JP5628035B2 - ウェルプレート - Google Patents
ウェルプレート Download PDFInfo
- Publication number
- JP5628035B2 JP5628035B2 JP2010521206A JP2010521206A JP5628035B2 JP 5628035 B2 JP5628035 B2 JP 5628035B2 JP 2010521206 A JP2010521206 A JP 2010521206A JP 2010521206 A JP2010521206 A JP 2010521206A JP 5628035 B2 JP5628035 B2 JP 5628035B2
- Authority
- JP
- Japan
- Prior art keywords
- hole
- plate
- membrane
- sample
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2202—Preparing specimens therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B42/00—Obtaining records using waves other than optical waves; Visualisation of such records by using optical means
- G03B42/02—Obtaining records using waves other than optical waves; Visualisation of such records by using optical means using X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/074—Investigating materials by wave or particle radiation secondary emission activation analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/309—Accessories, mechanical or electrical features support of sample holder
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/64—Specific applications or type of materials multiple-sample chamber, multiplicity of materials
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
- Apparatus Associated With Microorganisms And Enzymes (AREA)
- Measuring Or Testing Involving Enzymes Or Micro-Organisms (AREA)
Description
4 プレート
6 膜
8 ホール
10 底面
12 上面
14 接着剤
16 底プレート
Claims (10)
- プレートであって、前記プレートを貫通する少なくとも一つのホールを有するプレート;及び
前記ホールを覆う膜であって、前記膜に対して垂直に指向された2,300eVのX線に対し少なくとも5%の半透明性を有する膜;
を備え、
前記ホールが前記膜と隣接する位置において、前記ホールが、前記膜と平行な少なくとも一つの寸法において50マイクロメートルから500マイクロメートルの間であることを特徴とするX線蛍光分光分析による測定用の一つ又はそれ以上の試料を調製する装置。 - 前記ホールが、約45°未満の先端角を有することを特徴とする請求項1に記載の装置。
- 前記ホールが前記膜と隣接する位置において、前記ホールの面積が、約0.005平方センチメートル未満であることを特徴とする請求項2に記載の装置。
- 前記ホールの内側の面が、約20マイクロメートル未満のRMS粗さを有することを特徴とする請求項3に記載の装置。
- 前記ホールが前記膜と隣接する位置における前記ホールの断面積が、前記ホールの最も狭い部分の断面積よりも大きいことを特徴とする請求項4に記載の装置。
- プレートであって、前記プレートを貫通する少なくとも一つのホールを有するプレート;及び
前記ホールに対し防水密封を形成する膜;
を備え、
前記膜が、前記プレートから取り外し可能であり、
前記膜が、オスミウム、イットリウム、イリジウム、リン、ジルコニウム、白金、金、ニオビウム、水銀、タリウム、モリブデン、硫黄、鉛、ビスマス、テクネチウム、ルテニウム、塩素、ロジウム、パラジウム、アルゴン、銀、及びトリウムのリストから選択された少なくとも一つの元素を実質的に含まず、
前記ホールが前記膜と隣接する位置での前記膜と平行な少なくとも一つの寸法において、前記ホールが、50マイクロメートルから500マイクロメートルの間であることを特徴とするX線蛍光分光分析による測定用の一つ又はそれ以上の試料を調製する装置。 - 前記ホールが、約45°未満の先端角を有することを特徴とする請求項6に記載の装置。
- 前記ホールが前記膜と隣接する位置において、前記ホールの面積が、約0.005平方センチメートル未満であることを特徴とする請求項7に記載の装置。
- 前記ホールの内側の面が、約20マイクロメートル未満のRMS粗さを有することを特徴とする請求項8に記載の装置。
- 前記ホールが前記膜と隣接する位置における前記ホールの断面積が、前記ホールの最も狭い部分の断面積よりも大きいことを特徴とする請求項9に記載の装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US96505207P | 2007-08-16 | 2007-08-16 | |
US60/965,052 | 2007-08-16 | ||
PCT/US2008/073359 WO2009023847A1 (en) | 2007-08-16 | 2008-08-15 | Well plate |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013117600A Division JP5755682B2 (ja) | 2007-08-16 | 2013-06-04 | ウェルプレート |
JP2014202871A Division JP6076308B2 (ja) | 2007-08-16 | 2014-10-01 | ウェルプレート |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2010537171A JP2010537171A (ja) | 2010-12-02 |
JP5628035B2 true JP5628035B2 (ja) | 2014-11-19 |
Family
ID=40351190
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010521206A Active JP5628035B2 (ja) | 2007-08-16 | 2008-08-15 | ウェルプレート |
JP2013117600A Active JP5755682B2 (ja) | 2007-08-16 | 2013-06-04 | ウェルプレート |
JP2014202871A Active JP6076308B2 (ja) | 2007-08-16 | 2014-10-01 | ウェルプレート |
Family Applications After (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013117600A Active JP5755682B2 (ja) | 2007-08-16 | 2013-06-04 | ウェルプレート |
JP2014202871A Active JP6076308B2 (ja) | 2007-08-16 | 2014-10-01 | ウェルプレート |
Country Status (6)
Country | Link |
---|---|
US (4) | US8238515B2 (ja) |
EP (1) | EP2183644B1 (ja) |
JP (3) | JP5628035B2 (ja) |
DK (1) | DK2183644T3 (ja) |
ES (1) | ES2585345T3 (ja) |
WO (1) | WO2009023847A1 (ja) |
Families Citing this family (16)
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US20090087919A1 (en) | 2007-09-28 | 2009-04-02 | Caldera Pharmaceuticals, Inc. | Method and Apparatus for Measuring Protein Post-Translational Modification |
US8687189B2 (en) * | 2008-03-03 | 2014-04-01 | Ajjer, Llc | Analysis of arrays by laser induced breakdown spectroscopy |
US20120307962A1 (en) * | 2009-12-16 | 2012-12-06 | Georgia Tech Resarch Corporation | Systems and methods for x-ray fluorescence computed tomography imaging with nanoparticles |
US8440926B2 (en) * | 2010-06-09 | 2013-05-14 | Apple Inc. | Low profile tape structures |
US9063066B2 (en) | 2010-10-14 | 2015-06-23 | Xrpro Sciences, Inc. | Method for analysis using X-ray fluorescence |
US9488605B2 (en) | 2012-09-07 | 2016-11-08 | Carl Zeiss X-ray Microscopy, Inc. | Confocal XRF-CT system for mining analysis |
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WO2017184564A1 (en) | 2016-04-18 | 2017-10-26 | Icagen, Inc. | Sensors and sensor arrays for detection of analytes |
BR112020012824B1 (pt) | 2017-12-26 | 2023-04-18 | Jfe Steel Corporation | Tubo de aço sem emenda de alta resistência e baixo teor de liga para produtos tubulares para a indústria petrolífera |
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JP6551633B1 (ja) | 2017-12-26 | 2019-07-31 | Jfeスチール株式会社 | 油井用低合金高強度継目無鋼管 |
KR102217403B1 (ko) * | 2019-01-30 | 2021-02-19 | 고려대학교 산학협력단 | 연속 결정학을 위한 메쉬 기반 결정 시료 홀더 |
JP7236295B2 (ja) * | 2019-03-19 | 2023-03-09 | 浜松ホトニクス株式会社 | 試料支持体、イオン化方法、及び質量分析方法 |
JP7233268B2 (ja) * | 2019-03-19 | 2023-03-06 | 浜松ホトニクス株式会社 | 試料支持体、イオン化方法、及び質量分析方法 |
WO2023180213A1 (en) * | 2022-03-24 | 2023-09-28 | Thermo Fisher Scientific Messtechnik Gmbh | Substrate alloy influence compensation |
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-
2008
- 2008-08-15 WO PCT/US2008/073359 patent/WO2009023847A1/en active Application Filing
- 2008-08-15 DK DK08798006.6T patent/DK2183644T3/en active
- 2008-08-15 US US12/192,762 patent/US8238515B2/en active Active
- 2008-08-15 EP EP08798006.6A patent/EP2183644B1/en active Active
- 2008-08-15 JP JP2010521206A patent/JP5628035B2/ja active Active
- 2008-08-15 ES ES08798006.6T patent/ES2585345T3/es active Active
-
2012
- 2012-08-06 US US13/567,613 patent/US8873707B2/en active Active
-
2013
- 2013-06-04 JP JP2013117600A patent/JP5755682B2/ja active Active
-
2014
- 2014-10-01 JP JP2014202871A patent/JP6076308B2/ja active Active
- 2014-10-07 US US14/508,322 patent/US9476846B2/en active Active
-
2016
- 2016-09-23 US US15/273,767 patent/US10782253B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
EP2183644A1 (en) | 2010-05-12 |
US8238515B2 (en) | 2012-08-07 |
JP2010537171A (ja) | 2010-12-02 |
JP2013224946A (ja) | 2013-10-31 |
EP2183644A4 (en) | 2012-01-18 |
WO2009023847A1 (en) | 2009-02-19 |
US8873707B2 (en) | 2014-10-28 |
JP6076308B2 (ja) | 2017-02-08 |
US20090046832A1 (en) | 2009-02-19 |
US9476846B2 (en) | 2016-10-25 |
EP2183644B1 (en) | 2016-06-08 |
US20150023467A1 (en) | 2015-01-22 |
US10782253B2 (en) | 2020-09-22 |
ES2585345T3 (es) | 2016-10-05 |
JP5755682B2 (ja) | 2015-07-29 |
US20170010228A1 (en) | 2017-01-12 |
US20130034205A1 (en) | 2013-02-07 |
DK2183644T3 (en) | 2016-08-29 |
JP2015004692A (ja) | 2015-01-08 |
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