JP2017067526A - 打刻検査方法 - Google Patents
打刻検査方法 Download PDFInfo
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- JP2017067526A JP2017067526A JP2015191116A JP2015191116A JP2017067526A JP 2017067526 A JP2017067526 A JP 2017067526A JP 2015191116 A JP2015191116 A JP 2015191116A JP 2015191116 A JP2015191116 A JP 2015191116A JP 2017067526 A JP2017067526 A JP 2017067526A
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Abstract
【解決手段】打刻検査方法は、文字Lを除く検査対象物Wの表面Wsの状態を変位センサ2によって測定する第1測定工程と、第1測定工程において測定された表面Wsの状態に基づいて、文字Lの打刻深さを変位センサ2によって測定する第2測定工程と、変位センサ2により取得された打刻深さの測定値に基づいて、文字Lに係る打刻の良否を演算処理装置5によって判定する判定工程とを備える。
【選択図】図1
Description
5 制御装置(演算処理装置)
W ワーク(検査対象物)
Ws 表面
Claims (2)
- 検査対象物の表面に打刻された文字を検査する方法であって、
前記文字を除く前記表面の状態を変位センサによって測定する第1測定工程と、
前記第1測定工程において測定された前記表面の状態に基づいて、前記文字の打刻深さを前記変位センサによって測定する第2測定工程と、
前記変位センサにより取得された前記打刻深さの測定値に基づいて、前記文字に係る打刻の良否を演算処理装置によって判定する判定工程と、を備える打刻検査方法。 - 前記演算処理装置は、前記打刻深さに係る基準値を記憶しており、かつ、前記打刻深さの前記測定値と前記基準値とを比較して前記打刻深さの良否を判定する請求項1に記載の打刻検査方法。
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2022112665A (ja) * | 2021-01-22 | 2022-08-03 | 進一 二ノ宮 | 打刻印評価方法および、打刻装置システム |
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JP2022112665A (ja) * | 2021-01-22 | 2022-08-03 | 進一 二ノ宮 | 打刻印評価方法および、打刻装置システム |
JP7356669B2 (ja) | 2021-01-22 | 2023-10-05 | 進一 二ノ宮 | 打刻印評価方法および、打刻装置システム |
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