JP2016197260A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2016197260A5 JP2016197260A5 JP2016147913A JP2016147913A JP2016197260A5 JP 2016197260 A5 JP2016197260 A5 JP 2016197260A5 JP 2016147913 A JP2016147913 A JP 2016147913A JP 2016147913 A JP2016147913 A JP 2016147913A JP 2016197260 A5 JP2016197260 A5 JP 2016197260A5
- Authority
- JP
- Japan
- Prior art keywords
- image
- objective lens
- snr
- estimate
- background
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003384 imaging method Methods 0.000 claims description 10
- 238000000926 separation method Methods 0.000 claims 4
- 238000000034 method Methods 0.000 claims 3
- 238000000386 microscopy Methods 0.000 claims 3
- 238000005457 optimization Methods 0.000 claims 3
- 238000007476 Maximum Likelihood Methods 0.000 claims 1
- 238000001914 filtration Methods 0.000 claims 1
- 238000002372 labelling Methods 0.000 claims 1
- 230000005284 excitation Effects 0.000 description 4
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NZ588199 | 2010-09-24 | ||
| NZ58819910 | 2010-09-24 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013530109A Division JP2013539074A (ja) | 2010-09-24 | 2011-09-26 | 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016197260A JP2016197260A (ja) | 2016-11-24 |
| JP2016197260A5 true JP2016197260A5 (enExample) | 2017-01-12 |
| JP6416160B2 JP6416160B2 (ja) | 2018-10-31 |
Family
ID=44993857
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013530109A Ceased JP2013539074A (ja) | 2010-09-24 | 2011-09-26 | 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム |
| JP2016147913A Active JP6416160B2 (ja) | 2010-09-24 | 2016-07-28 | 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013530109A Ceased JP2013539074A (ja) | 2010-09-24 | 2011-09-26 | 3d局在顕微鏡法並びに4d局在顕微鏡法及び追跡方法並びに追跡システム |
Country Status (4)
| Country | Link |
|---|---|
| US (3) | US9523846B2 (enExample) |
| JP (2) | JP2013539074A (enExample) |
| DE (1) | DE112011103187B4 (enExample) |
| WO (1) | WO2012039636A2 (enExample) |
Families Citing this family (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7838302B2 (en) | 2006-08-07 | 2010-11-23 | President And Fellows Of Harvard College | Sub-diffraction limit image resolution and other imaging techniques |
| CN101918816B (zh) | 2007-12-21 | 2015-12-02 | 哈佛大学 | 三维中的亚衍射极限图像分辨率 |
| DE102012201003B4 (de) * | 2012-01-24 | 2024-07-25 | Carl Zeiss Microscopy Gmbh | Mikroskop und Verfahren für die hochauflösende 3-D Fluoreszenzmikroskopie |
| DE102012201286B4 (de) * | 2012-01-30 | 2025-07-24 | Carl Zeiss Microscopy Gmbh | Mikroskop und Verfahren für die wellenlängenselektive und örtlich hochauflösende Mikroskopie |
| DE102012202730B4 (de) | 2012-02-22 | 2025-07-24 | Carl Zeiss Microscopy Gmbh | Wellenlängenselektive und örtlich hochauflösende Fluoreszenzmikroskopie |
| EP2966492B1 (en) | 2012-05-02 | 2020-10-21 | Centre National De La Recherche Scientifique | Method and apparatus for single-particle localization using wavelet analysis |
| JP6106956B2 (ja) * | 2012-05-31 | 2017-04-05 | 株式会社ニコン | 顕微鏡装置 |
| DE102013208415B4 (de) * | 2013-05-07 | 2023-12-28 | Carl Zeiss Microscopy Gmbh | Mikroskop und Verfahren für die 3D-hochauflösende Lokalisierungsmikroskopie |
| DE102013208927A1 (de) | 2013-05-14 | 2014-11-20 | Carl Zeiss Microscopy Gmbh | Verfahren zur 3D-hochauflösenden Lokalisierungsmikroskopie |
| DE102013208926A1 (de) | 2013-05-14 | 2014-11-20 | Carl Zeiss Microscopy Gmbh | Verfahren zur 3D-hochauflösenden Lokalisierungsmikroskopie |
| DE102013015933A1 (de) | 2013-09-19 | 2015-03-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
| DE102013016368B4 (de) * | 2013-09-30 | 2024-05-16 | Carl Zeiss Microscopy Gmbh | Lichtmikroskop und Mikroskopieverfahren zum Untersuchen einer mikroskopischen Probe |
| WO2017090210A1 (ja) | 2015-11-27 | 2017-06-01 | 株式会社ニコン | 顕微鏡、観察方法、及び画像処理プログラム |
| CN105403170B (zh) * | 2015-12-11 | 2018-05-25 | 华侨大学 | 一种显微3d形貌测量方法及装置 |
| US10908072B2 (en) | 2016-12-15 | 2021-02-02 | The Board Of Regents Of The University Of Texas System | Total internal reflection and transmission illumination fluorescence microscopy imaging system with improved background suppression |
| JPWO2018116851A1 (ja) * | 2016-12-21 | 2019-10-24 | 株式会社ニコン | 情報処理装置、画像処理装置、顕微鏡、情報処理方法、及び情報処理プログラム |
| DE102017105103A1 (de) | 2017-03-10 | 2018-09-13 | Carl Zeiss Microscopy Gmbh | 3D-Mikroskopie |
| WO2018187419A1 (en) * | 2017-04-04 | 2018-10-11 | University Of Utah Research Foundation | Phase plate for high precision wavelength extraction in a microscope |
| CN107133964B (zh) * | 2017-06-01 | 2020-04-24 | 江苏火米互动科技有限公司 | 一种基于Kinect的抠像方法 |
| WO2019135069A1 (en) * | 2018-01-02 | 2019-07-11 | King's College London | Method and system for localisation microscopy |
| CN109080144A (zh) * | 2018-07-10 | 2018-12-25 | 泉州装备制造研究所 | 基于中心点判断的3d打印喷头末端实时跟踪定位方法 |
| CN108982454B (zh) * | 2018-07-30 | 2021-03-02 | 华中科技大学苏州脑空间信息研究院 | 一种轴向多层并行扫描显微成像方法及系统 |
| US20200056615A1 (en) | 2018-08-16 | 2020-02-20 | Saudi Arabian Oil Company | Motorized pump |
| US20200056462A1 (en) | 2018-08-16 | 2020-02-20 | Saudi Arabian Oil Company | Motorized pump |
| DE102018122652B4 (de) * | 2018-09-17 | 2025-11-27 | Carl Zeiss Microscopy Gmbh | Spektralauflösende, hochauflösende 3D-Lokalisierungmikroskopie |
| DE102018128590A1 (de) | 2018-11-14 | 2020-05-14 | Carl Zeiss Microscopy Gmbh | Fluktuationsbasierte Fluoreszenzmikroskopie |
| US11347040B2 (en) | 2019-02-14 | 2022-05-31 | Double Helix Optics Inc. | 3D target for optical system characterization |
| DE102020113998A1 (de) | 2020-05-26 | 2021-12-02 | Abberior Instruments Gmbh | Verfahren, Computerprogramm und Vorrichtung zum Bestimmen von Positionen von Molekülen in einer Probe |
| US11371326B2 (en) | 2020-06-01 | 2022-06-28 | Saudi Arabian Oil Company | Downhole pump with switched reluctance motor |
| US11499563B2 (en) | 2020-08-24 | 2022-11-15 | Saudi Arabian Oil Company | Self-balancing thrust disk |
| US11920469B2 (en) | 2020-09-08 | 2024-03-05 | Saudi Arabian Oil Company | Determining fluid parameters |
| US11644351B2 (en) | 2021-03-19 | 2023-05-09 | Saudi Arabian Oil Company | Multiphase flow and salinity meter with dual opposite handed helical resonators |
| US11591899B2 (en) | 2021-04-05 | 2023-02-28 | Saudi Arabian Oil Company | Wellbore density meter using a rotor and diffuser |
| US11913464B2 (en) | 2021-04-15 | 2024-02-27 | Saudi Arabian Oil Company | Lubricating an electric submersible pump |
| US11994016B2 (en) | 2021-12-09 | 2024-05-28 | Saudi Arabian Oil Company | Downhole phase separation in deviated wells |
| US12258954B2 (en) | 2021-12-15 | 2025-03-25 | Saudi Arabian Oil Company | Continuous magnetic positive displacement pump |
| US12085687B2 (en) | 2022-01-10 | 2024-09-10 | Saudi Arabian Oil Company | Model-constrained multi-phase virtual flow metering and forecasting with machine learning |
| DE102022200841B3 (de) | 2022-01-26 | 2023-05-04 | Carl Zeiss Microscopy Gmbh | Verfahren, Anordnung und Mikroskop zur dreidimensionalen Bildgebung in der Mikroskopie unter Nutzung einer asymmetrischen Punktbildübertragungsfunktion |
| JP7673010B2 (ja) * | 2022-03-22 | 2025-05-08 | 株式会社日立ハイテク | 光電子顕微鏡 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0695038A (ja) * | 1992-03-19 | 1994-04-08 | Matsushita Electric Ind Co Ltd | 超解像走査光学装置、光学装置の超解像用光源装置及び光学装置の超解像用フィルター |
| JP2006071950A (ja) * | 2004-09-01 | 2006-03-16 | Canon Inc | 光学機器 |
| JP4883936B2 (ja) | 2005-05-12 | 2012-02-22 | オリンパス株式会社 | 走査型サイトメータの画像処理方法及び装置 |
| EP3203235A1 (en) * | 2005-05-23 | 2017-08-09 | Harald F. Hess | Optical microscopy with phototransformable optical labels |
| JP4789177B2 (ja) | 2005-07-06 | 2011-10-12 | 独立行政法人科学技術振興機構 | 3次元位置観測方法及び装置 |
| KR100743591B1 (ko) * | 2005-09-23 | 2007-07-27 | 한국과학기술원 | 사이드 로브가 제거된 공초점 자가 간섭 현미경 |
| US7705970B2 (en) | 2006-06-05 | 2010-04-27 | The Regents Of The University Of Colorado | Method and system for optical imaging and ranging |
| JP4986582B2 (ja) * | 2006-11-15 | 2012-07-25 | シチズンホールディングス株式会社 | 液晶光変調素子、液晶光変調装置、および液晶光変調素子の駆動方法 |
| US7924432B2 (en) * | 2006-12-21 | 2011-04-12 | Howard Hughes Medical Institute | Three-dimensional interferometric microscopy |
| JP4835750B2 (ja) | 2007-04-12 | 2011-12-14 | 株式会社ニコン | 顕微鏡装置 |
| JP5536650B2 (ja) | 2007-08-31 | 2014-07-02 | ザ ジェネラル ホスピタル コーポレイション | 自己干渉蛍光顕微鏡検査のためのシステムと方法、及び、それに関連するコンピュータがアクセス可能な媒体 |
| CN101918816B (zh) * | 2007-12-21 | 2015-12-02 | 哈佛大学 | 三维中的亚衍射极限图像分辨率 |
| DE102008009216A1 (de) | 2008-02-13 | 2009-08-20 | Carl Zeiss Microimaging Gmbh | Vorrichtung und Verfahren zum räumlich hochauflösenden Abbilden einer Struktur einer Probe |
| WO2009115108A1 (en) * | 2008-03-19 | 2009-09-24 | Ruprecht-Karls-Universität Heidelberg | A method and an apparatus for localization of single dye molecules in the fluorescent microscopy |
| US7772569B2 (en) * | 2008-04-01 | 2010-08-10 | The Jackson Laboratory | 3D biplane microscopy |
| JP4288323B1 (ja) | 2008-09-13 | 2009-07-01 | 独立行政法人科学技術振興機構 | 顕微鏡装置及びそれを用いた蛍光観察方法 |
| DE102008049886B4 (de) | 2008-09-30 | 2021-11-04 | Carl Zeiss Microscopy Gmbh | Vorrichtung, insbesondere ein Mikroskop, zur Untersuchung von Proben |
| DE102008054317A1 (de) | 2008-11-03 | 2010-05-06 | Carl Zeiss Microlmaging Gmbh | Kombinationsmikroskopie |
| DE102008059328A1 (de) * | 2008-11-27 | 2010-06-02 | Carl Zeiss Microimaging Gmbh | Auflösungsgesteigerte Mikroskopie |
| WO2010080030A2 (en) | 2009-01-09 | 2010-07-15 | Aleksey Nikolaevich Simonov | Optical rangefinder an imaging apparatus with chiral optical arrangement |
| US8620065B2 (en) * | 2010-04-09 | 2013-12-31 | The Regents Of The University Of Colorado | Methods and systems for three dimensional optical imaging, sensing, particle localization and manipulation |
| US8711211B2 (en) * | 2010-06-14 | 2014-04-29 | Howard Hughes Medical Institute | Bessel beam plane illumination microscope |
| US9500846B2 (en) * | 2014-03-17 | 2016-11-22 | Howard Hughes Medical Institute | Rapid adaptive optical microscopy over large multicellular volumes |
| US10341640B2 (en) * | 2015-04-10 | 2019-07-02 | The Board Of Trustees Of The Leland Stanford Junior University | Multi-wavelength phase mask |
-
2011
- 2011-09-26 JP JP2013530109A patent/JP2013539074A/ja not_active Ceased
- 2011-09-26 DE DE112011103187.4T patent/DE112011103187B4/de active Active
- 2011-09-26 US US13/825,794 patent/US9523846B2/en active Active
- 2011-09-26 WO PCT/NZ2011/000200 patent/WO2012039636A2/en not_active Ceased
-
2016
- 2016-07-28 JP JP2016147913A patent/JP6416160B2/ja active Active
- 2016-11-03 US US15/342,615 patent/US10007103B2/en active Active
-
2018
- 2018-03-28 US US15/938,627 patent/US10571674B2/en active Active
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2016197260A5 (enExample) | ||
| JP6796917B2 (ja) | 粒子撮像装置および粒子撮像方法 | |
| JP5528173B2 (ja) | 画像処理装置、撮像装置および画像処理プログラム | |
| JP5734425B2 (ja) | 多開口撮像のためのフラッシュシステム | |
| JP5868076B2 (ja) | 画像処理装置及び画像処理方法 | |
| JP5409589B2 (ja) | 画像処理方法、画像処理プログラム、画像処理装置および撮像装置 | |
| US10755429B2 (en) | Apparatus and method for capturing images using lighting from different lighting angles | |
| JP2011211669A5 (enExample) | ||
| EP3657784B1 (fr) | Procédé d'estimation d'un défaut d'un système de capture d'images et systèmes associés | |
| JP2012058352A5 (enExample) | ||
| CN104168813B (zh) | 荧光观察装置和荧光观察装置的工作方法 | |
| JP2010139890A (ja) | 撮像装置 | |
| US20130070054A1 (en) | Image processing apparatus, fluorescence microscope apparatus, and image processing program | |
| US10838184B2 (en) | Artefact reduction for angularly-selective illumination | |
| CN111433811B (zh) | 减少图像中的图像伪影 | |
| US10097806B2 (en) | Image processing apparatus, image pickup apparatus, image processing method, non-transitory computer-readable storage medium for improving quality of image | |
| US10063829B2 (en) | Image processing method, image processing apparatus, image pickup apparatus, and non-transitory computer-readable storage medium | |
| JP2010181247A (ja) | 形状測定装置及び形状測定方法 | |
| JP2014085599A (ja) | 顕微鏡 | |
| JP5149984B2 (ja) | 撮像装置 | |
| JP2020003793A5 (enExample) | ||
| JP6436840B2 (ja) | 画像処理装置、撮像装置、画像処理方法、画像処理プログラム、および、記憶媒体 | |
| JP6016000B1 (ja) | 超解像処理方法、超解像処理装置及び超解像処理システム | |
| JP5209137B2 (ja) | 撮像装置 | |
| JP2018088587A5 (enExample) |