JP2016080506A - 物品検査装置 - Google Patents
物品検査装置 Download PDFInfo
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- JP2016080506A JP2016080506A JP2014211856A JP2014211856A JP2016080506A JP 2016080506 A JP2016080506 A JP 2016080506A JP 2014211856 A JP2014211856 A JP 2014211856A JP 2014211856 A JP2014211856 A JP 2014211856A JP 2016080506 A JP2016080506 A JP 2016080506A
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- 238000007689 inspection Methods 0.000 title claims abstract description 132
- 230000005856 abnormality Effects 0.000 claims abstract description 59
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- 238000005303 weighing Methods 0.000 description 13
- 238000010586 diagram Methods 0.000 description 10
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- 230000007246 mechanism Effects 0.000 description 6
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- 241000251468 Actinopterygii Species 0.000 description 3
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- 238000010894 electron beam technology Methods 0.000 description 1
- 235000013305 food Nutrition 0.000 description 1
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Abstract
Description
図1において、本発明の一実施形態に係る物品検査装置1は、搬送部2と、検査部3と、表示操作部4と、判定部5と、制御回路6と、検査記録情報蓄積部9と、を備えている。
2 搬送部
3 検査部
3A X線検出部
3B 金属検出部
3C 重量検出部
4 表示操作部(表示部)
5 判定部
6 制御回路
7 記憶部
8 制御部(集計部)
9 検査記録情報蓄積部
52 搬入センサ
W 被検査物
Claims (5)
- 装置の動作来歴に関する情報である来歴情報を蓄積する検査記録情報蓄積部(9)と、
前記来歴情報から装置の異常の発生回数を予め設定された条件で集計して表示部(4)に表示させる集計部(8)と、を備える物品検査装置。 - 前記集計部は、前記来歴情報に区切りを設定し、前記区切りの前後での前記異常の発生回数を予め設定された条件で集計して表示部に表示させる請求項1に記載の物品検査装置。
- 前記集計部は、前記集計の条件として前記異常の種別ごとに発生回数を集計する請求項1または2に記載の物品検査装置。
- 前記集計部は、表示された前記異常の種別ごとの発生回数から選択された前記異常の種別の発生日時を全て前記表示部に表示させる請求項3に記載の物品検査装置。
- 前記集計部は、表示された前記異常の発生日時から選択された発生日時の前後の前記来歴情報を前記表示部に表示させる請求項4に記載の物品検査装置。
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JP2014211856A JP6438264B2 (ja) | 2014-10-16 | 2014-10-16 | 物品検査装置 |
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JP2014211856A JP6438264B2 (ja) | 2014-10-16 | 2014-10-16 | 物品検査装置 |
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JP2016080506A true JP2016080506A (ja) | 2016-05-16 |
JP6438264B2 JP6438264B2 (ja) | 2018-12-12 |
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JP2014211856A Active JP6438264B2 (ja) | 2014-10-16 | 2014-10-16 | 物品検査装置 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2019211446A (ja) * | 2018-06-08 | 2019-12-12 | アンリツインフィビス株式会社 | 物品検査装置、物品検査システム及びプログラム |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080059856A1 (en) * | 2006-08-29 | 2008-03-06 | Samsung Electronics Co., Ltd | Method of defining fault pattern of equipment and method of monitoring equipment using the same |
JP2009074901A (ja) * | 2007-09-20 | 2009-04-09 | Sysmex Corp | 検体分析装置 |
JP2009210318A (ja) * | 2008-03-03 | 2009-09-17 | Shimadzu Corp | 分析装置 |
JP2013242244A (ja) * | 2012-05-22 | 2013-12-05 | Hitachi High-Technologies Corp | 自動分析装置 |
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2014
- 2014-10-16 JP JP2014211856A patent/JP6438264B2/ja active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080059856A1 (en) * | 2006-08-29 | 2008-03-06 | Samsung Electronics Co., Ltd | Method of defining fault pattern of equipment and method of monitoring equipment using the same |
JP2009074901A (ja) * | 2007-09-20 | 2009-04-09 | Sysmex Corp | 検体分析装置 |
JP2009210318A (ja) * | 2008-03-03 | 2009-09-17 | Shimadzu Corp | 分析装置 |
JP2013242244A (ja) * | 2012-05-22 | 2013-12-05 | Hitachi High-Technologies Corp | 自動分析装置 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2019211446A (ja) * | 2018-06-08 | 2019-12-12 | アンリツインフィビス株式会社 | 物品検査装置、物品検査システム及びプログラム |
US11132782B2 (en) | 2018-06-08 | 2021-09-28 | Anritsu Corporation | Article inspection apparatus, article inspection system, and non-transitory computer-readable storage medium storing computer program |
JP7042166B2 (ja) | 2018-06-08 | 2022-03-25 | アンリツ株式会社 | 物品検査装置、物品検査システム及びプログラム |
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