JP2016505863A5 - - Google Patents
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- Publication number
- JP2016505863A5 JP2016505863A5 JP2015540706A JP2015540706A JP2016505863A5 JP 2016505863 A5 JP2016505863 A5 JP 2016505863A5 JP 2015540706 A JP2015540706 A JP 2015540706A JP 2015540706 A JP2015540706 A JP 2015540706A JP 2016505863 A5 JP2016505863 A5 JP 2016505863A5
- Authority
- JP
- Japan
- Prior art keywords
- viewport
- protector
- holder
- motomeko
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000001012 protector Effects 0.000 claims 18
- 230000005855 radiation Effects 0.000 claims 13
- 239000000758 substrate Substances 0.000 claims 8
- 239000000463 material Substances 0.000 claims 5
- 238000000295 emission spectrum Methods 0.000 claims 4
- 238000000034 method Methods 0.000 claims 4
- 230000003595 spectral effect Effects 0.000 claims 4
- 239000013077 target material Substances 0.000 claims 3
- 239000011521 glass Substances 0.000 claims 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims 1
- 244000062793 Sorghum vulgare Species 0.000 claims 1
- 229910052802 copper Inorganic materials 0.000 claims 1
- 239000010949 copper Substances 0.000 claims 1
- 239000010408 film Substances 0.000 claims 1
- 235000019713 millet Nutrition 0.000 claims 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims 1
- 239000010409 thin film Substances 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/671,378 US9341752B2 (en) | 2012-11-07 | 2012-11-07 | Viewport protector for an extreme ultraviolet light source |
| US13/671,378 | 2012-11-07 | ||
| PCT/US2013/066239 WO2014074302A1 (en) | 2012-11-07 | 2013-10-22 | Viewport protector for an extreme ultraviolet light source |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016505863A JP2016505863A (ja) | 2016-02-25 |
| JP2016505863A5 true JP2016505863A5 (enExample) | 2016-11-04 |
| JP6388869B2 JP6388869B2 (ja) | 2018-09-12 |
Family
ID=50622109
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015540706A Expired - Fee Related JP6388869B2 (ja) | 2012-11-07 | 2013-10-22 | 極紫外光源のためのビューポートプロテクタ |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9341752B2 (enExample) |
| JP (1) | JP6388869B2 (enExample) |
| KR (2) | KR102081862B1 (enExample) |
| CN (1) | CN104781705B (enExample) |
| TW (1) | TWI612849B (enExample) |
| WO (1) | WO2014074302A1 (enExample) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9341951B2 (en) * | 2012-12-21 | 2016-05-17 | Ultratech, Inc. | Wynn-dyson imaging system with reduced thermal distortion |
| US9497840B2 (en) * | 2013-09-26 | 2016-11-15 | Asml Netherlands B.V. | System and method for creating and utilizing dual laser curtains from a single laser in an LPP EUV light source |
| US9241395B2 (en) * | 2013-09-26 | 2016-01-19 | Asml Netherlands B.V. | System and method for controlling droplet timing in an LPP EUV light source |
| JP2017520010A (ja) * | 2014-05-01 | 2017-07-20 | エーエスエムエル ネザーランズ ビー.ブイ. | クリーニング装置及び関連する低圧チャンバ装置 |
| US10186416B2 (en) | 2014-05-15 | 2019-01-22 | Excelitas Technologies Corp. | Apparatus and a method for operating a variable pressure sealed beam lamp |
| EP3457430B1 (en) | 2014-05-15 | 2023-10-25 | Excelitas Technologies Corp. | Laser driven sealed beam lamp with dual focus regions |
| US9741553B2 (en) | 2014-05-15 | 2017-08-22 | Excelitas Technologies Corp. | Elliptical and dual parabolic laser driven sealed beam lamps |
| US9357625B2 (en) * | 2014-07-07 | 2016-05-31 | Asml Netherlands B.V. | Extreme ultraviolet light source |
| US10008378B2 (en) | 2015-05-14 | 2018-06-26 | Excelitas Technologies Corp. | Laser driven sealed beam lamp with improved stability |
| US9576785B2 (en) * | 2015-05-14 | 2017-02-21 | Excelitas Technologies Corp. | Electrodeless single CW laser driven xenon lamp |
| US10057973B2 (en) * | 2015-05-14 | 2018-08-21 | Excelitas Technologies Corp. | Electrodeless single low power CW laser driven plasma lamp |
| US10429314B2 (en) * | 2017-07-31 | 2019-10-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | EUV vessel inspection method and related system |
| US10109473B1 (en) | 2018-01-26 | 2018-10-23 | Excelitas Technologies Corp. | Mechanically sealed tube for laser sustained plasma lamp and production method for same |
| US11466228B1 (en) * | 2018-11-02 | 2022-10-11 | Endress+Hauser Optical Analysis, Inc. | Friction control and captive sealant for pressed windows |
| RU188876U1 (ru) * | 2018-12-25 | 2019-04-25 | Федеральное государственное бюджетное научное учреждение "Федеральный исследовательский центр Институт прикладной физики Российской академии наук" (ИПФ РАН) | Пространственный фильтр для мощных многокаскадных лазерных усилителей |
| JP7630515B2 (ja) * | 2019-12-23 | 2025-02-17 | エーエスエムエル ネザーランズ ビー.ブイ. | コレクタ流リング |
| WO2022002560A1 (en) * | 2020-07-01 | 2022-01-06 | Asml Netherlands B.V. | Precise vacuum window viewports and pellicles for rapid metrology recovery |
| KR102476767B1 (ko) | 2021-03-17 | 2022-12-09 | 피에스케이홀딩스 (주) | 플라즈마 감지 장치 |
| US11647578B2 (en) | 2021-08-31 | 2023-05-09 | Taiwan Semiconductor Manufacturing Co., Ltd. | Lithography thermal control |
| KR20250022035A (ko) * | 2022-06-13 | 2025-02-14 | 에이에스엠엘 네델란즈 비.브이. | 극자외선 광원을 위한 뷰포트 어셈블리 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5922927B2 (ja) | 1977-02-04 | 1984-05-30 | キヤノン株式会社 | カメラの附属品の装着装置 |
| US5359620A (en) | 1992-11-12 | 1994-10-25 | Cymer Laser Technologies | Apparatus for, and method of, maintaining a clean window in a laser |
| US5773841A (en) * | 1995-01-13 | 1998-06-30 | High Yield Technology, Inc. | Self aligning vacuum seal assembly |
| US5898522A (en) * | 1995-10-06 | 1999-04-27 | Herpst; Robert D. | Protective window assembly and method of using the same for a laser beam generating apparatus |
| US5804827A (en) * | 1995-10-27 | 1998-09-08 | Nikon Corporation | Infrared ray detection device and solid-state imaging apparatus |
| US5933273A (en) * | 1997-06-11 | 1999-08-03 | Mcdonnell Douglas Corporation | Ultraviolet blocking coating and associated coated optical element |
| US6972421B2 (en) * | 2000-06-09 | 2005-12-06 | Cymer, Inc. | Extreme ultraviolet light source |
| US8191901B2 (en) | 2000-10-26 | 2012-06-05 | Kimball Physics, Inc. | Minimal thickness, double-sided flanges for ultra-high vacuum components |
| US20050115941A1 (en) | 2002-07-31 | 2005-06-02 | Sukhman Yefim P. | Laser containment structure allowing the use of plastics |
| US7217941B2 (en) * | 2003-04-08 | 2007-05-15 | Cymer, Inc. | Systems and methods for deflecting plasma-generated ions to prevent the ions from reaching an internal component of an EUV light source |
| JP2005268035A (ja) | 2004-03-18 | 2005-09-29 | Canon Inc | Euv光源の評価用評価装置、およびそれを用いた評価方法 |
| US7109503B1 (en) | 2005-02-25 | 2006-09-19 | Cymer, Inc. | Systems for protecting internal components of an EUV light source from plasma-generated debris |
| US7196343B2 (en) | 2004-12-30 | 2007-03-27 | Asml Netherlands B.V. | Optical element, lithographic apparatus including such an optical element, device manufacturing method, and device manufactured thereby |
| JP2006259162A (ja) | 2005-03-16 | 2006-09-28 | Olympus Imaging Corp | 防塵機能付き光学装置 |
| WO2007067296A2 (en) * | 2005-12-02 | 2007-06-14 | Alis Corporation | Ion sources, systems and methods |
| US20080266651A1 (en) * | 2007-04-24 | 2008-10-30 | Katsuhiko Murakami | Optical apparatus, multilayer-film reflective mirror, exposure apparatus, and device |
| DE102008041827A1 (de) * | 2008-09-05 | 2010-03-18 | Carl Zeiss Smt Ag | Schutzmodul für EUV-Lithographievorrichtung sowie EUV-Lithographievorrichtung |
| EP2170021B1 (en) * | 2008-09-25 | 2015-11-04 | ASML Netherlands B.V. | Source module, radiation source and lithographic apparatus |
| JP5368261B2 (ja) * | 2008-11-06 | 2013-12-18 | ギガフォトン株式会社 | 極端紫外光源装置、極端紫外光源装置の制御方法 |
| JP5534910B2 (ja) * | 2009-04-23 | 2014-07-02 | ギガフォトン株式会社 | 極端紫外光源装置 |
| CN101694287A (zh) * | 2009-10-13 | 2010-04-14 | 中国航天科技集团公司第五研究院第五一〇研究所 | 一种近紫外辐照设备中过滤红外光和可见光的装置 |
| WO2011055376A1 (en) * | 2009-11-09 | 2011-05-12 | Tata Institute Of Fundamental Research | Biological laser plasma x-ray point source |
| US8173985B2 (en) | 2009-12-15 | 2012-05-08 | Cymer, Inc. | Beam transport system for extreme ultraviolet light source |
| US8000212B2 (en) | 2009-12-15 | 2011-08-16 | Cymer, Inc. | Metrology for extreme ultraviolet light source |
| US8263953B2 (en) * | 2010-04-09 | 2012-09-11 | Cymer, Inc. | Systems and methods for target material delivery protection in a laser produced plasma EUV light source |
-
2012
- 2012-11-07 US US13/671,378 patent/US9341752B2/en not_active Expired - Fee Related
-
2013
- 2013-10-22 CN CN201380058123.4A patent/CN104781705B/zh not_active Expired - Fee Related
- 2013-10-22 KR KR1020157011977A patent/KR102081862B1/ko not_active Expired - Fee Related
- 2013-10-22 JP JP2015540706A patent/JP6388869B2/ja not_active Expired - Fee Related
- 2013-10-22 KR KR1020207005022A patent/KR102159046B1/ko not_active Expired - Fee Related
- 2013-10-22 WO PCT/US2013/066239 patent/WO2014074302A1/en not_active Ceased
- 2013-10-24 TW TW102138447A patent/TWI612849B/zh not_active IP Right Cessation
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