JP2015531480A5 - - Google Patents

Download PDF

Info

Publication number
JP2015531480A5
JP2015531480A5 JP2015531228A JP2015531228A JP2015531480A5 JP 2015531480 A5 JP2015531480 A5 JP 2015531480A5 JP 2015531228 A JP2015531228 A JP 2015531228A JP 2015531228 A JP2015531228 A JP 2015531228A JP 2015531480 A5 JP2015531480 A5 JP 2015531480A5
Authority
JP
Japan
Prior art keywords
subsystem
ray
xrf
sample
interest
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2015531228A
Other languages
English (en)
Japanese (ja)
Other versions
JP2015531480A (ja
JP6353450B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2013/058464 external-priority patent/WO2014039793A1/en
Publication of JP2015531480A publication Critical patent/JP2015531480A/ja
Publication of JP2015531480A5 publication Critical patent/JP2015531480A5/ja
Application granted granted Critical
Publication of JP6353450B2 publication Critical patent/JP6353450B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2015531228A 2012-09-07 2013-09-06 共焦点x線蛍光・x線コンピュータ断層撮影複合システムおよび方法 Active JP6353450B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201261698137P 2012-09-07 2012-09-07
US61/698,137 2012-09-07
PCT/US2013/058464 WO2014039793A1 (en) 2012-09-07 2013-09-06 Combined confocal x-ray fluorescence and x-ray computerised tomographic system and method

Publications (3)

Publication Number Publication Date
JP2015531480A JP2015531480A (ja) 2015-11-02
JP2015531480A5 true JP2015531480A5 (https=) 2016-07-07
JP6353450B2 JP6353450B2 (ja) 2018-07-04

Family

ID=49213145

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015531228A Active JP6353450B2 (ja) 2012-09-07 2013-09-06 共焦点x線蛍光・x線コンピュータ断層撮影複合システムおよび方法

Country Status (5)

Country Link
US (2) US9488605B2 (https=)
EP (1) EP2893331B1 (https=)
JP (1) JP6353450B2 (https=)
CN (1) CN104769422B (https=)
WO (1) WO2014039793A1 (https=)

Families Citing this family (67)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5907375B2 (ja) * 2011-12-28 2016-04-26 株式会社テクノエックス 蛍光x線分析装置及び蛍光x線分析方法
JP6036321B2 (ja) * 2012-03-23 2016-11-30 株式会社リガク X線複合装置
WO2013184021A1 (en) * 2012-06-09 2013-12-12 Schlumberger, Holdings Limited A method for estimating porosity of a rock sample
US10247682B2 (en) * 2013-04-04 2019-04-02 Illinois Tool Works Inc. Helical computed tomography
JP6105806B2 (ja) * 2013-04-12 2017-03-29 イリノイ トゥール ワークス インコーポレイティド 高解像度コンピュータートモグラフィー
JP6361871B2 (ja) * 2014-07-07 2018-07-25 住友金属鉱山株式会社 データ処理装置、データ処理プログラム、データ処理方法および処理条件決定方法
JP6763301B2 (ja) 2014-09-02 2020-09-30 株式会社ニコン 検査装置、検査方法、検査処理プログラムおよび構造物の製造方法
CN107076684B (zh) 2014-09-02 2021-04-02 株式会社尼康 测量处理装置、测量处理方法和测量处理程序
CN104502374A (zh) * 2014-12-17 2015-04-08 中国石油天然气股份有限公司 一种岩心ct扫描射线硬化的校正方法
US9368321B1 (en) * 2014-12-22 2016-06-14 Fei Company Fiducial-based correlative microscopy
CZ201527A3 (cs) * 2015-01-20 2016-07-27 Pixel R&D S.R.O. Způsob trojrozměrného skenování pomocí fluorescence vyvolané elektromagnetickým zářením a zařízení k provádění tohoto způsobu
EP3278091B1 (en) * 2015-04-02 2022-07-20 Soreq Nuclear Research Center System and method for reading x-ray-fluorescence marking
US10697908B2 (en) * 2015-06-01 2020-06-30 Xwinsys Ltd. Metrology inspection apparatus
US20170023495A1 (en) * 2015-07-20 2017-01-26 Apple Inc. Universal computerized tomography fixture system with a multi-scan robotic positioning apparatus
WO2017039475A1 (en) * 2015-09-03 2017-03-09 Schlumberger Technology Corporation A computer-implemented method and a system for creating a three-dimensional mineral model of a sample of a heterogenerous medium
US10107769B2 (en) 2016-01-11 2018-10-23 Carl Zeiss X-Ray Microscopy Inc. Multimodality mineralogy segmentation system and method
JP6830607B2 (ja) * 2016-04-04 2021-02-17 ソレク ニュークリア リサーチ センターSoreq Nuclear Research Center Xrfをマーキングし、電子システムのxrfを読み取る方法及びシステム
US11029267B2 (en) 2016-04-04 2021-06-08 Security Matters Ltd. Method and a system for XRF marking and reading XRF marks of electronic systems
GB2551980A (en) * 2016-06-30 2018-01-10 Commw Scient Ind Res Org Method and system for low level metal analysis of mineral samples
GB201611357D0 (en) * 2016-06-30 2016-08-17 Cirdan Imaging Ltd A cabinet x-ray system for imaging a specimen and associated method
US10359376B2 (en) * 2016-07-20 2019-07-23 Malvern Panalytical B.V. Sample holder for X-ray analysis
KR102426344B1 (ko) * 2016-09-19 2022-07-27 소레크 뉴클리어 리서치 센터 샘플을 식별하는 xrf 시스템과 방법
WO2018083930A1 (ja) * 2016-11-01 2018-05-11 株式会社島津製作所 放射線断層撮影装置の撮像倍率校正方法
SE540371C2 (en) 2017-02-06 2018-08-21 Orexplore Ab A sample holder for holding a drill core sample or drill cuttings, an apparatus and system comprising the holder
US11352879B2 (en) 2017-03-14 2022-06-07 Saudi Arabian Oil Company Collaborative sensing and prediction of source rock properties
CN107315019A (zh) * 2017-07-25 2017-11-03 清华大学 射线透射和荧光ct成像系统和成像方法
US11547314B2 (en) * 2017-11-28 2023-01-10 Dotter Inc. Optical coherence tomography system
US10788435B2 (en) * 2017-12-21 2020-09-29 Hamilton Sundstrand Corporation Fixtures for radiographically imaging industrial articles
JP6994952B2 (ja) * 2018-01-12 2022-01-14 株式会社ミツトヨ 計測用x線ct装置、及び、その校正方法
US10764555B2 (en) * 2018-02-02 2020-09-01 II William G. Behenna 3-dimensional physical object dynamic display
KR102170972B1 (ko) * 2018-03-28 2020-10-28 주식회사 자비스옵틱스 엑스레이를 이용한 물질두께 측정 장치
GB2572569C (en) * 2018-04-03 2022-12-14 Mineral Explor Network Finland Ltd Nugget effect grade assessment
CN108597018A (zh) * 2018-04-28 2018-09-28 清能艾科(深圳)能源技术有限公司 对土壤实现数值模拟的方法和装置
US11592407B2 (en) * 2018-05-18 2023-02-28 Enersoft Inc. Systems, devices, and methods for x-ray fluorescence analysis of geological samples
SE543606C2 (en) * 2018-08-03 2021-04-13 Orexplore Ab Density analysis of geological sample
JP7052643B2 (ja) * 2018-08-29 2022-04-12 住友金属鉱山株式会社 試料分析方法
CN109596657A (zh) * 2018-11-29 2019-04-09 石家庄铁道大学 高速动车组走行部运动部件早期缺陷扩展诊断方法
JP7198078B2 (ja) * 2018-12-27 2022-12-28 株式会社堀場製作所 分析装置、分析方法、及びプログラム
CN109632854B (zh) * 2019-01-14 2022-10-11 东华理工大学 一种双探测结构的块状铀矿多元素在线x荧光分析仪
JP7234821B2 (ja) * 2019-02-13 2023-03-08 住友金属鉱山株式会社 粉末試料の分析方法、x線ct測定用試料の作製方法およびx線ct測定用試料
JP7150638B2 (ja) * 2019-02-27 2022-10-11 キオクシア株式会社 半導体欠陥検査装置、及び、半導体欠陥検査方法
WO2020225876A1 (ja) * 2019-05-08 2020-11-12 株式会社日立ハイテク パターン計測装置および計測方法
CN110152557A (zh) * 2019-06-14 2019-08-23 清华大学深圳研究生院 一种气体水合物高通量并行反应系统及方法
JP7286485B2 (ja) * 2019-09-06 2023-06-05 株式会社ミツトヨ 計測用x線ct装置
US12082956B2 (en) * 2019-09-09 2024-09-10 Universidad De La Frontera Integral systems of orthovoltage sources that induce ionizing radiation
US11604152B2 (en) * 2019-10-09 2023-03-14 Baker Hughes Oilfield Operations Llc Fast industrial computed tomography for large objects
US11645792B2 (en) * 2019-12-20 2023-05-09 Carl Zeiss X-ray Microscopy, Inc. Edge phase effects removal using wavelet correction and particle classification using combined absorption and phase contrast
CN111751394B (zh) 2020-04-17 2021-08-27 山东大学 基于图像与xrf矿物反演的岩性识别方法及系统
CN111624218B (zh) * 2020-06-30 2022-01-04 中国科学院南京地质古生物研究所 非破坏性立体化石及文物表面化学元素分布特征分析方法
WO2022058912A1 (en) * 2020-09-16 2022-03-24 Enersoft Inc. Multiple-sensor analysis of geological samples
EP4248196A4 (en) * 2020-11-21 2024-10-30 Bar-Ilan University SYSTEM AND METHOD FOR IMAGING CHEMICAL ELEMENTS IN A SAMPLE
US11790598B2 (en) * 2020-12-16 2023-10-17 Nvidia Corporation Three-dimensional tomography reconstruction pipeline
CN113418949B (zh) * 2020-12-16 2024-02-23 中航复合材料有限责任公司 复合材料x射线测试的标准尺寸样品制备方法及测试方法
EP4019951A1 (en) 2020-12-24 2022-06-29 Inel S.A.S Apparatuses and methods for combined simultaneous analyses of materials
JP7499194B2 (ja) * 2021-01-27 2024-06-13 大成建設株式会社 分析方法および分析装置
WO2022266779A1 (en) 2021-06-25 2022-12-29 Enersoft Inc. Laser induced breakdown spectroscopy for geological analysis
EP4177596A1 (en) * 2021-11-05 2023-05-10 Carl Zeiss X-Ray Microscopy, Inc. Multi-fraction sample holder for 3d particle analysis
WO2023077494A1 (en) * 2021-11-08 2023-05-11 Shenzhen Xpectvision Technology Co., Ltd. Apparatus and method for x-ray fluorescence imaging
CN114813798B (zh) * 2022-05-18 2023-07-07 中国工程物理研究院化工材料研究所 用于表征材料内部结构及成分的ct检测装置和成像方法
CN115420764A (zh) * 2022-09-30 2022-12-02 苏州锂影科技有限公司 基于长方形x射线光束的二维掠入射x射线散射测试装置
CN115656238B (zh) * 2022-10-17 2023-05-12 中国科学院高能物理研究所 一种微区xrf元素分析与多维成像方法及系统
CN116678909A (zh) * 2023-06-08 2023-09-01 深圳综合粒子设施研究院 一种共聚焦荧光实验装置、荧光信号的探测方法
US12444099B2 (en) * 2023-06-15 2025-10-14 Baker Hughes Holdings Llc Systems and methods for computed tomography inaccuracy compensation
US12436123B2 (en) * 2023-09-06 2025-10-07 Schlumberger Technology Corporation XRF measurements of multiphase oilfield fluids
CN119091600B (zh) * 2024-08-02 2025-05-16 山东盛泰矿业科技有限公司 一种钛铁矿下料报警装置
CN118837396B (zh) * 2024-08-16 2025-11-28 天津大学 一种三维图像辅助xrf光谱分析的磨粒颗粒度效应校正方法
CN121350324B (zh) * 2025-12-18 2026-03-20 四川省自然资源实验测试研究中心(四川省核应急技术支持中心) 一种基于三维建模的矿石元素分布可视化方法及系统

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5192869A (en) 1990-10-31 1993-03-09 X-Ray Optical Systems, Inc. Device for controlling beams of particles, X-ray and gamma quanta
US5497008A (en) 1990-10-31 1996-03-05 X-Ray Optical Systems, Inc. Use of a Kumakhov lens in analytic instruments
JPH0560702A (ja) * 1991-09-04 1993-03-12 Hitachi Ltd X線を用いた断層像撮像方法及び装置
US5570408A (en) 1995-02-28 1996-10-29 X-Ray Optical Systems, Inc. High intensity, small diameter x-ray beam, capillary optic system
US5604353A (en) 1995-06-12 1997-02-18 X-Ray Optical Systems, Inc. Multiple-channel, total-reflection optic with controllable divergence
US6697454B1 (en) 2000-06-29 2004-02-24 X-Ray Optical Systems, Inc. X-ray analytical techniques applied to combinatorial library screening
JP3998556B2 (ja) * 2002-10-17 2007-10-31 株式会社東研 高分解能x線顕微検査装置
US7551714B2 (en) * 2006-05-05 2009-06-23 American Science And Engineering, Inc. Combined X-ray CT/neutron material identification system
JP5628035B2 (ja) 2007-08-16 2014-11-19 カルデラ・ファーマシューティカルズ・インコーポレーテッド ウェルプレート
JP5547873B2 (ja) * 2008-04-22 2014-07-16 株式会社東芝 X線ct装置
JP5557266B2 (ja) * 2008-07-17 2014-07-23 国立大学法人 筑波大学 蛍光エックス線検出装置
CN201417256Y (zh) * 2008-10-20 2010-03-03 北京师范大学 毛细管x光透镜共聚焦微区x射线荧光谱仪
US8565376B2 (en) 2010-01-07 2013-10-22 The Board Of Trustees Of The University Of Illinois Method and apparatus for measuring properties of a compound
CN101862200B (zh) * 2010-05-12 2012-07-04 中国科学院上海应用物理研究所 一种快速x射线荧光ct方法
US20140376685A1 (en) 2011-10-18 2014-12-25 Schlumberger Technology Corporation Method for 3d mineral mapping of a rock sample
JP6036321B2 (ja) * 2012-03-23 2016-11-30 株式会社リガク X線複合装置

Similar Documents

Publication Publication Date Title
JP2015531480A5 (https=)
CN106651750B (zh) 用于基于卷积神经网络回归的2d/3d图像配准的方法和系统
JP2015515894A5 (https=)
Du Plessis et al. Standard method for microCT-based additive manufacturing quality control 3: surface roughness
US10977787B2 (en) Feedback for multi-modality auto-registration
US20120020573A1 (en) Image analysis systems using non-linear data processing techniques and methods using same
Visvikis et al. The age of reason for FDG PET image-derived indices
WO2014165091A3 (en) Three-dimensional image processing to locate nanoparticles in biolgical and nonbiological media
WO2013106926A1 (en) Method for three-dimensional localization of an object from a two-dimensional medical image
JP2014534826A5 (https=)
CN102915555A (zh) 用于裁剪三维医疗数据集的方法和系统
EP2800060A3 (en) Medical imaging apparatus and control method for the same
RU2015103232A (ru) Система компьютерной томографии
JP2009157527A5 (https=)
DE102014204820A1 (de) Dreidimensionale Fingerspitzenverfolgung
EP2763103A3 (en) Integrated-attenuation based optic neuropathy detection in three-dimensional optical coherence tomography
CN106163380B (zh) 用于实时肿瘤检测和介入引导的定量组织特性映射
JP2015033556A5 (https=)
RU2017125784A (ru) Редактирование медицинских изображений
RU2013144201A (ru) Визуализация для навигационного указания
Bartkowiak et al. Multiscale characterizations of surface anisotropies
JP2013153882A5 (https=)
Chun et al. A foot-arch parameter measurement system using a RGB-D camera
Wentz et al. Accuracy of dynamic patient surface monitoring using a time-of-flight camera and B-spline modeling for respiratory motion characterization
EP2679989A3 (en) X-ray CT system for measuring three dimensional shapes and measuring method of three dimensional shapes by X-ray CT system