FR3092398B1 - Procédés et systèmes pour l’imagerie de contraste phase - Google Patents

Procédés et systèmes pour l’imagerie de contraste phase Download PDF

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Publication number
FR3092398B1
FR3092398B1 FR1900968A FR1900968A FR3092398B1 FR 3092398 B1 FR3092398 B1 FR 3092398B1 FR 1900968 A FR1900968 A FR 1900968A FR 1900968 A FR1900968 A FR 1900968A FR 3092398 B1 FR3092398 B1 FR 3092398B1
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France
Prior art keywords
elementary detectors
phase contrast
group
mask
contrast imaging
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Active
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FR1900968A
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English (en)
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FR3092398A1 (fr
Inventor
Fabrice Harms
Xavier Levecq
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Imagine Optic SA
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Imagine Optic SA
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Priority to FR1900968A priority Critical patent/FR3092398B1/fr
Priority to PCT/EP2020/052401 priority patent/WO2020157263A1/fr
Publication of FR3092398A1 publication Critical patent/FR3092398A1/fr
Application granted granted Critical
Publication of FR3092398B1 publication Critical patent/FR3092398B1/fr
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/32—Accessories, mechanical or electrical features adjustments of elements during operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/612—Specific applications or type of materials biological material

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  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Abstract

Procédés et systèmes pour l’imagerie de contraste phase Selon un aspect, la présente description a pour objet un procédé d’imagerie de contraste de phase d’un objet comprenant : l’émission, au moyen d’une source de rayons X, d’un faisceau d’illumination ; l’envoi dudit faisceau d’illumination vers un détecteur (230) comprenant un agencement bidimensionnel de détecteurs élémentaires (232) identiques, lesdits détecteurs élémentaires formant une pluralité de groupes (234) de détecteurs élémentaires juxtaposés, chaque groupe comprenant quatre détecteurs élémentaires agencés en carré; le positionnement d’au moins un premier masque (220) entre ladite source et le détecteur, le premier masque comprenant un arrangement bidimensionnel de premiers éléments (222) opaques dans une bande spectrale utile desdits rayons X, de formes et de dimensions données telles que l’ombre projetée (224) de chaque premier élément opaque éclairé par ledit faisceau d’illumination recouvre partiellement chacun des quatre détecteurs élémentaires d’un groupe de détecteurs élémentaires; la formation d’une image de contraste de phase d’un objet d’intérêt agencé à proximité dudit premier masque, la formation de ladite image comprenant l’acquisition d’une pluralité d’éléments d’image associés chacun à un groupe de ladite pluralité de groupes de détecteurs élémentaires, l’acquisition d’un élément d’image comprenant la mesure du déplacement de l’ombre projetée d’un premier élément opaque sur ledit groupe de détecteurs élémentaires. FIG. 2B
FR1900968A 2019-01-31 2019-01-31 Procédés et systèmes pour l’imagerie de contraste phase Active FR3092398B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR1900968A FR3092398B1 (fr) 2019-01-31 2019-01-31 Procédés et systèmes pour l’imagerie de contraste phase
PCT/EP2020/052401 WO2020157263A1 (fr) 2019-01-31 2020-01-31 Procedes et systemes pour l'imagerie de contraste phase

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1900968 2019-01-31
FR1900968A FR3092398B1 (fr) 2019-01-31 2019-01-31 Procédés et systèmes pour l’imagerie de contraste phase

Publications (2)

Publication Number Publication Date
FR3092398A1 FR3092398A1 (fr) 2020-08-07
FR3092398B1 true FR3092398B1 (fr) 2021-02-26

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ID=67107706

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1900968A Active FR3092398B1 (fr) 2019-01-31 2019-01-31 Procédés et systèmes pour l’imagerie de contraste phase

Country Status (2)

Country Link
FR (1) FR3092398B1 (fr)
WO (1) WO2020157263A1 (fr)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2441578A (en) 2006-09-08 2008-03-12 Ucl Business Plc Phase Contrast X-Ray Imaging
JP5269041B2 (ja) * 2009-12-04 2013-08-21 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5586986B2 (ja) * 2010-02-23 2014-09-10 キヤノン株式会社 Ｘ線撮像装置
JP5610885B2 (ja) * 2010-07-12 2014-10-22 キヤノン株式会社 Ｘ線撮像装置および撮像方法
GB201112506D0 (en) 2011-07-21 2011-08-31 Ucl Business Plc Phase imaging
US9445775B2 (en) * 2013-08-19 2016-09-20 University Of Houston System Single step differential phase contrast x-ray imaging

Also Published As

Publication number Publication date
FR3092398A1 (fr) 2020-08-07
WO2020157263A1 (fr) 2020-08-06

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