JP2017500160A5 - - Google Patents

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JP2017500160A5
JP2017500160A5 JP2016542973A JP2016542973A JP2017500160A5 JP 2017500160 A5 JP2017500160 A5 JP 2017500160A5 JP 2016542973 A JP2016542973 A JP 2016542973A JP 2016542973 A JP2016542973 A JP 2016542973A JP 2017500160 A5 JP2017500160 A5 JP 2017500160A5
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grating
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ray detector
ray
interference fringes
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JP6448649B2 (ja
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JP2016542973A 2013-12-30 2014-11-18 収集及び再構築技術を含む離調構成に基づく大視野位相差撮影法 Expired - Fee Related JP6448649B2 (ja)

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Application Number Priority Date Filing Date Title
US14/143,254 2013-12-30
US14/143,254 US9357975B2 (en) 2013-12-30 2013-12-30 Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques
PCT/US2014/066027 WO2015102756A1 (en) 2013-12-30 2014-11-18 Large fov phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques

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JP2017500160A JP2017500160A (ja) 2017-01-05
JP2017500160A5 true JP2017500160A5 (OSRAM) 2017-11-24
JP6448649B2 JP6448649B2 (ja) 2019-01-09

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JP2016542973A Expired - Fee Related JP6448649B2 (ja) 2013-12-30 2014-11-18 収集及び再構築技術を含む離調構成に基づく大視野位相差撮影法

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US (2) US9357975B2 (OSRAM)
EP (1) EP3090253A1 (OSRAM)
JP (1) JP6448649B2 (OSRAM)
CN (1) CN105874323A (OSRAM)
WO (1) WO2015102756A1 (OSRAM)

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