JP2016003889A5 - - Google Patents

Download PDF

Info

Publication number
JP2016003889A5
JP2016003889A5 JP2014122744A JP2014122744A JP2016003889A5 JP 2016003889 A5 JP2016003889 A5 JP 2016003889A5 JP 2014122744 A JP2014122744 A JP 2014122744A JP 2014122744 A JP2014122744 A JP 2014122744A JP 2016003889 A5 JP2016003889 A5 JP 2016003889A5
Authority
JP
Japan
Prior art keywords
pattern
pattern group
mask
patterns
group
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2014122744A
Other languages
English (en)
Japanese (ja)
Other versions
JP6420572B2 (ja
JP2016003889A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2014122744A priority Critical patent/JP6420572B2/ja
Priority claimed from JP2014122744A external-priority patent/JP6420572B2/ja
Priority to US14/734,559 priority patent/US9714826B2/en
Publication of JP2016003889A publication Critical patent/JP2016003889A/ja
Publication of JP2016003889A5 publication Critical patent/JP2016003889A5/ja
Application granted granted Critical
Publication of JP6420572B2 publication Critical patent/JP6420572B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2014122744A 2014-06-13 2014-06-13 計測装置およびその方法 Expired - Fee Related JP6420572B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2014122744A JP6420572B2 (ja) 2014-06-13 2014-06-13 計測装置およびその方法
US14/734,559 US9714826B2 (en) 2014-06-13 2015-06-09 Measurement apparatus and method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014122744A JP6420572B2 (ja) 2014-06-13 2014-06-13 計測装置およびその方法

Publications (3)

Publication Number Publication Date
JP2016003889A JP2016003889A (ja) 2016-01-12
JP2016003889A5 true JP2016003889A5 (OSRAM) 2017-07-13
JP6420572B2 JP6420572B2 (ja) 2018-11-07

Family

ID=54835890

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014122744A Expired - Fee Related JP6420572B2 (ja) 2014-06-13 2014-06-13 計測装置およびその方法

Country Status (2)

Country Link
US (1) US9714826B2 (OSRAM)
JP (1) JP6420572B2 (OSRAM)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6418884B2 (ja) * 2014-10-10 2018-11-07 キヤノン株式会社 三次元計測装置、三次元計測方法及びプログラム
US10032279B2 (en) * 2015-02-23 2018-07-24 Canon Kabushiki Kaisha Information processing apparatus, information processing method, and storage medium
KR101586765B1 (ko) * 2015-02-27 2016-01-25 주식회사 다우인큐브 반도체 공정 기반 3차원 가상 형상 모델링 방법
US10171730B2 (en) 2016-02-15 2019-01-01 Canon Kabushiki Kaisha Information processing apparatus, method of controlling information processing apparatus, and storage medium
US10685490B2 (en) 2016-03-10 2020-06-16 Canon Kabushiki Kaisha Information processing apparatus, information processing method, and storage medium
JP6791645B2 (ja) * 2016-03-29 2020-11-25 本田技研工業株式会社 光通信装置、光通信システム、および光通信方法
JP6735615B2 (ja) * 2016-06-29 2020-08-05 キヤノン株式会社 情報処理装置、情報処理装置の制御方法およびプログラム
JP6673266B2 (ja) * 2017-03-08 2020-03-25 オムロン株式会社 相互反射検出装置、相互反射検出方法、およびプログラム
EP3788319A1 (en) * 2018-04-30 2021-03-10 Path Robotics, Inc. Reflection refuting laser scanner
JP7178803B2 (ja) 2018-06-04 2022-11-28 キヤノン株式会社 情報処理装置、情報処理装置の制御方法およびプログラム
JP6975106B2 (ja) * 2018-07-31 2021-12-01 株式会社デンソーアイティーラボラトリ ３次元形状計測システム、３次元形状計測方法、及び３次元形状計測プログラム
WO2020169834A1 (en) * 2019-02-22 2020-08-27 Prophesee Three-dimensional imaging and sensing using a dynamic vision sensor and pattern projection
JP7202966B2 (ja) * 2019-04-26 2023-01-12 株式会社キーエンス 三次元測定装置及び三次元測定方法
US12449671B2 (en) * 2021-10-21 2025-10-21 Tata Consultancy Services Limited Portable speckle imaging system and method for automated speckle activity map based dynamic speckle analysis
CN116320191A (zh) * 2023-02-16 2023-06-23 苏州佳世达光电有限公司 投影图样的形成方法及扫描器
CN118999346A (zh) * 2023-05-17 2024-11-22 华为技术有限公司 物体三维信息测量方法、控制器及系统

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000292135A (ja) * 1999-04-07 2000-10-20 Minolta Co Ltd ３次元情報入力カメラ
JP2001349713A (ja) * 2000-06-06 2001-12-21 Asahi Hightech Kk 三次元形状測定装置
JP3871963B2 (ja) * 2002-05-16 2007-01-24 住友化学株式会社 表面検査装置及び表面検査方法
JP2006098252A (ja) * 2004-09-30 2006-04-13 Brother Ind Ltd ３次元情報取得方法
JP4611782B2 (ja) 2005-03-28 2011-01-12 シチズンホールディングス株式会社 ３次元形状測定方法及び測定装置
JP2008281399A (ja) 2007-05-09 2008-11-20 Konica Minolta Sensing Inc 三次元測定装置及び携帯型計測器
JP4931728B2 (ja) * 2007-08-08 2012-05-16 シーケーディ株式会社 三次元計測装置及び基板検査機
JP5517829B2 (ja) * 2010-08-19 2014-06-11 キヤノン株式会社 三次元計測装置及び三次元計測方法
WO2012023256A2 (en) * 2010-08-19 2012-02-23 Canon Kabushiki Kaisha Three-dimensional measurement apparatus, method for three-dimensional measurement, and computer program
KR101289595B1 (ko) * 2011-02-28 2013-07-24 이경자 격자패턴투영장치

Similar Documents

Publication Publication Date Title
JP2016003889A5 (OSRAM)
JP2015135294A5 (OSRAM)
JP6420572B2 (ja) 計測装置およびその方法
US9546863B2 (en) Three-dimensional measuring apparatus and control method therefor
EP2899583A3 (en) Periodic fringe imaging with structured pattern illumination and electronic rolling shutter detection
JP2014115264A5 (OSRAM)
US20180335298A1 (en) Three-dimensional shape measuring apparatus and control method thereof
JP2012103239A5 (OSRAM)
JP2014115109A5 (OSRAM)
JP2014119442A5 (OSRAM)
JP2011027724A5 (OSRAM)
RU2016150826A (ru) Оценка глубины с использованием многоракурсного стереоизображения и откалиброванного проектора
JP2013185832A5 (OSRAM)
JP2018026064A5 (OSRAM)
JP2012141964A5 (OSRAM)
JP2013254480A5 (OSRAM)
JP2015090298A5 (OSRAM)
JP2015036629A5 (OSRAM)
JP2017126870A5 (OSRAM)
JP2012251997A5 (OSRAM)
JP2018097148A5 (OSRAM)
JP2018004357A5 (OSRAM)
WO2015073590A3 (en) Multiple template improved 3d modeling of imaged objects using camera position and pose to obtain accuracy
JP2013218177A5 (OSRAM)
JP2014021562A5 (ja) 検出装置、検出方法及びプログラム