JP2015194405A5 - - Google Patents

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Publication number
JP2015194405A5
JP2015194405A5 JP2014072552A JP2014072552A JP2015194405A5 JP 2015194405 A5 JP2015194405 A5 JP 2015194405A5 JP 2014072552 A JP2014072552 A JP 2014072552A JP 2014072552 A JP2014072552 A JP 2014072552A JP 2015194405 A5 JP2015194405 A5 JP 2015194405A5
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JP
Japan
Prior art keywords
reference value
pulse width
pulse
wave
pulse wave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2014072552A
Other languages
English (en)
Japanese (ja)
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JP6225798B2 (ja
JP2015194405A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from JP2014072552A external-priority patent/JP6225798B2/ja
Priority to JP2014072552A priority Critical patent/JP6225798B2/ja
Priority to EP15772509.4A priority patent/EP3128310B1/en
Priority to PCT/JP2015/057304 priority patent/WO2015151753A1/ja
Priority to SG11201607752QA priority patent/SG11201607752QA/en
Priority to CN201580014243.3A priority patent/CN106461531B/zh
Publication of JP2015194405A publication Critical patent/JP2015194405A/ja
Publication of JP2015194405A5 publication Critical patent/JP2015194405A5/ja
Priority to US15/268,989 priority patent/US20170003213A1/en
Publication of JP6225798B2 publication Critical patent/JP6225798B2/ja
Application granted granted Critical
Priority to US16/694,014 priority patent/US20200088626A1/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2014072552A 2014-03-31 2014-03-31 分析装置及び分析方法 Expired - Fee Related JP6225798B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2014072552A JP6225798B2 (ja) 2014-03-31 2014-03-31 分析装置及び分析方法
CN201580014243.3A CN106461531B (zh) 2014-03-31 2015-03-12 分析装置和分析方法
PCT/JP2015/057304 WO2015151753A1 (ja) 2014-03-31 2015-03-12 分析装置及び分析方法
SG11201607752QA SG11201607752QA (en) 2014-03-31 2015-03-12 Analysis device and analysis method
EP15772509.4A EP3128310B1 (en) 2014-03-31 2015-03-12 Analysis device and analysis method
US15/268,989 US20170003213A1 (en) 2014-03-31 2016-09-19 Analysis Device and Analysis Method
US16/694,014 US20200088626A1 (en) 2014-03-31 2019-11-25 Analysis device and analysis method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014072552A JP6225798B2 (ja) 2014-03-31 2014-03-31 分析装置及び分析方法

Publications (3)

Publication Number Publication Date
JP2015194405A JP2015194405A (ja) 2015-11-05
JP2015194405A5 true JP2015194405A5 (enExample) 2016-07-21
JP6225798B2 JP6225798B2 (ja) 2017-11-08

Family

ID=54240085

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014072552A Expired - Fee Related JP6225798B2 (ja) 2014-03-31 2014-03-31 分析装置及び分析方法

Country Status (6)

Country Link
US (2) US20170003213A1 (enExample)
EP (1) EP3128310B1 (enExample)
JP (1) JP6225798B2 (enExample)
CN (1) CN106461531B (enExample)
SG (1) SG11201607752QA (enExample)
WO (1) WO2015151753A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6962276B2 (ja) * 2018-06-06 2021-11-05 株式会社Ｊｖｃケンウッド 分析用閾値決定装置及び分析用閾値決定方法
JP7000998B2 (ja) * 2018-06-06 2022-01-19 株式会社Ｊｖｃケンウッド 分析用閾値生成装置及び分析用閾値生成方法
JP7218788B2 (ja) * 2018-06-06 2023-02-07 株式会社Ｊｖｃケンウッド 分析用閾値生成装置及び分析用閾値生成方法
JP7208468B2 (ja) * 2018-08-01 2023-01-19 株式会社Ｊｖｃケンウッド 分析装置及び分析方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001013366A1 (en) * 1999-08-18 2001-02-22 Matsushita Electric Industrial Co., Ltd. Optical disk reproducing method and reproducing device
US7221632B2 (en) * 2001-07-12 2007-05-22 Burstein Technologies, Inc. Optical disc system and related detecting methods for analysis of microscopic structures
WO2003036337A2 (en) * 2001-10-24 2003-05-01 Burstein Technologies, Inc. Optical biological disk analyser
US6970799B2 (en) * 2002-10-02 2005-11-29 Airadvice, Inc. Method and apparatus for particle sizing
JP2004309288A (ja) * 2003-04-07 2004-11-04 Matsushita Electric Ind Co Ltd 分析装置
JP4498082B2 (ja) * 2003-10-30 2010-07-07 パナソニック株式会社 光学分析装置およびその粒子カウント方法
JP2008071422A (ja) * 2006-09-14 2008-03-27 Sanyo Electric Co Ltd トラックジャンプ制御回路
TW201017149A (en) * 2008-08-06 2010-05-01 Invitrox Inc Use of focused light scattering techniques in biological applications
CN103026205B (zh) * 2010-07-26 2016-03-23 奥林巴斯株式会社 使用发光探针检测溶液中稀疏颗粒的方法
JP5958066B2 (ja) * 2011-05-13 2016-07-27 株式会社Ｊｖｃケンウッド 試料分析用ディスク
JP5510388B2 (ja) * 2011-05-13 2014-06-04 株式会社Ｊｖｃケンウッド 光学的分析装置、光学的分析方法
US8691160B2 (en) * 2011-05-13 2014-04-08 JVC Kenwood Corporation Sample analysis disc and method of producing sample analysis disc

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