JP6643849B2 - 打刻検査方法 - Google Patents
打刻検査方法 Download PDFInfo
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- JP6643849B2 JP6643849B2 JP2015191116A JP2015191116A JP6643849B2 JP 6643849 B2 JP6643849 B2 JP 6643849B2 JP 2015191116 A JP2015191116 A JP 2015191116A JP 2015191116 A JP2015191116 A JP 2015191116A JP 6643849 B2 JP6643849 B2 JP 6643849B2
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Description
5 制御装置(演算処理装置)
W ワーク(検査対象物)
Ws 表面
Claims (2)
- 第1の端部及び第2の端部を有する検査対象物の表面に打刻された文字を検査する方法であって、
投光部を有する変位センサによって、前記文字を除く前記表面の状態を測定する第1測定工程と、
前記第1測定工程において測定された前記表面の状態の測定データを反映させ、前記文字の打刻深さを前記変位センサによって測定する第2測定工程と、
前記変位センサにより取得された前記打刻深さの測定値に基づいて、前記文字に係る打刻の良否を演算処理装置によって判定する判定工程と、を備え、
前記第1測定工程では、前記変位センサを前記検査対象物に対して相対的に前記第1の端部側から前記第2の端部側へと移動させ、この移動の間に、前記文字に対して前記投光部による投光を行うことなく、前記文字を除く前記表面に対して前記投光部による投光を行い、
前記第2測定工程では、前記変位センサを前記検査対象物に対して相対的に前記第2の端部側から前記第1の端部側へと移動させ、この移動の間に、前記文字を除く前記表面に対して前記投光部による投光を行うことなく、前記文字に対して前記投光部による投光を行う打刻検査方法。 - 前記演算処理装置は、前記打刻深さに係る基準値を記憶しており、かつ、前記打刻深さの前記測定値と前記基準値とを比較して前記打刻深さの良否を判定する請求項1に記載の打刻検査方法。
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JP6643849B2 true JP6643849B2 (ja) | 2020-02-12 |
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JP7356669B2 (ja) * | 2021-01-22 | 2023-10-05 | 進一 二ノ宮 | 打刻印評価方法および、打刻装置システム |
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