JP5918384B2 - 静電イオントラップの同調方法および装置 - Google Patents

静電イオントラップの同調方法および装置 Download PDF

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Publication number
JP5918384B2
JP5918384B2 JP2014539139A JP2014539139A JP5918384B2 JP 5918384 B2 JP5918384 B2 JP 5918384B2 JP 2014539139 A JP2014539139 A JP 2014539139A JP 2014539139 A JP2014539139 A JP 2014539139A JP 5918384 B2 JP5918384 B2 JP 5918384B2
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Prior art keywords
ion
trap
iped
setting
excitation
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JP2014539139A
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Japanese (ja)
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JP2015501520A5 (cg-RX-API-DMAC7.html
JP2015501520A (ja
Inventor
ブラッカー・ジェラルド・エー
ラスボーン・ジー・ジェフリー
ホーヴァス・ブライアン・ジェイ
スウィニー・ティモシー・シー
ブラウチ・スティーブン・シー
マッカーシー・ジェフリー・ジー
ピウォンカ−コルレ・ティモシー・アール
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MKS Instruments Inc
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MKS Instruments Inc
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Publication of JP2015501520A5 publication Critical patent/JP2015501520A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/4245—Electrostatic ion traps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00—Ion beam tubes
    • H01J27/02—Ion sources; Ion guns
    • H01J27/20—Ion sources; Ion guns using particle beam bombardment, e.g. ionisers
    • H01J27/205—Ion sources; Ion guns using particle beam bombardment, e.g. ionisers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0009—Calibration of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H01J49/0031—Step by step routines describing the use of the apparatus
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Combustion & Propulsion (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2014539139A 2011-10-31 2012-10-30 静電イオントラップの同調方法および装置 Active JP5918384B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201161553779P 2011-10-31 2011-10-31
US61/553,779 2011-10-31
US201261719668P 2012-10-29 2012-10-29
US61/719,668 2012-10-29
PCT/US2012/062599 WO2013066881A2 (en) 2011-10-31 2012-10-30 Method and apparatus for tuning an electrostatic ion trap

Publications (3)

Publication Number Publication Date
JP2015501520A JP2015501520A (ja) 2015-01-15
JP2015501520A5 JP2015501520A5 (cg-RX-API-DMAC7.html) 2015-10-29
JP5918384B2 true JP5918384B2 (ja) 2016-05-18

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014539139A Active JP5918384B2 (ja) 2011-10-31 2012-10-30 静電イオントラップの同調方法および装置

Country Status (4)

Country Link
US (1) US9040907B2 (cg-RX-API-DMAC7.html)
EP (1) EP2774169A2 (cg-RX-API-DMAC7.html)
JP (1) JP5918384B2 (cg-RX-API-DMAC7.html)
WO (1) WO2013066881A2 (cg-RX-API-DMAC7.html)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6059814B2 (ja) * 2013-08-30 2017-01-11 アトナープ株式会社 分析装置
RU2577781C1 (ru) * 2014-09-09 2016-03-20 Закрытое акционерное общество "Инновационный центр "Бирюч" (ЗАО "ИЦ "Бирюч") Дифференциальный спектрометр ионной подвижности с ионной ловушкой
CN105158666B (zh) * 2015-08-24 2018-02-09 北京工业大学 一种测量及表征半导体器件陷阱参数的方法
US10395895B2 (en) * 2015-08-27 2019-08-27 Mks Instruments, Inc. Feedback control by RF waveform tailoring for ion energy distribution
CN118824834A (zh) * 2016-12-22 2024-10-22 株式会社岛津制作所 质谱分析装置以及非暂时性计算机可读介质
WO2019058226A1 (en) * 2017-09-25 2019-03-28 Dh Technologies Development Pte. Ltd. MASS SPECTROMETER WITH ELECTRO-STATIC LINEAR ION TRAP
GB201808893D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
US11367607B2 (en) 2018-05-31 2022-06-21 Micromass Uk Limited Mass spectrometer
GB201808894D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808936D0 (en) * 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
US11373849B2 (en) 2018-05-31 2022-06-28 Micromass Uk Limited Mass spectrometer having fragmentation region
GB201808890D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808949D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808892D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
US10600632B2 (en) 2018-08-23 2020-03-24 Thermo Finnigan Llc Methods for operating electrostatic trap mass analyzers
CN116438625A (zh) 2020-08-26 2023-07-14 沃特世科技爱尔兰有限公司 用于在调谐质谱设备时选择参数值的方法、介质和系统

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62161047A (ja) * 1986-01-10 1987-07-17 Hitachi Ltd 質量分析装置の分解能および感度設定方法
US6294780B1 (en) * 1999-04-01 2001-09-25 Varian, Inc. Pulsed ion source for ion trap mass spectrometer
DE60140314D1 (de) * 2000-12-14 2009-12-10 Mks Instr Inc Ionenspeicher
JP2004192844A (ja) * 2002-12-09 2004-07-08 Hitachi High-Technologies Corp プラズマイオン源三次元四重極質量分析装置
US8890058B2 (en) * 2005-11-16 2014-11-18 Shimadzu Corporation Mass spectrometer
US7622713B2 (en) 2008-02-05 2009-11-24 Thermo Finnigan Llc Method and apparatus for normalizing performance of an electron source
US8309912B2 (en) * 2008-11-21 2012-11-13 Applied Nanotech Holdings, Inc. Atmospheric pressure ion trap
EP2430646B1 (en) * 2009-05-06 2019-02-27 MKS Instruments, Inc. Electrostatic ion trap

Also Published As

Publication number Publication date
WO2013066881A2 (en) 2013-05-10
US9040907B2 (en) 2015-05-26
WO2013066881A3 (en) 2013-11-07
EP2774169A2 (en) 2014-09-10
US20140264068A1 (en) 2014-09-18
JP2015501520A (ja) 2015-01-15

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