JP2016509985A - 基板用キャリア - Google Patents
基板用キャリア Download PDFInfo
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- JP2016509985A JP2016509985A JP2015561954A JP2015561954A JP2016509985A JP 2016509985 A JP2016509985 A JP 2016509985A JP 2015561954 A JP2015561954 A JP 2015561954A JP 2015561954 A JP2015561954 A JP 2015561954A JP 2016509985 A JP2016509985 A JP 2016509985A
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- 239000000758 substrate Substances 0.000 title claims abstract description 303
- 238000009434 installation Methods 0.000 claims abstract description 136
- 238000012545 processing Methods 0.000 claims abstract description 30
- 239000000463 material Substances 0.000 claims description 36
- 238000000151 deposition Methods 0.000 claims description 29
- 230000008021 deposition Effects 0.000 claims description 22
- 239000011521 glass Substances 0.000 claims description 13
- 230000006835 compression Effects 0.000 claims description 8
- 238000007906 compression Methods 0.000 claims description 8
- 238000005452 bending Methods 0.000 description 18
- 238000005137 deposition process Methods 0.000 description 13
- 238000000034 method Methods 0.000 description 13
- 230000008569 process Effects 0.000 description 10
- 239000000969 carrier Substances 0.000 description 5
- 238000005240 physical vapour deposition Methods 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 150000004767 nitrides Chemical class 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 238000000137 annealing Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000007717 exclusion Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 230000000873 masking effect Effects 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000007688 edging Methods 0.000 description 1
- -1 etc.) Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 150000001247 metal acetylides Chemical class 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 238000010606 normalization Methods 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000005361 soda-lime glass Substances 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 230000005654 stationary process Effects 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4587—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially vertically
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
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- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- General Chemical & Material Sciences (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Physical Vapour Deposition (AREA)
- Inorganic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims (15)
- 基板処理チャンバ(600)の中で基板(101)を支持するための、基板据付けアセンブリを含むキャリア(100)であって、
前記基板据付けアセンブリは、一つ又は複数の据付けユニット(120)を含み、各据付けユニット(120)は、
前記基板(101)のエッジに接触し、接触位置を画定するように構成されるエッジ接触面(121)と、
前記基板(101)の第一の基板面(102)に接触するように構成される第一の面(124)を有する第一の据付け要素(122)であって、前記第一の基板面(102)と実質的に平行に第一の長さ(L1)だけ前記接触位置から伸びる第一の据付け要素(122)と、
前記基板(101)の前記第一の基板面(102)に対向する前記基板(101)の第二の基板面(103)に接触するように構成される第二の面(125)を有する第二の据付け要素(123)であって、前記第二の基板面(103)と実質的に平行に第二の長さ(L2)だけ前記接触位置から伸びる第二の据付け要素(123)と、
前記第一の据付け要素(122)と前記第二の据付け要素(123)のうちの少なくとも一つとともに、前記基板(101)に据付け力(140)を与えるための力要素(130)とを含み、
前記第一の長さ(L1)と前記第二の長さ(L2)のうちの短い方の長さ(L1、L2)が、前記据付け力(140)との組み合わせでモーメンタムを与え、
前記一つ又は複数の据付けユニット(120)が、基板エッジ長さ単位当たり10Nmm以上であるように前記モーメンタムを与える、基板据付けアセンブリを含むキャリア(100)。 - フレーム(160)の基板領域の中に前記基板(101)を受け入れるように構成されるフレーム(160)を更に含む、請求項1に記載のキャリア(100)。
- 前記据付けアセンブリ及び詳細には前記据付けユニット(120)が、前記フレーム(160)に固定される、請求項1又は2に記載のキャリア(100)。
- 前記第二の据付け要素(123)が、所定の位置に固定されており、前記第一の据付け要素(122)が、前記第二の据付け要素(123)の前記第二の面(125)と実質的に垂直な方向に又は前記第一の基板面(102)と実質的に垂直な方向に、前記第二の据付け要素(123)に対して可動である、請求項1から3のいずれか一項に記載のキャリア(100)。
- 前記第一の据付け要素(122)と前記第一の据付け要素(123)が、前記第一の据付け要素(122)の前記第一の面(124)及び/又は前記第二の据付け要素(123)の前記第二の面(125)と実質的に垂直な方向に、互いに対して両方とも可動である、請求項1から3のいずれか一項に記載のキャリア(100)。
- 前記力要素(100)が、前記第一の据付け要素(122)及び/又は前記第二の据付け要素(123)に接続される、請求項1から5のいずれか一項に記載のキャリア(100)。
- 前記力要素(130)が、スプリング、圧縮ばね、レバー、圧電デバイス及び空気圧式デバイスのうちの少なくとも一つを含む、請求項1から6のいずれか一項に記載のキャリア(100)。
- 前記エッジ接触面(121)が、前記第一の据付け要素(122)又は前記第二の据付け要素(123)と一体的に形成される、請求項1から7のいずれか一項に記載のキャリア(100)。
- 前記据付けユニット(120)が、前記エッジ接触面(121)を画定する停止要素(126)を更に含む、請求項1から7のいずれか一項に記載のキャリア(100)。
- 前記停止要素(126)が、前記第一の据付け要素(122)又は前記第二の据付け要素(123)と一体的に形成される、請求項9に記載のキャリア(100)。
- 前記基板(101)に追加の支持領域を与えるように構成される支持要素(170)を更に含む、請求項1から10のいずれか一項に記載のキャリア(100)。
- 前記支持要素(170)の前記追加の支持領域が、前記第二の据付け要素(123)の前記第二の面(125)と実質的に平行な平面の中に設けられる、請求項11に記載のキャリア(100)
- 前記第一の基板面(102)及び前記第二の基板面(103)と実質的に平行な平面の中に前記基板(101)を位置決めするように構成される、前記フレーム(160)に取付けられる一つ又は複数の位置決め要素(151、152)を更に含む、請求項1から12のいずれか一項に記載のキャリア(100)。
- 前記少なくとも一つの据付けユニット(120)が、0.1mm〜1.8mmの厚さを有する前記基板(101)を固定するように構成される、請求項1から13のいずれか一項に記載のキャリア(100)。
- 大面積ガラス基板(101)上に層を堆積させるための装置(600)であって、
真空チャンバ(612)の中での層堆積のために適合される真空チャンバ(612)と、
請求項1から14のいずれか一項に記載のキャリア(100)の輸送のために適合される輸送システム(620)と、
前記層を形成する材料を堆積させるための堆積源(630)とを含む、装置(600)。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP2013/055440 WO2014139591A1 (en) | 2013-03-15 | 2013-03-15 | Carrier for substrates |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017245628A Division JP2018085523A (ja) | 2017-12-21 | 2017-12-21 | 基板用キャリア |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2016509985A true JP2016509985A (ja) | 2016-04-04 |
JP2016509985A5 JP2016509985A5 (ja) | 2016-05-19 |
JP6268198B2 JP6268198B2 (ja) | 2018-01-24 |
Family
ID=47997407
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2015561954A Active JP6268198B2 (ja) | 2013-03-15 | 2013-03-15 | 基板用キャリア |
Country Status (7)
Country | Link |
---|---|
US (1) | US20160002780A1 (ja) |
EP (1) | EP2971224B1 (ja) |
JP (1) | JP6268198B2 (ja) |
KR (1) | KR102107970B1 (ja) |
CN (2) | CN105189812B (ja) |
TW (2) | TWI631650B (ja) |
WO (1) | WO2014139591A1 (ja) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3008224B1 (en) * | 2013-06-10 | 2024-09-04 | View, Inc. | Glass pallet for sputtering systems |
US11688589B2 (en) * | 2013-06-10 | 2023-06-27 | View, Inc. | Carrier with vertical grid for supporting substrates in coater |
CN107326337B (zh) * | 2017-07-06 | 2019-06-14 | 京东方科技集团股份有限公司 | 押元结构和基板承载装置 |
CN111868295B (zh) * | 2018-03-13 | 2023-08-11 | 唯景公司 | 用于在涂布机中支撑基板的具有竖直网格的载体 |
CN108750675B (zh) * | 2018-06-28 | 2021-01-26 | 武汉华星光电技术有限公司 | 承载组件及基板承载与传送装置 |
CN111690906B (zh) * | 2020-06-30 | 2023-07-21 | 通威太阳能(金堂)有限公司 | 承载装置 |
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US4138099A (en) * | 1978-04-17 | 1979-02-06 | Englehart Clem C | Materials handling device |
JPS5580731A (en) * | 1978-12-11 | 1980-06-18 | Triplex Safety Glass Co | Curving glass sheet*its manufacture and device |
JPH1072668A (ja) * | 1996-09-02 | 1998-03-17 | Toray Ind Inc | 基板支持具ならびに該支持具を用いた薄膜の製造方法およびその製造装置 |
JPH11246046A (ja) * | 1998-03-02 | 1999-09-14 | Sony Corp | 基板搬送装置 |
JP2007094040A (ja) * | 2005-09-29 | 2007-04-12 | Seiko Epson Corp | フレーム治具及びそれを用いた光学薄膜の形成方法 |
US20100151680A1 (en) * | 2008-12-17 | 2010-06-17 | Optisolar Inc. | Substrate carrier with enhanced temperature uniformity |
JP2010183078A (ja) * | 2009-02-03 | 2010-08-19 | Nordson Corp | プラズマ加工システムにおいて使用する磁気クリップ及び基板ホルダー |
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JPH11307608A (ja) * | 1998-04-16 | 1999-11-05 | Nissin Electric Co Ltd | 被処理物体搬送装置 |
JP2000124288A (ja) * | 1998-10-21 | 2000-04-28 | Dainippon Screen Mfg Co Ltd | 基板搬送方法および基板搬送装置 |
JP4211185B2 (ja) * | 2000-02-29 | 2009-01-21 | 株式会社デンソー | Cvd,ale装置用ガラス基板収納治具 |
TW509227U (en) * | 2001-04-02 | 2002-11-01 | Au Optronics Corp | Locator for a material sheet |
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CN201186950Y (zh) * | 2008-02-03 | 2009-01-28 | 北儒精密股份有限公司 | 基板载具 |
JP5873251B2 (ja) * | 2011-04-28 | 2016-03-01 | キヤノンアネルバ株式会社 | 基板トレイ及び該トレイを用いた基板処理装置 |
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-
2013
- 2013-03-15 KR KR1020157029246A patent/KR102107970B1/ko active IP Right Grant
- 2013-03-15 CN CN201380074727.8A patent/CN105189812B/zh active Active
- 2013-03-15 US US14/770,390 patent/US20160002780A1/en not_active Abandoned
- 2013-03-15 CN CN201710858361.3A patent/CN107574426B/zh active Active
- 2013-03-15 JP JP2015561954A patent/JP6268198B2/ja active Active
- 2013-03-15 EP EP13711866.7A patent/EP2971224B1/en not_active Not-in-force
- 2013-03-15 WO PCT/EP2013/055440 patent/WO2014139591A1/en active Application Filing
-
2014
- 2014-02-27 TW TW106135157A patent/TWI631650B/zh active
- 2014-02-27 TW TW103106642A patent/TWI609450B/zh active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4138099A (en) * | 1978-04-17 | 1979-02-06 | Englehart Clem C | Materials handling device |
JPS5580731A (en) * | 1978-12-11 | 1980-06-18 | Triplex Safety Glass Co | Curving glass sheet*its manufacture and device |
JPH1072668A (ja) * | 1996-09-02 | 1998-03-17 | Toray Ind Inc | 基板支持具ならびに該支持具を用いた薄膜の製造方法およびその製造装置 |
JPH11246046A (ja) * | 1998-03-02 | 1999-09-14 | Sony Corp | 基板搬送装置 |
JP2007094040A (ja) * | 2005-09-29 | 2007-04-12 | Seiko Epson Corp | フレーム治具及びそれを用いた光学薄膜の形成方法 |
US20100151680A1 (en) * | 2008-12-17 | 2010-06-17 | Optisolar Inc. | Substrate carrier with enhanced temperature uniformity |
JP2010183078A (ja) * | 2009-02-03 | 2010-08-19 | Nordson Corp | プラズマ加工システムにおいて使用する磁気クリップ及び基板ホルダー |
Also Published As
Publication number | Publication date |
---|---|
CN105189812B (zh) | 2017-10-20 |
JP6268198B2 (ja) | 2018-01-24 |
KR102107970B1 (ko) | 2020-05-07 |
WO2014139591A1 (en) | 2014-09-18 |
CN107574426B (zh) | 2020-06-09 |
CN105189812A (zh) | 2015-12-23 |
US20160002780A1 (en) | 2016-01-07 |
TW201804560A (zh) | 2018-02-01 |
TWI609450B (zh) | 2017-12-21 |
TWI631650B (zh) | 2018-08-01 |
KR20150130522A (ko) | 2015-11-23 |
CN107574426A (zh) | 2018-01-12 |
EP2971224A1 (en) | 2016-01-20 |
EP2971224B1 (en) | 2018-01-31 |
TW201507053A (zh) | 2015-02-16 |
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