JP2015501520A5 - - Google Patents
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- Publication number
- JP2015501520A5 JP2015501520A5 JP2014539139A JP2014539139A JP2015501520A5 JP 2015501520 A5 JP2015501520 A5 JP 2015501520A5 JP 2014539139 A JP2014539139 A JP 2014539139A JP 2014539139 A JP2014539139 A JP 2014539139A JP 2015501520 A5 JP2015501520 A5 JP 2015501520A5
- Authority
- JP
- Japan
- Prior art keywords
- ion
- setting
- iped
- excitation
- electron source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 150000002500 ions Chemical class 0.000 claims description 92
- 230000005284 excitation Effects 0.000 claims description 56
- 238000005040 ion trap Methods 0.000 claims description 54
- 238000000034 method Methods 0.000 claims description 49
- 238000005381 potential energy Methods 0.000 claims description 16
- 238000001228 spectrum Methods 0.000 claims description 8
- 230000003595 spectral effect Effects 0.000 claims description 4
- 238000010894 electron beam technology Methods 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims description 3
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161553779P | 2011-10-31 | 2011-10-31 | |
| US61/553,779 | 2011-10-31 | ||
| US201261719668P | 2012-10-29 | 2012-10-29 | |
| US61/719,668 | 2012-10-29 | ||
| PCT/US2012/062599 WO2013066881A2 (en) | 2011-10-31 | 2012-10-30 | Method and apparatus for tuning an electrostatic ion trap |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015501520A JP2015501520A (ja) | 2015-01-15 |
| JP2015501520A5 true JP2015501520A5 (cg-RX-API-DMAC7.html) | 2015-10-29 |
| JP5918384B2 JP5918384B2 (ja) | 2016-05-18 |
Family
ID=48193013
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014539139A Active JP5918384B2 (ja) | 2011-10-31 | 2012-10-30 | 静電イオントラップの同調方法および装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9040907B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP2774169A2 (cg-RX-API-DMAC7.html) |
| JP (1) | JP5918384B2 (cg-RX-API-DMAC7.html) |
| WO (1) | WO2013066881A2 (cg-RX-API-DMAC7.html) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6059814B2 (ja) * | 2013-08-30 | 2017-01-11 | アトナープ株式会社 | 分析装置 |
| RU2577781C1 (ru) * | 2014-09-09 | 2016-03-20 | Закрытое акционерное общество "Инновационный центр "Бирюч" (ЗАО "ИЦ "Бирюч") | Дифференциальный спектрометр ионной подвижности с ионной ловушкой |
| CN105158666B (zh) * | 2015-08-24 | 2018-02-09 | 北京工业大学 | 一种测量及表征半导体器件陷阱参数的方法 |
| US10395895B2 (en) * | 2015-08-27 | 2019-08-27 | Mks Instruments, Inc. | Feedback control by RF waveform tailoring for ion energy distribution |
| CN118824834A (zh) * | 2016-12-22 | 2024-10-22 | 株式会社岛津制作所 | 质谱分析装置以及非暂时性计算机可读介质 |
| WO2019058226A1 (en) * | 2017-09-25 | 2019-03-28 | Dh Technologies Development Pte. Ltd. | MASS SPECTROMETER WITH ELECTRO-STATIC LINEAR ION TRAP |
| GB201808893D0 (en) | 2018-05-31 | 2018-07-18 | Micromass Ltd | Bench-top time of flight mass spectrometer |
| GB201808912D0 (en) | 2018-05-31 | 2018-07-18 | Micromass Ltd | Bench-top time of flight mass spectrometer |
| US11367607B2 (en) | 2018-05-31 | 2022-06-21 | Micromass Uk Limited | Mass spectrometer |
| GB201808894D0 (en) | 2018-05-31 | 2018-07-18 | Micromass Ltd | Mass spectrometer |
| GB201808936D0 (en) * | 2018-05-31 | 2018-07-18 | Micromass Ltd | Bench-top time of flight mass spectrometer |
| US11373849B2 (en) | 2018-05-31 | 2022-06-28 | Micromass Uk Limited | Mass spectrometer having fragmentation region |
| GB201808890D0 (en) | 2018-05-31 | 2018-07-18 | Micromass Ltd | Bench-top time of flight mass spectrometer |
| GB201808949D0 (en) | 2018-05-31 | 2018-07-18 | Micromass Ltd | Bench-top time of flight mass spectrometer |
| GB201808932D0 (en) | 2018-05-31 | 2018-07-18 | Micromass Ltd | Bench-top time of flight mass spectrometer |
| GB201808892D0 (en) | 2018-05-31 | 2018-07-18 | Micromass Ltd | Mass spectrometer |
| US10600632B2 (en) | 2018-08-23 | 2020-03-24 | Thermo Finnigan Llc | Methods for operating electrostatic trap mass analyzers |
| CN116438625A (zh) | 2020-08-26 | 2023-07-14 | 沃特世科技爱尔兰有限公司 | 用于在调谐质谱设备时选择参数值的方法、介质和系统 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62161047A (ja) * | 1986-01-10 | 1987-07-17 | Hitachi Ltd | 質量分析装置の分解能および感度設定方法 |
| US6294780B1 (en) * | 1999-04-01 | 2001-09-25 | Varian, Inc. | Pulsed ion source for ion trap mass spectrometer |
| DE60140314D1 (de) * | 2000-12-14 | 2009-12-10 | Mks Instr Inc | Ionenspeicher |
| JP2004192844A (ja) * | 2002-12-09 | 2004-07-08 | Hitachi High-Technologies Corp | プラズマイオン源三次元四重極質量分析装置 |
| US8890058B2 (en) * | 2005-11-16 | 2014-11-18 | Shimadzu Corporation | Mass spectrometer |
| US7622713B2 (en) | 2008-02-05 | 2009-11-24 | Thermo Finnigan Llc | Method and apparatus for normalizing performance of an electron source |
| US8309912B2 (en) * | 2008-11-21 | 2012-11-13 | Applied Nanotech Holdings, Inc. | Atmospheric pressure ion trap |
| EP2430646B1 (en) * | 2009-05-06 | 2019-02-27 | MKS Instruments, Inc. | Electrostatic ion trap |
-
2012
- 2012-10-30 JP JP2014539139A patent/JP5918384B2/ja active Active
- 2012-10-30 WO PCT/US2012/062599 patent/WO2013066881A2/en not_active Ceased
- 2012-10-30 EP EP12791898.5A patent/EP2774169A2/en not_active Withdrawn
- 2012-10-30 US US14/354,227 patent/US9040907B2/en active Active
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