JP2017521170A5 - - Google Patents

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Publication number
JP2017521170A5
JP2017521170A5 JP2017502174A JP2017502174A JP2017521170A5 JP 2017521170 A5 JP2017521170 A5 JP 2017521170A5 JP 2017502174 A JP2017502174 A JP 2017502174A JP 2017502174 A JP2017502174 A JP 2017502174A JP 2017521170 A5 JP2017521170 A5 JP 2017521170A5
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JP
Japan
Prior art keywords
grating
segment
ray
ray imaging
imaging apparatus
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JP2017502174A
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English (en)
Japanese (ja)
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JP6475315B2 (ja
JP2017521170A (ja
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Priority claimed from PCT/EP2015/065405 external-priority patent/WO2016008762A1/en
Publication of JP2017521170A publication Critical patent/JP2017521170A/ja
Publication of JP2017521170A5 publication Critical patent/JP2017521170A5/ja
Application granted granted Critical
Publication of JP6475315B2 publication Critical patent/JP6475315B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2017502174A 2014-07-17 2015-07-07 Ｘ線イメージング装置 Expired - Fee Related JP6475315B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP14177486.9 2014-07-17
EP14177486 2014-07-17
PCT/EP2015/065405 WO2016008762A1 (en) 2014-07-17 2015-07-07 X-ray imaging device

Publications (3)

Publication Number Publication Date
JP2017521170A JP2017521170A (ja) 2017-08-03
JP2017521170A5 true JP2017521170A5 (OSRAM) 2018-08-09
JP6475315B2 JP6475315B2 (ja) 2019-02-27

Family

ID=51211608

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017502174A Expired - Fee Related JP6475315B2 (ja) 2014-07-17 2015-07-07 Ｘ線イメージング装置

Country Status (6)

Country Link
US (1) US10368815B2 (OSRAM)
EP (1) EP3169239B1 (OSRAM)
JP (1) JP6475315B2 (OSRAM)
CN (1) CN106535767B (OSRAM)
RU (1) RU2695311C2 (OSRAM)
WO (1) WO2016008762A1 (OSRAM)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107106101B (zh) * 2014-12-22 2020-04-24 株式会社岛津制作所 放射线相位差摄影装置
JP6753342B2 (ja) * 2017-03-15 2020-09-09 株式会社島津製作所 放射線格子検出器およびｘ線検査装置
US10441234B2 (en) * 2017-06-15 2019-10-15 Shimadzu Corporation Radiation-phase-contrast imaging device
JP6743983B2 (ja) * 2017-10-31 2020-08-19 株式会社島津製作所 Ｘ線位相差撮像システム
CN111089870B (zh) * 2019-12-12 2022-07-19 中国科学院苏州生物医学工程技术研究所 基于两次成像的x射线光栅相衬成像方法及系统、存储介质、设备
EP4029451A1 (en) 2021-01-19 2022-07-20 Koninklijke Philips N.V. An x-ray imaging system and method
US11860319B2 (en) * 2022-03-10 2024-01-02 GE Precision Healthcare LLC High-resolution detector having a reduced number of pixels

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5400379A (en) 1994-02-25 1995-03-21 General Electric Company Multi-slice x-ray CT using a detector mask
DE102009004702B4 (de) * 2009-01-15 2019-01-31 Paul Scherer Institut Anordnung und Verfahren zur projektiven und/oder tomographischen Phasenkontrastbildgebung mit Röntgenstrahlung
WO2010109390A1 (en) * 2009-03-27 2010-09-30 Koninklijke Philips Electronics N. V. Achromatic phase-contrast imaging
WO2010120525A1 (en) * 2009-04-01 2010-10-21 Brookhaven Science Associates Interwoven multi-aperture collimator for 3-dimensional radiation imaging applications
JP2010253194A (ja) 2009-04-28 2010-11-11 Fujifilm Corp 放射線位相画像撮影装置
CN102802529B (zh) * 2009-06-16 2015-09-16 皇家飞利浦电子股份有限公司 用于微分相衬成像的校正方法
JP5213923B2 (ja) 2010-01-29 2013-06-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
WO2012029005A1 (en) 2010-09-03 2012-03-08 Koninklijke Philips Electronics N.V. Differential phase-contrast imaging with improved sampling
EP2630476B1 (en) 2010-10-19 2017-12-13 Koninklijke Philips N.V. Differential phase-contrast imaging
JP2012166010A (ja) 2011-01-26 2012-09-06 Fujifilm Corp 放射線画像撮影装置および放射線画像検出器
US9597050B2 (en) 2012-01-24 2017-03-21 Koninklijke Philips N.V. Multi-directional phase contrast X-ray imaging
CN104869905B (zh) * 2012-12-21 2019-08-06 卡尔斯特里姆保健公司 基于微分相衬成像的医疗放射照相光栅
DE102012224258A1 (de) 2012-12-21 2014-06-26 Siemens Aktiengesellschaft Röntgenaufnahmesystem zur differentiellen Phasenkontrast-Bildgebung eines Untersuchungsobjekts mit Phase-Stepping sowie angiographisches Untersuchungsverfahren
JP2014142338A (ja) 2012-12-27 2014-08-07 Canon Inc 干渉計及び被検体情報取得システム
JP6106809B2 (ja) 2013-09-30 2017-04-05 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 可動式格子を含む微分位相コントラスト撮像装置
JP2014100063A (ja) 2014-03-03 2014-05-29 Fuji Electric Co Ltd 電源装置

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