JP2016507752A5 - - Google Patents

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Publication number
JP2016507752A5
JP2016507752A5 JP2015557062A JP2015557062A JP2016507752A5 JP 2016507752 A5 JP2016507752 A5 JP 2016507752A5 JP 2015557062 A JP2015557062 A JP 2015557062A JP 2015557062 A JP2015557062 A JP 2015557062A JP 2016507752 A5 JP2016507752 A5 JP 2016507752A5
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JP
Japan
Prior art keywords
light
test object
spectral light
image
spectral
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Pending
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JP2015557062A
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English (en)
Japanese (ja)
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JP2016507752A (ja
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Priority claimed from PCT/US2014/015078 external-priority patent/WO2014126778A2/en
Publication of JP2016507752A publication Critical patent/JP2016507752A/ja
Publication of JP2016507752A5 publication Critical patent/JP2016507752A5/ja
Pending legal-status Critical Current

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JP2015557062A 2013-02-12 2014-02-06 表面色を備えた表面トポグラフィ干渉計 Pending JP2016507752A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361763911P 2013-02-12 2013-02-12
US61/763,911 2013-02-12
PCT/US2014/015078 WO2014126778A2 (en) 2013-02-12 2014-02-06 Surface topography interferometer with surface color

Publications (2)

Publication Number Publication Date
JP2016507752A JP2016507752A (ja) 2016-03-10
JP2016507752A5 true JP2016507752A5 (enExample) 2016-04-21

Family

ID=51297243

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015557062A Pending JP2016507752A (ja) 2013-02-12 2014-02-06 表面色を備えた表面トポグラフィ干渉計

Country Status (6)

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US (1) US9541381B2 (enExample)
EP (1) EP2956742A4 (enExample)
JP (1) JP2016507752A (enExample)
KR (1) KR102048793B1 (enExample)
TW (1) TWI509220B (enExample)
WO (1) WO2014126778A2 (enExample)

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US9719777B1 (en) 2014-05-30 2017-08-01 Zygo Corporation Interferometer with real-time fringe-free imaging
US9282304B1 (en) * 2014-06-02 2016-03-08 Bruker Nano Inc. Full-color images produced by white-light interferometry
US9746315B1 (en) * 2014-06-02 2017-08-29 Bruker Nano Inc. Side illumination in interferometry
EP3213298B1 (en) * 2014-10-30 2018-12-12 Koninklijke Philips N.V. Texture analysis map for image data
JP6511263B2 (ja) * 2014-12-22 2019-05-15 株式会社トプコンテクノハウス 平面分光干渉計
WO2016127173A1 (en) * 2015-02-06 2016-08-11 The University Of Akron Optical imaging system and methods thereof
KR101637252B1 (ko) * 2015-03-26 2016-07-07 에스엔유 프리시젼 주식회사 백색광 위상천이 간섭계의 간섭신호 차수 오차 보정방법
JP2017099616A (ja) * 2015-12-01 2017-06-08 ソニー株式会社 手術用制御装置、手術用制御方法、およびプログラム、並びに手術システム
JP6674619B2 (ja) * 2015-12-11 2020-04-01 株式会社東京精密 画像生成方法及び画像生成装置
US10502556B2 (en) * 2016-07-20 2019-12-10 Mura Inc. Systems and methods for 3D surface measurements
CN109906370B (zh) * 2016-10-28 2021-07-27 富士胶片株式会社 光学相干断层图像摄像装置及测量方法
JP6766995B2 (ja) * 2016-11-09 2020-10-14 株式会社ミツトヨ 位相シフト干渉計
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FR3067108B1 (fr) 2017-06-01 2020-12-04 Unity Semiconductor Procede et systeme pour reconstituer une information de couleur d'un echantillon mesure par profilometrie optique en lumiere blanche, et applications de ce procede
CN117731237A (zh) * 2017-06-29 2024-03-22 登塔尔图像科技公司 具有彩色纹理的口内oct
TWI638132B (zh) * 2017-08-25 2018-10-11 三星科技股份有限公司 物件多面取像裝置
US10805034B2 (en) * 2018-02-22 2020-10-13 Nokia Solutions And Networks Oy Protection of channel connections in an optical network
WO2020215046A1 (en) * 2019-04-19 2020-10-22 Arizona Board Of Regents On Behalf Of The University Of Arizona On-chip signal processing method and pixel-array sensor
US11910104B2 (en) 2019-04-19 2024-02-20 ARIZONA BOARD OF REGENTS on behalf of THE UNIVERSITY OF ARIZONA, A BODY CORPORATE All-in-focus imager and associated method
FR3101702B1 (fr) * 2019-10-07 2021-11-19 Fogale Nanotech Dispositif et procédé de mesures d’imagerie et d’interférométrie
US20230003578A1 (en) * 2019-12-03 2023-01-05 ams Sensors Germany GmbH Color measurement
JP7001947B2 (ja) * 2020-12-24 2022-01-20 株式会社東京精密 表面形状測定方法
CN115035015B (zh) * 2021-02-23 2025-09-05 京东方科技集团股份有限公司 图片处理方法、装置、计算机设备及存储介质
DE102022101631B3 (de) * 2022-01-25 2023-01-05 Heidelberger Druckmaschinen Aktiengesellschaft Verfahren zur Anpassung eines Lab-Sollfarbwertes mehrfarbiger Druckprodukte
CN117538658B (zh) * 2023-11-16 2024-08-16 深圳市美信检测技术股份有限公司 基于红外光谱及热成像的人工智能故障定位方法及装置

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