JP2016197260A5 - - Google Patents

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JP2016197260A5
JP2016197260A5 JP2016147913A JP2016147913A JP2016197260A5 JP 2016197260 A5 JP2016197260 A5 JP 2016197260A5 JP 2016147913 A JP2016147913 A JP 2016147913A JP 2016147913 A JP2016147913 A JP 2016147913A JP 2016197260 A5 JP2016197260 A5 JP 2016197260A5
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JP2016147913A
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JP6416160B2 (ja
JP2016197260A (ja
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JP2016147913A 2010-09-24 2016-07-28 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム Active JP6416160B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NZ588199 2010-09-24
NZ58819910 2010-09-24

Related Parent Applications (1)

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JP2013530109A Division JP2013539074A (ja) 2010-09-24 2011-09-26 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム

Publications (3)

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JP2016197260A JP2016197260A (ja) 2016-11-24
JP2016197260A5 true JP2016197260A5 (enExample) 2017-01-12
JP6416160B2 JP6416160B2 (ja) 2018-10-31

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JP2013530109A Ceased JP2013539074A (ja) 2010-09-24 2011-09-26 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム
JP2016147913A Active JP6416160B2 (ja) 2010-09-24 2016-07-28 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム

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JP2013530109A Ceased JP2013539074A (ja) 2010-09-24 2011-09-26 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム

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US (3) US9523846B2 (enExample)
JP (2) JP2013539074A (enExample)
DE (1) DE112011103187B4 (enExample)
WO (1) WO2012039636A2 (enExample)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7838302B2 (en) 2006-08-07 2010-11-23 President And Fellows Of Harvard College Sub-diffraction limit image resolution and other imaging techniques
CN101918816B (zh) 2007-12-21 2015-12-02 哈佛大学 三维中的亚衍射极限图像分辨率
DE102012201003B4 (de) * 2012-01-24 2024-07-25 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren für die hochauflösende 3-D Fluoreszenzmikroskopie
DE102012201286B4 (de) * 2012-01-30 2025-07-24 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren für die wellenlängenselektive und örtlich hochauflösende Mikroskopie
DE102012202730B4 (de) 2012-02-22 2025-07-24 Carl Zeiss Microscopy Gmbh Wellenlängenselektive und örtlich hochauflösende Fluoreszenzmikroskopie
EP2966492B1 (en) 2012-05-02 2020-10-21 Centre National De La Recherche Scientifique Method and apparatus for single-particle localization using wavelet analysis
JP6106956B2 (ja) * 2012-05-31 2017-04-05 株式会社ニコン 顕微鏡装置
DE102013208415B4 (de) * 2013-05-07 2023-12-28 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren für die 3D-hochauflösende Lokalisierungsmikroskopie
DE102013208927A1 (de) 2013-05-14 2014-11-20 Carl Zeiss Microscopy Gmbh Verfahren zur 3D-hochauflösenden Lokalisierungsmikroskopie
DE102013208926A1 (de) 2013-05-14 2014-11-20 Carl Zeiss Microscopy Gmbh Verfahren zur 3D-hochauflösenden Lokalisierungsmikroskopie
DE102013015933A1 (de) 2013-09-19 2015-03-19 Carl Zeiss Microscopy Gmbh Hochauflösende Scanning-Mikroskopie
DE102013016368B4 (de) * 2013-09-30 2024-05-16 Carl Zeiss Microscopy Gmbh Lichtmikroskop und Mikroskopieverfahren zum Untersuchen einer mikroskopischen Probe
WO2017090210A1 (ja) 2015-11-27 2017-06-01 株式会社ニコン 顕微鏡、観察方法、及び画像処理プログラム
CN105403170B (zh) * 2015-12-11 2018-05-25 华侨大学 一种显微3d形貌测量方法及装置
US10908072B2 (en) 2016-12-15 2021-02-02 The Board Of Regents Of The University Of Texas System Total internal reflection and transmission illumination fluorescence microscopy imaging system with improved background suppression
JPWO2018116851A1 (ja) * 2016-12-21 2019-10-24 株式会社ニコン 情報処理装置、画像処理装置、顕微鏡、情報処理方法、及び情報処理プログラム
DE102017105103A1 (de) 2017-03-10 2018-09-13 Carl Zeiss Microscopy Gmbh 3D-Mikroskopie
WO2018187419A1 (en) * 2017-04-04 2018-10-11 University Of Utah Research Foundation Phase plate for high precision wavelength extraction in a microscope
CN107133964B (zh) * 2017-06-01 2020-04-24 江苏火米互动科技有限公司 一种基于Kinect的抠像方法
WO2019135069A1 (en) * 2018-01-02 2019-07-11 King's College London Method and system for localisation microscopy
CN109080144A (zh) * 2018-07-10 2018-12-25 泉州装备制造研究所 基于中心点判断的3d打印喷头末端实时跟踪定位方法
CN108982454B (zh) * 2018-07-30 2021-03-02 华中科技大学苏州脑空间信息研究院 一种轴向多层并行扫描显微成像方法及系统
US20200056615A1 (en) 2018-08-16 2020-02-20 Saudi Arabian Oil Company Motorized pump
US20200056462A1 (en) 2018-08-16 2020-02-20 Saudi Arabian Oil Company Motorized pump
DE102018122652B4 (de) * 2018-09-17 2025-11-27 Carl Zeiss Microscopy Gmbh Spektralauflösende, hochauflösende 3D-Lokalisierungmikroskopie
DE102018128590A1 (de) 2018-11-14 2020-05-14 Carl Zeiss Microscopy Gmbh Fluktuationsbasierte Fluoreszenzmikroskopie
US11347040B2 (en) 2019-02-14 2022-05-31 Double Helix Optics Inc. 3D target for optical system characterization
DE102020113998A1 (de) 2020-05-26 2021-12-02 Abberior Instruments Gmbh Verfahren, Computerprogramm und Vorrichtung zum Bestimmen von Positionen von Molekülen in einer Probe
US11371326B2 (en) 2020-06-01 2022-06-28 Saudi Arabian Oil Company Downhole pump with switched reluctance motor
US11499563B2 (en) 2020-08-24 2022-11-15 Saudi Arabian Oil Company Self-balancing thrust disk
US11920469B2 (en) 2020-09-08 2024-03-05 Saudi Arabian Oil Company Determining fluid parameters
US11644351B2 (en) 2021-03-19 2023-05-09 Saudi Arabian Oil Company Multiphase flow and salinity meter with dual opposite handed helical resonators
US11591899B2 (en) 2021-04-05 2023-02-28 Saudi Arabian Oil Company Wellbore density meter using a rotor and diffuser
US11913464B2 (en) 2021-04-15 2024-02-27 Saudi Arabian Oil Company Lubricating an electric submersible pump
US11994016B2 (en) 2021-12-09 2024-05-28 Saudi Arabian Oil Company Downhole phase separation in deviated wells
US12258954B2 (en) 2021-12-15 2025-03-25 Saudi Arabian Oil Company Continuous magnetic positive displacement pump
US12085687B2 (en) 2022-01-10 2024-09-10 Saudi Arabian Oil Company Model-constrained multi-phase virtual flow metering and forecasting with machine learning
DE102022200841B3 (de) 2022-01-26 2023-05-04 Carl Zeiss Microscopy Gmbh Verfahren, Anordnung und Mikroskop zur dreidimensionalen Bildgebung in der Mikroskopie unter Nutzung einer asymmetrischen Punktbildübertragungsfunktion
JP7673010B2 (ja) * 2022-03-22 2025-05-08 株式会社日立ハイテク 光電子顕微鏡

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0695038A (ja) * 1992-03-19 1994-04-08 Matsushita Electric Ind Co Ltd 超解像走査光学装置、光学装置の超解像用光源装置及び光学装置の超解像用フィルター
JP2006071950A (ja) * 2004-09-01 2006-03-16 Canon Inc 光学機器
JP4883936B2 (ja) 2005-05-12 2012-02-22 オリンパス株式会社 走査型サイトメータの画像処理方法及び装置
EP3203235A1 (en) * 2005-05-23 2017-08-09 Harald F. Hess Optical microscopy with phototransformable optical labels
JP4789177B2 (ja) 2005-07-06 2011-10-12 独立行政法人科学技術振興機構 3次元位置観測方法及び装置
KR100743591B1 (ko) * 2005-09-23 2007-07-27 한국과학기술원 사이드 로브가 제거된 공초점 자가 간섭 현미경
US7705970B2 (en) 2006-06-05 2010-04-27 The Regents Of The University Of Colorado Method and system for optical imaging and ranging
JP4986582B2 (ja) * 2006-11-15 2012-07-25 シチズンホールディングス株式会社 液晶光変調素子、液晶光変調装置、および液晶光変調素子の駆動方法
US7924432B2 (en) * 2006-12-21 2011-04-12 Howard Hughes Medical Institute Three-dimensional interferometric microscopy
JP4835750B2 (ja) 2007-04-12 2011-12-14 株式会社ニコン 顕微鏡装置
JP5536650B2 (ja) 2007-08-31 2014-07-02 ザ ジェネラル ホスピタル コーポレイション 自己干渉蛍光顕微鏡検査のためのシステムと方法、及び、それに関連するコンピュータがアクセス可能な媒体
CN101918816B (zh) * 2007-12-21 2015-12-02 哈佛大学 三维中的亚衍射极限图像分辨率
DE102008009216A1 (de) 2008-02-13 2009-08-20 Carl Zeiss Microimaging Gmbh Vorrichtung und Verfahren zum räumlich hochauflösenden Abbilden einer Struktur einer Probe
WO2009115108A1 (en) * 2008-03-19 2009-09-24 Ruprecht-Karls-Universität Heidelberg A method and an apparatus for localization of single dye molecules in the fluorescent microscopy
US7772569B2 (en) * 2008-04-01 2010-08-10 The Jackson Laboratory 3D biplane microscopy
JP4288323B1 (ja) 2008-09-13 2009-07-01 独立行政法人科学技術振興機構 顕微鏡装置及びそれを用いた蛍光観察方法
DE102008049886B4 (de) 2008-09-30 2021-11-04 Carl Zeiss Microscopy Gmbh Vorrichtung, insbesondere ein Mikroskop, zur Untersuchung von Proben
DE102008054317A1 (de) 2008-11-03 2010-05-06 Carl Zeiss Microlmaging Gmbh Kombinationsmikroskopie
DE102008059328A1 (de) * 2008-11-27 2010-06-02 Carl Zeiss Microimaging Gmbh Auflösungsgesteigerte Mikroskopie
WO2010080030A2 (en) 2009-01-09 2010-07-15 Aleksey Nikolaevich Simonov Optical rangefinder an imaging apparatus with chiral optical arrangement
US8620065B2 (en) * 2010-04-09 2013-12-31 The Regents Of The University Of Colorado Methods and systems for three dimensional optical imaging, sensing, particle localization and manipulation
US8711211B2 (en) * 2010-06-14 2014-04-29 Howard Hughes Medical Institute Bessel beam plane illumination microscope
US9500846B2 (en) * 2014-03-17 2016-11-22 Howard Hughes Medical Institute Rapid adaptive optical microscopy over large multicellular volumes
US10341640B2 (en) * 2015-04-10 2019-07-02 The Board Of Trustees Of The Leland Stanford Junior University Multi-wavelength phase mask

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