JP2011174715A5 - - Google Patents

Download PDF

Info

Publication number
JP2011174715A5
JP2011174715A5 JP2010036909A JP2010036909A JP2011174715A5 JP 2011174715 A5 JP2011174715 A5 JP 2011174715A5 JP 2010036909 A JP2010036909 A JP 2010036909A JP 2010036909 A JP2010036909 A JP 2010036909A JP 2011174715 A5 JP2011174715 A5 JP 2011174715A5
Authority
JP
Japan
Prior art keywords
light
region
ray
pattern
imaging apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2010036909A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011174715A (ja
JP5586986B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2010036909A priority Critical patent/JP5586986B2/ja
Priority claimed from JP2010036909A external-priority patent/JP5586986B2/ja
Priority to US13/518,233 priority patent/US8995613B2/en
Priority to PCT/JP2011/053585 priority patent/WO2011105306A1/en
Publication of JP2011174715A publication Critical patent/JP2011174715A/ja
Publication of JP2011174715A5 publication Critical patent/JP2011174715A5/ja
Application granted granted Critical
Publication of JP5586986B2 publication Critical patent/JP5586986B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2010036909A 2010-02-23 2010-02-23 Ｘ線撮像装置 Expired - Fee Related JP5586986B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2010036909A JP5586986B2 (ja) 2010-02-23 2010-02-23 Ｘ線撮像装置
US13/518,233 US8995613B2 (en) 2010-02-23 2011-02-14 X-ray imaging apparatus
PCT/JP2011/053585 WO2011105306A1 (en) 2010-02-23 2011-02-14 X-ray imaging apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010036909A JP5586986B2 (ja) 2010-02-23 2010-02-23 Ｘ線撮像装置

Publications (3)

Publication Number Publication Date
JP2011174715A JP2011174715A (ja) 2011-09-08
JP2011174715A5 true JP2011174715A5 (OSRAM) 2013-04-11
JP5586986B2 JP5586986B2 (ja) 2014-09-10

Family

ID=44168061

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010036909A Expired - Fee Related JP5586986B2 (ja) 2010-02-23 2010-02-23 Ｘ線撮像装置

Country Status (3)

Country Link
US (1) US8995613B2 (OSRAM)
JP (1) JP5586986B2 (OSRAM)
WO (1) WO2011105306A1 (OSRAM)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5631013B2 (ja) 2010-01-28 2014-11-26 キヤノン株式会社 Ｘ線撮像装置
JP5796976B2 (ja) 2010-05-27 2015-10-21 キヤノン株式会社 Ｘ線撮像装置
BR112013009253A2 (pt) 2010-10-19 2019-09-24 Koninl Philips Electronics Nv grade difração para obtenção de imagem por contraste da fase diferencial, disposição de detector de um sistema de raios x para gerar imagens por contraste de fase de um objeto, sistema de obtenção de imagem de clínica por raios x, método para obtenção de umagem de contraste de fase diferencial, elemento de programa de computador e meio legível em computador
WO2012052881A1 (en) * 2010-10-19 2012-04-26 Koninklijke Philips Electronics N.V. Differential phase-contrast imaging
JP5208224B2 (ja) * 2011-01-12 2013-06-12 富士フイルム株式会社 放射線撮影装置、及び放射線撮影システム
WO2013111050A1 (en) * 2012-01-24 2013-08-01 Koninklijke Philips N.V. Multi-directional phase contrast x-ray imaging
US20150160141A1 (en) * 2012-06-15 2015-06-11 Canon Kabushiki Kaisha X-ray apparatus and x-ray measurement method
DE102013221818A1 (de) * 2013-10-28 2015-04-30 Siemens Aktiengesellschaft Bildgebendes System und Verfahren zur Bildgebung
KR101690122B1 (ko) * 2013-11-26 2017-01-09 한국전기연구원 Ｘ―ｒａｙ 다중에너지 필터를 이용한 플라즈마 이온 분포 측정 방법 및 그 시스템
WO2017063156A1 (en) * 2015-10-14 2017-04-20 Shenzhen Xpectvision Technology Co., Ltd. X-ray detectors of high spatial resolution
EP3463090B1 (en) * 2016-06-02 2020-01-01 Koninklijke Philips N.V. X-ray imaging apparatus for compact (quasi-)isotropic multi source x-ray imaging
EP3473183A4 (en) * 2016-06-15 2020-02-12 Shimadzu Corporation RADIATION IMAGING DEVICE
IL251636B (en) 2017-04-06 2018-02-28 Yoav Berlatzky Coherence camera system and method thereof
EP3498171A1 (en) * 2017-12-15 2019-06-19 Koninklijke Philips N.V. Single shot x-ray phase-contrast and dark field imaging
EP3534376A1 (de) 2018-02-28 2019-09-04 Siemens Healthcare GmbH Verfahren zur herstellung eines mikrostrukturbauteils, mikrostrukturbauteil und röntgengerät
EP3534377B1 (de) * 2018-02-28 2021-11-17 Siemens Healthcare GmbH Verfahren zur herstellung eines mikrostrukturbauteils
DE102018124175A1 (de) * 2018-10-01 2020-04-02 Sikora Ag Verfahren und Vorrichtung zum Steuern einer Produktionsanlage für plattenförmige oder strangförmige Körper
FR3092398B1 (fr) * 2019-01-31 2021-02-26 Imagine Optic Procédés et systèmes pour l’imagerie de contraste phase

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2441578A (en) * 2006-09-08 2008-03-12 Ucl Business Plc Phase Contrast X-Ray Imaging
JP4864052B2 (ja) 2008-07-31 2012-01-25 アース製薬株式会社 温水洗浄便座の洗浄ノズル洗浄用泡吐出式ポンプ製品
JP5675169B2 (ja) * 2009-06-18 2015-02-25 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5631013B2 (ja) 2010-01-28 2014-11-26 キヤノン株式会社 Ｘ線撮像装置
US9066704B2 (en) 2011-03-14 2015-06-30 Canon Kabushiki Kaisha X-ray imaging apparatus

Similar Documents

Publication Publication Date Title
JP2011174715A5 (OSRAM)
JP2011189118A5 (OSRAM)
JP2012005820A5 (OSRAM)
JP5796976B2 (ja) Ｘ線撮像装置
JP6232603B2 (ja) Ｘ線撮像装置及びｘ線撮像方法
JP2012037352A5 (OSRAM)
JP2016501630A5 (OSRAM)
JP2012507690A5 (OSRAM)
JP5586986B2 (ja) Ｘ線撮像装置
JP2013138836A5 (OSRAM)
JP2012085995A5 (OSRAM)
JP2012045400A5 (OSRAM)
JP2011005235A5 (OSRAM)
RU2012136774A (ru) Устройство формирования рентгеновского изображения и способ формирования рентгеновского изображения
JP2012110472A5 (OSRAM)
JP2018519866A5 (OSRAM)
JP2014074891A5 (OSRAM)
RU2017103455A (ru) Устройство рентгеновской визуализации
JP2012154742A5 (ja) トールボット干渉計及び撮像方法
WO2010147125A1 (en) X-ray imaging apparatus and x-ray imaging method
RU2016115730A (ru) Устройство и способ визуализации
JP2017521170A5 (OSRAM)
JP5885405B2 (ja) 撮像装置、干渉縞解析プログラム及び干渉縞解析方法
JP2014142339A5 (OSRAM)
JP2013031784A5 (ja) Ｘ線撮像装置