码的太赫兹数字通信系统及方法 |
CN109406441B (zh) * | 2018-02-09 | 2020-12-11 | 雄安华讯方舟科技有限公司 | 太赫兹时域光谱仪 |
US11913151B2 (en) | 2021-01-11 | 2024-02-27 | Fitesa Simpsonville, Inc. | Nonwoven fabric having a single layer with a plurality of different fiber types, and an apparatus, system, and method for producing same |
US11733156B2 (en) | 2021-02-23 | 2023-08-22 | Joseph R. Demers | Semiconductor package for free-space coupling of radiation and method |
US11680897B2 (en) * | 2021-02-23 | 2023-06-20 | Joseph R. Demers | Multi-pass spectroscopy apparatus, associated sample holder and methods |
DE102021125196A1 (de) * | 2021-09-29 | 2023-03-30 | CiTEX Holding GmbH | THz-Messvorrichtung und Verfahren zum Vermessen eines Messobjektes |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004500582A (ja) * | 2000-04-06 | 2004-01-08 | レンセレイアー ポリテクニック インスティテュート | テラヘルツトランシーバーならびにこのようなトランシーバーを用いるテラヘルツパルスの放出および検出のための方法 |
JP2004522151A (ja) * | 2001-01-30 | 2004-07-22 | テラビュー リミテッド | サンプルを調べるためのプローブ、トランシーバ及び方法 |
JP2005524864A (ja) * | 2002-05-02 | 2005-08-18 | コーニング インコーポレイテッド | 光アイソレータ、及び直接接合を用いる作成方法 |
JP2006313140A (ja) * | 2005-05-07 | 2006-11-16 | Junichi Nishizawa | テラヘルツ波発生装置及び方法あるいは分光計測装置及び方法 |
US20080179528A1 (en) * | 2007-01-31 | 2008-07-31 | Emcore Corp. | Pulsed terahertz frequency domain spectrometer with single mode-locked laser and dispersive phase modulator |
JP2009540546A (ja) * | 2006-06-02 | 2009-11-19 | ピコメトリクス、エルエルシー | 光分配ファイバのための分散および非線形補償器 |
JP2013068528A (ja) * | 2011-09-22 | 2013-04-18 | Aisin Seiki Co Ltd | テラヘルツ波伝播装置、及びテラヘルツ波発生部又は検出部の固定部材 |
Family Cites Families (40)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4303802A (en) * | 1979-06-04 | 1981-12-01 | Venmark Corporation | Monitoring system using telephone circuit |
US5323260A (en) * | 1991-08-23 | 1994-06-21 | Alfano Robert R | Method and system for compressing and amplifying ultrashort laser pulses |
US5347601A (en) * | 1993-03-29 | 1994-09-13 | United Technologies Corporation | Integrated optical receiver/transmitter |
US6816647B1 (en) * | 1999-10-14 | 2004-11-09 | Picometrix, Inc. | Compact fiber pigtailed terahertz modules |
CA2396695C (en) * | 1999-12-28 | 2010-04-13 | Picometrix, Inc. | System and method for monitoring changes in state of matter with terahertz radiation |
US6344829B1 (en) * | 2000-05-11 | 2002-02-05 | Agilent Technologies, Inc. | High-isolation, common focus, transmit-receive antenna set |
US7061327B2 (en) * | 2002-01-24 | 2006-06-13 | Maxim Integrated Products, Inc. | Single supply headphone driver/charge pump combination |
US6977379B2 (en) * | 2002-05-10 | 2005-12-20 | Rensselaer Polytechnic Institute | T-ray Microscope |
US8759778B2 (en) * | 2007-09-27 | 2014-06-24 | Anis Rahman | Terahertz time domain and frequency domain spectroscopy |
CN100347764C (zh) * | 2003-10-28 | 2007-11-07 | 松下电器产业株式会社 | 信息再生装置及其电位差抑制电路和该电路实现方法 |
US7291839B1 (en) * | 2004-05-03 | 2007-11-06 | Emcore Corporation | Subcentimeter radiation detection and frequency domain spectroscopy |
WO2006019776A2 (en) * | 2004-07-14 | 2006-02-23 | William Marsh Rice University | A method for coupling terahertz pulses into a coaxial waveguide |
WO2006072762A1 (en) * | 2005-01-05 | 2006-07-13 | Isis Innovation Limited | Polarization sensitive electromagnetic radiation detector |
US7345279B2 (en) * | 2005-09-20 | 2008-03-18 | Coherent, Inc. | Identification of hidden objects by terahertz heterodyne laser imaging |
US20070159760A1 (en) * | 2005-05-13 | 2007-07-12 | Collins Clark | Methods and Systems Related to Pulsed Power |
JP4759380B2 (ja) * | 2005-12-12 | 2011-08-31 | 株式会社日立製作所 | 光通信用光学プリズム及び光送受信モジュール |
JP2009528781A (ja) * | 2006-02-28 | 2009-08-06 | ルネサンス・ワイヤレス | Rfトランシーバスイッチングシステム |
GB2438215B (en) * | 2006-05-19 | 2011-06-08 | Teraview Ltd | A THz investigation apparatus and method |
US7531803B2 (en) * | 2006-07-14 | 2009-05-12 | William Marsh Rice University | Method and system for transmitting terahertz pulses |
US7831210B1 (en) * | 2006-12-01 | 2010-11-09 | Rockwell Collins, Inc. | MEMS-based broadband transceiver/sensor |
WO2008147575A2 (en) * | 2007-01-11 | 2008-12-04 | Rensselaer Polytechnic Institute | Systems, methods, and devices for handling terahertz radiation |
US7535005B2 (en) * | 2007-01-31 | 2009-05-19 | Emcore Corporation | Pulsed terahertz spectrometer |
CN101802551A (zh) * | 2007-07-12 | 2010-08-11 | 派克米瑞斯有限责任公司 | 测量时域数据中脉冲的渡越时间位置的系统和方法 |
US20090066948A1 (en) * | 2007-09-07 | 2009-03-12 | Hydroelectron Ventures, Inc. | Compact Terahertz Spectrometer Using Optical Beam Recycling and Heterodyne Detection |
JP5341488B2 (ja) * | 2008-01-18 | 2013-11-13 | キヤノン株式会社 | テラヘルツ波を測定するための装置及び方法 |
US7936453B2 (en) * | 2008-04-04 | 2011-05-03 | Emcore Corporation | Terahertz frequency domain spectrometer with integrated dual laser module |
US8604433B2 (en) * | 2008-05-19 | 2013-12-10 | Emcore Corporation | Terahertz frequency domain spectrometer with frequency shifting of source laser beam |
US9029775B2 (en) * | 2008-05-19 | 2015-05-12 | Joseph R. Demers | Terahertz frequency domain spectrometer with phase modulation of source laser beam |
US20090309645A1 (en) * | 2008-06-13 | 2009-12-17 | Nonin Medical, Inc. | Switched capacitor apparatus providing integration of an input signal |
CA2759983C (en) * | 2009-04-27 | 2017-06-06 | Picometrix, Llc | System and method reducing fiber stretch induced timing errors in fiber optic coupled time domain terahertz systems |
WO2011098943A1 (en) * | 2010-02-15 | 2011-08-18 | Koninklijke Philips Electronics N.V. | Device for analyzing a sample using radiation in the terahertz frequency range |
JP5489906B2 (ja) * | 2010-08-05 | 2014-05-14 | キヤノン株式会社 | テラヘルツ波トランシーバ及び断層像取得装置 |
CN102749332B (zh) * | 2011-04-18 | 2015-08-26 | 通用电气公司 | 光学系统和光学检测装置以及检测方法 |
CN102759404B (zh) * | 2011-04-29 | 2014-04-30 | 深圳光启高等理工研究院 | 一种电磁波检测装置 |
US9195015B2 (en) * | 2011-06-29 | 2015-11-24 | Source Photonics, Inc. | Bi-directional fiber optic transceivers, housings therefor, and methods for making and using the same |
JP2014001925A (ja) * | 2012-06-14 | 2014-01-09 | Canon Inc | 測定装置及び方法、トモグラフィ装置及び方法 |
EP2717446A1 (en) * | 2012-10-05 | 2014-04-09 | Dialog Semiconductor GmbH | Powering down switching regulator using a ramped reference voltage |
US9400214B1 (en) * | 2013-03-15 | 2016-07-26 | Joseph R. Demers | Terahertz frequency domain spectrometer with a single photoconductive element for terahertz signal generation and detection |
EP2803960A1 (de) * | 2013-05-13 | 2014-11-19 | Philipps Universität Marburg | Verfahren zur Signalanalyse und mit einem Transceiver ausgestattetes THz- Zeitbereichsspektrometer zu seiner Anwendung |
CN105829866B (zh) * | 2013-11-15 | 2019-07-02 | 派克米瑞斯有限责任公司 | 用于使用太赫兹辐射确定片状电介质样本的至少一种性质的系统 |
-
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Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004500582A (ja) * | 2000-04-06 | 2004-01-08 | レンセレイアー ポリテクニック インスティテュート | テラヘルツトランシーバーならびにこのようなトランシーバーを用いるテラヘルツパルスの放出および検出のための方法 |
JP2004522151A (ja) * | 2001-01-30 | 2004-07-22 | テラビュー リミテッド | サンプルを調べるためのプローブ、トランシーバ及び方法 |
JP2005524864A (ja) * | 2002-05-02 | 2005-08-18 | コーニング インコーポレイテッド | 光アイソレータ、及び直接接合を用いる作成方法 |
JP2006313140A (ja) * | 2005-05-07 | 2006-11-16 | Junichi Nishizawa | テラヘルツ波発生装置及び方法あるいは分光計測装置及び方法 |
JP2009540546A (ja) * | 2006-06-02 | 2009-11-19 | ピコメトリクス、エルエルシー | 光分配ファイバのための分散および非線形補償器 |
US20080179528A1 (en) * | 2007-01-31 | 2008-07-31 | Emcore Corp. | Pulsed terahertz frequency domain spectrometer with single mode-locked laser and dispersive phase modulator |
JP2013068528A (ja) * | 2011-09-22 | 2013-04-18 | Aisin Seiki Co Ltd | テラヘルツ波伝播装置、及びテラヘルツ波発生部又は検出部の固定部材 |
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WO2015112284A2 (en) | 2015-07-30 |
CA2933870C (en) | 2021-11-23 |
CN105917200A (zh) | 2016-08-31 |
JP6441936B2 (ja) | 2018-12-19 |
KR20160099595A (ko) | 2016-08-22 |
EP3084376A2 (en) | 2016-10-26 |
EP3084376B1 (en) | 2019-01-16 |
KR102278849B1 (ko) | 2021-07-20 |
EP3084376A4 (en) | 2017-08-09 |
US20160315716A1 (en) | 2016-10-27 |
CN105917200B (zh) | 2019-07-02 |
CA2933870A1 (en) | 2015-07-30 |
US9998236B2 (en) | 2018-06-12 |
WO2015112284A3 (en) | 2015-10-08 |
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