JP2015531480A5 - - Google Patents
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- JP2015531480A5 JP2015531480A5 JP2015531228A JP2015531228A JP2015531480A5 JP 2015531480 A5 JP2015531480 A5 JP 2015531480A5 JP 2015531228 A JP2015531228 A JP 2015531228A JP 2015531228 A JP2015531228 A JP 2015531228A JP 2015531480 A5 JP2015531480 A5 JP 2015531480A5
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- JP
- Japan
- Prior art keywords
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- ray
- xrf
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- 238000004876 x-ray fluorescence Methods 0.000 claims description 23
- 238000002591 computed tomography Methods 0.000 claims 20
- 238000005259 measurement Methods 0.000 claims 5
- 238000000034 method Methods 0.000 claims 5
- 238000001228 spectrum Methods 0.000 claims 3
- 238000010521 absorption reaction Methods 0.000 claims 2
- 238000000926 separation method Methods 0.000 claims 2
- 230000002452 interceptive effect Effects 0.000 claims 1
- 238000003384 imaging method Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 239000012472 biological sample Substances 0.000 description 2
- 229960000074 biopharmaceutical Drugs 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 241000554740 Rusa unicolor Species 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000010422 painting Methods 0.000 description 1
- 235000013619 trace mineral Nutrition 0.000 description 1
- 239000011573 trace mineral Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201261698137P | 2012-09-07 | 2012-09-07 | |
| US61/698,137 | 2012-09-07 | ||
| PCT/US2013/058464 WO2014039793A1 (en) | 2012-09-07 | 2013-09-06 | Combined confocal x-ray fluorescence and x-ray computerised tomographic system and method |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015531480A JP2015531480A (ja) | 2015-11-02 |
| JP2015531480A5 true JP2015531480A5 (cg-RX-API-DMAC7.html) | 2016-07-07 |
| JP6353450B2 JP6353450B2 (ja) | 2018-07-04 |
Family
ID=49213145
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015531228A Active JP6353450B2 (ja) | 2012-09-07 | 2013-09-06 | 共焦点ｘ線蛍光・ｘ線コンピュータ断層撮影複合システムおよび方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US9488605B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP2893331B1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP6353450B2 (cg-RX-API-DMAC7.html) |
| CN (1) | CN104769422B (cg-RX-API-DMAC7.html) |
| WO (1) | WO2014039793A1 (cg-RX-API-DMAC7.html) |
Families Citing this family (67)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5907375B2 (ja) * | 2011-12-28 | 2016-04-26 | 株式会社テクノエックス | 蛍光ｘ線分析装置及び蛍光ｘ線分析方法 |
| JP6036321B2 (ja) * | 2012-03-23 | 2016-11-30 | 株式会社リガク | Ｘ線複合装置 |
| WO2013184021A1 (en) * | 2012-06-09 | 2013-12-12 | Schlumberger, Holdings Limited | A method for estimating porosity of a rock sample |
| US10247682B2 (en) * | 2013-04-04 | 2019-04-02 | Illinois Tool Works Inc. | Helical computed tomography |
| JP6105806B2 (ja) * | 2013-04-12 | 2017-03-29 | イリノイ トゥール ワークス インコーポレイティド | 高解像度コンピュータートモグラフィー |
| JP6361871B2 (ja) * | 2014-07-07 | 2018-07-25 | 住友金属鉱山株式会社 | データ処理装置、データ処理プログラム、データ処理方法および処理条件決定方法 |
| JP6763301B2 (ja) | 2014-09-02 | 2020-09-30 | 株式会社ニコン | 検査装置、検査方法、検査処理プログラムおよび構造物の製造方法 |
| CN107076684B (zh) | 2014-09-02 | 2021-04-02 | 株式会社尼康 | 测量处理装置、测量处理方法和测量处理程序 |
| CN104502374A (zh) * | 2014-12-17 | 2015-04-08 | 中国石油天然气股份有限公司 | 一种岩心ct扫描射线硬化的校正方法 |
| US9368321B1 (en) * | 2014-12-22 | 2016-06-14 | Fei Company | Fiducial-based correlative microscopy |
| CZ201527A3 (cs) * | 2015-01-20 | 2016-07-27 | Pixel R&D S.R.O. | Způsob trojrozměrného skenování pomocí fluorescence vyvolané elektromagnetickým zářením a zařízení k provádění tohoto způsobu |
| EP3278091B1 (en) * | 2015-04-02 | 2022-07-20 | Soreq Nuclear Research Center | System and method for reading x-ray-fluorescence marking |
| US10697908B2 (en) * | 2015-06-01 | 2020-06-30 | Xwinsys Ltd. | Metrology inspection apparatus |
| US20170023495A1 (en) * | 2015-07-20 | 2017-01-26 | Apple Inc. | Universal computerized tomography fixture system with a multi-scan robotic positioning apparatus |
| WO2017039475A1 (en) * | 2015-09-03 | 2017-03-09 | Schlumberger Technology Corporation | A computer-implemented method and a system for creating a three-dimensional mineral model of a sample of a heterogenerous medium |
| US10107769B2 (en) | 2016-01-11 | 2018-10-23 | Carl Zeiss X-Ray Microscopy Inc. | Multimodality mineralogy segmentation system and method |
| JP6830607B2 (ja) * | 2016-04-04 | 2021-02-17 | ソレク ニュークリア リサーチ センターＳｏｒｅｑ Ｎｕｃｌｅａｒ Ｒｅｓｅａｒｃｈ Ｃｅｎｔｅｒ | Ｘｒｆをマーキングし、電子システムのｘｒｆを読み取る方法及びシステム |
| US11029267B2 (en) | 2016-04-04 | 2021-06-08 | Security Matters Ltd. | Method and a system for XRF marking and reading XRF marks of electronic systems |
| GB2551980A (en) * | 2016-06-30 | 2018-01-10 | Commw Scient Ind Res Org | Method and system for low level metal analysis of mineral samples |
| GB201611357D0 (en) * | 2016-06-30 | 2016-08-17 | Cirdan Imaging Ltd | A cabinet x-ray system for imaging a specimen and associated method |
| US10359376B2 (en) * | 2016-07-20 | 2019-07-23 | Malvern Panalytical B.V. | Sample holder for X-ray analysis |
| KR102426344B1 (ko) * | 2016-09-19 | 2022-07-27 | 소레크 뉴클리어 리서치 센터 | 샘플을 식별하는 ｘｒｆ 시스템과 방법 |
| WO2018083930A1 (ja) * | 2016-11-01 | 2018-05-11 | 株式会社島津製作所 | 放射線断層撮影装置の撮像倍率校正方法 |
| SE540371C2 (en) | 2017-02-06 | 2018-08-21 | Orexplore Ab | A sample holder for holding a drill core sample or drill cuttings, an apparatus and system comprising the holder |
| US11352879B2 (en) | 2017-03-14 | 2022-06-07 | Saudi Arabian Oil Company | Collaborative sensing and prediction of source rock properties |
| CN107315019A (zh) * | 2017-07-25 | 2017-11-03 | 清华大学 | 射线透射和荧光ct成像系统和成像方法 |
| US11547314B2 (en) * | 2017-11-28 | 2023-01-10 | Dotter Inc. | Optical coherence tomography system |
| US10788435B2 (en) * | 2017-12-21 | 2020-09-29 | Hamilton Sundstrand Corporation | Fixtures for radiographically imaging industrial articles |
| JP6994952B2 (ja) * | 2018-01-12 | 2022-01-14 | 株式会社ミツトヨ | 計測用ｘ線ｃｔ装置、及び、その校正方法 |
| US10764555B2 (en) * | 2018-02-02 | 2020-09-01 | II William G. Behenna | 3-dimensional physical object dynamic display |
| KR102170972B1 (ko) * | 2018-03-28 | 2020-10-28 | 주식회사 자비스옵틱스 | 엑스레이를 이용한 물질두께 측정 장치 |
| GB2572569C (en) * | 2018-04-03 | 2022-12-14 | Mineral Explor Network Finland Ltd | Nugget effect grade assessment |
| CN108597018A (zh) * | 2018-04-28 | 2018-09-28 | 清能艾科（深圳）能源技术有限公司 | 对土壤实现数值模拟的方法和装置 |
| US11592407B2 (en) * | 2018-05-18 | 2023-02-28 | Enersoft Inc. | Systems, devices, and methods for x-ray fluorescence analysis of geological samples |
| SE543606C2 (en) * | 2018-08-03 | 2021-04-13 | Orexplore Ab | Density analysis of geological sample |
| JP7052643B2 (ja) * | 2018-08-29 | 2022-04-12 | 住友金属鉱山株式会社 | 試料分析方法 |
| CN109596657A (zh) * | 2018-11-29 | 2019-04-09 | 石家庄铁道大学 | 高速动车组走行部运动部件早期缺陷扩展诊断方法 |
| JP7198078B2 (ja) * | 2018-12-27 | 2022-12-28 | 株式会社堀場製作所 | 分析装置、分析方法、及びプログラム |
| CN109632854B (zh) * | 2019-01-14 | 2022-10-11 | 东华理工大学 | 一种双探测结构的块状铀矿多元素在线x荧光分析仪 |
| JP7234821B2 (ja) * | 2019-02-13 | 2023-03-08 | 住友金属鉱山株式会社 | 粉末試料の分析方法、ｘ線ｃｔ測定用試料の作製方法およびｘ線ｃｔ測定用試料 |
| JP7150638B2 (ja) * | 2019-02-27 | 2022-10-11 | キオクシア株式会社 | 半導体欠陥検査装置、及び、半導体欠陥検査方法 |
| WO2020225876A1 (ja) * | 2019-05-08 | 2020-11-12 | 株式会社日立ハイテク | パターン計測装置および計測方法 |
| CN110152557A (zh) * | 2019-06-14 | 2019-08-23 | 清华大学深圳研究生院 | 一种气体水合物高通量并行反应系统及方法 |
| JP7286485B2 (ja) * | 2019-09-06 | 2023-06-05 | 株式会社ミツトヨ | 計測用ｘ線ｃｔ装置 |
| US12082956B2 (en) * | 2019-09-09 | 2024-09-10 | Universidad De La Frontera | Integral systems of orthovoltage sources that induce ionizing radiation |
| US11604152B2 (en) * | 2019-10-09 | 2023-03-14 | Baker Hughes Oilfield Operations Llc | Fast industrial computed tomography for large objects |
| US11645792B2 (en) * | 2019-12-20 | 2023-05-09 | Carl Zeiss X-ray Microscopy, Inc. | Edge phase effects removal using wavelet correction and particle classification using combined absorption and phase contrast |
| CN111751394B (zh) | 2020-04-17 | 2021-08-27 | 山东大学 | 基于图像与xrf矿物反演的岩性识别方法及系统 |
| CN111624218B (zh) * | 2020-06-30 | 2022-01-04 | 中国科学院南京地质古生物研究所 | 非破坏性立体化石及文物表面化学元素分布特征分析方法 |
| WO2022058912A1 (en) * | 2020-09-16 | 2022-03-24 | Enersoft Inc. | Multiple-sensor analysis of geological samples |
| EP4248196A4 (en) * | 2020-11-21 | 2024-10-30 | Bar-Ilan University | SYSTEM AND METHOD FOR IMAGING CHEMICAL ELEMENTS IN A SAMPLE |
| US11790598B2 (en) * | 2020-12-16 | 2023-10-17 | Nvidia Corporation | Three-dimensional tomography reconstruction pipeline |
| CN113418949B (zh) * | 2020-12-16 | 2024-02-23 | 中航复合材料有限责任公司 | 复合材料x射线测试的标准尺寸样品制备方法及测试方法 |
| EP4019951A1 (en) | 2020-12-24 | 2022-06-29 | Inel S.A.S | Apparatuses and methods for combined simultaneous analyses of materials |
| JP7499194B2 (ja) * | 2021-01-27 | 2024-06-13 | 大成建設株式会社 | 分析方法および分析装置 |
| WO2022266779A1 (en) | 2021-06-25 | 2022-12-29 | Enersoft Inc. | Laser induced breakdown spectroscopy for geological analysis |
| EP4177596A1 (en) * | 2021-11-05 | 2023-05-10 | Carl Zeiss X-Ray Microscopy, Inc. | Multi-fraction sample holder for 3d particle analysis |
| WO2023077494A1 (en) * | 2021-11-08 | 2023-05-11 | Shenzhen Xpectvision Technology Co., Ltd. | Apparatus and method for x-ray fluorescence imaging |
| CN114813798B (zh) * | 2022-05-18 | 2023-07-07 | 中国工程物理研究院化工材料研究所 | 用于表征材料内部结构及成分的ct检测装置和成像方法 |
| CN115420764A (zh) * | 2022-09-30 | 2022-12-02 | 苏州锂影科技有限公司 | 基于长方形x射线光束的二维掠入射x射线散射测试装置 |
| CN115656238B (zh) * | 2022-10-17 | 2023-05-12 | 中国科学院高能物理研究所 | 一种微区xrf元素分析与多维成像方法及系统 |
| CN116678909A (zh) * | 2023-06-08 | 2023-09-01 | 深圳综合粒子设施研究院 | 一种共聚焦荧光实验装置、荧光信号的探测方法 |
| US12444099B2 (en) * | 2023-06-15 | 2025-10-14 | Baker Hughes Holdings Llc | Systems and methods for computed tomography inaccuracy compensation |
| US12436123B2 (en) * | 2023-09-06 | 2025-10-07 | Schlumberger Technology Corporation | XRF measurements of multiphase oilfield fluids |
| CN119091600B (zh) * | 2024-08-02 | 2025-05-16 | 山东盛泰矿业科技有限公司 | 一种钛铁矿下料报警装置 |
| CN118837396B (zh) * | 2024-08-16 | 2025-11-28 | 天津大学 | 一种三维图像辅助xrf光谱分析的磨粒颗粒度效应校正方法 |
| CN121350324B (zh) * | 2025-12-18 | 2026-03-20 | 四川省自然资源实验测试研究中心(四川省核应急技术支持中心) | 一种基于三维建模的矿石元素分布可视化方法及系统 |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5192869A (en) | 1990-10-31 | 1993-03-09 | X-Ray Optical Systems, Inc. | Device for controlling beams of particles, X-ray and gamma quanta |
| US5497008A (en) | 1990-10-31 | 1996-03-05 | X-Ray Optical Systems, Inc. | Use of a Kumakhov lens in analytic instruments |
| JPH0560702A (ja) * | 1991-09-04 | 1993-03-12 | Hitachi Ltd | Ｘ線を用いた断層像撮像方法及び装置 |
| US5570408A (en) | 1995-02-28 | 1996-10-29 | X-Ray Optical Systems, Inc. | High intensity, small diameter x-ray beam, capillary optic system |
| US5604353A (en) | 1995-06-12 | 1997-02-18 | X-Ray Optical Systems, Inc. | Multiple-channel, total-reflection optic with controllable divergence |
| US6697454B1 (en) | 2000-06-29 | 2004-02-24 | X-Ray Optical Systems, Inc. | X-ray analytical techniques applied to combinatorial library screening |
| JP3998556B2 (ja) * | 2002-10-17 | 2007-10-31 | 株式会社東研 | 高分解能ｘ線顕微検査装置 |
| US7551714B2 (en) * | 2006-05-05 | 2009-06-23 | American Science And Engineering, Inc. | Combined X-ray CT/neutron material identification system |
| JP5628035B2 (ja) | 2007-08-16 | 2014-11-19 | カルデラ・ファーマシューティカルズ・インコーポレーテッド | ウェルプレート |
| JP5547873B2 (ja) * | 2008-04-22 | 2014-07-16 | 株式会社東芝 | Ｘ線ｃｔ装置 |
| JP5557266B2 (ja) * | 2008-07-17 | 2014-07-23 | 国立大学法人 筑波大学 | 蛍光エックス線検出装置 |
| CN201417256Y (zh) * | 2008-10-20 | 2010-03-03 | 北京师范大学 | 毛细管x光透镜共聚焦微区x射线荧光谱仪 |
| US8565376B2 (en) | 2010-01-07 | 2013-10-22 | The Board Of Trustees Of The University Of Illinois | Method and apparatus for measuring properties of a compound |
| CN101862200B (zh) * | 2010-05-12 | 2012-07-04 | 中国科学院上海应用物理研究所 | 一种快速x射线荧光ct方法 |
| US20140376685A1 (en) | 2011-10-18 | 2014-12-25 | Schlumberger Technology Corporation | Method for 3d mineral mapping of a rock sample |
| JP6036321B2 (ja) * | 2012-03-23 | 2016-11-30 | 株式会社リガク | Ｘ線複合装置 |
-
2013
- 2013-09-06 CN CN201380056545.8A patent/CN104769422B/zh active Active
- 2013-09-06 JP JP2015531228A patent/JP6353450B2/ja active Active
- 2013-09-06 EP EP13763415.0A patent/EP2893331B1/en active Active
- 2013-09-06 US US14/020,180 patent/US9488605B2/en active Active
- 2013-09-06 US US14/425,573 patent/US9739729B2/en active Active
- 2013-09-06 WO PCT/US2013/058464 patent/WO2014039793A1/en not_active Ceased
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