JP2010533865A5 - - Google Patents

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Publication number
JP2010533865A5
JP2010533865A5 JP2010517061A JP2010517061A JP2010533865A5 JP 2010533865 A5 JP2010533865 A5 JP 2010533865A5 JP 2010517061 A JP2010517061 A JP 2010517061A JP 2010517061 A JP2010517061 A JP 2010517061A JP 2010533865 A5 JP2010533865 A5 JP 2010533865A5
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JP
Japan
Prior art keywords
axis
light
opening
light source
transmission sensor
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Application number
JP2010517061A
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English (en)
Japanese (ja)
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JP2010533865A (ja
JP5314015B2 (ja
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Priority claimed from PCT/US2008/068913 external-priority patent/WO2009014866A1/en
Publication of JP2010533865A publication Critical patent/JP2010533865A/ja
Publication of JP2010533865A5 publication Critical patent/JP2010533865A5/ja
Application granted granted Critical
Publication of JP5314015B2 publication Critical patent/JP5314015B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2010517061A 2007-07-19 2008-07-01 光学的特性センサー Expired - Fee Related JP5314015B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US95069307P 2007-07-19 2007-07-19
US60/950,693 2007-07-19
PCT/US2008/068913 WO2009014866A1 (en) 2007-07-19 2008-07-01 Optical property sensor

Publications (3)

Publication Number Publication Date
JP2010533865A JP2010533865A (ja) 2010-10-28
JP2010533865A5 true JP2010533865A5 (enExample) 2011-08-18
JP5314015B2 JP5314015B2 (ja) 2013-10-16

Family

ID=40281709

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010517061A Expired - Fee Related JP5314015B2 (ja) 2007-07-19 2008-07-01 光学的特性センサー

Country Status (7)

Country Link
US (1) US7969560B2 (enExample)
EP (1) EP2171430B1 (enExample)
JP (1) JP5314015B2 (enExample)
KR (1) KR101515246B1 (enExample)
CN (1) CN101680837B (enExample)
BR (1) BRPI0811794A2 (enExample)
WO (1) WO2009014866A1 (enExample)

Families Citing this family (20)

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Publication number Priority date Publication date Assignee Title
US8184294B2 (en) * 2009-03-09 2012-05-22 Honeywell International Inc. Apparatus and method for measuring haze of sheet materials or other materials
DE102009040642B3 (de) 2009-09-09 2011-03-10 Von Ardenne Anlagentechnik Gmbh Verfahren und Vorrichtung zur Messung von optischen Kenngrößen transparenter, streuender Messobjekte
CN101839802A (zh) * 2010-05-21 2010-09-22 西安工业大学 高反射镜激光积分散射率多角度综合测量装置
EP2466292B1 (en) 2010-10-29 2017-12-13 F. Hoffmann-La Roche AG System for performing scattering and absorbance assays
JP2012237599A (ja) * 2011-05-10 2012-12-06 Ulvac Japan Ltd 被処理体の検査装置
CN102305760B (zh) * 2011-05-23 2013-10-02 成都光明光电股份有限公司 光学玻璃耐腐蚀性测试装置及其测试方法
DE102011077290A1 (de) 2011-06-09 2012-12-13 Carl Zeiss Microimaging Gmbh Messverfahren und Messvorrichtung zur Ermittlung von Transmissions- und/oder Reflektionseigenschaften
DE102011050969A1 (de) * 2011-06-09 2013-05-16 Carl Zeiss Microscopy Gmbh Vorrichtung zur referenzierten Messung von reflektiertem Licht und Verfahren zum Kalibrieren einer solchen Vorrichtung
JP2014215257A (ja) * 2013-04-26 2014-11-17 日本電色工業株式会社 ヘーズ値計測装置
JP6529107B2 (ja) * 2014-08-19 2019-06-12 株式会社川島織物セルコン 光の透過性・拡散性評価方法、及び、当該評価方法を実施するために用いる透過性・拡散性評価システム
US20170109895A1 (en) * 2015-10-19 2017-04-20 Honeywell International Inc. Apparatus and method for measuring haze of sheet materials or other materials using off-axis detector
US20180364160A1 (en) 2015-12-11 2018-12-20 Dsm Ip Assets B.V. System and method for optical measurement on a transparent sheet
CN106198398B (zh) * 2016-08-17 2023-10-27 远方谱色科技有限公司 一种清晰度测量装置
CN106198399B (zh) * 2016-08-17 2023-10-27 远方谱色科技有限公司 一种清晰度测量装置
TWI604907B (zh) 2016-10-11 2017-11-11 財團法人工業技術研究院 雷射均勻加工裝置及其方法
CN106501184B (zh) * 2016-10-25 2020-07-28 成都光明光电股份有限公司 光学玻璃测量装置及其测量方法
DE102016226212A1 (de) * 2016-12-23 2018-06-28 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Analyseeinrichtung
CN110603433A (zh) 2017-05-05 2019-12-20 3M创新有限公司 散射测量系统及其使用方法
CN109588051A (zh) 2017-07-27 2019-04-05 法国圣戈班玻璃厂 用于光学测定交通工具基材的白雾的方法和设备
US11536541B2 (en) 2019-05-15 2022-12-27 Andrew Webberley Apparatus and method for monitoring and controlling a haze level

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JPH0638058B2 (ja) * 1984-08-16 1994-05-18 新日本製鐵株式会社 気体の濃度および分圧測定装置
US4687943A (en) 1985-01-18 1987-08-18 Research Technology International Optical motion picture film inspection system
JPS6375537A (ja) * 1986-09-18 1988-04-05 Toshiba Corp 自動化学分析装置
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JPH0827211B2 (ja) * 1992-07-22 1996-03-21 株式会社ジャパンエナジー 光量測定装置
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DE29511344U1 (de) * 1995-07-13 1996-11-14 Byk-Gardner GmbH, 82538 Geretsried Vorrichtung zur Messung von optischen Kenngrößen transparenter Materialien
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JP2002310902A (ja) * 2001-04-16 2002-10-23 Central Glass Co Ltd 波長選択性のある散乱光測定方法
JP2003014637A (ja) * 2001-06-29 2003-01-15 Ishikawajima Harima Heavy Ind Co Ltd Ｓｏ３濃度計測装置
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