EA201790061A1 - Способ и устройство для визуализации картины фрагментации, образованной в закаленной стеклянной панели - Google Patents

Способ и устройство для визуализации картины фрагментации, образованной в закаленной стеклянной панели

Info

Publication number
EA201790061A1
EA201790061A1 EA201790061A EA201790061A EA201790061A1 EA 201790061 A1 EA201790061 A1 EA 201790061A1 EA 201790061 A EA201790061 A EA 201790061A EA 201790061 A EA201790061 A EA 201790061A EA 201790061 A1 EA201790061 A1 EA 201790061A1
Authority
EA
Eurasian Patent Office
Prior art keywords
glass panel
fragmentation
hardened glass
visualization
picture formed
Prior art date
Application number
EA201790061A
Other languages
English (en)
Other versions
EA032784B1 (ru
Inventor
Ромен Дакен
Нерио Лукка
Original Assignee
Агк Гласс Юроп
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Агк Гласс Юроп filed Critical Агк Гласс Юроп
Publication of EA201790061A1 publication Critical patent/EA201790061A1/ru
Publication of EA032784B1 publication Critical patent/EA032784B1/ru

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/38—Concrete; ceramics; glass; bricks
    • G01N33/386—Glass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0006—Industrial image inspection using a design-rule based approach
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
    • G01N2021/8832—Structured background, e.g. for transparent objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9586—Windscreens

Abstract

Способ и устройство (1) для обследования картины фрагментации в закаленной стеклянной панели (2) посредством дефлектометрии после испытания на фрагментацию, при этом способ включает: (i) расположение закаленной стеклянной панели (2) в контакте с опорным средством (6, 7); (ii) проецирование с помощью устройства (3) отображения картины структурированного света на поверхность по меньшей мере одной части закаленной стеклянной панели (2); (iii) захват изображения, отраженного поверхностью первой части закаленной стеклянной панели (2), с помощью устройства (4) захвата изображения; и (iv) обработку изображений для определения картины фрагментации с помощью устройства (5) обработки изображения.
EA201790061A 2014-07-24 2015-07-15 Способ обследования картины фрагментации закаленной стеклянной панели EA032784B1 (ru)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP14178286.2A EP2977756A1 (en) 2014-07-24 2014-07-24 Method and installation for imaging a fragmentation pattern formed in a tempered glass panel
PCT/EP2015/066123 WO2016012321A1 (en) 2014-07-24 2015-07-15 Method and installation for imaging a fragmentation pattern formed in a tempered glass panel

Publications (2)

Publication Number Publication Date
EA201790061A1 true EA201790061A1 (ru) 2017-06-30
EA032784B1 EA032784B1 (ru) 2019-07-31

Family

ID=51302625

Family Applications (1)

Application Number Title Priority Date Filing Date
EA201790061A EA032784B1 (ru) 2014-07-24 2015-07-15 Способ обследования картины фрагментации закаленной стеклянной панели

Country Status (5)

Country Link
US (1) US10282832B2 (ru)
EP (2) EP2977756A1 (ru)
JP (1) JP6799527B2 (ru)
EA (1) EA032784B1 (ru)
WO (1) WO2016012321A1 (ru)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110189287A (zh) * 2018-09-05 2019-08-30 永康市胜时电机有限公司 像素点双向拟合系统
US10598604B1 (en) 2019-04-26 2020-03-24 Cark Zeiss Industrial Metrology, LLC Normal incidence phase-shifted deflectometry sensor, system, and method for inspecting a surface of a specimen
EP3858794A1 (en) 2020-01-31 2021-08-04 Glaston Finland Oy Method for tempering a glass sheet
CN111323434B (zh) * 2020-03-16 2021-08-13 征图新视(江苏)科技股份有限公司 相位偏折术在玻璃缺陷检测的应用

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3937559A1 (de) * 1989-09-02 1991-03-14 Flachglas Ag Verfahren zum ermitteln von optischen fehlern in scheiben aus einem transparenten material, insbesondere aus glas
JPH0431749A (ja) * 1990-05-28 1992-02-03 Fuji Electric Co Ltd 強化ガラス品の割れの検査方法
US6766046B1 (en) 1998-02-19 2004-07-20 Asahi Glass Company Ltd. Plate glass shatter testing method, device, imaging method for glass testing and image signal processing method
KR101242984B1 (ko) * 2005-07-15 2013-03-12 아사히 가라스 가부시키가이샤 형상 검사 방법 및 장치
GB0702937D0 (en) * 2007-02-15 2007-03-28 Pilkington Group Ltd Glazing inspection
GB0721060D0 (en) * 2007-10-29 2007-12-05 Pilkington Group Ltd Optical inspection
JP2009229227A (ja) * 2008-03-21 2009-10-08 Asahi Glass Co Ltd 湾曲した板状体の検査装置及び検査方法
FR2960059B1 (fr) 2010-05-11 2012-12-28 Visuol Technologies Installation de controle de la qualite d'une surface d'un objet
US20120098959A1 (en) * 2010-10-20 2012-04-26 Glasstech, Inc. Method and apparatus for measuring transmitted optical distortion in glass sheets
JP2013024737A (ja) * 2011-07-21 2013-02-04 Nikon Corp ３次元形状測定方法及び装置並びに３次元形状測定用顕微鏡装置

Also Published As

Publication number Publication date
EP3172561B1 (en) 2018-06-06
EP2977756A1 (en) 2016-01-27
US10282832B2 (en) 2019-05-07
JP6799527B2 (ja) 2020-12-16
EA032784B1 (ru) 2019-07-31
US20170221198A1 (en) 2017-08-03
JP2017522566A (ja) 2017-08-10
EP3172561A1 (en) 2017-05-31
WO2016012321A1 (en) 2016-01-28

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Legal Events

Date Code Title Description
MM4A Lapse of a eurasian patent due to non-payment of renewal fees within the time limit in the following designated state(s)

Designated state(s): AM AZ BY KZ KG TJ TM