JP2011189118A5 - - Google Patents

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Publication number
JP2011189118A5
JP2011189118A5 JP2011004533A JP2011004533A JP2011189118A5 JP 2011189118 A5 JP2011189118 A5 JP 2011189118A5 JP 2011004533 A JP2011004533 A JP 2011004533A JP 2011004533 A JP2011004533 A JP 2011004533A JP 2011189118 A5 JP2011189118 A5 JP 2011189118A5
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JP
Japan
Prior art keywords
shielding
grating
ray
relative position
interference pattern
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JP2011004533A
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Japanese (ja)
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JP2011189118A (ja
JP5725870B2 (ja
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Publication of JP2011189118A5 publication Critical patent/JP2011189118A5/ja
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JP2011004533A 2010-02-22 2011-01-13 Ｘ線撮像装置およびｘ線撮像方法 Expired - Fee Related JP5725870B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2011004533A JP5725870B2 (ja) 2010-02-22 2011-01-13 Ｘ線撮像装置およびｘ線撮像方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2010035746 2010-02-22
JP2010035746 2010-02-22
JP2011004533A JP5725870B2 (ja) 2010-02-22 2011-01-13 Ｘ線撮像装置およびｘ線撮像方法

Publications (3)

Publication Number Publication Date
JP2011189118A JP2011189118A (ja) 2011-09-29
JP2011189118A5 true JP2011189118A5 (OSRAM) 2014-02-27
JP5725870B2 JP5725870B2 (ja) 2015-05-27

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JP2011004533A Expired - Fee Related JP5725870B2 (ja) 2010-02-22 2011-01-13 Ｘ線撮像装置およびｘ線撮像方法

Country Status (3)

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US (1) US8831174B2 (OSRAM)
JP (1) JP5725870B2 (OSRAM)
WO (1) WO2011102247A2 (OSRAM)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5631013B2 (ja) 2010-01-28 2014-11-26 キヤノン株式会社 Ｘ線撮像装置
BR112013009253A2 (pt) * 2010-10-19 2019-09-24 Koninl Philips Electronics Nv grade difração para obtenção de imagem por contraste da fase diferencial, disposição de detector de um sistema de raios x para gerar imagens por contraste de fase de um objeto, sistema de obtenção de imagem de clínica por raios x, método para obtenção de umagem de contraste de fase diferencial, elemento de programa de computador e meio legível em computador
WO2012052881A1 (en) * 2010-10-19 2012-04-26 Koninklijke Philips Electronics N.V. Differential phase-contrast imaging
GB201112506D0 (en) * 2011-07-21 2011-08-31 Ucl Business Plc Phase imaging
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
US9826949B2 (en) * 2012-03-05 2017-11-28 University Of Rochester Methods and apparatus for differential phase-contrast cone-beam CT and hybrid cone-beam CT
CN104394770B (zh) * 2012-06-27 2018-06-08 皇家飞利浦有限公司 基于光栅的差分相位对比成像
JP2014140632A (ja) * 2012-12-27 2014-08-07 Canon Inc 演算装置、画像取得方法、プログラム、及びｘ線撮像システム
JP6191136B2 (ja) * 2013-01-10 2017-09-06 コニカミノルタ株式会社 画像生成方法
KR101370964B1 (ko) 2013-01-23 2014-03-12 주식회사 미르기술 모아레 프로젝터의 격자 간격 조정방법
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US10416099B2 (en) 2013-09-19 2019-09-17 Sigray, Inc. Method of performing X-ray spectroscopy and X-ray absorption spectrometer system
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
EP3066670B1 (en) * 2013-11-05 2017-06-28 Koninklijke Philips N.V. X-ray imaging device with fast spatial modulation of photon flux
JP2015166676A (ja) * 2014-03-03 2015-09-24 キヤノン株式会社 Ｘ線撮像システム
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
JP6667215B2 (ja) * 2014-07-24 2020-03-18 キヤノン株式会社 Ｘ線遮蔽格子、構造体、トールボット干渉計、ｘ線遮蔽格子の製造方法
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
JP6422123B2 (ja) * 2015-08-27 2018-11-14 国立大学法人東北大学 放射線画像生成装置
CN105067117B (zh) * 2015-09-18 2017-04-12 中国工程物理研究院激光聚变研究中心 一种高谱分辨与宽谱测量范围的透射光栅谱仪
WO2017176976A1 (en) * 2016-04-08 2017-10-12 Rensselaer Polytechnic Institute Rapid filtration methods for dual-energy x-ray ct
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
JP7195341B2 (ja) 2018-06-04 2022-12-23 シグレイ、インコーポレイテッド 波長分散型ｘ線分光計
CN112470245B (zh) 2018-07-26 2025-03-18 斯格瑞公司 高亮度x射线反射源
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
DE112019004433B4 (de) 2018-09-04 2024-09-12 Sigray, Inc. System und verfahren für röntgenstrahlfluoreszenz mit filterung
WO2020051221A2 (en) 2018-09-07 2020-03-12 Sigray, Inc. System and method for depth-selectable x-ray analysis
EP3922179A1 (en) * 2020-06-08 2021-12-15 Koninklijke Philips N.V. Stepping strategy for defect compensation in dax imaging

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3548664B2 (ja) * 1996-03-29 2004-07-28 株式会社日立製作所 位相コントラストｘ線撮像装置
DE102006037254B4 (de) * 2006-02-01 2017-08-03 Paul Scherer Institut Fokus-Detektor-Anordnung zur Erzeugung projektiver oder tomographischer Phasenkontrastaufnahmen mit röntgenoptischen Gittern, sowie Röntgen-System, Röntgen-C-Bogen-System und Röntgen-Computer-Tomographie-System
EP1879020A1 (en) * 2006-07-12 2008-01-16 Paul Scherrer Institut X-ray interferometer for phase contrast imaging
US8411816B2 (en) * 2007-02-21 2013-04-02 Konica Minolta Medical & Graphic, Inc. Radiological image capturing apparatus and radiological image capturing system
JP2008200360A (ja) * 2007-02-21 2008-09-04 Konica Minolta Medical & Graphic Inc Ｘ線撮影システム
JP2010035746A (ja) 2008-08-04 2010-02-18 Fujifilm Corp カプセル内視鏡システム、カプセル内視鏡及びカプセル内視鏡の動作制御方法
JP2010063646A (ja) * 2008-09-11 2010-03-25 Fujifilm Corp 放射線位相画像撮影装置
CN102197303A (zh) * 2008-10-29 2011-09-21 佳能株式会社 X射线成像装置和x射线成像方法
JP2010236986A (ja) * 2009-03-31 2010-10-21 Fujifilm Corp 放射線位相画像撮影装置
JP5631013B2 (ja) 2010-01-28 2014-11-26 キヤノン株式会社 Ｘ線撮像装置

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