JP2016507004A5 - - Google Patents

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Publication number
JP2016507004A5
JP2016507004A5 JP2015555746A JP2015555746A JP2016507004A5 JP 2016507004 A5 JP2016507004 A5 JP 2016507004A5 JP 2015555746 A JP2015555746 A JP 2015555746A JP 2015555746 A JP2015555746 A JP 2015555746A JP 2016507004 A5 JP2016507004 A5 JP 2016507004A5
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JP
Japan
Prior art keywords
sputtering target
mixture
sputtering
oxide
atomic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2015555746A
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English (en)
Japanese (ja)
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JP2016507004A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/EP2014/052134 external-priority patent/WO2014122120A1/en
Publication of JP2016507004A publication Critical patent/JP2016507004A/ja
Publication of JP2016507004A5 publication Critical patent/JP2016507004A5/ja
Ceased legal-status Critical Current

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JP2015555746A 2013-02-05 2014-02-04 (Ga)ZnSn酸化物スパッタリングターゲット Ceased JP2016507004A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP13154037 2013-02-05
EP13154037.9 2013-02-05
PCT/EP2014/052134 WO2014122120A1 (en) 2013-02-05 2014-02-04 (ga) zn sn oxide sputtering target

Publications (2)

Publication Number Publication Date
JP2016507004A JP2016507004A (ja) 2016-03-07
JP2016507004A5 true JP2016507004A5 (https=) 2016-04-14

Family

ID=47720328

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015555746A Ceased JP2016507004A (ja) 2013-02-05 2014-02-04 (Ga)ZnSn酸化物スパッタリングターゲット

Country Status (8)

Country Link
US (1) US9758856B2 (https=)
EP (1) EP2953915B1 (https=)
JP (1) JP2016507004A (https=)
KR (1) KR20150115906A (https=)
BE (1) BE1021021B1 (https=)
ES (1) ES2615933T3 (https=)
PL (1) PL2953915T3 (https=)
WO (1) WO2014122120A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017179595A (ja) * 2016-03-28 2017-10-05 日立金属株式会社 スパッタリングターゲット材およびその製造方法
WO2019079207A1 (en) * 2017-10-16 2019-04-25 Materials Science International, Inc. PROCESS FOR PRODUCTION OF CATHODIC SPUTTER TARGET IN ZINC STANNATE
BE1025799B1 (nl) 2017-12-18 2019-07-19 Soleras Advanced Coatings Bvba Gespoten lithiumcobaltoxide-targets
KR20240013218A (ko) 2021-06-04 2024-01-30 제이엑스금속주식회사 스퍼터링 타깃 및 그 제조 방법
US20250075308A1 (en) 2022-01-05 2025-03-06 Jx Advanced Metals Corporation Oxide film and oxide sputtering target

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5171411A (en) * 1991-05-21 1992-12-15 The Boc Group, Inc. Rotating cylindrical magnetron structure with self supporting zinc alloy target
JPH05156431A (ja) 1991-11-29 1993-06-22 Asahi Glass Co Ltd 回転カソードターゲットの製造方法
EP0852266B1 (en) * 1995-08-23 2004-10-13 Asahi Glass Ceramics Co., Ltd. Target, process for production thereof, and method of forming highly refractive film
GB9600210D0 (en) 1996-01-05 1996-03-06 Vanderstraeten E Bvba Improved sputtering targets and method for the preparation thereof
JPH1068072A (ja) 1996-08-26 1998-03-10 Japan Energy Corp Itoシリンドリカルターゲットおよびその製造方法
CN1369572A (zh) 2001-04-03 2002-09-18 中国科学院长春光学精密机械与物理研究所 氧化物透明导电薄膜材料
KR100873088B1 (ko) * 2004-10-01 2008-12-09 미쓰이 긴조꾸 고교 가부시키가이샤 스퍼터링 타깃용 타깃재의 제조 방법
JP5395994B2 (ja) * 2005-11-18 2014-01-22 出光興産株式会社 半導体薄膜、及びその製造方法、並びに薄膜トランジスタ
JP4552950B2 (ja) 2006-03-15 2010-09-29 住友金属鉱山株式会社 ターゲット用酸化物焼結体、その製造方法、それを用いた透明導電膜の製造方法、及び得られる透明導電膜
KR101137906B1 (ko) * 2006-08-03 2012-05-03 삼성코닝정밀소재 주식회사 회전식 타겟 어셈블리
WO2009078330A1 (ja) 2007-12-19 2009-06-25 Hitachi Metals, Ltd. 酸化亜鉛焼結体およびその製造方法、スパッタリングターゲット、このスパッタリングターゲットを用いて形成された電極
JP5024226B2 (ja) 2008-08-06 2012-09-12 日立金属株式会社 酸化物焼結体およびその製造方法、スパッタリングターゲット、半導体薄膜
JP5679315B2 (ja) 2010-03-31 2015-03-04 日立金属株式会社 円筒型Mo合金ターゲットの製造方法
JP2012107296A (ja) * 2010-11-18 2012-06-07 Tosoh Corp セラミック溶射円筒ターゲットの製造方法
DE112012007295B3 (de) * 2011-06-08 2022-02-03 Semiconductor Energy Laboratory Co., Ltd. Verfahren zum Herstellen eines Sputtertargets und Verfahren zum Herstellen einer Halbleitervorrichtung
CN102286717B (zh) * 2011-09-01 2013-07-03 基迈克材料科技(苏州)有限公司 以等离子喷涂制备圆柱形大面积镀膜靶材及方法

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