JP2015530573A5 - - Google Patents

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Publication number
JP2015530573A5
JP2015530573A5 JP2015530253A JP2015530253A JP2015530573A5 JP 2015530573 A5 JP2015530573 A5 JP 2015530573A5 JP 2015530253 A JP2015530253 A JP 2015530253A JP 2015530253 A JP2015530253 A JP 2015530253A JP 2015530573 A5 JP2015530573 A5 JP 2015530573A5
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JP
Japan
Prior art keywords
light
diffusing element
screen
light diffusing
measurement component
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JP2015530253A
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English (en)
Japanese (ja)
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JP6357153B2 (ja
JP2015530573A (ja
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Priority claimed from PCT/CA2013/050694 external-priority patent/WO2014036660A1/en
Publication of JP2015530573A publication Critical patent/JP2015530573A/ja
Publication of JP2015530573A5 publication Critical patent/JP2015530573A5/ja
Application granted granted Critical
Publication of JP6357153B2 publication Critical patent/JP6357153B2/ja
Expired - Fee Related legal-status Critical Current
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JP2015530253A 2012-09-10 2013-09-10 光を測定するデバイス及び方法 Expired - Fee Related JP6357153B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201261698995P 2012-09-10 2012-09-10
US61/698,995 2012-09-10
US201361784827P 2013-03-14 2013-03-14
US61/784,827 2013-03-14
PCT/CA2013/050694 WO2014036660A1 (en) 2012-09-10 2013-09-10 Devices and methods for measuring light

Publications (3)

Publication Number Publication Date
JP2015530573A JP2015530573A (ja) 2015-10-15
JP2015530573A5 true JP2015530573A5 (enExample) 2016-11-04
JP6357153B2 JP6357153B2 (ja) 2018-07-11

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JP2015530253A Expired - Fee Related JP6357153B2 (ja) 2012-09-10 2013-09-10 光を測定するデバイス及び方法

Country Status (8)

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US (3) US9310298B2 (enExample)
EP (1) EP2893310A4 (enExample)
JP (1) JP6357153B2 (enExample)
CN (1) CN104797912B (enExample)
AR (1) AR092504A1 (enExample)
CA (1) CA2922975C (enExample)
TW (1) TW201428245A (enExample)
WO (1) WO2014036660A1 (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6357153B2 (ja) * 2012-09-10 2018-07-11 ブルーライト アナリティックス インコーポレイテッド 光を測定するデバイス及び方法
US10231810B2 (en) * 2012-09-14 2019-03-19 3M Innovative Properties Company Dental irradiation device and system
TW201528211A (zh) * 2013-10-21 2015-07-16 Sicpa Holding Sa 安全性檢查站
US9423534B2 (en) * 2014-06-18 2016-08-23 Vishay Capella Microsystems (Taiwan) Limited Optical module
ES2597982B1 (es) * 2015-01-05 2017-11-30 Abengoa Solar New Technologies, S.A. Sistema y método de medida de la irradiancia asociada a una fuente de radiación lumínica y del ángulo de incidencia de dicha radiación
CA3073739A1 (en) 2017-08-25 2019-02-28 Bluelight Analytics, Inc. System and devices for measuring light sources and methods of use thereof
CN108645600B (zh) * 2018-04-28 2021-01-22 海正药业(杭州)有限公司 一种弥散光纤发光均匀性检测仪及其检测方法
US11441942B2 (en) * 2018-06-25 2022-09-13 Hutchinson Technology Incorporated Photoresist spectral sensitivity matching radiometer for trace/space width variation improvement
CN113167639A (zh) * 2018-10-19 2021-07-23 蓝光分析股份有限公司 测量光源的系统和设备及其使用方法
CN112903251B (zh) * 2019-12-04 2023-04-07 周卓煇 视网膜安全提升指标的量测装置及方法
TWI722695B (zh) * 2019-12-04 2021-03-21 國立清華大學 視網膜安全提升指標的量測裝置及方法
TWI731679B (zh) * 2020-05-13 2021-06-21 國立清華大學 視網膜可容許曝照時間簡易測定裝置及方法
CN111964876B (zh) * 2020-07-29 2021-11-23 南京理工大学 基于lrte-nufft的平行平板光学均匀性的测量方法
US12055641B2 (en) * 2020-10-01 2024-08-06 Woods Hole Oceanographic Institution Methods and apparatus for direct calibration
EP4484873A1 (de) * 2023-06-26 2025-01-01 Ivoclar Vivadent AG Belichtungsgerät zum beleuchten eines dentalobjekts
JP2025010795A (ja) * 2023-07-10 2025-01-23 コニカミノルタ株式会社 測光装置及び測光方法

Family Cites Families (54)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2417399C3 (de) * 1974-04-09 1981-11-05 Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH, 8000 München Gerät zur Messung inhomogener optischer Strahlung
JPS5441743Y2 (enExample) * 1975-03-10 1979-12-05
US4915500A (en) * 1985-08-16 1990-04-10 The United States Of America As Represented By The Department Of Energy Multichannel optical sensing device
US5800184A (en) * 1994-03-08 1998-09-01 International Business Machines Corporation High density electrical interconnect apparatus and method
US6292003B1 (en) * 1998-07-01 2001-09-18 Xilinx, Inc. Apparatus and method for testing chip scale package integrated circuits
US6872933B2 (en) 1998-07-15 2005-03-29 Alvin R. Wirthlin Optical transducer
US6710798B1 (en) * 1999-03-09 2004-03-23 Applied Precision Llc Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card
US6519037B2 (en) * 1999-12-23 2003-02-11 Lj Laboratories, Llc Spectrometer having optical unit including a randomized fiber optic implement
US6437861B1 (en) * 2000-02-16 2002-08-20 Expo Photonic Solutions Inc. Compact light integration interface
US6468077B1 (en) * 2001-04-26 2002-10-22 New Photonics, Llc Compact device for curing dental compositions and method of curing
US6919919B2 (en) * 2002-02-06 2005-07-19 Xenogen Corporation Light calibration device for use in low level light imaging systems
JP3716303B2 (ja) * 2002-01-24 2005-11-16 独立行政法人産業技術総合研究所 光感応型発光素子の発光効率測定方法及び装置
US8078256B2 (en) * 2002-10-10 2011-12-13 Visualsonics Inc. Integrated multi-rail imaging system
US7782071B2 (en) * 2006-12-19 2010-08-24 Rudolph Technologies, Inc. Probe card analysis system and method
WO2005024437A1 (ja) * 2003-09-05 2005-03-17 Nec Corporation 測定システム
US7250611B2 (en) 2003-12-02 2007-07-31 3M Innovative Properties Company LED curing apparatus and method
US20050234526A1 (en) * 2004-04-14 2005-10-20 Gilhuly Terence J Systems and methods for detection of disease including oral scopes and ambient light management systems (ALMS)
US7697750B2 (en) 2004-12-06 2010-04-13 John Castle Simmons Specially coherent optics
US20060134576A1 (en) * 2004-12-21 2006-06-22 John West Dental illumination device with single or multiple total internal reflectors (TIR)
EP1880165A2 (en) * 2005-03-24 2008-01-23 Infotonics Technology Center, Inc. Hyperspectral imaging system and methods thereof
US20070037113A1 (en) * 2005-08-10 2007-02-15 Scott Robert R Dental curing light including a light integrator for providing substantially equal distribution of each emitted wavelength
JP4938782B2 (ja) * 2005-10-18 2012-05-23 ジーエスアイ・グループ・コーポレーション 光学的基準を利用する方法および装置
JP4425206B2 (ja) * 2005-11-07 2010-03-03 シャープ株式会社 光走査装置及びこれを用いた画像形成装置
DE102006035657B3 (de) 2006-07-31 2008-04-03 Ivoclar Vivadent Ag Lichtmessvorrichtung
JP2008067981A (ja) * 2006-09-15 2008-03-27 Shin Etsu Polymer Co Ltd 歯科治療用の遮光器具
WO2009045676A1 (en) * 2007-10-05 2009-04-09 3M Innovative Properties Company Automatic darkening filter apparatus and method
US8345226B2 (en) * 2007-11-30 2013-01-01 Jingyun Zhang Spectrometers miniaturized for working with cellular phones and other portable electronic devices
US8116658B2 (en) * 2008-05-22 2012-02-14 Xerox Corporation Marking engine viewing system
JP5352217B2 (ja) * 2008-12-12 2013-11-27 日置電機株式会社 積分球及び測光装置
BRPI0923037A2 (pt) 2008-12-18 2015-12-15 Novartis Ag método para produzir lentes de contato de hidrogel de silicone
US20100176831A1 (en) * 2009-01-14 2010-07-15 Palcisko William M Probe Test Card with Flexible Interconnect Structure
JP5572954B2 (ja) * 2009-01-26 2014-08-20 株式会社リコー 撮像素子及び該撮像素子を備えた画像撮像装置
CA2758036C (en) 2009-04-09 2019-08-13 Dalhousie University Method and system for measurement of curing energy delivered during simulated dental restorations
EP2446928A4 (en) 2009-09-09 2013-04-17 Univ Tokai Educational System METHOD FOR SELECTIVELY KILLING TUMOR CELLS AND DEVICE FOR THIS METHOD
US8854734B2 (en) * 2009-11-12 2014-10-07 Vela Technologies, Inc. Integrating optical system and methods
DK2513002T3 (en) 2009-12-17 2016-04-04 Dsm Ip Assets Bv LED CURE OF RADIATABLE OPTICAL FIBER COATING COMPOSITIONS
JP5608919B2 (ja) * 2010-02-24 2014-10-22 大塚電子株式会社 光学測定装置
JP5643983B2 (ja) * 2010-03-25 2014-12-24 大塚電子株式会社 光学測定装置、光学測定システムおよびファイバ結合器
US9684052B2 (en) * 2010-04-23 2017-06-20 Rudolph Technologies, Inc. Method of measuring and assessing a probe card with an inspection device
US8476918B2 (en) * 2010-04-28 2013-07-02 Tsmc Solid State Lighting Ltd. Apparatus and method for wafer level classification of light emitting device
JP5608502B2 (ja) * 2010-09-30 2014-10-15 オリンパス株式会社 照明システム及び照明方法
JP2012165359A (ja) * 2010-10-13 2012-08-30 Act Research Corp 多数、変換可能な表示モードのプロジェクションディスプレイのシステムそして方法
US20120130142A1 (en) * 2010-11-24 2012-05-24 Uop, Llc Automatically measuring color changes in a stream
JP6357153B2 (ja) 2012-09-10 2018-07-11 ブルーライト アナリティックス インコーポレイテッド 光を測定するデバイス及び方法
WO2014043406A1 (en) * 2012-09-14 2014-03-20 Flir Systems, Inc. Illuminator for wafer prober
JP5813609B2 (ja) * 2012-09-28 2015-11-17 株式会社日立ハイテクノロジーズ 熱アシスト磁気ヘッド検査方法及び熱アシスト磁気ヘッド検査装置
ES2701054T3 (es) * 2013-01-08 2019-02-20 Commscope Inc North Carolina Curado selectivo de epoxi adyacente a fibras ópticas por transmisión de energía UV a través del revestimiento de las fibras
JP5792348B1 (ja) * 2014-04-16 2015-10-07 シャープ株式会社 位置入力装置およびタッチパネル
US10345504B2 (en) * 2014-10-15 2019-07-09 Sharp Kabushiki Kaisha Lighting device, display device, and method of manufacturing lighting device
FR3028685B1 (fr) * 2014-11-18 2018-05-25 Valeo Equipements Electriques Moteur Systeme d'alimentation electrique d'un vehicule automobile et module electronique de commande correspondant
US10182702B2 (en) * 2015-03-13 2019-01-22 Panasonic Intellectual Property Management Co., Ltd. Light-emitting apparatus including photoluminescent layer
JP6786798B2 (ja) * 2015-12-22 2020-11-18 株式会社リコー 光学センサ、光学検査装置、及び光学特性検出方法
US10596964B2 (en) * 2016-01-13 2020-03-24 Ricoh Company, Ltd. Distance measurement device, moveable device, and distance measuring method
US10360459B2 (en) * 2016-04-06 2019-07-23 Panasonic Intellectual Property Management Co., Ltd. Detection device, detection method, and non-transitory computer-readable recording medium storing detection program

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