JP2015524050A5 - - Google Patents

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Publication number
JP2015524050A5
JP2015524050A5 JP2015512155A JP2015512155A JP2015524050A5 JP 2015524050 A5 JP2015524050 A5 JP 2015524050A5 JP 2015512155 A JP2015512155 A JP 2015512155A JP 2015512155 A JP2015512155 A JP 2015512155A JP 2015524050 A5 JP2015524050 A5 JP 2015524050A5
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JP
Japan
Prior art keywords
target object
image
illumination pattern
light source
dimensional array
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2015512155A
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English (en)
Japanese (ja)
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JP2015524050A (ja
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Publication date
Application filed filed Critical
Priority claimed from PCT/IB2013/053534 external-priority patent/WO2013171613A1/en
Publication of JP2015524050A publication Critical patent/JP2015524050A/ja
Publication of JP2015524050A5 publication Critical patent/JP2015524050A5/ja
Ceased legal-status Critical Current

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JP2015512155A 2012-05-14 2013-05-03 ターゲット物体の表面の深さをプロファイリングするための装置及び方法 Ceased JP2015524050A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP12167885.8 2012-05-14
EP12167885 2012-05-14
PCT/IB2013/053534 WO2013171613A1 (en) 2012-05-14 2013-05-03 Apparatus and method for profiling a depth of a surface of a target object

Publications (2)

Publication Number Publication Date
JP2015524050A JP2015524050A (ja) 2015-08-20
JP2015524050A5 true JP2015524050A5 (enExample) 2016-06-23

Family

ID=48628752

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2015512155A Ceased JP2015524050A (ja) 2012-05-14 2013-05-03 ターゲット物体の表面の深さをプロファイリングするための装置及び方法

Country Status (7)

Country Link
US (1) US9797708B2 (enExample)
EP (1) EP2849644A1 (enExample)
JP (1) JP2015524050A (enExample)
CN (1) CN104284625B (enExample)
BR (1) BR112014028135A2 (enExample)
RU (1) RU2633922C2 (enExample)
WO (1) WO2013171613A1 (enExample)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104798271B (zh) 2012-11-29 2018-08-28 皇家飞利浦有限公司 用于向场景上投射结构化光图案的激光设备
EP3177890B1 (en) 2014-08-10 2019-10-09 Facebook Technologies, LLC Structured light for 3d sensing
WO2016025831A2 (en) * 2014-08-14 2016-02-18 Bae Systems Information And Electronic Systems Integration Inc. System for uniformly illuminating target to reduce speckling
US9553423B2 (en) 2015-02-27 2017-01-24 Princeton Optronics Inc. Miniature structured light illuminator
US9946089B2 (en) 2015-10-21 2018-04-17 Princeton Optronics, Inc. Generation of coded structured light patterns using VCSEL arrays
US9952036B2 (en) * 2015-11-06 2018-04-24 Intel Corporation Systems, methods, and apparatuses for implementing maximum likelihood image binarization in a coded light range camera
JP6782559B2 (ja) * 2016-05-13 2020-11-11 株式会社小糸製作所 車両用前照灯
US10241244B2 (en) 2016-07-29 2019-03-26 Lumentum Operations Llc Thin film total internal reflection diffraction grating for single polarization or dual polarization
ES2743298T3 (es) * 2016-10-27 2020-02-18 Pepperl Fuchs Ag Dispositivo de medición y procedimiento para la medición por triangulación
US10419741B2 (en) * 2017-02-24 2019-09-17 Analog Devices Global Unlimited Company Systems and methods for compression of three dimensional depth sensing
US10627709B2 (en) 2018-06-29 2020-04-21 Ricoh Company, Ltd. Light source, projection device, measurement device, robot, electronic device, mobile object, and shaping apparatus
JP7379859B2 (ja) * 2018-06-29 2023-11-15 株式会社リコー 光源、投影装置、計測装置、ロボット、電子機器、移動体、および造形装置
JP7222200B2 (ja) 2018-08-27 2023-02-15 株式会社リコー 光学装置、計測装置、ロボット、電子機器、移動体、および造形装置
CN109584150B (zh) * 2018-11-28 2023-03-14 维沃移动通信（杭州）有限公司 一种图像处理方法及终端设备
JP2020153798A (ja) * 2019-03-19 2020-09-24 株式会社リコー 光学装置、測距光学系ユニット、測距装置及び測距システム
US12400322B2 (en) * 2021-02-22 2025-08-26 Fresenius Medical Care Holdings, Inc. System and method for measuring edema at home and measurement pattern for use therewith
JP2022131710A (ja) * 2021-02-26 2022-09-07 国立大学法人福井大学 集光する特性を持つ光学素子を複数個配置した集光手段を備えた格子投影装置及び前記格子投影装置を用いた計測装置
CN113654487B (zh) * 2021-08-17 2023-07-18 西安交通大学 一种单幅彩色条纹图动态三维测量方法及系统
US20230085063A1 (en) * 2021-09-13 2023-03-16 Facebook Technologies, Llc Vcsel chip for generation of linear structured light patterns and flood illumination
TW202315250A (zh) * 2021-09-13 2023-04-01 美商元平台技術有限公司 用於產生線性結構光圖案及泛光照明的垂直腔面射型雷射晶片
CN115077402B (zh) * 2022-06-22 2024-07-12 广州市城市规划勘测设计研究院 一种管线埋深及管径的测量装置及方法
WO2024100475A1 (en) * 2022-11-09 2024-05-16 Mtr Corporation Limited Method and device for inspecting a moving apparatus
CN117058004B (zh) * 2023-10-13 2024-03-08 埃克斯工业有限公司 晶圆的晶粒图像重构方法、电子设备及存储介质

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
RU2050543C1 (ru) * 1993-03-12 1995-12-20 Черняков Геннадий Михайлович Устройство для регистрации изображения поверхности сложного профиля, расположенной на заданной глубине объекта
US5933240A (en) * 1997-02-12 1999-08-03 Jurca; Marius Christian Method and apparatus for determining the distance between a base and a specular surface by means of radiation reflected at the surface
US6912076B2 (en) 2000-03-17 2005-06-28 Accu-Sort Systems, Inc. Coplanar camera scanning system
US20030216719A1 (en) * 2001-12-12 2003-11-20 Len Debenedictis Method and apparatus for treating skin using patterns of optical energy
US20040082940A1 (en) 2002-10-22 2004-04-29 Michael Black Dermatological apparatus and method
US6931149B2 (en) 2002-04-19 2005-08-16 Norsk Elektro Optikk A/S Pipeline internal inspection device and method
US20060082882A1 (en) 2004-10-14 2006-04-20 Wang Michael R Achromatic imaging lens with extended depth of focus
JP2006267031A (ja) * 2005-03-25 2006-10-05 Brother Ind Ltd ３次元入力装置および３次元入力方法
US8475506B1 (en) * 2007-08-13 2013-07-02 Lockheed Martin Corporation VCSEL array stimulator apparatus and method for light stimulation of bodily tissues
DE602006016013D1 (de) * 2005-11-28 2010-09-16 3Shape As Codiertes strukturiertes licht
WO2007102195A1 (ja) 2006-03-07 2007-09-13 Fujitsu Limited 撮影装置、及び撮影方法
US20080238338A1 (en) 2007-03-30 2008-10-02 Stephen Andrew Latham Method and system for providing scalable and configurable illumination
US8384997B2 (en) 2008-01-21 2013-02-26 Primesense Ltd Optical pattern projection
JP5571651B2 (ja) 2008-03-18 2014-08-13 コーニンクレッカ フィリップス エヌ ヴェ 皮膚撮像装置及び皮膚分析システム
JP4235684B1 (ja) * 2008-06-17 2009-03-11 株式会社創喜 表面検査装置
DE102008057542A1 (de) 2008-11-08 2009-07-02 Daimler Ag Erfassungseinrichtung zur Erkennung eines Zustands eines Reifens
JP5257053B2 (ja) 2008-12-24 2013-08-07 株式会社豊田中央研究所 光走査装置及びレーザレーダ装置
GB0907277D0 (en) 2009-04-29 2009-06-10 Univ Kent Kanterbury Method for depth resolved wavefront sensing, depth resolved wavefront sensors and method and apparatus for optical imaging
US20110040192A1 (en) * 2009-05-21 2011-02-17 Sara Brenner Method and a system for imaging and analysis for mole evolution tracking
EP2467910B1 (en) * 2009-08-20 2019-02-06 Koninklijke Philips N.V. A vertical cavity surface emitting laser device with angular-selective feedback
JP2011064482A (ja) * 2009-09-15 2011-03-31 Kurabo Ind Ltd 高速三次元計測装置及び高速三次元計測方法
US8830227B2 (en) * 2009-12-06 2014-09-09 Primesense Ltd. Depth-based gain control
GB0921461D0 (en) 2009-12-08 2010-01-20 Qinetiq Ltd Range based sensing
US8210716B2 (en) * 2010-08-27 2012-07-03 Quarkstar Llc Solid state bidirectional light sheet for general illumination

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